Handling, conveying or loading

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CPC
G01R31/2893

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2893Handling, conveying or loading

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting memory chip
- Patent number 12,181,517
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Yan-De Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device testing apparatus and electronic device testing m...
- Patent number 12,180,018
- Issue date Dec 31, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lead guides having a recessed face
- Patent number 12,181,516
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Chi-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probing device and inspection method using the same
- Patent number 12,174,249
- Issue date Dec 24, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 12,169,217
- Issue date Dec 17, 2024
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit spike check probing apparatus and method
- Patent number 12,169,220
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- William Joshua Bush
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test system and automatic test method for integrated-circ...
- Patent number 12,158,494
- Issue date Dec 3, 2024
- Kingston Digital, Inc.
- Chao-Kun Lee
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Alignment platform and electronic component transmission apparatus
- Patent number 12,131,935
- Issue date Oct 29, 2024
- HON. PRECISION, INC.
- Yuan-Long Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection system
- Patent number 12,117,485
- Issue date Oct 15, 2024
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Chip carrier, chip testing module, and chip handling module
- Patent number 12,112,964
- Issue date Oct 8, 2024
- CHROMA ATE INC.
- Sheng-Hung Wang
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Electronic device pick-and-place system and electronic device testi...
- Patent number 12,103,789
- Issue date Oct 1, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device, change kit, and method of exchanging change kit
- Patent number 12,106,997
- Issue date Oct 1, 2024
- Tokyo Electron Limited
- Hiroki Hosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assembly for carrying chip, and device and method for testing chip
- Patent number 12,092,654
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Chip detection device, chip detection system, and control method
- Patent number 12,032,017
- Issue date Jul 9, 2024
- Shandong Caiju Electronic Technology Co., Ltd.
- Meng Meng
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Apparatus for aligning device having fine pitch and method therefor
- Patent number 12,019,116
- Issue date Jun 25, 2024
- AMT CO., LTD.
- Du Chul Kim
- G01 - MEASURING TESTING
Information Patent Grant
Maintenance apparatus, maintenance method, and recording medium hav...
- Patent number 12,014,335
- Issue date Jun 18, 2024
- Advantest Corporation
- Hajime Sugimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for aligning device having fine pitch, apparatus for test...
- Patent number 11,982,708
- Issue date May 14, 2024
- AMT CO., LTD.
- Du Chul Kim
- G01 - MEASURING TESTING
Information Patent Grant
Chip tray positioning device
- Patent number 11,970,342
- Issue date Apr 30, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handling integrated circuits in automated testing
- Patent number 11,961,220
- Issue date Apr 16, 2024
- Texas Instruments Incorporated
- Neeraj Bhardwaj
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular automated test system
- Patent number 11,953,519
- Issue date Apr 9, 2024
- Teradyne, Inc.
- Christopher James Bruno
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 11,940,482
- Issue date Mar 26, 2024
- Nidec-Read Corporation
- Takashi Isa
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control and method for devices under test and image sen...
- Patent number 11,932,498
- Issue date Mar 19, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Test kit for testing a device under test
- Patent number 11,879,934
- Issue date Jan 23, 2024
- Mediatek Inc.
- Jing-Hui Zhuang
- G01 - MEASURING TESTING
Information Patent Grant
Device for carrying chip, and device and method for testing chip
- Patent number 11,874,324
- Issue date Jan 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitor wafer measuring method and measuring apparatus
- Patent number 11,862,495
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- He Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 11,860,225
- Issue date Jan 2, 2024
- Renesas Electronics Corporation
- Fukumi Unokuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 11,821,940
- Issue date Nov 21, 2023
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component handler, electronic component tester, and meth...
- Patent number 11,815,549
- Issue date Nov 14, 2023
- NS Technologies, Inc.
- Fuyumi Takata
- G01 - MEASURING TESTING
Information Patent Grant
Testing a single chip in a wafer probing system
- Patent number 11,808,808
- Issue date Nov 7, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatuses for intrusion detection and analy...
- Patent number 11,809,552
- Issue date Nov 7, 2023
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION APPARATUS
- Publication number 20250004043
- Publication date Jan 2, 2025
- Hitachi High-Tech Corporation
- Yoshihiro SATOU
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR SEMICONDUCTOR PACKAGE
- Publication number 20240426905
- Publication date Dec 26, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER
- Publication number 20240369623
- Publication date Nov 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Akira YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MEASURING METHOD U...
- Publication number 20240353484
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- G01 - MEASURING TESTING
Information Patent Application
HOUSING AND PROBER
- Publication number 20240319264
- Publication date Sep 26, 2024
- TOKYO SEIMITSU CO., LTD.
- Hideaki NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
CHIP MOVING DEVICE
- Publication number 20240310435
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TEST...
- Publication number 20240288493
- Publication date Aug 29, 2024
- AMT CO., LTD.
- Du Chul KIM
- G01 - MEASURING TESTING
Information Patent Application
MAGNETICALLY RETAINED REPLACEABLE CONTACT PLATE FOR SEMICONDUCTOR H...
- Publication number 20240210468
- Publication date Jun 27, 2024
- Advantest Corporation
- Patrick Sherman
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INCLUDING TEST CIRCUIT AND SUBSTRATE TEST APPARATUS INCLU...
- Publication number 20240194542
- Publication date Jun 13, 2024
- Samsung Electronics Co., Ltd.
- Junghyun PARK
- G01 - MEASURING TESTING
Information Patent Application
Module for exchanging an interface unit, test system with such a mo...
- Publication number 20240168087
- Publication date May 23, 2024
- Turbodynamics GmbH
- Stefan Thurmaier
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20240036103
- Publication date Feb 1, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027520
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027522
- Publication date Jan 25, 2024
- Advantest Corporation
- Takayuki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027521
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027523
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20240019487
- Publication date Jan 18, 2024
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20240019488
- Publication date Jan 18, 2024
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST SYSTEM AND AUTOMATIC TEST METHOD FOR INTEGRATED-CIRC...
- Publication number 20240003963
- Publication date Jan 4, 2024
- KINGSTON DIGITAL, INC.
- Chao-Kun LEE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHA...
- Publication number 20230417796
- Publication date Dec 28, 2023
- Western Digital Technologies, Inc.
- Yalaj Goyal
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR A SEMICONDUCTOR PACKAGE
- Publication number 20230384368
- Publication date Nov 30, 2023
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Application
PROBING DEVICE AND INSPECTION METHOD USING THE SAME
- Publication number 20230358803
- Publication date Nov 9, 2023
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing a package-on-package semiconductor...
- Publication number 20230349968
- Publication date Nov 2, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT T...
- Publication number 20230341462
- Publication date Oct 26, 2023
- Advantest Corporation
- Akihisa Suda
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...
- Publication number 20230280394
- Publication date Sep 7, 2023
- Advantest Corporation
- Matthias WERNER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20230266386
- Publication date Aug 24, 2023
- RENESAS ELECTRONICS CORPORATION
- Fukumi UNOKUCHI
- G01 - MEASURING TESTING
Information Patent Application
CHIP CARRIER
- Publication number 20230253226
- Publication date Aug 10, 2023
- Po-Hsiang CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRESSURIZING DEVICE FOR SEMICONDUCTOR TESTING AND SEMICONDUCTOR TES...
- Publication number 20230221366
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- Changgeun YANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20230204651
- Publication date Jun 29, 2023
- AEHR TEST SYSTEMS
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20230176116
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
TRAY CARRIER AND CORRESPONDING METHOD
- Publication number 20230170236
- Publication date Jun 1, 2023
- STMicroelectronics (Malta) Ltd.
- Silvio SPITERI
- H01 - BASIC ELECTRIC ELEMENTS

