Membership
Tour
Register
Log in
Error reduction by correction of the measurement signal based on independently determined error sources
Follow
Industry
CPC
G01B9/0207
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/0207
Error reduction by correction of the measurement signal based on independently determined error sources
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
System and method for correcting optical path length measurement er...
Patent number
11,920,928
Issue date
Mar 5, 2024
Tokyo Electron Limited
Kenji Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Locking a self-homodyne mixed beat frequency to an external frequen...
Patent number
11,914,038
Issue date
Feb 27, 2024
Aeva, Inc.
Bryce Bradford
G01 - MEASURING TESTING
Information
Patent Grant
Thickness evaluation method of cell sheet
Patent number
11,906,301
Issue date
Feb 20, 2024
SCREEN Holdings Co., Ltd.
Ryo Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Frequency-domain interferometric based imaging systems and methods
Patent number
11,890,052
Issue date
Feb 6, 2024
Carl Zeiss Meditec, Inc.
Tilman Schmoll
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus for interferometrically determining a surface s...
Patent number
11,892,283
Issue date
Feb 6, 2024
Carl Zeiss SMT GmbH
Stefan Schulte
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement system, optical measurement method, and non-tra...
Patent number
11,892,281
Issue date
Feb 6, 2024
Otsuka Electronics Co., Ltd.
Shiro Kawaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Manual calibration of imaging system
Patent number
11,892,289
Issue date
Feb 6, 2024
PHILIPS IMAGE GUIDED THERAPY CORPORATION
Andreas Johansson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Determination of measurement error in an etalon
Patent number
11,860,036
Issue date
Jan 2, 2024
Cymer, LLC
Russell Allen Burdt
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for semiconductor chip surface topography metro...
Patent number
11,796,307
Issue date
Oct 24, 2023
Yangtze Memory Technologies Co., Ltd.
Sicong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous phase-shift point diffraction interferometer and metho...
Patent number
11,788,829
Issue date
Oct 17, 2023
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Peng Feng
G01 - MEASURING TESTING
Information
Patent Grant
Method for calibrating a measuring apparatus
Patent number
11,774,237
Issue date
Oct 3, 2023
Carl Zeiss SMT GmbH
Jochen Hetzler
G01 - MEASURING TESTING
Information
Patent Grant
System, method, and computer-accessible medium for subsurface capil...
Patent number
11,771,321
Issue date
Oct 3, 2023
The Research Foundation for SUNY
Yingtian Pan
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Interferometer system, method of determining a mode hop of a laser...
Patent number
11,719,529
Issue date
Aug 8, 2023
ASML Netherlands B.V.
Maarten Jozef Jansen
G01 - MEASURING TESTING
Information
Patent Grant
Systems, methods, and media for multiple reference arm spectral dom...
Patent number
11,713,961
Issue date
Aug 1, 2023
The General Hospital Corporation
Guillermo J. Tearney
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for detecting wavefront error by modal-based opti...
Patent number
11,709,111
Issue date
Jul 25, 2023
Zhejiang University
Jian Bai
G01 - MEASURING TESTING
Information
Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
Patent number
11,703,317
Issue date
Jul 18, 2023
Raytheon Company
Richard Lee Kendrick
G01 - MEASURING TESTING
Information
Patent Grant
Optical coherence tomography (OCT) apparatus and OCT method for axi...
Patent number
11,690,516
Issue date
Jul 4, 2023
University of Kent
Adrian Podoleanu
G01 - MEASURING TESTING
Information
Patent Grant
Device for determining an orientation of an optical device of a coh...
Patent number
11,623,299
Issue date
Apr 11, 2023
Precitec GmbH & Co. KG
Matthias Sauer
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
External parameter calibration method for robot sensors and apparat...
Patent number
11,590,655
Issue date
Feb 28, 2023
UBTECH ROBOTICS CORP LTD
Youjun Xiong
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Dynamical modeling of CMMs for numerically correcting measurement r...
Patent number
11,585,650
Issue date
Feb 21, 2023
Hexagon Technology Center GmbH
Claudio Iseli
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Truncated non-linear interferometer-based sensor system
Patent number
11,561,453
Issue date
Jan 24, 2023
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Analysis apparatus, analysis method, and interference measurement s...
Patent number
11,536,562
Issue date
Dec 27, 2022
Mitutoyo Corp.
Shimpei Matsuura
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method
Patent number
11,525,664
Issue date
Dec 13, 2022
Mitutoyo Corporation
Masayuki Nara
G01 - MEASURING TESTING
Information
Patent Grant
Systems having light source with extended spectrum for semiconducto...
Patent number
11,454,491
Issue date
Sep 27, 2022
Yangtze Memory Technologies Co., Ltd.
Sicong Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for compensating a magnetic locator, locator and computer pr...
Patent number
11,428,840
Issue date
Aug 30, 2022
MINMAXMEDICAL
Loic Huguel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and systems for the non-invasive optical characterization of...
Patent number
11,408,723
Issue date
Aug 9, 2022
Centre National de la Recherche Scientifique
Alexandre Aubry
G01 - MEASURING TESTING
Information
Patent Grant
In vivo optical flow imaging
Patent number
11,375,913
Issue date
Jul 5, 2022
Oregon Health & Science University
Yali Jia
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Ophthalmic apparatus
Patent number
11,369,265
Issue date
Jun 28, 2022
Tomey Corporation
Yuji Nozawa
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method for measuring complex degree of coherence of random optical...
Patent number
11,366,017
Issue date
Jun 21, 2022
Soochow University
Yahong Chen
G01 - MEASURING TESTING
Information
Patent Grant
Spatial accuracy correction method and apparatus
Patent number
11,366,448
Issue date
Jun 21, 2022
Mitutoyo Corporation
Shinichiro Yanaka
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
NIRAF Calibration Packaging Phantom
Publication number
20240125588
Publication date
Apr 18, 2024
Canon U.S.A., Inc.
