Error reduction by correction of the measurement signal based on independently determined error sources

Industry

CPC
G01B9/0207

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/0207Error reduction by correction of the measurement signal based on independently determined error sources

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Truncated nonlinear interferometer-based sensor system
- Patent number 12,181,773
- Issue date Dec 31, 2024
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 12,181,280
- Issue date Dec 31, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Self-configuration and error correction in linear photonic circuits
- Patent number 12,174,018
- Issue date Dec 24, 2024
- Massachusetts Institute of Technology
- Ryan Hamerly
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a substrate and method for correcting cyclic e...
- Patent number 12,135,211
- Issue date Nov 5, 2024
- Carl Zeiss SMT GmbH
- Stephan Zschaeck
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical coherence tomography system for subsurface inspection
- Patent number 12,085,387
- Issue date Sep 10, 2024
- Hamamatsu Photonics K.K.
- Qingsong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography-based intraoral scanner calibration de...
- Patent number 12,062,212
- Issue date Aug 13, 2024
- HUVITZ CO., LTD.
- Hyo Sang Jeong
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical phase locked loops for generating highly-linear frequency c...
- Patent number 12,034,268
- Issue date Jul 9, 2024
- JASR Systems, LLC
- Tianyi Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Full-field OCT method and system for generating an imaging of an oc...
- Patent number 11,986,242
- Issue date May 21, 2024
- VISOTEC GMBH
- Peter Koch
- G01 - MEASURING TESTING
Information Patent Grant
System and method for correcting optical path length measurement er...
- Patent number 11,920,928
- Issue date Mar 5, 2024
- Tokyo Electron Limited
- Kenji Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Locking a self-homodyne mixed beat frequency to an external frequen...
- Patent number 11,914,038
- Issue date Feb 27, 2024
- Aeva, Inc.
- Bryce Bradford
- G01 - MEASURING TESTING
Information Patent Grant
Thickness evaluation method of cell sheet
- Patent number 11,906,301
- Issue date Feb 20, 2024
- SCREEN Holdings Co., Ltd.
- Ryo Hasebe
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain interferometric based imaging systems and methods
- Patent number 11,890,052
- Issue date Feb 6, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for interferometrically determining a surface s...
- Patent number 11,892,283
- Issue date Feb 6, 2024
- Carl Zeiss SMT GmbH
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system, optical measurement method, and non-tra...
- Patent number 11,892,281
- Issue date Feb 6, 2024
- Otsuka Electronics Co., Ltd.
- Shiro Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Manual calibration of imaging system
- Patent number 11,892,289
- Issue date Feb 6, 2024
- PHILIPS IMAGE GUIDED THERAPY CORPORATION
- Andreas Johansson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of measurement error in an etalon
- Patent number 11,860,036
- Issue date Jan 2, 2024
- Cymer, LLC
- Russell Allen Burdt
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for semiconductor chip surface topography metro...
- Patent number 11,796,307
- Issue date Oct 24, 2023
- Yangtze Memory Technologies Co., Ltd.
- Sicong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
- Patent number 11,788,829
- Issue date Oct 17, 2023
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Peng Feng
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a measuring apparatus
- Patent number 11,774,237
- Issue date Oct 3, 2023
- Carl Zeiss SMT GmbH
- Jochen Hetzler
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and computer-accessible medium for subsurface capil...
- Patent number 11,771,321
- Issue date Oct 3, 2023
- The Research Foundation for SUNY
- Yingtian Pan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometer system, method of determining a mode hop of a laser...
- Patent number 11,719,529
- Issue date Aug 8, 2023
- ASML Netherlands B.V.
- Maarten Jozef Jansen
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
- Patent number 11,713,961
- Issue date Aug 1, 2023
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting wavefront error by modal-based opti...
- Patent number 11,709,111
- Issue date Jul 25, 2023
- Zhejiang University
- Jian Bai
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography (OCT) apparatus and OCT method for axi...
- Patent number 11,690,516
- Issue date Jul 4, 2023
- University of Kent
- Adrian Podoleanu
- G01 - MEASURING TESTING
Information Patent Grant
Device for determining an orientation of an optical device of a coh...
- Patent number 11,623,299
- Issue date Apr 11, 2023
- Precitec GmbH & Co. KG
- Matthias Sauer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
External parameter calibration method for robot sensors and apparat...
- Patent number 11,590,655
- Issue date Feb 28, 2023
- UBTECH ROBOTICS CORP LTD
- Youjun Xiong
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Dynamical modeling of CMMs for numerically correcting measurement r...
- Patent number 11,585,650
- Issue date Feb 21, 2023
- Hexagon Technology Center GmbH
- Claudio Iseli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Truncated non-linear interferometer-based sensor system
