for measuring gain factor thereof

Industry

CPC
G01R31/2625

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2625for measuring gain factor thereof

Industries

Patents Grantslast 30 patents

Information Patent Grant
Monitoring circuit monitoring performance of transistors
- Patent number 11,982,702
- Issue date May 14, 2024
- SK Hynix Inc.
- Sung Mook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method to monitor and quantify effective work function...
- Patent number 10,763,179
- Issue date Sep 1, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of predicting unity gain frequency with direct current and/...
- Patent number 10,090,209
- Issue date Oct 2, 2018
- GLOBALFOUNDRIES Inc.
- Amit A. Dikshit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor devices and methods for testing a gate insulation of...
- Patent number 10,079,187
- Issue date Sep 18, 2018
- Infineon Technologies AG
- Daniel Beckmeier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of inspecting a semiconductor device
- Patent number 10,006,958
- Issue date Jun 26, 2018
- ABLIC INC.
- Kaoru Sakaguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods of predicting unity gain frequency with direct current and/...
- Patent number 9,704,763
- Issue date Jul 11, 2017
- GLOBALFOUNDRIES Inc.
- Amit A. Dikshit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing method and test method of semiconductor device
- Patent number 9,136,188
- Issue date Sep 15, 2015
- Semiconductor Energy Laboratory Co., Ltd.
- Hiromichi Godo
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method and test method of semiconductor device
- Patent number 8,912,016
- Issue date Dec 16, 2014
- Semiconductor Energy Laboratory Co., Ltd.
- Hiromichi Godo
- G01 - MEASURING TESTING
Information Patent Grant
Calibration technique for measuring gate resistance of power MOS ga...
- Patent number 8,174,283
- Issue date May 8, 2012
- Alpha & Omega Semiconductor, Inc.
- Anup Bhalla
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method to synchronize two different pulse generators
- Patent number 7,705,622
- Issue date Apr 27, 2010
- Evan Grund
- G01 - MEASURING TESTING
Information Patent Grant
Calibration technique for measuring gate resistance of power MOS ga...
- Patent number 7,535,021
- Issue date May 19, 2009
- Alpha and Omega Semiconductor, Ltd.
- Anup Bhalla
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and circuit for extracting current-voltage characteristics o...
- Patent number 7,362,122
- Issue date Apr 22, 2008
- Macronix International Co., Ltd.
- Wei-Cheng Lin
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor element
- Patent number 5,905,384
- Issue date May 18, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Akira Inoue
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MONITORING CIRCUIT MONITORING PERFORMANCE OF TRANSISTORS
- Publication number 20220349933
- Publication date Nov 3, 2022
- SK HYNIX INC.
- Sung Mook KIM
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor Devices and Methods for Testing a Gate Insulation of...
- Publication number 20170316991
- Publication date Nov 2, 2017
- INFINEON TECHNOLOGIES AG
- Daniel Beckmeier
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF PREDICTING UNITY GAIN FREQUENCY WITH DIRECT CURRENT AND/...
- Publication number 20170271213
- Publication date Sep 21, 2017
- GLOBALFOUNDRIES INC.
- Amit A. Dikshit
- G01 - MEASURING TESTING
Information Patent Application
In-Line Transistor Bandwidth Measurement
- Publication number 20140184242
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Erik L. Hedberg
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD AND TEST METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20110318851
- Publication date Dec 29, 2011
- Semiconductor Energy Laboratory Co., Ltd.
- Hiromichi GODO
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO SYNCHRONIZE TWO DIFFERENT PULSE GENERATORS
- Publication number 20100117677
- Publication date May 13, 2010
- Evan Grund
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Calibration technique for measuring gate resistance of power MOS ga...
- Publication number 20090219044
- Publication date Sep 3, 2009
- Alpha & Omega Semiconductor, LTD.
- Anup Bhalla
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Calibration technique for measuring gate resistance of power MOS ga...
- Publication number 20070096093
- Publication date May 3, 2007
- Alpha & Omega Semiconductor, LTD.
- Anup Bhalla
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and circuit for extracting current-voltage characteristics o...
- Publication number 20070007931
- Publication date Jan 11, 2007
- Wei-Cheng Lin
- G01 - MEASURING TESTING

for measuring gain factor thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Monitoring circuit monitoring performance of transistors

Non-contact method to monitor and quantify effective work function...

Methods of predicting unity gain frequency with direct current and/...

Semiconductor devices and methods for testing a gate insulation of...

Semiconductor device and method of inspecting a semiconductor device

Methods of predicting unity gain frequency with direct current and/...

Manufacturing method and test method of semiconductor device

Manufacturing method and test method of semiconductor device

Calibration technique for measuring gate resistance of power MOS ga...

Method to synchronize two different pulse generators

Calibration technique for measuring gate resistance of power MOS ga...

Method and circuit for extracting current-voltage characteristics o...

Method for testing semiconductor element

Patents Applicationslast 30 patents

MONITORING CIRCUIT MONITORING PERFORMANCE OF TRANSISTORS

Semiconductor Devices and Methods for Testing a Gate Insulation of...

METHODS OF PREDICTING UNITY GAIN FREQUENCY WITH DIRECT CURRENT AND/...

In-Line Transistor Bandwidth Measurement

MANUFACTURING METHOD AND TEST METHOD OF SEMICONDUCTOR DEVICE

METHOD TO SYNCHRONIZE TWO DIFFERENT PULSE GENERATORS

Calibration technique for measuring gate resistance of power MOS ga...

Calibration technique for measuring gate resistance of power MOS ga...

Method and circuit for extracting current-voltage characteristics o...