Evaluation methods

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G01R31/31711

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31711Evaluation methods

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Circuit, chip and semiconductor device
- Patent number 12,021,537
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao Chieh Li
- G01 - MEASURING TESTING
Information Patent Grant
Identifying data valid windows
- Patent number 11,815,554
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Phillip A. Rasmussen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit, chip and semiconductor device
- Patent number 11,533,056
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chao Chieh Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Margin test methods and circuits
- Patent number 11,233,589
- Issue date Jan 25, 2022
- RAMBUS INC.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Margin test methods and circuits
- Patent number 10,880,022
- Issue date Dec 29, 2020
- RAMBUS INC.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
DFE margin test methods and circuits that decouple sample feedback...
- Patent number 10,764,093
- Issue date Sep 1, 2020
- RAMBUS INC.
- Brian S. Leibowitz
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observation system and method for waveform observation
- Patent number 10,749,643
- Issue date Aug 18, 2020
- Denso Corporation
- Hironobu Akita
- G01 - MEASURING TESTING
Information Patent Grant
Margin test methods and circuits
- Patent number 10,735,116
- Issue date Aug 4, 2020
- RAMBUS INC.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer evaluation standard setting method, semiconduct...
- Patent number 10,261,125
- Issue date Apr 16, 2019
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Margin test methods and circuits
- Patent number 10,193,642
- Issue date Jan 29, 2019
- Rambus Inc.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip eye diagram capture
- Patent number 9,766,288
- Issue date Sep 19, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Hung Huang
- G01 - MEASURING TESTING
Information Patent Grant
Margin test methods and circuits
- Patent number 9,544,071
- Issue date Jan 10, 2017
- Rambus Inc.
- Andrew Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-chip eye diagram capture
- Patent number 9,267,988
- Issue date Feb 23, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Hung Huang
- G01 - MEASURING TESTING
Information Patent Grant
Margin test methods and circuits
- Patent number 9,116,810
- Issue date Aug 25, 2015
- Rambus Inc.
- Andrew Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for analyzing a signal under test
- Patent number 8,995,510
- Issue date Mar 31, 2015
- Tektronix, Inc.
- Toshiaki Obata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Margin test methods and circuits
- Patent number 8,817,932
- Issue date Aug 26, 2014
- Rambus Inc.
- Andrew Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-chip eye viewer architecture for highspeed transceivers
- Patent number 8,744,012
- Issue date Jun 3, 2014
- Altera Corporation
- Weiqi Ding
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Increased reliability in the processing of digital signals
- Patent number 8,738,331
- Issue date May 27, 2014
- ABB Technology AG
- Hans Björklund
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,666,691
- Issue date Mar 4, 2014
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and device for clock data recovery
- Patent number 8,625,729
- Issue date Jan 7, 2014
- Rohde & Schwarz GmbH & Co. KG
- Rubén Villarino-Villa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Margin test methods and circuits
- Patent number 8,559,493
- Issue date Oct 15, 2013
- Rambus Inc.
- Andrew Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Receiver circuit architectures
- Patent number 8,385,492
- Issue date Feb 26, 2013
- Rambus Inc.
- Andrew Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Flexible timebase for eye diagram
- Patent number 8,355,469
- Issue date Jan 15, 2013
- Tektronix, Inc.
- Daniel G. Baker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for eye margin calculating, and computer-reada...
- Patent number 8,243,995
- Issue date Aug 14, 2012
- Fujitsu Limited
- Daita Tsubamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for clock-data recovery
- Patent number 8,208,594
- Issue date Jun 26, 2012
- Rohde & Schwarz GmbH & Co. KG
- Rubén Villarino-Villa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Flexible timebase for EYE diagram
- Patent number 8,184,747
- Issue date May 22, 2012
- Tektronix, Inc.
- Daniel G. Baker
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Noise separating apparatus, noise separating method, probability de...
- Patent number 8,121,815
- Issue date Feb 21, 2012
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Waveform analyzer
- Patent number 8,054,907
- Issue date Nov 8, 2011
- John David Hamre
- G11 - INFORMATION STORAGE
Information Patent Grant
Measuring device and method for measuring relative phase shifts of...
- Patent number 7,945,406
- Issue date May 17, 2011
- Infineon Technologies AG
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Grant
Estimating boundaries of Schmoo plots
- Patent number 7,711,524
- Issue date May 4, 2010
- Verigy (Singapore) Pte. Ltd.
- Lokesh Johri
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20240305301
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO CHIEH LI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM
