for testing field-effect devices

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G01R31/2639

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2639for testing field-effect devices

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Patents Grantslast 30 patents

Information Patent Grant
Power leakage testing
- Patent number 12,072,394
- Issue date Aug 27, 2024
- Nordic Semiconductor ASA
- Esa Korhonen
- G01 - MEASURING TESTING
Information Patent Grant
Two-step charge-based capacitor measurement
- Patent number 12,066,475
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Techniques for isolating interfaces while testing semiconductor dev...
- Patent number 11,867,744
- Issue date Jan 9, 2024
- NVIDIA Corporation
- Animesh Khare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic test equipment apparatus and methods of operating thereof
- Patent number 11,740,278
- Issue date Aug 29, 2023
- Infineon Technologies AG
- Kevin Roche
- G01 - MEASURING TESTING
Information Patent Grant
Power reduction in very large-scale integration (VLSI) systems
- Patent number 11,675,944
- Issue date Jun 13, 2023
- International Business Machines Corporation
- Lior Arie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fabricating metal-oxide-metal capacitor
- Patent number 11,527,605
- Issue date Dec 13, 2022
- United Microelectronics Corp.
- Shu-Ji Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-frequency method and apparatus for measuring an amplifier
- Patent number 11,480,604
- Issue date Oct 25, 2022
- NEC Corporation
- Yoji Murao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing an integrated capacitor
- Patent number 11,467,204
- Issue date Oct 11, 2022
- Semtech Corporation
- Jonah Edward Nuttgens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Functional prober chip
- Patent number 11,280,825
- Issue date Mar 22, 2022
- Xallent LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Functional prober chip
- Patent number 10,866,273
- Issue date Dec 15, 2020
- Xallent, LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Operational amplifier circuit and current detection device using th...
- Patent number 10,771,027
- Issue date Sep 8, 2020
- Fuji Electric Co., Ltd.
- Motomitsu Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and device of remaining life prediction for electromigration...
- Patent number 10,732,216
- Issue date Aug 4, 2020
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for MOM capacitance value control
- Patent number 10,269,893
- Issue date Apr 23, 2019
- Shanghai Huali Microelectronics Corporation
- Yeqing Cui
- G01 - MEASURING TESTING
Information Patent Grant
Assessment of HCI in logic circuits based on AC stress in discrete...
- Patent number 10,126,354
- Issue date Nov 13, 2018
- GLOBALFOUNDRIES Inc.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution power electronics measurements
- Patent number 10,094,863
- Issue date Oct 9, 2018
- Texas Instruments Incorporated
- Sandeep R. Bahl
- G01 - MEASURING TESTING
Information Patent Grant
On-die verification of resistor fabricated in CMOS process
- Patent number 9,977,073
- Issue date May 22, 2018
- INTEGRATED DEVICE TECHNOLOY, INC.
- Pak-Kim Lau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating defect region of semiconductor substrate
- Patent number 9,958,493
- Issue date May 1, 2018
- Shin-Etsu Handotai Co., Ltd.
- Takashi Aratani
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and device of remaining life prediction for electromigration...
- Patent number 9,952,275
- Issue date Apr 24, 2018
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for testing a device-under-test by using a voltage-set...
- Patent number 9,939,463
- Issue date Apr 10, 2018
- United Microelectronics Corp.
- Po-Wei Tsou
- G01 - MEASURING TESTING
Information Patent Grant
High di/dt capacity measurement hardware
- Patent number 9,846,182
- Issue date Dec 19, 2017
- Infineon Technologies AG
- Pon Tiam Meng
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing display panel
