Housings Supporting members Arrangements of terminals

Industry

CPC
G01R1/04

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/04Housings Supporting members Arrangements of terminals

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electrode lead gripper for pressure activation device
- Patent number 11,982,686
- Issue date May 14, 2024
- APRO CO., LTD
- Jong Hyun Lim
- G01 - MEASURING TESTING
Information Patent Grant
Pre-fabricated movable walk-in chamber for testing secondary cells
- Patent number 11,982,685
- Issue date May 14, 2024
- Northvolt AB
- Sean Stephenson
- G01 - MEASURING TESTING
Information Patent Grant
IC chip holder
- Patent number 11,982,687
- Issue date May 14, 2024
- Brother Kogyo Kabushiki Kaisha
- Hidekazu Komiya
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact and test socket with same
- Patent number 11,982,688
- Issue date May 14, 2024
- Hicon Co., Ltd.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 11,977,099
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomohisa Ohtaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High current contact for contacting a high current socket
- Patent number 11,978,977
- Issue date May 7, 2024
- Lisa Draxlmaier GmbH
- Manuel Kagerhuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connector and device for testing conduction
- Patent number 11,973,289
- Issue date Apr 30, 2024
- SUZHOU HYC TECHNOLOGY CO., LTD.
- Jianye Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass-interconnect engaging device
- Patent number 11,971,430
- Issue date Apr 30, 2024
- Jeffery P. Stowers
- G01 - MEASURING TESTING
Information Patent Grant
Triaxial power and control systems and methods
- Patent number 11,959,937
- Issue date Apr 16, 2024
- Keithley Instruments, LLC
- Matthew Alan Holtz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip socket, testing fixture and chip testing method thereof
- Patent number 11,959,939
- Issue date Apr 16, 2024
- NANYA TECHNOLOGY CORPORATION
- Shih-Ting Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Handling integrated circuits in automated testing
- Patent number 11,961,220
- Issue date Apr 16, 2024
- Texas Instruments Incorporated
- Neeraj Bhardwaj
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Package substrate, apparatus for testing power supply noise and met...
- Patent number 11,959,938
- Issue date Apr 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Honglong Shi
- G01 - MEASURING TESTING
Information Patent Grant
Modular automated test system
- Patent number 11,953,519
- Issue date Apr 9, 2024
- Teradyne, Inc.
- Christopher James Bruno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor chip test socket
- Patent number 11,953,520
- Issue date Apr 9, 2024
- MICRO CONTACT SOLUTION CO., LTD.
- Kyung Hoon Yoo
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device characterization systems and methods
- Patent number 11,940,478
- Issue date Mar 26, 2024
- Duke University
- Aaron D. Franklin
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly
- Patent number 11,940,462
- Issue date Mar 26, 2024
- Jong Choen Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Film for component manufacture and component manufacturing method
- Patent number 11,942,349
- Issue date Mar 26, 2024
- Mitsui Chemicals Tohcello, Inc.
- Eiji Hayashishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test fixture
- Patent number 11,933,815
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Maosong Ma
- G01 - MEASURING TESTING
Information Patent Grant
Portable probe card assembly
- Patent number 11,933,816
- Issue date Mar 19, 2024
- Celadon Systems, Inc.
- William A. Funk
- G01 - MEASURING TESTING
Information Patent Grant
Radio frequency ejector pin for production testing and radio freque...
- Patent number 11,927,602
- Issue date Mar 12, 2024
- SPREADTRUM COMMUNICATIONS (SHENZHEN) CO., LTD.
- Chuan He
- G01 - MEASURING TESTING
Information Patent Grant
Multi-site concurrent wafer probe magnetic circuit testing
- Patent number 11,927,604
- Issue date Mar 12, 2024
- Texas Instruments Incorporated
- Xinkun Huang
- G01 - MEASURING TESTING
Information Patent Grant
USB integrated circuit, testing platform and operating method for U...
- Patent number 11,914,491
- Issue date Feb 27, 2024
- VIA LABS, INC.
- Hao-Hsuan Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test carrier and carrier assembling apparatus
- Patent number 11,906,548
- Issue date Feb 20, 2024
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Testing module and testing method using the same
- Patent number 11,906,573
- Issue date Feb 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems, apparatuses, or components for electrolytic corrosion prot...
- Patent number 11,906,547
- Issue date Feb 20, 2024
- Intel Corporation
- Minh Nhat Dang
- G01 - MEASURING TESTING
Information Patent Grant
Automated test system
- Patent number 11,899,042
- Issue date Feb 13, 2024
- Teradyne, Inc.
- Philip Luke Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Modular customer premises equipment for providing broadband internet
- Patent number 11,894,883
- Issue date Feb 6, 2024
- Avista Edge, Inc.
- David Gregory Schafer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device
- Patent number 11,892,472
- Issue date Feb 6, 2024
- Leeno Industrial Inc.
- Chang-hyun Song
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detection unit
- Patent number 11,892,480
