Handling, conveying or loading

Industry

CPC
G01R31/2893

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2893Handling, conveying or loading

Industries

Patents Grantslast 30 patents

Information Patent Grant
Chip tray positioning device
- Patent number 11,970,342
- Issue date Apr 30, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handling integrated circuits in automated testing
- Patent number 11,961,220
- Issue date Apr 16, 2024
- Texas Instruments Incorporated
- Neeraj Bhardwaj
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modular automated test system
- Patent number 11,953,519
- Issue date Apr 9, 2024
- Teradyne, Inc.
- Christopher James Bruno
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 11,940,482
- Issue date Mar 26, 2024
- Nidec-Read Corporation
- Takashi Isa
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control and method for devices under test and image sen...
- Patent number 11,932,498
- Issue date Mar 19, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Test kit for testing a device under test
- Patent number 11,879,934
- Issue date Jan 23, 2024
- Mediatek Inc.
- Jing-Hui Zhuang
- G01 - MEASURING TESTING
Information Patent Grant
Device for carrying chip, and device and method for testing chip
- Patent number 11,874,324
- Issue date Jan 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitor wafer measuring method and measuring apparatus
- Patent number 11,862,495
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- He Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 11,860,225
- Issue date Jan 2, 2024
- Renesas Electronics Corporation
- Fukumi Unokuchi
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 11,821,940
- Issue date Nov 21, 2023
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component handler, electronic component tester, and meth...
- Patent number 11,815,549
- Issue date Nov 14, 2023
- NS Technologies, Inc.
- Fuyumi Takata
- G01 - MEASURING TESTING
Information Patent Grant
Testing a single chip in a wafer probing system
- Patent number 11,808,808
- Issue date Nov 7, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatuses for intrusion detection and analy...
- Patent number 11,809,552
- Issue date Nov 7, 2023
- Power Fingerprinting Inc.
- Carlos R. Aguayo Gonzalez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic component test handler having hand teaching function and...
- Patent number 11,802,906
- Issue date Oct 31, 2023
- ATECO INC.
- Taek Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Stacker of electronic component test handler, and electronic compon...
- Patent number 11,802,907
- Issue date Oct 31, 2023
- ATECO INC.
- Taek Seon Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection system
- Patent number 11,762,012
- Issue date Sep 19, 2023
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Electronic test equipment apparatus and methods of operating thereof
- Patent number 11,740,278
- Issue date Aug 29, 2023
- Infineon Technologies AG
- Kevin Roche
- G01 - MEASURING TESTING
Information Patent Grant
Multistory electronic device testing apparatus
- Patent number 11,740,283
- Issue date Aug 29, 2023
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 11,714,124
- Issue date Aug 1, 2023
- Advantest Corporation
- Hiromitsu Horino
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 11,635,459
- Issue date Apr 25, 2023
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test handler having multiple testing sectors
- Patent number 11,592,477
- Issue date Feb 28, 2023
- ASMPT SINGAPORE PTE. LTD.
- Chi Wah Cheng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Testing holders for chip unit and die package
- Patent number 11,579,190
- Issue date Feb 14, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Mill-Jer Wang
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 11,579,189
- Issue date Feb 14, 2023
- ADVANIEST Corporation
- Yoshinori Arai
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 11,567,123
- Issue date Jan 31, 2023
- Tokyo Electron Limited
- Junichi Hagihara
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact test solution for Antenna-On-Package (AOP) devices usin...
- Patent number 11,552,382
- Issue date Jan 10, 2023
- Texas Instmments Incorporated
- Meysam Moallem
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module inspection device with robot
- Patent number 11,519,958
- Issue date Dec 6, 2022
- Samsung Electronics Co., Ltd.
- Minwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test handler and semiconductor device equipment including same
- Patent number 11,513,151
- Issue date Nov 29, 2022
- Samsung Electronics Co., Ltd.
- Yeong Seok Kim
- G01 - MEASURING TESTING
Information Patent Grant
On-wafer tuner system and method
- Patent number 11,506,708
- Issue date Nov 22, 2022
- Christos Tsironis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inspection apparatus
- Patent number 11,486,924
- Issue date Nov 1, 2022
- Tokyo Electron Limited
- Hiroki Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Kit-less pick and place handler system for thermal testing
- Patent number 11,474,147
- Issue date Oct 18, 2022
- Boston Semi Equipment LLC
- Larry Stuckey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONICS TESTER
- Publication number 20240036103
- Publication date Feb 1, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027520
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027522
- Publication date Jan 25, 2024
- Advantest Corporation
- Takayuki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027521
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT
- Publication number 20240027523
- Publication date Jan 25, 2024
- Advantest Corporation
- Hiroki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20240019487
- Publication date Jan 18, 2024
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20240019488
- Publication date Jan 18, 2024
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST SYSTEM AND AUTOMATIC TEST METHOD FOR INTEGRATED-CIRC...
- Publication number 20240003963
- Publication date Jan 4, 2024
- KINGSTON DIGITAL, INC.
- Chao-Kun LEE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHA...
- Publication number 20230417796
- Publication date Dec 28, 2023
- Western Digital Technologies, Inc.
- Yalaj Goyal
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR A SEMICONDUCTOR PACKAGE
- Publication number 20230384368
- Publication date Nov 30, 2023
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Application
PROBING DEVICE AND INSPECTION METHOD USING THE SAME
- Publication number 20230358803
- Publication date Nov 9, 2023
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing a package-on-package semiconductor...
- Publication number 20230349968
- Publication date Nov 2, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT T...
- Publication number 20230341462
- Publication date Oct 26, 2023
- Advantest Corporation
- Akihisa Suda
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...
- Publication number 20230280394
- Publication date Sep 7, 2023
- Advantest Corporation
- Matthias WERNER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20230266386
- Publication date Aug 24, 2023
- RENESAS ELECTRONICS CORPORATION
- Fukumi UNOKUCHI
- G01 - MEASURING TESTING
Information Patent Application
CHIP CARRIER
- Publication number 20230253226
- Publication date Aug 10, 2023
- Po-Hsiang CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRESSURIZING DEVICE FOR SEMICONDUCTOR TESTING AND SEMICONDUCTOR TES...
- Publication number 20230221366
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- Changgeun YANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20230204651
- Publication date Jun 29, 2023
- AEHR TEST SYSTEMS
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM
- Publication number 20230176116
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Thomas Gentner
- G01 - MEASURING TESTING
Information Patent Application
TRAY CARRIER AND CORRESPONDING METHOD
- Publication number 20230170236
- Publication date Jun 1, 2023
- STMicroelectronics (Malta) Ltd.
- Silvio SPITERI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN AUTOMATED TEST SYSTEM FOR TESTING SINGULATED ELECTRONIC COMPONEN...
- Publication number 20230160949
- Publication date May 25, 2023
- Cohu GmbH
- Anton SCHUSTER
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20230134360
- Publication date May 4, 2023
- TOKYO ELECTRON LIMITED
- Junichi Hagihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP TEST CARRIER
- Publication number 20230130114
- Publication date Apr 27, 2023
- G.Skill International Enterprise Co., Ltd.
- Chiung-Huang HUANG
- G01 - MEASURING TESTING
Information Patent Application
Electronic device pick-and-place system and electronic device testi...
- Publication number 20230086540
- Publication date Mar 23, 2023
- CHROMA ATE INC.
- Chien-Ming CHEN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE TESTING APPARATUS AND ELECTRONIC DEVICE TESTING M...
- Publication number 20230086266
- Publication date Mar 23, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
DETECTING CIRCUIT AND METHOD FOR DETECTING MEMORY CHIP
- Publication number 20230071925
- Publication date Mar 9, 2023
- NANYA TECHNOLOGY CORPORATION
- Yan-De LIN
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH AND METHOD THEREFOR
- Publication number 20230051231
- Publication date Feb 16, 2023
- AMT CO., LTD.
- Du Chul KIM
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20230024921
- Publication date Jan 26, 2023
- NIDEC-READ CORPORATION
- Takashi ISA
- G01 - MEASURING TESTING
Information Patent Application
Multistory Electronic Device Testing Apparatus
- Publication number 20230022501
- Publication date Jan 26, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TEST...
- Publication number 20230003793
- Publication date Jan 5, 2023
- AMT CO., LTD.
- Du Chul KIM
- G01 - MEASURING TESTING

