End test of the packaged device

Industry

CPC
B81C99/0045

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BPERFORMING OPERATIONS TRANSPORTING B81Micro-structural technology B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICRO-STRUCTURAL DEVICES OR SYSTEMS B81C99/00Subject matter not provided for in other groups of this subclass

Current Industry

B81C99/0045End test of the packaged device

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semi-finished product of electronic device and electronic device
- Patent number 12,129,169
- Issue date Oct 29, 2024
- Merry Electronics Co., Ltd.
- Jen-Yi Chen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Testing apparatus and testing method thereof
- Patent number 11,368,804
- Issue date Jun 21, 2022
- xMEMS Labs, Inc.
- Yuan-Shuang Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Device and method for a threshold sensor
- Patent number 10,793,424
- Issue date Oct 6, 2020
- Invensense, Inc.
- Matthew Julian Thompson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Cover based adhesion force measurement system for microelectromecha...
- Patent number 10,717,641
- Issue date Jul 21, 2020
- Invensense, Inc.
- Alexander Castro
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus and methods for integrated MEMS devices
- Patent number 10,479,676
- Issue date Nov 19, 2019
- MCube, Inc.
- Ben Lee
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Device and method for a threshold sensor
- Patent number 10,399,849
- Issue date Sep 3, 2019
- Invensense, Inc.
- Matthew Julian Thompson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Controlled pulse generation methods and apparatuses for evaluating...
- Patent number 10,393,618
- Issue date Aug 27, 2019
- NXP USA, INC.
- Peter T. Jones
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor structure with cavity spacing monitoring functions
- Patent number 10,202,278
- Issue date Feb 12, 2019
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jung-Huei Peng
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for detecting a perturbation by hysteretic cycle using a non...
- Patent number 10,119,856
- Issue date Nov 6, 2018
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Sebastien Hentz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus and methods for integrated MEMS devices
- Patent number 10,046,966
- Issue date Aug 14, 2018
- MCube, Inc.
- Ben Lee
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of detecting whether microelectromechanical system device is...
- Patent number 9,915,679
- Issue date Mar 13, 2018
- Sensortek Technology Corp.
- Hsin-Hung Huang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Inertial angular sensor of balanced MEMS type and method for balanc...
- Patent number 9,869,551
- Issue date Jan 16, 2018
- Sagem Defense Securite
- Alain Jeanroy
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Packaged MEMS device comprising adjustable ventilation opening
- Patent number 9,673,785
- Issue date Jun 6, 2017
- Infineon Technologies AG
- Christian Herzum
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for testing signal-to-noise ratio using a film frame
- Patent number 9,491,558
- Issue date Nov 8, 2016
- Robert Bosch GmbH
- Andrew J. Doller
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Testing for defective manufacturing of microphones and ultralow pre...
- Patent number 9,400,262
- Issue date Jul 26, 2016
- Robert Bosch GmbH
- Andrew J. Doller
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Microelectromechanical component and method for testing a microelec...
- Patent number 9,399,572
- Issue date Jul 26, 2016
- Elmos Semiconductor AG
- Bernd Burchard
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Device testing using acoustic port obstruction
- Patent number 9,326,080
- Issue date Apr 26, 2016
- Robert Bosch GmbH
- Andrew J. Doller
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Tester and method for testing a strip of devices
- Patent number 9,285,422
- Issue date Mar 15, 2016
- Freescale Semiconductor Inc.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for producing a sensor
- Patent number 9,278,854
- Issue date Mar 8, 2016
- Epcos AG
- Wolfgang Pahl
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Packaged MEMS device and method of calibrating a packaged MEMS device
- Patent number 9,210,516
- Issue date Dec 8, 2015
- Infineon Technologies AG
- Christian Herzum
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of testing of MEMS devices on a wafer level
- Patent number 9,034,666
- Issue date May 19, 2015
- Vladimir Vaganov
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for producing hollow nanoparticle comprising deposition on/i...
- Patent number 8,999,225
- Issue date Apr 7, 2015
- National University Corporation Nagoya University
- Tsukasa Torimoto
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
MEMS vacuum level monitor in sealed package
- Patent number 8,887,573
- Issue date Nov 18, 2014
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tung-Tsun Chen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Measurement and apparatus for electrical measurement of electrical...
- Patent number 8,775,107
- Issue date Jul 8, 2014
- QUALCOMM MEMS Technologies, Inc.
- Alok Govil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micromechanical component having a test structure for determining t...
- Patent number 8,695,427
- Issue date Apr 15, 2014
- Robert Bosch GmbH
- Jochen Reinmuth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Detection and mitigation of particle contaminants in MEMS devices
- Patent number 8,598,891
- Issue date Dec 3, 2013
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Semiconductor device structures and their fabrication
- Patent number 8,530,984
- Issue date Sep 10, 2013
- Texas Instruments Incorporated
- Clayton Lee Stevenson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Detection and mitigation of particle contaminants in MEMS devices
- Patent number 8,421,481
- Issue date Apr 16, 2013
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Methods for measurement and characterization of interferometric mod...
- Patent number 8,386,201
- Issue date Feb 26, 2013
- QUALCOMM MEMS Technologies, Inc.