Handling, conveying or loading

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for detecting memory chip

Electronic device testing apparatus and electronic device testing m...

Lead guides having a recessed face

Probing device and inspection method using the same

Electronics tester

Integrated circuit spike check probing apparatus and method

Automatic test system and automatic test method for integrated-circ...

Alignment platform and electronic component transmission apparatus

Wafer inspection system

Chip carrier, chip testing module, and chip handling module

Electronic device pick-and-place system and electronic device testi...

Test device, change kit, and method of exchanging change kit

Assembly for carrying chip, and device and method for testing chip

Chip detection device, chip detection system, and control method

Apparatus for aligning device having fine pitch and method therefor

Maintenance apparatus, maintenance method, and recording medium hav...

Apparatus for aligning device having fine pitch, apparatus for test...

Chip tray positioning device

Handling integrated circuits in automated testing

Modular automated test system

Inspection device

Temperature control and method for devices under test and image sen...

Test kit for testing a device under test

Device for carrying chip, and device and method for testing chip

Monitor wafer measuring method and measuring apparatus

Method of manufacturing semiconductor device

Electronics tester

Electronic component handler, electronic component tester, and meth...

Testing a single chip in a wafer probing system

Systems, methods, and apparatuses for intrusion detection and analy...

Patents Applicationslast 30 patents

WAFER INSPECTION APPARATUS

TEST APPARATUS FOR SEMICONDUCTOR PACKAGE

WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER

MEASURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MEASURING METHOD U...

HOUSING AND PROBER

CHIP MOVING DEVICE

APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TEST...

MAGNETICALLY RETAINED REPLACEABLE CONTACT PLATE FOR SEMICONDUCTOR H...

SUBSTRATE INCLUDING TEST CIRCUIT AND SUBSTRATE TEST APPARATUS INCLU...

Module for exchanging an interface unit, test system with such a mo...

ELECTRONICS TESTER

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

WAFER INSPECTION SYSTEM

TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM

AUTOMATIC TEST SYSTEM AND AUTOMATIC TEST METHOD FOR INTEGRATED-CIRC...

INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHA...

TEST APPARATUS FOR A SEMICONDUCTOR PACKAGE

PROBING DEVICE AND INSPECTION METHOD USING THE SAME

Method and apparatus for testing a package-on-package semiconductor...

ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT T...

METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

CHIP CARRIER

PRESSURIZING DEVICE FOR SEMICONDUCTOR TESTING AND SEMICONDUCTOR TES...

ELECTRONICS TESTER

TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM

TRAY CARRIER AND CORRESPONDING METHOD