Emily Chernich
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
Publication number
20240115128
Publication date
Apr 11, 2024
Carl Zeiss Meditec, Inc.
Tilman Schmoll
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
AN INTERFEROMETER SYSTEM, POSITIONING SYSTEM, A LITHOGRAPHIC APPARA...
Publication number
20240061351
Publication date
Feb 22, 2024
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G01 - MEASURING TESTING
Information
Patent Application
Line-field swept source OCT system for monitoring biological systems
Publication number
20240035806
Publication date
Feb 1, 2024
KineoLabs
Walid A. Atia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CALIBRATION OF IMAGING SYSTEM WITH COMBINED OPTICAL COHERENCE TOMOG...
Publication number
20240027180
Publication date
Jan 25, 2024
Alcon Inc.
Wei Wei
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER DISPLACEMENT MEASUREMENT SYSTEM AND METHOD
Publication number
20230417532
Publication date
Dec 28, 2023
BEIJING U-PRECISION TECH CO., LTD.
Guohua SUN
G01 - MEASURING TESTING
Information
Patent Application
METHOD, MEASURING DEVICE, MACHINING SYSTEM AND COMPUTER PROGRAM PRO...
Publication number
20230384083
Publication date
Nov 30, 2023
Lessmüller Lasertechnik GmbH
Eckhard Lessmüller
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
DATA AGE REDUCTION
Publication number
20230366670
Publication date
Nov 16, 2023
Zygo Corporation
Frank C. Demarest
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE TOMOGRAPHIC IMAGING DEVICE
Publication number
20230358527
Publication date
Nov 9, 2023
NEC Corporation
Shigeru NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
Publication number
20230324164
Publication date
Oct 12, 2023
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LASER INTERFEROMETER
Publication number
20230280152
Publication date
Sep 7, 2023
SEIKO EPSON CORPORATION
Kohei YAMADA
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Reconstruction of Digital Holograms
Publication number
20230259070
Publication date
Aug 17, 2023
ORBOTECH LTD.
Yigal KATZIR
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
OPTICAL SYSTEM USING ENHANCED STATIC FRINGE CAPTURE
Publication number
20230213334
Publication date
Jul 6, 2023
BMV Optical Technologies Inc.
Curtis Blake LaPlante
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION METHOD OF OPTICAL COHERENCE TOMOGRAPHY DEVICE
Publication number
20230194238
Publication date
Jun 22, 2023
HUVITZ CO., LTD.
Hyo Sang JEONG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATION OF AN OPTICAL MEASUREMENT SYSTEM AND OPTICAL...
Publication number
20230168077
Publication date
Jun 1, 2023
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G01 - MEASURING TESTING
Information
Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
Publication number
20230161220
Publication date
May 25, 2023
UT-Battelle, LLC
Raphael C. Pooser
B82 - NANO-TECHNOLOGY
Information
Patent Application
SIMULTANEOUS PHASE-SHIFT POINT DIFFRACTION INTERFEROMETER AND METHO...
Publication number
20230160684
Publication date
May 25, 2023
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Peng FENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING ONE OR MORE OPTICAL SENSORS OF A LASER MACHI...
Publication number
20230133662
Publication date
May 4, 2023
Precitec GmbH & Co. KG
Rüdiger Moser
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Systems, Methods and Computer Program Products for Optimizing Optic...
Publication number
20230107680
Publication date
Apr 6, 2023
Leica Microsystems Inc.
Eric Lynch
G02 - OPTICS
Information
Patent Application
In-Situ Residual Intensity Noise Measurement Method And System
Publication number
20230049259
Publication date
Feb 16, 2023
KVH Industries, Inc.
Jan Amir Khan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING AND CONTROLLING THE SEPARATION DI...
Publication number
20230013723
Publication date
Jan 19, 2023
Adige S.p.A.
Simone DONADELLO
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING THE LOCAL POSITION OF AT LEAST ON...
Publication number
20220410309
Publication date
Dec 29, 2022
Adige S.p.A.
Simone DONADELLO
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Self-Configuration and Error Correction in Linear Photonic Circuits
Publication number
20220397383
Publication date
Dec 15, 2022
Ryan HAMERLY
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CORRECTING OPTICAL PATH LENGTH MEASUREMENT ER...
Publication number
20220357146
Publication date
Nov 10, 2022
TOKYO ELECTRON LIMITED
Kenji NAGAI
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS FOR INTERFEROMETRIC SHAPE MEASUREMENT
Publication number
20220349700
Publication date
Nov 3, 2022
Carl Zeiss SMT GMBH
Jochen HETZLER
G01 - MEASURING TESTING
Information
Patent Application
PHASE UNWRAPPING DEVICE AND PHASE UNWRAPPING METHOD
Publication number
20220283294
Publication date
Sep 8, 2022
NEC Corporation
Taichi TANAKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR MEASURING A SUBSTRATE AND METHOD FOR CORRECTING CYCLIC E...
Publication number
20220260359
Publication date
Aug 18, 2022
Carl Zeiss SMT GMBH
Stephan Zschaeck
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
Publication number
20220221266
Publication date
Jul 14, 2022
TOPCON CORPORATION
Homare MOMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS FOR INTERFEROMETRICALLY DETERMINING A SURFACE S...
Publication number
20220221269
Publication date
Jul 14, 2022
Carl Zeiss SMT GMBH
Stefan SCHULTE
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
Publication number
20220205775
Publication date
Jun 30, 2022
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G01 - MEASURING TESTING