- Patent number 11,561,453
- Issue date Jan 24, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Analysis apparatus, analysis method, and interference measurement s...
- Patent number 11,536,562
- Issue date Dec 27, 2022
- Mitutoyo Corp.
- Shimpei Matsuura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF
- Publication number 20240426594
- Publication date Dec 26, 2024
- OptiPro Systems, LLC
- James F. Munro
- G01 - MEASURING TESTING
Information Patent Application
Relative intensity noise Cat's-eye swept source laser for OCT and s...
- Publication number 20240418497
- Publication date Dec 19, 2024
- KineoLabs, Inc.
- Walid A. Atia
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20240410685
- Publication date Dec 12, 2024
- ChromoLogic LLC
- Matthew BREHOVE
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE
- Publication number 20240393098
- Publication date Nov 28, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for 1-Micron Frequency Comb Optical Coherence T...
- Publication number 20240377184
- Publication date Nov 14, 2024
- The Regents of the University of California
- Tristan Melton
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO REDUCE MEASUREMENT ERROR IN INTERFEROMETRY-BAS...
- Publication number 20240337478
- Publication date Oct 10, 2024
- KLA Corporation
- Yuchi Chen
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAFERS
- Publication number 20240310159
- Publication date Sep 19, 2024
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
MANUAL CALIBRATION OF IMAGING SYSTEM
- Publication number 20240288262
- Publication date Aug 29, 2024
- PHILIPS IMAGE GUIDED THERAPY CORPORATION
- Andreas JOHANSSON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ADJUSTING A REFERENCE SECTION OF AN OCT SYSTEM
- Publication number 20240271923
- Publication date Aug 15, 2024
- TRUMPF Laser GmbH
- Stefan Braun
- G01 - MEASURING TESTING
Information Patent Application
Imaging Target Movement Compensation in a Fourier-domain Optical Co...
- Publication number 20240197171
- Publication date Jun 20, 2024
- OPTOS PLC
- Miguel Angel Preciado
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE
- Publication number 20240183650
- Publication date Jun 6, 2024
- Mitsubishi Electric Corporation
- Takanori YAMAUCHI
- G01 - MEASURING TESTING
Information Patent Application
NIRAF Calibration Packaging Phantom
- Publication number 20240125588
- Publication date Apr 18, 2024
- Canon U.S.A., Inc.
- Emily Chernich
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20240115128
- Publication date Apr 11, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...
- Publication number 20240061351
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
Line-field swept source OCT system for monitoring biological systems
- Publication number 20240035806
- Publication date Feb 1, 2024
- KineoLabs
- Walid A. Atia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION OF IMAGING SYSTEM WITH COMBINED OPTICAL COHERENCE TOMOG...
- Publication number 20240027180
- Publication date Jan 25, 2024
- Alcon Inc.
- Wei Wei
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
- Publication number 20230417532
- Publication date Dec 28, 2023
- BEIJING U-PRECISION TECH CO., LTD.
- Guohua SUN
- G01 - MEASURING TESTING
Information Patent Application
METHOD, MEASURING DEVICE, MACHINING SYSTEM AND COMPUTER PROGRAM PRO...
- Publication number 20230384083
- Publication date Nov 30, 2023
- Lessmüller Lasertechnik GmbH
- Eckhard Lessmüller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DATA AGE REDUCTION
- Publication number 20230366670
- Publication date Nov 16, 2023
- Zygo Corporation
- Frank C. Demarest
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE
- Publication number 20230358527
- Publication date Nov 9, 2023
- NEC Corporation
- Shigeru NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
- Publication number 20230324164
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LASER INTERFEROMETER
- Publication number 20230280152
- Publication date Sep 7, 2023
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Reconstruction of Digital Holograms
- Publication number 20230259070
- Publication date Aug 17, 2023
- ORBOTECH LTD.
- Yigal KATZIR
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE
- Publication number 20230213334
- Publication date Jul 6, 2023
- BMV Optical Technologies Inc.
- Curtis Blake LaPlante
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD OF OPTICAL COHERENCE TOMOGRAPHY DEVICE
- Publication number 20230194238
- Publication date Jun 22, 2023
- HUVITZ CO., LTD.
- Hyo Sang JEONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
- Publication number 20230168077
- Publication date Jun 1, 2023
- ASML NETHERLANDS B.V.
- Maarten Jozef JANSEN
- G01 - MEASURING TESTING
Information Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20230161220
- Publication date May 25, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...
- Publication number 20230160684
- Publication date May 25, 2023
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Peng FENG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...
- Publication number 20230133662
- Publication date May 4, 2023
- Precitec GmbH & Co. KG
- Rüdiger Moser
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Error reduction by correction of the measurement signal based on independently determined error sources