- Publication number 20230288476
- Publication date Sep 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Huan LU
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20230118223
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO CHIEH LI
- G04 - HOROLOGY
Information Patent Application
Margin Test Methods and Circuits
- Publication number 20220182158
- Publication date Jun 9, 2022
- Rambus Inc.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Margin Test Methods and Circuits
- Publication number 20210126722
- Publication date Apr 29, 2021
- Rambus Inc.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE
- Publication number 20210080503
- Publication date Mar 18, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- CHAO CHIEH LI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR AUTOMATED MEASUREMENT OF SEVERAL...
- Publication number 20210018561
- Publication date Jan 21, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Matthias RUENGELER
- G01 - MEASURING TESTING
Information Patent Application
Margin Test Methods and Circuits
- Publication number 20210006341
- Publication date Jan 7, 2021
- Rambus Inc.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAVEFORM OBSERVATION SYSTEM AND METHOD FOR WAVEFORM OBSERVATION
- Publication number 20190296867
- Publication date Sep 26, 2019
- Hironobu AKITA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Margin Test Methods and Circuits
- Publication number 20190190627
- Publication date Jun 20, 2019
- RAMBUS INC.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING AN EMBEDDED CONTROLLER
- Publication number 20180348301
- Publication date Dec 6, 2018
- Raytheon Company
- Terence J. McKiernan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION STANDARD SETTING METHOD, SEMICONDUCT...
- Publication number 20180136279
- Publication date May 17, 2018
- SUMCO CORPORATION
- Takahiro NAGASAWA
- G01 - MEASURING TESTING
Information Patent Application
NOISE FIGURE MEASUREMENT USING NARROWBAND COMPENSATION
- Publication number 20150309101
- Publication date Oct 29, 2015
- Keysight Technologies, Inc.
- David J. Ballo
- G01 - MEASURING TESTING
Information Patent Application
Margin Test Methods and Circuits
- Publication number 20140331112
- Publication date Nov 6, 2014
- Andrew Ho
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP EYE DIAGRAM CAPTURE
- Publication number 20140266152
- Publication date Sep 18, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Wen-Hung HUANG
- G01 - MEASURING TESTING
Information Patent Application
Margin Test Methods and Circuits
- Publication number 20140161166
- Publication date Jun 12, 2014
- RAMBUS INC.
- Andrew Ho
- G01 - MEASURING TESTING
Information Patent Application
Eye pattern generation of unequalized eye patterns using a serial r...
- Publication number 20140133614
- Publication date May 15, 2014
- Alexander Neal Huntley
- G01 - MEASURING TESTING
Information Patent Application
Receiver Circuit Architectures
- Publication number 20120140812
- Publication date Jun 7, 2012
- RAMBUS INC.
- Andrew Ho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110288810
- Publication date Nov 24, 2011
- Advantest Corporation
- Shinichi ISHIKAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FLEXIBLE TIMEBASE FOR EYE DIAGRAM
- Publication number 20110274153
- Publication date Nov 10, 2011
- Tektronix, Inc.
- DANIEL G. BAKER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD OF DETERMINING CHARACTERISTICS OF DEVICE UNDER TEST, PROGRAM...
- Publication number 20110119010
- Publication date May 19, 2011
- Advantest Corporation
- Junichi Yuki
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Clock Data Recovery
- Publication number 20110096881
- Publication date Apr 28, 2011
- Rohde& Schwarz GmbH & Co. KG
- Rubén Villarino-Villa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INCREASED RELIABILITY IN THE PROCESSING OF DIGITAL SIGNALS
- Publication number 20100289551
- Publication date Nov 18, 2010
- ABB TECHNOLOGY AG
- Hans Björklund
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CLOCK-DATA RECOVERY
- Publication number 20100141308
- Publication date Jun 10, 2010
- ROHDE &SCHWARZ GMBH & CO. KG
- Rubén Villarino-Villa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
EYE MAPPING BUILT-IN SELF TEST (BIST) METHOD AND APPARATUS
- Publication number 20100097087
- Publication date Apr 22, 2010
- STMicroelectronics, Inc.
- John Hogeboom
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for eye margin calculating, and computer-reada...
- Publication number 20100080421
- Publication date Apr 1, 2010
- FUJITSU LIMITED
- Daita Tsubamoto
- G01 - MEASURING TESTING
Information Patent Application
Margin Test Methods And Circuits
- Publication number 20100074314
- Publication date Mar 25, 2010
- RAMBUS INC.
- Vladimir Stojanovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DFE Margin Test Methods and Circuits that Decouple Sample and Feedb...
- Publication number 20100020861
- Publication date Jan 28, 2010
- RAMBUS INC.
- Brian S. Leibowitz
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS AND METHOD FOR ANALYZING A SIGNAL UNDER TEST
- Publication number 20090245339
- Publication date Oct 1, 2009
- Tektronix, Inc.
- Toshiaki OBATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING CIRCUIT FUNCTIONALITY UNDER VARYI...
- Publication number 20090219032
- Publication date Sep 3, 2009
- QIMONDA AG
- Alessandro Minzoni
- G01 - MEASURING TESTING

