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G01P2015/0817
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PHYSICS
G01
Measuring instruments
G01P
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
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G01P2015/0817
for pivoting movement of the mass
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Patents Grants
last 30 patents
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Patent Grant
Resonantly vibrating accelerometer driven in multiple vibrational m...
Patent number
11,965,907
Issue date
Apr 23, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Resonantly vibrating accelerometer with cross-coupling signal suppr...
Patent number
11,959,935
Issue date
Apr 16, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Self-compensating resonantly vibrating accelerometer driven in mult...
Patent number
11,953,514
Issue date
Apr 9, 2024
Emcore Corporation
Sergey Alexandrovich Zotov
G01 - MEASURING TESTING
Information
Patent Grant
Micro-electromechanical system device and method of forming the same
Patent number
11,878,905
Issue date
Jan 23, 2024
Vanguard International Semiconductor Corporation
Jia Jie Xia
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor and electronic device
Patent number
11,630,121
Issue date
Apr 18, 2023
Kabushiki Kaisha Toshiba
Kei Masunishi
G01 - MEASURING TESTING
Information
Patent Grant
Accelerometric sensor in mems technology having high accuracy and l...
Patent number
11,408,904
Issue date
Aug 9, 2022
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer excitation ring
Patent number
11,169,175
Issue date
Nov 9, 2021
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Piezoresistive detection resonant device in particular with large v...
Patent number
11,125,632
Issue date
Sep 21, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Patrice Rey
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Accelerometer with strain compensation
Patent number
10,823,754
Issue date
Nov 3, 2020
Honeywell International Inc.
Paul W. Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Damped linear accerelometer
Patent number
10,371,711
Issue date
Aug 6, 2019
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Bruno Fain
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical structure for an acceleration sensor
Patent number
10,215,772
Issue date
Feb 26, 2019
Robert Bosch GmbH
Johannes Classen
G01 - MEASURING TESTING
Information
Patent Grant
MEMS sensor and a semiconductor package
Patent number
10,137,851
Issue date
Nov 27, 2018
Murata Manufacturing Co., Ltd.
Ville-Pekka Rytkönen
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Micro-electromechanical device comprising a mobile mass that can mo...
Patent number
10,094,851
Issue date
Oct 9, 2018
Tronic's Microsystems
Francois-Xavier Boillot
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrated piezoelectric sensor for detecting in-plane forces, such...
Patent number
10,031,155
Issue date
Jul 24, 2018
STMicroelectronics S.r.l.
Francesco Procopio
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MEMS sensor
Patent number
10,024,881
Issue date
Jul 17, 2018
Murata Manufacturing Co., Ltd.
Ville-Pekka Rytkönen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
In-plane piezoresistive detection sensor
Patent number
9,702,893
Issue date
Jul 11, 2017
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Philippe Robert
G01 - MEASURING TESTING
Information
Patent Grant
In-plane vibrating beam accelerometer
Patent number
9,689,888
Issue date
Jun 27, 2017
Honeywell International Inc.
Stephen F. Becka
G01 - MEASURING TESTING
Information
Patent Grant
In-plane piezoresistive detection sensor
Patent number
9,146,252
Issue date
Sep 29, 2015
Comissariat a l'Energie Atomique et aux Energies Alternatives
Philippe Robert
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical sensor with multiple spring bars
Patent number
9,103,850
Issue date
Aug 11, 2015
Maxim Integrated Products, Inc.
Hanno Hammer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromechanical structure comprising a mobile part having stops for...
Patent number
9,061,895
Issue date
Jun 23, 2015
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Philippe Robert
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Acceleration measuring apparatus
Patent number
8,919,201
Issue date
Dec 30, 2014
Nihon Dempa Kogyo Co., Ltd.
Mitsuaki Koyama
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical component and method for operating a micromechanica...
