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G01R31/318572
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/318572
Input/Output interfaces
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Process for scan chain in a memory
Patent number
11,971,448
Issue date
Apr 30, 2024
Ceremorphic, Inc.
Robert F. Wiser
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Dummy dual in-line memory module (DIMM) testing system based on bou...
Patent number
11,965,931
Issue date
Apr 23, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Yuan Sang
G01 - MEASURING TESTING
Information
Patent Grant
Hold time improved low area flip-flop architecture
Patent number
11,946,973
Issue date
Apr 2, 2024
Texas Instruments Incorporated
Arnab Khawas
G01 - MEASURING TESTING
Information
Patent Grant
FPGA chip with protected JTAG interface
Patent number
11,941,133
Issue date
Mar 26, 2024
Hewlett Packard Enterprise Development LP
Siung Siew Liew
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Built-in self-test for die-to-die physical interfaces
Patent number
11,940,491
Issue date
Mar 26, 2024
Apple Inc.
Fabien S. Faure
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and system for debugging solid-state disk (SSD) device
Patent number
11,933,847
Issue date
Mar 19, 2024
Silicon Motion, Inc.
Han-Chih Tsai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
Patent number
11,927,627
Issue date
Mar 12, 2024
Tektronix, Inc.
Daniel S. Froelich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for schedule-based I/O multiplexing for integrate...
Patent number
11,927,630
Issue date
Mar 12, 2024
MARVELL ASIA PTE. LTD.
Sounil Biswas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
DIMM slot test system without series connection of test board throu...
Patent number
11,927,632
Issue date
Mar 12, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Chang-Qing Mu
G01 - MEASURING TESTING
Information
Patent Grant
Early detection of quality control test failures for manufacturing...
Patent number
11,892,507
Issue date
Feb 6, 2024
Exfo Inc.
Jonathan Plante
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan testing using scan frames with embedded commands
Patent number
11,879,941
Issue date
Jan 23, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit chip testing interface with reduced signal wires
Patent number
11,860,228
Issue date
Jan 2, 2024
Xilinx, Inc.
Albert Shih-Huai Lin
G01 - MEASURING TESTING
Information
Patent Grant
Stimulated circuits and fault testing methods
Patent number
11,852,685
Issue date
Dec 26, 2023
Hamilton Sundstrand Corporation
Christopher Blazer
G01 - MEASURING TESTING
Information
Patent Grant
Two pin serial bus communication interface and process
Patent number
11,854,654
Issue date
Dec 26, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Selectable JTAG or trace access with data store and output
Patent number
11,835,578
Issue date
Dec 5, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Full pad coverage boundary scan
Patent number
11,821,945
Issue date
Nov 21, 2023
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
AT-speed test access port operations
Patent number
11,808,810
Issue date
Nov 7, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan testing in a processor
Patent number
11,802,911
Issue date
Oct 31, 2023
Graphcore Limited
Natalie Narkonski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic device comprising a memory accessible via a JTAG interfa...
Patent number
11,789,078
Issue date
Oct 17, 2023
STMicroelectronics S.r.l.
Filippo Minnella
G01 - MEASURING TESTING
Information
Patent Grant
Wafer scale testing using a 2 signal JTAG interface
Patent number
11,782,091
Issue date
Oct 10, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for protecting a reconfigurable digital integrated circuit a...
Patent number
11,762,722
Issue date
Sep 19, 2023
Thales
Yann Oster
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
3D TAP and scan port architectures
Patent number
11,762,014
Issue date
Sep 19, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Performing scan data transfer inside multi-die package with SERDES...
Patent number
11,762,017
Issue date
Sep 19, 2023
Advanced Micro Devices, Inc.
Ahmet Tokuz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
DDR5 SDRAM DIMM slot detection system and method thereof
Patent number
11,754,626
Issue date
Sep 12, 2023
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Jin-Dong Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Method of converting a serial vector format (SVF) file to a vector...
Patent number
11,747,400
Issue date
Sep 5, 2023
The United States of America, as represented by the Secretary of the Navy
Daniel M. Dosado
G01 - MEASURING TESTING
Information
Patent Grant
Addressable test access port apparatus
Patent number
11,747,397
Issue date
Sep 5, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Memory device having an enhanced ESD protection and a secure access...
Patent number
11,749,325
Issue date
Sep 5, 2023
Micron Technology, Inc.