- Patent number 9,702,919
- Issue date Jul 11, 2017
- Joled Inc
- Mario Amatsuchi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and device for testing an image sensor and motor vehicle
- Patent number 9,681,124
- Issue date Jun 13, 2017
- Robert Bosch GmbH
- Frank Moesle
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Current measurement and control of a semiconductor element based on...
- Patent number 9,429,598
- Issue date Aug 30, 2016
- Infineon Technologies AG
- Rainald Sander
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring interface state density
- Patent number 9,110,126
- Issue date Aug 18, 2015
- Shanghai Huali Microelectronics Corporation
- Yongfeng Cao
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact determination of interface trap density for semiconducto...
- Patent number 9,041,417
- Issue date May 26, 2015
- University of South Florida
- Elena I. Oborina
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test structure and method for characterization of deep t...
- Patent number 7,960,998
- Issue date Jun 14, 2011
- National Semiconductor Corporation
- Lisa V. Rozario
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining effective channel dimensions of m...
- Patent number 7,514,940
- Issue date Apr 7, 2009
- National Semiconductor Corporation
- Jiankang Bu
- G01 - MEASURING TESTING
Information Patent Grant
TDDB test pattern and method for testing TDDB of MOS capacitor diel...
- Patent number 7,479,797
- Issue date Jan 20, 2009
- LG Semicon Co., Ltd.
- Ha Zoong Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring gate capacitance by correcting dissipation fact...
- Patent number 7,298,160
- Issue date Nov 20, 2007
- Samsung Electronics Co., Ltd.
- Gi-Young Yang
- G01 - MEASURING TESTING
Information Patent Grant
TDDB test pattern and method for testing TDDB of MOS capacitor diel...
- Patent number 7,170,309
- Issue date Jan 30, 2007
- LG Semicon Co., Ltd.
- Ha Zoong Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...
- Publication number 20240369612
- Publication date Nov 7, 2024
- Shanghai IC R&D Center Co., Ltd.
- Linlin LIU
- G01 - MEASURING TESTING
Information Patent Application
Two-Step Charge-Based Capacitor Measurement
- Publication number 20240361370
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POWER REDUCTION IN VERY LARGE-SCALE INTEGRATION (VLSI) SYSTEMS
- Publication number 20220366110
- Publication date Nov 17, 2022
- International Business Machines Corporation
- Lior Arie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER LEAKAGE TESTING
- Publication number 20220268857
- Publication date Aug 25, 2022
- NORDIC SEMICONDUCTOR ASA
- Esa KORHONEN
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR ISOLATING INTERFACES WHILE TESTING SEMICONDUCTOR DEV...
- Publication number 20220120804
- Publication date Apr 21, 2022
- NVIDIA Corporation
- Animesh KHARE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING AN INTEGRATED CAPACITOR
- Publication number 20220113346
- Publication date Apr 14, 2022
- SEMTECH CORPORATION
- Jonah Edward NUTTGENS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-Step Charge-Based Capacitor Measurement
- Publication number 20210373059
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tai-Yi Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FUNCTIONAL PROBER CHIP
- Publication number 20210063470
- Publication date Mar 4, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
Electronic Test Equipment Apparatus and Methods of Operating Thereof
- Publication number 20210033659
- Publication date Feb 4, 2021
- Kevin Roche
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY MEASUREMENT METHOD AND HIGH-FREQUENCY MEASUREMENT AP...
- Publication number 20190369158
- Publication date Dec 5, 2019
- NEC Corporation
- Yoji MURAO
- G01 - MEASURING TESTING
Information Patent Application
OPERATIONAL AMPLIFIER CIRCUIT AND CURRENT DETECTION DEVICE USING TH...
- Publication number 20190296704
- Publication date Sep 26, 2019
- Fuji Electric Co., Ltd.