Patent number
8,596,122
Issue date
Dec 3, 2013
Robert Bosch GmbH
Johannes Classen
G01 - MEASURING TESTING
Information
Patent Grant
Flexure assemblies and methods for manufacturing and using the same
Patent number
8,528,405
Issue date
Sep 10, 2013
The Charles Stark Draper Laboratory, Inc.
Lyle J. Jenkins
G01 - MEASURING TESTING
Information
Patent Grant
Acceleration sensor
Patent number
8,497,672
Issue date
Jul 30, 2013
Kabushiki Kaisha Toshiba
Takashi Kawakubo
G01 - MEASURING TESTING
Information
Patent Grant
Acceleration sensor
Patent number
8,327,708
Issue date
Dec 11, 2012
Panasonic Corporation
Isao Hattori
G01 - MEASURING TESTING
Information
Patent Grant
Method of epitaxially growing piezoresistors
Patent number
8,187,903
Issue date
May 29, 2012
Robert Bosch GmbH
Gary Yama
G01 - MEASURING TESTING
Information
Patent Grant
Inertia force sensor and composite sensor for detecting inertia force
Patent number
8,117,914
Issue date
Feb 21, 2012
Panasonic Corporation
Satoshi Ohuchi
G01 - MEASURING TESTING
Information
Patent Grant
Device sensitive to a movement comprising at least one transistor
Patent number
8,030,690
Issue date
Oct 4, 2011
Commissariat a l'Energie Atomique
Eric Ollier
G01 - MEASURING TESTING
Information
Patent Grant
Single-mask fabrication process for linear and angular piezoresisti...
Patent number
7,939,355
Issue date
May 10, 2011
The Regents of the University of California
Erik J. Eklund
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor mechanical sensor
Patent number
7,866,210
Issue date
Jan 11, 2011
Denso Corporation
Tetsuo Fujii
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF FABRICATING MICRO-ELECTROMECHANICAL SYSTEM DEVICE
Publication number
20240116749
Publication date
Apr 11, 2024
Vanguard International Semiconductor Corporation
Jia Jie Xia
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INERTIAL SENSOR AND INERTIAL MEASUREMENT UNIT
Publication number
20220404389
Publication date
Dec 22, 2022
SEIKO EPSON CORPORATION
Shota Kigure
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND ELECTRONIC DEVICE
Publication number
20220137085
Publication date
May 5, 2022
Kabushiki Kaisha Toshiba
Kei Masunishi
G01 - MEASURING TESTING
Information
Patent Application
MICRO-ELECTROMECHANICAL SYSTEM DEVICE AND METHOD OF FORMING THE SAME
Publication number
20220024754
Publication date
Jan 27, 2022
Vanguard International Semiconductor Corporation
Jia Jie Xia
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICRO-ELECTROMECHANICAL SYSTEM DEVICE AND METHOD OF FORMING THE SAME
Publication number
20220024753
Publication date
Jan 27, 2022
Vanguard International Semiconductor Corporation
Jia Jie Xia
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MULTILAYER EXCITATION RING
Publication number
20210247418
Publication date
Aug 12, 2021
HONEYWELL INTERNATIONAL INC.
Paul W. Dwyer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
EFFECTIVE ACCELEROMETER HAVING A REDUCED SIZE
Publication number
20210132106
Publication date
May 6, 2021
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Martial DEFOORT
G01 - MEASURING TESTING
Information
Patent Application
ACCELEROMETRIC SENSOR IN MEMS TECHNOLOGY HAVING HIGH ACCURACY AND L...
Publication number
20200132711
Publication date
Apr 30, 2020
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL STRUCTURE FOR AN ACCELERATION SENSOR
Publication number
20170052207
Publication date
Feb 23, 2017
ROBERT BOSCH GmbH
Johannes CLASSEN
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATION SENSOR AND METHOD FOR OPERATING AN ACCELERATION SENSOR
Publication number
20140083190
Publication date
Mar 27, 2014
Rolf Kaack
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATION MEASURING APPARATUS
Publication number
20120312097
Publication date
Dec 13, 2012
NIHON DEMPA KOGYO CO., LTD.
