In-circuit Testers

Industry

CPC
G01R31/31915

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31915In-circuit Testers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Data recorder
- Patent number 11,953,547
- Issue date Apr 9, 2024
- Bae Systems Controls Inc.
- Thomas J. Cummings
- G01 - MEASURING TESTING
Information Patent Grant
Compiler-based code generation for post-silicon validation
- Patent number 11,796,593
- Issue date Oct 24, 2023
- Synopsys, Inc.
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Grant
Controller structural testing with automated test vectors
- Patent number 11,598,808
- Issue date Mar 7, 2023
- Micron Technology, Inc.
- Michael Richard Spica
- G11 - INFORMATION STORAGE
Information Patent Grant
Trimming analog circuits
- Patent number 11,313,901
- Issue date Apr 26, 2022
- Smart Prong Technologies, Inc.
- Silvia Jaeckel
- G01 - MEASURING TESTING
Information Patent Grant
Detection of performance degradation in integrated circuits
- Patent number 11,105,856
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Grant
Controller structural testing with automated test vectors
- Patent number 10,976,367
- Issue date Apr 13, 2021
- Micron Technology, Inc.
- Michael Richard Spica
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit on chip instrument controller
- Patent number 10,871,517
- Issue date Dec 22, 2020
- NXP B.V.
- Johannes Petrus Wilhelmus van Beers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test equipment (ATE) contactor adaptor
- Patent number 10,866,275
- Issue date Dec 15, 2020
- Texas Instruments Incorporated
- Raymond Joseph Ochotorena
- G01 - MEASURING TESTING
Information Patent Grant
Method for network extraction based on phase localization
- Patent number 10,788,529
- Issue date Sep 29, 2020
- Anritsu Company
- Jon S. Martens
- G01 - MEASURING TESTING
Information Patent Grant
Independently driving built-in self test circuitry over a range of...
- Patent number 10,254,340
- Issue date Apr 9, 2019
- International Business Machines Corporation
- John B. DeForge
- G01 - MEASURING TESTING
Information Patent Grant
Integrated defect detection and location systems and methods in sem...
- Patent number 10,168,387
- Issue date Jan 1, 2019
- Infineon Technologies Austria AG
- Cheow Guan Lim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scalable test engine
- Patent number 10,042,729
- Issue date Aug 7, 2018
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and structure for correlation of test signals routed using...
- Patent number 8,738,979
- Issue date May 27, 2014
- LSI Corporation
- Paul J. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Built off testing apparatus
- Patent number 8,674,718
- Issue date Mar 18, 2014
- Samsung Electronics Co., Ltd.
- Se-jang Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Self-trim and self-test of on-chip values
- Patent number 8,143,953
- Issue date Mar 27, 2012
- Dialog Semiconductor GmbH
- Hans Martin von Staudt
- G01 - MEASURING TESTING
Information Patent Grant
Testing an integrated circuit having configurable input/output term...
- Patent number 8,065,570
- Issue date Nov 22, 2011
- Xilinx, Inc.
- Tuyet Ngoc Simmons
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit (IC) with on-board characterization unit
- Patent number 7,475,312
- Issue date Jan 6, 2009
- NXP B.V.
- Kees Marinus Maria Van Kaam
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing multiple modules on an integrated circuit
- Patent number 7,340,659
- Issue date Mar 4, 2008
- Infineon Technologies, AG
- Prashant Balakrishnan
- G01 - MEASURING TESTING
Information Patent Grant
Single board DFT integrated circuit tester
- Patent number 7,036,062
- Issue date Apr 25, 2006
- Teseda Corporation
- Steven R. Morris
- G01 - MEASURING TESTING
Information Patent Grant
Card for testing functions of card interface
- Patent number 7,003,419
- Issue date Feb 21, 2006
- High Tech Computer Corp.
- Jen-De Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for translating test vectors
- Patent number 6,760,904
- Issue date Jul 6, 2004
- Unisys Corporation
- Mark W. Jennion
- G01 - MEASURING TESTING
Information Patent Grant
Die fault testing utilizing an exclusive-or network of gates
- Patent number 6,697,980
- Issue date Feb 24, 2004
- Intel Corporation
- Gabi Glasser
- G01 - MEASURING TESTING
Information Patent Grant
Modular architecture for memory testing on event based test system
- Patent number 6,651,204
- Issue date Nov 18, 2003
- Advantest Corp.
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing a circuit implemented on a programmab...
- Patent number 6,618,686
- Issue date Sep 9, 2003
- Xilinx, Inc.
- Chakravarthy K. Allamsetty
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of testing a chip
- Patent number 6,483,338
- Issue date Nov 19, 2002
- VIA Technologies, Inc.
- Chih-Hsien Weng
- G01 - MEASURING TESTING
Information Patent Grant
Measuring a characteristic of an integrated circuit
- Patent number 6,469,533
- Issue date Oct 22, 2002
- Intel Corporation
- Nasser A. Kurd
- G01 - MEASURING TESTING
Information Patent Grant
Network link tester device configured to selectively and automatica...
- Patent number 6,434,716
- Issue date Aug 13, 2002
- Psiber Data Systems Inc.
- Darrell J. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting shorts, opens and connected pins on...