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Truncated nonlinear interferometer-based sensor system

Systems, methods, and media for multiple reference arm spectral dom...

Self-configuration and error correction in linear photonic circuits

Device for measuring a substrate and method for correcting cyclic e...

Optical coherence tomography system for subsurface inspection

Optical coherence tomography-based intraoral scanner calibration de...

Optical phase locked loops for generating highly-linear frequency c...

Full-field OCT method and system for generating an imaging of an oc...

System and method for correcting optical path length measurement er...

Locking a self-homodyne mixed beat frequency to an external frequen...

Thickness evaluation method of cell sheet

Frequency-domain interferometric based imaging systems and methods

Measuring apparatus for interferometrically determining a surface s...

Optical measurement system, optical measurement method, and non-tra...

Manual calibration of imaging system

Determination of measurement error in an etalon

Systems and methods for semiconductor chip surface topography metro...

Simultaneous phase-shift point diffraction interferometer and metho...

Method for calibrating a measuring apparatus

System, method, and computer-accessible medium for subsurface capil...

Interferometer system, method of determining a mode hop of a laser...

Systems, methods, and media for multiple reference arm spectral dom...

Device and method for detecting wavefront error by modal-based opti...

Heterodyne photonic integrated circuit for absolute metrology

Optical coherence tomography (OCT) apparatus and OCT method for axi...

Device for determining an orientation of an optical device of a coh...

External parameter calibration method for robot sensors and apparat...

Dynamical modeling of CMMs for numerically correcting measurement r...

Truncated non-linear interferometer-based sensor system

Analysis apparatus, analysis method, and interference measurement s...

Patents Applicationslast 30 patents

REFLECTIVE CO-AXIAL INTERFEROMETER SYSTEMS AND METHODS THEREOF

Relative intensity noise Cat's-eye swept source laser for OCT and s...

MONITORING OBJECTS IN AQUEOUS MEDIA USING OPTICAL COHERENCE TOMOGRAPHY

ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE

Systems and Methods for 1-Micron Frequency Comb Optical Coherence T...

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

SYSTEM AND METHOD TO REDUCE MEASUREMENT ERROR IN INTERFEROMETRY-BAS...

DEVICE AND METHOD FOR MEASURING WAFERS

MANUAL CALIBRATION OF IMAGING SYSTEM

METHOD AND SYSTEM FOR ADJUSTING A REFERENCE SECTION OF AN OCT SYSTEM

Imaging Target Movement Compensation in a Fourier-domain Optical Co...

OPTICAL MEASUREMENT DEVICE

NIRAF Calibration Packaging Phantom

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...

Line-field swept source OCT system for monitoring biological systems

CALIBRATION OF IMAGING SYSTEM WITH COMBINED OPTICAL COHERENCE TOMOG...

INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD

METHOD, MEASURING DEVICE, MACHINING SYSTEM AND COMPUTER PROGRAM PRO...

DATA AGE REDUCTION

OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE

INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...

LASER INTERFEROMETER

Systems and Methods for Reconstruction of Digital Holograms

OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE

CALIBRATION METHOD OF OPTICAL COHERENCE TOMOGRAPHY DEVICE

METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...

TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM

SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...

METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...