- Issue date Feb 6, 2024
- Yazaki Corporation
- Yutaro Okazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test socket
- Publication number 20240159794
- Publication date May 16, 2024
- OKINS ELECTRONICS CO.,LTD
- Jin Kook JUN
- G01 - MEASURING TESTING
Information Patent Application
IC INSPECTION SOCKET
- Publication number 20240159793
- Publication date May 16, 2024
- YOKOWO CO., LTD.
- Daigo TAKEI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN
- Publication number 20240159795
- Publication date May 16, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240151746
- Publication date May 9, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS FOR IMAGE SENSOR PACKAGE
- Publication number 20240151769
- Publication date May 9, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
SOCKET FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20240142493
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- Sanguk Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240142492
- Publication date May 2, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
TESTING MODULE AND TESTING METHOD USING THE SAME
- Publication number 20240133942
- Publication date Apr 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hao Chen
- G01 - MEASURING TESTING
Information Patent Application
Current Sensing Device
- Publication number 20240133926
- Publication date Apr 25, 2024
- SMART ELECTRONICS INC.
- Jeong Bok Lee
- G01 - MEASURING TESTING
Information Patent Application
TEST BOX WITH CIRCUIT BOARDS ASSEMBLED BY MEANS OF GUIDE RAILS
- Publication number 20240133920
- Publication date Apr 25, 2024
- Junming LI
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR SEATING DETECTION SYSTEM
- Publication number 20240133976
- Publication date Apr 25, 2024
- Dell Products L.P.
- Kannan Karuppiah
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE INCLUDING AN NTEGRATED SHUNT RESISTOR
- Publication number 20240125818
- Publication date Apr 18, 2024
- MICROCHIP TECHNOLOGY INCORPORATED
- Gerald Steele
- G01 - MEASURING TESTING
Information Patent Application
RUBBER SOCKET WITH BUILT-IN COMPONENT
- Publication number 20240125845
- Publication date Apr 18, 2024
- TSE CO., LTD
- Seon A. KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FENCE TESTER
- Publication number 20240118312
- Publication date Apr 11, 2024
- Forcefield Active Technology Limited
- Aidan MURPHY
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Application
TEST DEVICE CAPABLE OF TESTING MICRO LED AND MANUFACTURING METHOD T...
- Publication number 20240118335
- Publication date Apr 11, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MAGNETIC CURRENT SENSOR INTEGRATION INTO HIGH CURRENT CONNECTOR DEV...
- Publication number 20240110940
- Publication date Apr 4, 2024
- INFINEON TECHNOLOGIES AG
- Theodor KRANZ
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING TEST SOCKET
- Publication number 20240110947
- Publication date Apr 4, 2024
- LEENO INDUSTRIAL INC.
- Seungha BAEK
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
- Publication number 20240103037
- Publication date Mar 28, 2024
- Advantest Corporation
- Eddy Wayne CHOW
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING ELECTRONIC COMPONENTS AND ELECTRONIC DEVICE
- Publication number 20240103063
- Publication date Mar 28, 2024
- Innolux Corporation
- Zhi-Fu Huang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...
- Publication number 20240103069
- Publication date Mar 28, 2024
- RENESAS ELECTRONICS CORPORATION
- Osamu MIZOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SOCKET BOARD AND METHOD FOR INSPECTING A SEMICONDUCTOR DEVICE
- Publication number 20240094244
- Publication date Mar 21, 2024
- KIOXIA Corporation
- Tsunehiro KITA
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET WITH CONDUCTIVE COMPRESSION CONTACTS FOR INTEGRATED CIR...
- Publication number 20240094245
- Publication date Mar 21, 2024
- Ironwood Electronics, Inc.
- Ilavarasan M. Palaniappa
- G01 - MEASURING TESTING
Information Patent Application
SOCKET AND INSPECTION SOCKET
- Publication number 20240094243
- Publication date Mar 21, 2024
- ENPLAS CORPORATION
- Hiroyuki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR DISPLAY APPARATUS AND INSPECTION METHOD FOR D...
- Publication number 20240094246
- Publication date Mar 21, 2024
- SAMSUNG DISPLAY CO., LTD.
- Daewon Lee
- G01 - MEASURING TESTING
Information Patent Application
PNEUMATIC SEMICONDUCTOR SOCKET LID ASSEMBLY
- Publication number 20240094242
- Publication date Mar 21, 2024
- Ironwood Electronics, Inc.
- Jacob Vavra
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET
- Publication number 20240094251
- Publication date Mar 21, 2024
- TSE CO., LTD
- Chang Su OH
- G01 - MEASURING TESTING
Information Patent Application
CURRENT-SENSING RESISTOR
- Publication number 20240085459
- Publication date Mar 14, 2024
- ISABELLENHUTTE HEUSLER GMBH & CO. KG
- Benedikt KRAMM
- G01 - MEASURING TESTING
Information Patent Application
MASS-INTERCONNECT ENGAGING DEVICE
- Publication number 20240077517
- Publication date Mar 7, 2024
- Leyo, LLC
- Jeffery P. Stowers
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...
- Publication number 20240077530
- Publication date Mar 7, 2024
- KIOXIA Corporation
- Tetsuharu KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR
- Publication number 20240069065
- Publication date Feb 29, 2024
- Tektronix, Inc.
- JULIE A. CAMPBELL
- G01 - MEASURING TESTING