- Motomitsu IWAMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HIGH-RESOLUTION POWER ELECTRONICS MEASUREMENTS
- Publication number 20190094276
- Publication date Mar 28, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Sandeep R. Bahl
- G01 - MEASURING TESTING
Information Patent Application
TESTING MOS POWER SWITCHES
- Publication number 20190056448
- Publication date Feb 21, 2019
- INFINEON TECHNOLOGIES AG
- Michael Asam
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD AND SYSTEM FOR MOM CAPACITANCE VALUE CONTROL
- Publication number 20180294330
- Publication date Oct 11, 2018
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Yeqing Cui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Device of Remaining Life Prediction for Electromigration...
- Publication number 20180188316
- Publication date Jul 5, 2018
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE VERIFICATION OF RESISTOR FABRICATED IN CMOS PROCESS
- Publication number 20170356952
- Publication date Dec 14, 2017
- Integrated Device Technology, Inc.
- Pak-Kim Lau
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT FOR TESTING A DEVICE-UNDER-TEST BY USING A VOLTAGE-SET...
- Publication number 20170292976
- Publication date Oct 12, 2017
- UNITED MICROELECTRONICS CORP.
- Po-Wei Tsou
- G01 - MEASURING TESTING
Information Patent Application
Functional Prober Chip
- Publication number 20170261544
- Publication date Sep 14, 2017
- Xallent, LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING DEFECT REGION OF SEMICONDUCTOR SUBSTRATE
- Publication number 20170160335
- Publication date Jun 8, 2017
- Shin-Etsu Handotai Co., Ltd.
- Takashi ARATANI
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR DEVICE TESTING APPARATUS, SEMICONDUCTOR DEVICE TESTIN...
- Publication number 20160306005
- Publication date Oct 20, 2016
- KABUSHIKI KAISHA TOSHIBA
- Teruyuki OHASHI
- G01 - MEASURING TESTING
Information Patent Application
High di/dt Capacity Measurement Hardware
- Publication number 20150346242
- Publication date Dec 3, 2015
- INFINEON TECHNOLOGIES AG
- Pon Tiam Meng
- G01 - MEASURING TESTING
Information Patent Application
NONCONTACT DETERMINATION OF INTERFACE TRAP DENSITY FOR SEMICONDUCTO...
- Publication number 20140132286
- Publication date May 15, 2014
- University of South Florida
- ELENA I. OBORINA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING INTERFACE STATE DENSITY
- Publication number 20130099799
- Publication date Apr 25, 2013
- YONGFENG CAO
- G01 - MEASURING TESTING
Information Patent Application
NONCONTACT DETERMINATION OF INTERFACE TRAP DENSITY FOR SEMICONDUCTO...
- Publication number 20120176146
- Publication date Jul 12, 2012
- University of South Florida
- ELENA I. OBORINA
- G01 - MEASURING TESTING
Information Patent Application
VALUATION METHOD OF DIELECTRIC BREAKDOWN LIFETIME OF GATE INSULATIN...
- Publication number 20110031981
- Publication date Feb 10, 2011
- SONY CORPORATION
- Shimpei Tsujikawa
- G01 - MEASURING TESTING
Information Patent Application
Method for Calculating Capacitance of High Voltage Depletion Capacitor
- Publication number 20100161262
- Publication date Jun 24, 2010
- Sang-Hun Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRICAL TEST STRUCTURE AND METHOD FOR CHARACTERIZATION OF DEEP T...
- Publication number 20090206865
- Publication date Aug 20, 2009
- Lisa V. Rozario
- G01 - MEASURING TESTING
Information Patent Application
TDDB test pattern and method for testing TDDB of MOS capacitor diel...
- Publication number 20070103184
- Publication date May 10, 2007
- Ha Zoong Kim
- G01 - MEASURING TESTING
Information Patent Application
PLL LOOP FILTER CAPACITOR TEST CIRCUIT AND METHOD FOR ON CHIP TESTI...
- Publication number 20060164067
- Publication date Jul 27, 2006
- International Business Machines Corporation
- James P. Eckhardt
- G01 - MEASURING TESTING
Information Patent Application
Method for modeling inductive effects on circuit performance
- Publication number 20060109021
- Publication date May 25, 2006
- Nagaraj Narasimh Savithri
- G01 - MEASURING TESTING