Handling, conveying or loading

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Chip tray positioning device

Handling integrated circuits in automated testing

Modular automated test system

Inspection device

Temperature control and method for devices under test and image sen...

Test kit for testing a device under test

Device for carrying chip, and device and method for testing chip

Monitor wafer measuring method and measuring apparatus

Method of manufacturing semiconductor device

Electronics tester

Electronic component handler, electronic component tester, and meth...

Testing a single chip in a wafer probing system

Systems, methods, and apparatuses for intrusion detection and analy...

Electronic component test handler having hand teaching function and...

Stacker of electronic component test handler, and electronic compon...

Wafer inspection system

Electronic test equipment apparatus and methods of operating thereof

Multistory electronic device testing apparatus

Electronic component handling apparatus and electronic component te...

Electronics tester

Test handler having multiple testing sectors

Testing holders for chip unit and die package

Electronic component handling apparatus and electronic component te...

Wafer inspection system

Non-contact test solution for Antenna-On-Package (AOP) devices usin...

Semiconductor module inspection device with robot

Test handler and semiconductor device equipment including same

On-wafer tuner system and method

Inspection apparatus

Kit-less pick and place handler system for thermal testing

Patents Applicationslast 30 patents

ELECTRONICS TESTER

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

AUTOMATIC TEST EQUIPMENT

WAFER INSPECTION SYSTEM

TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM

AUTOMATIC TEST SYSTEM AND AUTOMATIC TEST METHOD FOR INTEGRATED-CIRC...

INTEGRATED CIRCUIT TEST SOCKET WITH INTEGRATED DEVICE PICKING MECHA...

TEST APPARATUS FOR A SEMICONDUCTOR PACKAGE

PROBING DEVICE AND INSPECTION METHOD USING THE SAME

Method and apparatus for testing a package-on-package semiconductor...

ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT T...

METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

CHIP CARRIER

PRESSURIZING DEVICE FOR SEMICONDUCTOR TESTING AND SEMICONDUCTOR TES...

ELECTRONICS TESTER

TESTING A SINGLE CHIP IN A WAFER PROBING SYSTEM

TRAY CARRIER AND CORRESPONDING METHOD

AN AUTOMATED TEST SYSTEM FOR TESTING SINGULATED ELECTRONIC COMPONEN...

WAFER INSPECTION SYSTEM

CHIP TEST CARRIER

Electronic device pick-and-place system and electronic device testi...

ELECTRONIC DEVICE TESTING APPARATUS AND ELECTRONIC DEVICE TESTING M...

DETECTING CIRCUIT AND METHOD FOR DETECTING MEMORY CHIP

APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH AND METHOD THEREFOR

INSPECTION DEVICE

Multistory Electronic Device Testing Apparatus

APPARATUS FOR ALIGNING DEVICE HAVING FINE PITCH, APPARATUS FOR TEST...