Housings Supporting members Arrangements of terminals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electrode lead gripper for pressure activation device

Pre-fabricated movable walk-in chamber for testing secondary cells

IC chip holder

Spring contact and test socket with same

Method for manufacturing semiconductor device

High current contact for contacting a high current socket

System for testing an integrated circuit of a device and its method...

Electrical connector and device for testing conduction

Mass-interconnect engaging device

Triaxial power and control systems and methods

Chip socket, testing fixture and chip testing method thereof

Handling integrated circuits in automated testing

Package substrate, apparatus for testing power supply noise and met...

Modular automated test system

Semiconductor chip test socket

Electronic device characterization systems and methods

Test socket assembly

Film for component manufacture and component manufacturing method

Test fixture

Portable probe card assembly

Radio frequency ejector pin for production testing and radio freque...

Multi-site concurrent wafer probe magnetic circuit testing

USB integrated circuit, testing platform and operating method for U...

Test carrier and carrier assembling apparatus

Testing module and testing method using the same

Systems, apparatuses, or components for electrolytic corrosion prot...

Automated test system

Modular customer premises equipment for providing broadband internet

Test device

Voltage detection unit

Patents Applicationslast 30 patents

Test socket

IC INSPECTION SOCKET

ELECTRICALLY CONDUCTIVE CONTACT PIN

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

TEST APPARATUS FOR IMAGE SENSOR PACKAGE

SOCKET FOR TESTING SEMICONDUCTOR DEVICE

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

TESTING MODULE AND TESTING METHOD USING THE SAME

Current Sensing Device

TEST BOX WITH CIRCUIT BOARDS ASSEMBLED BY MEANS OF GUIDE RAILS

CONNECTOR SEATING DETECTION SYSTEM

INTEGRATED CIRCUIT PACKAGE INCLUDING AN NTEGRATED SHUNT RESISTOR

RUBBER SOCKET WITH BUILT-IN COMPONENT

FENCE TESTER

TEST DEVICE CAPABLE OF TESTING MICRO LED AND MANUFACTURING METHOD T...

MAGNETIC CURRENT SENSOR INTEGRATION INTO HIGH CURRENT CONNECTOR DEV...

METHOD FOR FABRICATING TEST SOCKET

TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS

METHOD FOR INSPECTING ELECTRONIC COMPONENTS AND ELECTRONIC DEVICE

METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...

SOCKET BOARD AND METHOD FOR INSPECTING A SEMICONDUCTOR DEVICE

TEST SOCKET WITH CONDUCTIVE COMPRESSION CONTACTS FOR INTEGRATED CIR...

SOCKET AND INSPECTION SOCKET

INSPECTION DEVICE FOR DISPLAY APPARATUS AND INSPECTION METHOD FOR D...

PNEUMATIC SEMICONDUCTOR SOCKET LID ASSEMBLY

TEST SOCKET

CURRENT-SENSING RESISTOR

MASS-INTERCONNECT ENGAGING DEVICE

TEST BOARD, AND DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND NON-TRANS...

PRECISION, HIGH BANDWIDTH, SWITCHING ATTENUATOR