Elements of similar construction connected in series or parallel to average out manufacturing variations in characteristics

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Y10S257/919

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S257/00Active solid-state devices

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Y10S257/919Elements of similar construction connected in series or parallel to average out manufacturing variations in characteristics

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for evaluating characteristics of t...
- Patent number 7,042,007
- Issue date May 9, 2006
- Matsushita Electric Industrial Co., Ltd.
- Takatoshi Yasui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current reference apparatus and systems
- Patent number 6,975,005
- Issue date Dec 13, 2005
- Intel Corporation
- Siva G. Narendra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Padless structure design for easy identification of bridging defect...
- Patent number 6,949,765
- Issue date Sep 27, 2005
- Chartered Semiconductor Manufacturing Ltd.
- Zhigang Song
- G01 - MEASURING TESTING
Information Patent Grant
Current reference apparatus
- Patent number 6,693,332
- Issue date Feb 17, 2004
- Intel Corporation
- Siva G. Narendra
- G05 - CONTROLLING REGULATING
Information Patent Grant
Operational amplifier topology and method
- Patent number 6,590,448
- Issue date Jul 8, 2003
- Texas Instruments Incorporated
- Rodney T. Burt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 6,320,262
- Issue date Nov 20, 2001
- Ricoh Company, Ltd.
- Akishige Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bipolar Silicon transistor with arsenic and phosphorous ratio
- Patent number 5,965,929
- Issue date Oct 12, 1999
- Siemens Aktiengesellschaft
- Klaus Gnannt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout structure of capacitive element(s) and interconnections in a...
- Patent number 5,892,266
- Issue date Apr 6, 1999
- Sumitomo Metal Industries, Ltd.
- Yoshihiro Hirota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SRAM cell with balanced load resistors
- Patent number 5,625,215
- Issue date Apr 29, 1997
- Lucent Technologies Inc.
- Min-Liang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantum well switching device with stimulated emission capabilities
- Patent number 5,298,762
- Issue date Mar 29, 1994
- TRW Inc.
- Szutsun S. Ou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Compensating lead structure for distributed IC components
- Patent number 5,289,040
- Issue date Feb 22, 1994
- National Semiconductor Corporation
- Alan C. Rogers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge shrinkage compensated devices
- Patent number 5,189,595
- Issue date Feb 23, 1993
- Silicon Systems, Inc.
- James Dunkley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-effect transistor device
- Patent number 5,175,604
- Issue date Dec 29, 1992
- Kabushiki Kaisha Toshiba
- Kazutaka Nogami
- G11 - INFORMATION STORAGE
Information Patent Grant
N-channel MOS transistors having source/drain regions with germanium
- Patent number 4,928,156
- Issue date May 22, 1990
- Motorola, Inc.
- John R. Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 4,864,382
- Issue date Sep 5, 1989
- Hitachi, Ltd.
- Masaaki Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IGT and MOSFET devices having reduced channel width
- Patent number 4,803,533
- Issue date Feb 7, 1989
- General Electric Company
- Mike F. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of insulated gate field effect transistor usin...
- Patent number 4,755,479
- Issue date Jul 5, 1988
- Fujitsu Limited
- Takao Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche photodiode and a method of making same
- Patent number 4,700,209
- Issue date Oct 13, 1987
- RCA Inc.
- Paul P. Webb
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing a semiconductor device
- Patent number 4,560,582
- Issue date Dec 24, 1985
- Kabushiki Kaisha Suwa Seikosha
- Matsuo Ichikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of producing semiconductor devices
- Patent number 3,972,113
- Issue date Aug 3, 1976
- Mitsubishi Denki Kabushiki Kaisha
- Josuke Nakata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3863331
- Patent number 3,863,331
- Issue date Feb 4, 1975
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3858238
- Patent number 3,858,238
- Issue date Dec 31, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3812519
- Patent number 3,812,519
- Issue date May 21, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3802968
- Patent number 3,802,968
- Issue date Apr 9, 1974
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3723199
- Patent number 3,723,199
- Issue date Mar 27, 1973
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3484658
- Patent number 3,484,658
- Issue date Dec 16, 1969
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3431150
- Patent number 3,431,150
- Issue date Mar 4, 1969
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3259815
- Patent number 3,259,815
- Issue date Jul 5, 1966
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and method for evaluating characteristics of t...
- Publication number 20040212016
- Publication date Oct 28, 2004
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Takatoshi Yasui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Padless structure design for easy identification of bridging defect...
- Publication number 20040084671
- Publication date May 6, 2004
- Chartered Semiconductor Manufacturing Ltd.
- Zhigang Song
- G01 - MEASURING TESTING
Information Patent Application
Current reference apparatus and systems
- Publication number 20040080362
- Publication date Apr 29, 2004
- Siva G. Narendra
- G05 - CONTROLLING REGULATING
Information Patent Application
Current reference apparatus
- Publication number 20030111698
- Publication date Jun 19, 2003
- Intel Corporation
- Siva G. Narendra
- G05 - CONTROLLING REGULATING

Elements of similar construction connected in series or parallel to average out manufacturing variations in characteristics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device and method for evaluating characteristics of t...

Current reference apparatus and systems

Padless structure design for easy identification of bridging defect...

Current reference apparatus

Operational amplifier topology and method

Semiconductor device and manufacturing method thereof

Bipolar Silicon transistor with arsenic and phosphorous ratio

Layout structure of capacitive element(s) and interconnections in a...

SRAM cell with balanced load resistors

Quantum well switching device with stimulated emission capabilities

Compensating lead structure for distributed IC components

Edge shrinkage compensated devices

Field-effect transistor device

N-channel MOS transistors having source/drain regions with germanium

Semiconductor device

IGT and MOSFET devices having reduced channel width

Manufacturing method of insulated gate field effect transistor usin...

Avalanche photodiode and a method of making same

Method of preparing a semiconductor device

Process of producing semiconductor devices

3863331

3858238

3812519

3802968

3723199

3484658

3431150

3259815

Patents Applicationslast 30 patents

Semiconductor device and method for evaluating characteristics of t...

Padless structure design for easy identification of bridging defect...

Current reference apparatus and systems

Current reference apparatus