MITSUAKI KOYAMA
G01 - MEASURING TESTING
Information
Patent Application
IN-PLANE PIEZORESISTIVE DETECTION SENSOR
Publication number
20120210792
Publication date
Aug 23, 2012
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Philippe Robert
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATION SENSOR
Publication number
20120125102
Publication date
May 24, 2012
PANASONIC CORPORATION
Isao Hattori
G01 - MEASURING TESTING
Information
Patent Application
Micromechanical Sensor
Publication number
20120042728
Publication date
Feb 23, 2012
Hanno Hammer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Low Cost Optical Accelerometer
Publication number
20120024062
Publication date
Feb 2, 2012
Simeon E. Tiefel
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATION SENSOR
Publication number
20110234206
Publication date
Sep 29, 2011
Kabushiki Kaisha Toshiba
Takashi KAWAKUBO
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL COMPONENT AND METHOD FOR OPERATING A MICROMECHANICA...
Publication number
20110154899
Publication date
Jun 30, 2011
Johannes Classen
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL STRUCTURE COMPRISING A MOBILE PART HAVING STOPS FOR...
Publication number
20110147860
Publication date
Jun 23, 2011
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE. ALT.
Philippe ROBERT
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FLEXURE ASSEMBLIES AND METHODS FOR MANUFACTURING AND USING THE SAME
Publication number
20110132088
Publication date
Jun 9, 2011
The Charles Stark Draper Laboratory, Inc.
Lyle J. Jenkins
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EPITAXIALLY GROWING PIEZORESISTORS
Publication number
20100176465
Publication date
Jul 15, 2010
STANFORD UNIVERSITY
Gary Yama
G01 - MEASURING TESTING
Information
Patent Application
INERTIA FORCE SENSOR
Publication number
20100126270
Publication date
May 27, 2010
PANASONIC CORPORATION
Jirou Terada
G01 - MEASURING TESTING
Information
Patent Application
INERTIA FORCE SENSOR AND COMPOSITE SENSOR FOR DETECTING INERTIA FORCE
Publication number
20100071468
Publication date
Mar 25, 2010
PANASONIC CORPORATION
Satoshi Ohuchi
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL SENSOR AND INERTIAL DETECTING DEVICE
Publication number
20090322183
Publication date
Dec 31, 2009
Kabushiki Kaisha Toshiba
Takashi Kawakubo
G01 - MEASURING TESTING
Information
Patent Application
DEVICE SENSITIVE TO A MOVEMENT COMPRISING AT LEAST ONE TRANSISTOR
Publication number
20090321793
Publication date
Dec 31, 2009
COMMISSARIAT A L'ENERGIE ATOMIQUE
Eric Ollier
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MECHANICAL SENSEOR
Publication number
20090179288
Publication date
Jul 16, 2009
DENSO CORPORATION
Tetsuo Fujii
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Semiconductor mechanical sensor
Publication number
20090014820
Publication date
Jan 15, 2009
Tetsuo Fujii
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Accelerometer With Reducted Extraneous Vibrations Owing To Improved...
Publication number
20080196500
Publication date
Aug 21, 2008
Jean-Paul Menard
G01 - MEASURING TESTING
Information
Patent Application
Silicon inertial sensors formed using MEMS
Publication number
20070193353
Publication date
Aug 23, 2007
Eun Sok Kim
G01 - MEASURING TESTING
Information
Patent Application
Single-mask fabrication process for linear and angular piezoresisti...
Publication number
20070084041
Publication date
Apr 19, 2007
E. Jesper Eklund
G01 - MEASURING TESTING
Information
Patent Application
Silicon inertial sensors formed using MEMS
Publication number
20060225506
Publication date
Oct 12, 2006
Asad Madni
G01 - MEASURING TESTING