- Alok Govil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Measurement and apparatus for electrical measurement of electrical...
- Patent number 8,355,883
- Issue date Jan 15, 2013
- QUALCOMM MEMS Technologies, Inc.
- Alok Govil
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SEMI-FINISHED PRODUCT OF ELECTRONIC DEVICE AND ELECTRONIC DEVICE
- Publication number 20220298010
- Publication date Sep 22, 2022
- Merry Electronics Co., Ltd.
- Jen-Yi Chen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DEVICE AND METHOD FOR A THRESHOLD SENSOR
- Publication number 20190382259
- Publication date Dec 19, 2019
- InvenSense, Inc.
- MATTHEW JULIAN THOMPSON
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
APPARATUS AND METHODS FOR INTEGRATED MEMS DEVICES
- Publication number 20180346328
- Publication date Dec 6, 2018
- MCUBE, INC.
- Ben LEE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
APPARATUS AND METHODS FOR INTEGRATED MEMS DEVICES
- Publication number 20170283256
- Publication date Oct 5, 2017
- MCUBE, INC.
- Ben LEE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS
- Publication number 20160116361
- Publication date Apr 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL SYSTEM AND METHODS OF USE
- Publication number 20150177272
- Publication date Jun 25, 2015
- Jason V. Clark
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD OF MANUFACTURING MEMS DEVICES WITH RELIABLE HERMETIC SEAL
- Publication number 20140356989
- Publication date Dec 4, 2014
- Analog Devices, Inc.
- Li Chen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL ANGULAR SENSOR OF BALANCED MEMS TYPE AND METHOD FOR BALANC...
- Publication number 20140299947
- Publication date Oct 9, 2014
- Sagem Defense Securite
- Alain Jeanroy
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TESTING FOR DEFECTIVE MANUFACTURING OF MICROPHONES AND ULTRALOW PRE...
- Publication number 20140076052
- Publication date Mar 20, 2014
- ROBERT BOSCH GmbH
- Andrew J. Doller
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DEVICE TESTING USING ACOUSTIC PORT OBSTRUCTION
- Publication number 20140079229
- Publication date Mar 20, 2014
- ROBERT BOSCH GmbH
- Andrew J. Doller
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL COMPONENT AND METHOD FOR TESTING A MICROELEC...
- Publication number 20130305804
- Publication date Nov 21, 2013
- Silicon Microstructures, Inc.
- Bernd Burchard
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TESTER AND METHOD FOR TESTING A STRIP OF DEVICES
- Publication number 20130297248
- Publication date Nov 7, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Packaged MEMS Device and Method of Calibrating a Packaged MEMS Device
- Publication number 20130277776
- Publication date Oct 24, 2013
- INFINEON TECHNOLOGIES AG
- Christian Herzum
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS VACUUM LEVEL MONITOR IN SEALED PACKAGE
- Publication number 20130213139
- Publication date Aug 22, 2013
- Taiwan Semiconductor Manufacturing Co., LTD
- Tung-Tsun CHEN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Detection and Mitigation of Particle Contaminants in MEMS Devices
- Publication number 20130168675
- Publication date Jul 4, 2013
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURES AND THEIR FABRICATION
- Publication number 20130105995
- Publication date May 2, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Clayton Lee Stevenson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
HERMETICALLY SEALED MEMS DEVICE WITH A PORTION EXPOSED TO THE ENVIR...
- Publication number 20130001550
- Publication date Jan 3, 2013
- INVENSENSE, INC.
- Joseph SEEGER
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS DEVICE AND FABRICATION METHOD
- Publication number 20120329180
- Publication date Dec 27, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Clayton Lee Stevenson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEASUREMENT AND APPARATUS FOR ELECTRICAL MEASUREMENT OF ELECTRICAL...
- Publication number 20120256615
- Publication date Oct 11, 2012
- QUALCOMM MEMS TECHNOLOGIES, INC.
- Alok Govil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEASUREMENT AND APPARATUS FOR ELECTRICAL MEASUREMENT OF ELECTRICAL...
- Publication number 20120249122
- Publication date Oct 4, 2012
- QUALCOMM MEMS TECHNOLOGIES, INC.
- Alok Govil
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD FOR PRODUCING HOLLOW NANOPARTICLE, HOLLOW NANOPARTICLE, AND...
- Publication number 20120219800
- Publication date Aug 30, 2012
- OSAKA UNIVERSITY
- Tsukasa Torimoto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR TESTING OF MEMS DEVICES
- Publication number 20120194207
- Publication date Aug 2, 2012
- Vladimir Vaganov
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS Device and Fabrication Method
- Publication number 20120038019
- Publication date Feb 16, 2012
- Clayton Lee Stevenson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROMECHANICAL COMPONENT HAVING A TEST STRUCTURE FOR DETERMINING T...
- Publication number 20110296917
- Publication date Dec 8, 2011
- Jochen Reinmuth
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Detection and Mitigation of Particle Contaminants in MEMS Devices
- Publication number 20110115498
- Publication date May 19, 2011
- Analog Devices, Inc.
- Vineet Kumar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD FOR CARRYING OUT A SELF-TEST FOR A MICROMECHANICAL SENSOR DE...
- Publication number 20110067506
- Publication date Mar 24, 2011
- Stefan KIMMERLE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20110061449
- Publication date Mar 17, 2011
- Kabushiki Kaisha Toshiba
- Hitoshi YAGI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DYNAMIC QUANTITY SENSOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100307242
- Publication date Dec 9, 2010
- DENSO CORPORATION
- Minekazu SAKAI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Apparatus and Method of Detecting Microchip Hermeticity
- Publication number 20100154517
- Publication date Jun 24, 2010
- Analog Devices, Inc.
- Firas Sammoura
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD OF CHECKING THE HERMETICITY OF A CLOSED CAVITY OF A MICROMET...
- Publication number 20100064779
- Publication date Mar 18, 2010
- Asulab S.A.
- Francois Gueissaz
- B81 - MICRO-STRUCTURAL TECHNOLOGY