for testing field-effect devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Power leakage testing

Two-step charge-based capacitor measurement

Techniques for isolating interfaces while testing semiconductor dev...

Electronic test equipment apparatus and methods of operating thereof

Power reduction in very large-scale integration (VLSI) systems

Method for fabricating metal-oxide-metal capacitor

High-frequency method and apparatus for measuring an amplifier

Testing an integrated capacitor

Functional prober chip

Functional prober chip

Operational amplifier circuit and current detection device using th...

Method and device of remaining life prediction for electromigration...

Method and system for MOM capacitance value control

Assessment of HCI in logic circuits based on AC stress in discrete...

High-resolution power electronics measurements

On-die verification of resistor fabricated in CMOS process

Method for evaluating defect region of semiconductor substrate

Method and device of remaining life prediction for electromigration...

Test circuit for testing a device-under-test by using a voltage-set...

High di/dt capacity measurement hardware

Method for manufacturing display panel

Method and device for testing an image sensor and motor vehicle

Current measurement and control of a semiconductor element based on...

Method for measuring interface state density

Noncontact determination of interface trap density for semiconducto...

Electrical test structure and method for characterization of deep t...

System and method for determining effective channel dimensions of m...

TDDB test pattern and method for testing TDDB of MOS capacitor diel...

Method of measuring gate capacitance by correcting dissipation fact...

TDDB test pattern and method for testing TDDB of MOS capacitor diel...

Patents Applicationslast 30 patents

MEASUREMENT SYSTEM FOR RADIO FREQUENCY MOS DEVICE MODELING AND MODE...

Two-Step Charge-Based Capacitor Measurement

POWER REDUCTION IN VERY LARGE-SCALE INTEGRATION (VLSI) SYSTEMS

POWER LEAKAGE TESTING

TECHNIQUES FOR ISOLATING INTERFACES WHILE TESTING SEMICONDUCTOR DEV...

TESTING AN INTEGRATED CAPACITOR

Two-Step Charge-Based Capacitor Measurement

FUNCTIONAL PROBER CHIP

Electronic Test Equipment Apparatus and Methods of Operating Thereof

HIGH-FREQUENCY MEASUREMENT METHOD AND HIGH-FREQUENCY MEASUREMENT AP...

OPERATIONAL AMPLIFIER CIRCUIT AND CURRENT DETECTION DEVICE USING TH...

HIGH-RESOLUTION POWER ELECTRONICS MEASUREMENTS

TESTING MOS POWER SWITCHES

METHOD AND SYSTEM FOR MOM CAPACITANCE VALUE CONTROL

Method and Device of Remaining Life Prediction for Electromigration...

ON-DIE VERIFICATION OF RESISTOR FABRICATED IN CMOS PROCESS

TEST CIRCUIT FOR TESTING A DEVICE-UNDER-TEST BY USING A VOLTAGE-SET...

Functional Prober Chip

METHOD FOR EVALUATING DEFECT REGION OF SEMICONDUCTOR SUBSTRATE

SEMICONDUCTOR DEVICE TESTING APPARATUS, SEMICONDUCTOR DEVICE TESTIN...

High di/dt Capacity Measurement Hardware

NONCONTACT DETERMINATION OF INTERFACE TRAP DENSITY FOR SEMICONDUCTO...

METHOD FOR MEASURING INTERFACE STATE DENSITY

NONCONTACT DETERMINATION OF INTERFACE TRAP DENSITY FOR SEMICONDUCTO...

VALUATION METHOD OF DIELECTRIC BREAKDOWN LIFETIME OF GATE INSULATIN...

Method for Calculating Capacitance of High Voltage Depletion Capacitor

ELECTRICAL TEST STRUCTURE AND METHOD FOR CHARACTERIZATION OF DEEP T...

TDDB test pattern and method for testing TDDB of MOS capacitor diel...

PLL LOOP FILTER CAPACITOR TEST CIRCUIT AND METHOD FOR ON CHIP TESTI...

Method for modeling inductive effects on circuit performance