Evaluation methods

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Circuit, chip and semiconductor device

Identifying data valid windows

Circuit, chip and semiconductor device

Margin test methods and circuits

Margin test methods and circuits

DFE margin test methods and circuits that decouple sample feedback...

Waveform observation system and method for waveform observation

Margin test methods and circuits

Semiconductor wafer evaluation standard setting method, semiconduct...

Margin test methods and circuits

On-chip eye diagram capture

Margin test methods and circuits

On-chip eye diagram capture

Margin test methods and circuits

Apparatus and method for analyzing a signal under test

Margin test methods and circuits

On-chip eye viewer architecture for highspeed transceivers

Increased reliability in the processing of digital signals

Test apparatus and test method

Method and device for clock data recovery

Margin test methods and circuits

Receiver circuit architectures

Flexible timebase for eye diagram

Apparatus and method for eye margin calculating, and computer-reada...

Method and device for clock-data recovery

Flexible timebase for EYE diagram

Noise separating apparatus, noise separating method, probability de...

Waveform analyzer

Measuring device and method for measuring relative phase shifts of...

Estimating boundaries of Schmoo plots

Patents Applicationslast 30 patents

CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE

METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM

CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE

Margin Test Methods and Circuits

Margin Test Methods and Circuits

CIRCUIT, CHIP AND SEMICONDUCTOR DEVICE

MEASUREMENT SYSTEM AND METHOD FOR AUTOMATED MEASUREMENT OF SEVERAL...

Margin Test Methods and Circuits

WAVEFORM OBSERVATION SYSTEM AND METHOD FOR WAVEFORM OBSERVATION

Margin Test Methods and Circuits

SYSTEMS AND METHODS FOR TESTING AN EMBEDDED CONTROLLER

SEMICONDUCTOR WAFER EVALUATION STANDARD SETTING METHOD, SEMICONDUCT...

NOISE FIGURE MEASUREMENT USING NARROWBAND COMPENSATION

Margin Test Methods and Circuits

ON-CHIP EYE DIAGRAM CAPTURE

Margin Test Methods and Circuits

Eye pattern generation of unequalized eye patterns using a serial r...

Receiver Circuit Architectures

TEST APPARATUS AND TEST METHOD

FLEXIBLE TIMEBASE FOR EYE DIAGRAM

METHOD OF DETERMINING CHARACTERISTICS OF DEVICE UNDER TEST, PROGRAM...

Method and Device for Clock Data Recovery

INCREASED RELIABILITY IN THE PROCESSING OF DIGITAL SIGNALS

METHOD AND DEVICE FOR CLOCK-DATA RECOVERY

EYE MAPPING BUILT-IN SELF TEST (BIST) METHOD AND APPARATUS

Apparatus and method for eye margin calculating, and computer-reada...

Margin Test Methods And Circuits

DFE Margin Test Methods and Circuits that Decouple Sample and Feedb...

APPARATUS AND METHOD FOR ANALYZING A SIGNAL UNDER TEST

SYSTEM AND METHOD FOR DETERMINING CIRCUIT FUNCTIONALITY UNDER VARYI...