End test of the packaged device

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semi-finished product of electronic device and electronic device

Testing apparatus and testing method thereof

Device and method for a threshold sensor

Cover based adhesion force measurement system for microelectromecha...

Apparatus and methods for integrated MEMS devices

Device and method for a threshold sensor

Controlled pulse generation methods and apparatuses for evaluating...

Semiconductor structure with cavity spacing monitoring functions

Method for detecting a perturbation by hysteretic cycle using a non...

Apparatus and methods for integrated MEMS devices

Method of detecting whether microelectromechanical system device is...

Inertial angular sensor of balanced MEMS type and method for balanc...

Packaged MEMS device comprising adjustable ventilation opening

Method for testing signal-to-noise ratio using a film frame

Testing for defective manufacturing of microphones and ultralow pre...

Microelectromechanical component and method for testing a microelec...

Device testing using acoustic port obstruction

Tester and method for testing a strip of devices

Method for producing a sensor

Packaged MEMS device and method of calibrating a packaged MEMS device

Method of testing of MEMS devices on a wafer level

Method for producing hollow nanoparticle comprising deposition on/i...

MEMS vacuum level monitor in sealed package

Measurement and apparatus for electrical measurement of electrical...

Micromechanical component having a test structure for determining t...

Detection and mitigation of particle contaminants in MEMS devices

Semiconductor device structures and their fabrication

Detection and mitigation of particle contaminants in MEMS devices

Methods for measurement and characterization of interferometric mod...

Measurement and apparatus for electrical measurement of electrical...

Patents Applicationslast 30 patents

SEMI-FINISHED PRODUCT OF ELECTRONIC DEVICE AND ELECTRONIC DEVICE

DEVICE AND METHOD FOR A THRESHOLD SENSOR

APPARATUS AND METHODS FOR INTEGRATED MEMS DEVICES

APPARATUS AND METHODS FOR INTEGRATED MEMS DEVICES

SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS

MICROELECTROMECHANICAL SYSTEM AND METHODS OF USE

METHOD OF MANUFACTURING MEMS DEVICES WITH RELIABLE HERMETIC SEAL

INERTIAL ANGULAR SENSOR OF BALANCED MEMS TYPE AND METHOD FOR BALANC...

TESTING FOR DEFECTIVE MANUFACTURING OF MICROPHONES AND ULTRALOW PRE...

DEVICE TESTING USING ACOUSTIC PORT OBSTRUCTION

MICROELECTROMECHANICAL COMPONENT AND METHOD FOR TESTING A MICROELEC...

TESTER AND METHOD FOR TESTING A STRIP OF DEVICES

Packaged MEMS Device and Method of Calibrating a Packaged MEMS Device

MEMS VACUUM LEVEL MONITOR IN SEALED PACKAGE

Detection and Mitigation of Particle Contaminants in MEMS Devices

SEMICONDUCTOR DEVICE STRUCTURES AND THEIR FABRICATION

HERMETICALLY SEALED MEMS DEVICE WITH A PORTION EXPOSED TO THE ENVIR...

MEMS DEVICE AND FABRICATION METHOD

MEASUREMENT AND APPARATUS FOR ELECTRICAL MEASUREMENT OF ELECTRICAL...

MEASUREMENT AND APPARATUS FOR ELECTRICAL MEASUREMENT OF ELECTRICAL...

METHOD FOR PRODUCING HOLLOW NANOPARTICLE, HOLLOW NANOPARTICLE, AND...

METHOD AND SYSTEM FOR TESTING OF MEMS DEVICES

MEMS Device and Fabrication Method

MICROMECHANICAL COMPONENT HAVING A TEST STRUCTURE FOR DETERMINING T...

Detection and Mitigation of Particle Contaminants in MEMS Devices

METHOD FOR CARRYING OUT A SELF-TEST FOR A MICROMECHANICAL SENSOR DE...

ELECTRONIC DEVICE

DYNAMIC QUANTITY SENSOR AND METHOD OF MANUFACTURING THE SAME

Apparatus and Method of Detecting Microchip Hermeticity

METHOD OF CHECKING THE HERMETICITY OF A CLOSED CAVITY OF A MICROMET...