- Patent number 6,291,978
- Issue date Sep 18, 2001
- Agilent Technologies, Inc.
- Kevin G. Chandler
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting shorts, opens and connected pins on...
- Patent number 6,191,570
- Issue date Feb 20, 2001
- Agilent Technologies, Inc.
- Kevin G. Chandler
- G01 - MEASURING TESTING
Information Patent Grant
Circuit-board tester with backdrive-based burst timing
- Patent number 6,175,230
- Issue date Jan 16, 2001
- GenRad, Inc.
- Michael W. Hamblin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZ...
- Publication number 20240133952
- Publication date Apr 25, 2024
- Intel NDTM US LLC
- Andreas KERBER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
IN-CIRCUIT EMULATOR DEVICE
- Publication number 20230314513
- Publication date Oct 5, 2023
- LAPIS Technology Co., Ltd.
- Hiroshi YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
DATA RECORDER
- Publication number 20230204665
- Publication date Jun 29, 2023
- BAE Systems Controls Inc.
- Thomas J. Cummings
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION
- Publication number 20220381824
- Publication date Dec 1, 2022
- International Business Machines Corporation
- Hillel Mendelson
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLER STRUCTURAL TESTING WITH AUTOMATED TEST VECTORS
- Publication number 20210208199
- Publication date Jul 8, 2021
- Micron Technology, Inc.
- Michael Richard Spica
- G01 - MEASURING TESTING
Information Patent Application
TRIMMING ANALOG CIRCUITS
- Publication number 20210173002
- Publication date Jun 10, 2021
- Smart Prong Technologies, Inc.
- Silvia Jaeckel
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLER STRUCTURAL TESTING WITH AUTOMATED TEST VECTORS
- Publication number 20200191869
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Michael Richard Spica
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS
- Publication number 20200150181
- Publication date May 14, 2020
- International Business Machines Corporation
- Emily A. Ray
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC TEST EQUIPMENT (ATE) CONTACTOR ADAPTOR
- Publication number 20200088787
- Publication date Mar 19, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Raymond Joseph Ochotorena
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT STRUCTURE
- Publication number 20180024191
- Publication date Jan 25, 2018
- ALI CORPORATION
- Chi-Bin Chen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR A SCALABLE TEST ENGINE
- Publication number 20170286247
- Publication date Oct 5, 2017
- LAKSHMINARAYANA PAPPU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGTRATED CIRCUIT INCLUDING TEST PADS
- Publication number 20150067430
- Publication date Mar 5, 2015
- SK HYNIX INC.
- Dong Uk LEE
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL GATE STRESS TESTING
- Publication number 20150067429
- Publication date Mar 5, 2015
- FREESCALE SEMICONDUCTOR, INC.
- William E. Edwards
- G01 - MEASURING TESTING
Information Patent Application
BUILT OFF TESTING APPARATUS
- Publication number 20140139258
- Publication date May 22, 2014
- Samsung Electronics Co., Ltd.
- Se-jang OH
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND STRUCTURE FOR CORRELATION OF TEST SIGNALS ROUTED USING...
- Publication number 20130262946
- Publication date Oct 3, 2013
- Paul J. Smith
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR WITH MULTI-PIN DEVICE CONTACTS
- Publication number 20130063172
- Publication date Mar 14, 2013
- TEXAS INSTRUMENTS INCORPORATED
- STANLEY HSU
- G01 - MEASURING TESTING
Information Patent Application
BUILT OFF TESTING APPARATUS
- Publication number 20100289517
- Publication date Nov 18, 2010
- Samsung Electronics Co., Ltd.
- Se-jang OH
- G01 - MEASURING TESTING
Information Patent Application
Self-trim and self-test of on-chip values
- Publication number 20100289590
- Publication date Nov 18, 2010
- Dialog Semiconductor GmbH
- Hans Martin von Staudt
- G01 - MEASURING TESTING
Information Patent Application
Equipment testing system and method having scaleable test line limits
- Publication number 20080126001
- Publication date May 29, 2008
- David W. Murray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ic with on-board characterization unit
- Publication number 20060155500
- Publication date Jul 13, 2006
- Kees Marinus Maria Van Kaam
- G01 - MEASURING TESTING
Information Patent Application
Testing card
- Publication number 20040138848
- Publication date Jul 15, 2004
- Jen-De Chen
- G01 - MEASURING TESTING
Information Patent Application
Single board DFT integrated circuit tester
- Publication number 20040068699
- Publication date Apr 8, 2004
- Teseda Corporation
- Steven R. Morris
- G01 - MEASURING TESTING
Information Patent Application
Method of testing multiple modules on an integrated circuit
- Publication number 20030221150
- Publication date Nov 27, 2003
- Infineon Technologies AG
- Prashant Balakrishnan
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING A CIRCUIT IMPLEMENTED ON A PROGRAMMAB...
- Publication number 20030078752
- Publication date Apr 24, 2003
- CHAKRAVARTHY K. ALLAMSETTY
- G01 - MEASURING TESTING
Information Patent Application
Method and system of testing a chip
- Publication number 20010050575
- Publication date Dec 13, 2001
- Chih-Hsien Weng
- G01 - MEASURING TESTING

In-circuit Testers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Data recorder

Compiler-based code generation for post-silicon validation

Controller structural testing with automated test vectors

Trimming analog circuits

Detection of performance degradation in integrated circuits

Controller structural testing with automated test vectors

Integrated circuit on chip instrument controller

Automatic test equipment (ATE) contactor adaptor

Method for network extraction based on phase localization

Independently driving built-in self test circuitry over a range of...

Integrated defect detection and location systems and methods in sem...

Apparatus and method for a scalable test engine

Methods and structure for correlation of test signals routed using...

Built off testing apparatus

Self-trim and self-test of on-chip values

Testing an integrated circuit having configurable input/output term...

Integrated circuit (IC) with on-board characterization unit

Method of testing multiple modules on an integrated circuit

Single board DFT integrated circuit tester

Card for testing functions of card interface

Apparatus and methods for translating test vectors

Die fault testing utilizing an exclusive-or network of gates

Modular architecture for memory testing on event based test system

System and method for testing a circuit implemented on a programmab...

Method and system of testing a chip

Measuring a characteristic of an integrated circuit

Network link tester device configured to selectively and automatica...

System and method for detecting shorts, opens and connected pins on...

System and method for detecting shorts, opens and connected pins on...

Circuit-board tester with backdrive-based burst timing

Patents Applicationslast 30 patents

DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZ...

IN-CIRCUIT EMULATOR DEVICE

DATA RECORDER

COMPILER-BASED CODE GENERATION FOR POST-SILICON VALIDATION

CONTROLLER STRUCTURAL TESTING WITH AUTOMATED TEST VECTORS

TRIMMING ANALOG CIRCUITS

CONTROLLER STRUCTURAL TESTING WITH AUTOMATED TEST VECTORS

DETECTION OF PERFORMANCE DEGRADATION IN INTEGRATED CIRCUITS

AUTOMATIC TEST EQUIPMENT (ATE) CONTACTOR ADAPTOR

INTEGRATED CIRCUIT STRUCTURE

APPARATUS AND METHOD FOR A SCALABLE TEST ENGINE

SEMICONDUCTOR INTEGTRATED CIRCUIT INCLUDING TEST PADS

WAFER-LEVEL GATE STRESS TESTING

BUILT OFF TESTING APPARATUS

METHODS AND STRUCTURE FOR CORRELATION OF TEST SIGNALS ROUTED USING...

CONTACTOR WITH MULTI-PIN DEVICE CONTACTS

BUILT OFF TESTING APPARATUS

Self-trim and self-test of on-chip values

Equipment testing system and method having scaleable test line limits

Ic with on-board characterization unit

Testing card

Single board DFT integrated circuit tester

Method of testing multiple modules on an integrated circuit

SYSTEM AND METHOD FOR TESTING A CIRCUIT IMPLEMENTED ON A PROGRAMMAB...

Method and system of testing a chip