Alberto Troia
G11 - INFORMATION STORAGE
Information
Patent Grant
Scan testing using scan frames with embedded commands
Patent number
11,740,286
Issue date
Aug 29, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit die test architecture
Patent number
11,726,135
Issue date
Aug 15, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing memory device employing limited number of test pi...
Patent number
11,719,748
Issue date
Aug 8, 2023
Yangtze Memory Technologies Co., Ltd.
Xiaodong Xu
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
AT-SPEED TEST ACCESS PORT OPERATIONS
Publication number
20240061038
Publication date
Feb 22, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PERFORMING SCAN DATA TRANSFER INSIDE MULTI-DIE PACKAGE WITH SERDES...
Publication number
20240027525
Publication date
Jan 25, 2024
ADVANCED MICRO DEVICES, INC.
AHMET TOKUZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
Publication number
20240019489
Publication date
Jan 18, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COST-SAVING SCHEME FOR SCAN TESTING OF 3D STACK DIE
Publication number
20240019493
Publication date
Jan 18, 2024
ADVANCED MICRO DEVICES, INC.
SongGan Zang
G01 - MEASURING TESTING
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20240012050
Publication date
Jan 11, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR TESTING SEMICONDUCTOR CIRCUITS
Publication number
20240003972
Publication date
Jan 4, 2024
Ampere Computing LLC
Kha NGUYEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230417831
Publication date
Dec 28, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE/UNICAST FOR TEST CONTENT, FIRMWARE, AND SOFTWARE DELIVERY
Publication number
20230408581
Publication date
Dec 21, 2023
Intel Corporation
Rakesh Kandula
G01 - MEASURING TESTING
Information
Patent Application
ADDRESSABLE TEST ACCESS PORT
Publication number
20230400513
Publication date
Dec 14, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20230384376
Publication date
Nov 30, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Built-in Self-Test for Die-to-Die Physical Interfaces
Publication number
20230384377
Publication date
Nov 30, 2023
Apple Inc.
Fabien S. Faure
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT CHIP TESTING INTERFACE WITH REDUCED SIGNAL WIRES
Publication number
20230366929
Publication date
Nov 16, 2023
Xilinx, Inc.
Albert Shih-Huai LIN
G01 - MEASURING TESTING
Information
Patent Application
MANAGING DATA PROTECTION SETTINGS FOR AN ELECTRONIC CONTROL UNIT
Publication number
20230368588
Publication date
Nov 16, 2023
Rivian IP Holdings, LLC
Jack Austin Doan
B60 - VEHICLES IN GENERAL
Information
Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
Publication number
20230366920
Publication date
Nov 16, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Te...
Publication number
20230366930
Publication date
Nov 16, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Anshuman Chandra
G01 - MEASURING TESTING
Information
Patent Application
TEST ACCESS PORT WITH ADDRESS AND COMMAND CAPABILITY
Publication number
20230333159
Publication date
Oct 19, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
DDR5 SDRAM DIMM SLOT DETECTION SYSTEM AND METHOD THEREOF
Publication number
20230296673
Publication date
Sep 21, 2023
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Jin-Dong Zhao
G01 - MEASURING TESTING
Information
Patent Application
Process for Scan Chain in a Memory
Publication number
20230296672
Publication date
Sep 21, 2023
Ceremorphic, Inc.
Robert F. Wiser
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
COMMANDED JTAG TEST ACCESS PORT OPERATIONS
Publication number
20230221368
Publication date
Jul 13, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
STIMULATED CIRCUITS AND FAULT TESTING METHODS
Publication number
20230221369
Publication date
Jul 13, 2023
HAMILTON SUNDSTRAND CORPORATION
Christopher Blazer
G01 - MEASURING TESTING
Information
Patent Application
CHIP TEST CIRCUIT AND CIRCUIT TEST METHOD
Publication number
20230204660
Publication date
Jun 29, 2023
Huawei Technologies Co., Ltd
Changming CUI
G01 - MEASURING TESTING
Information
Patent Application
TEST CIRCUIT IN CHIP AND CIRCUIT TEST METHOD
Publication number
20230204661
Publication date
Jun 29, 2023
Huawei Technologies Co., Ltd
Yu HUANG
G01 - MEASURING TESTING
Information
Patent Application
Scan Chain for Memory with Reduced Power Consumption
Publication number
20230194607
Publication date
Jun 22, 2023
Ceremorphic, Inc.
Shakti SINGH
G01 - MEASURING TESTING
Information
Patent Application
AT-SPEED TEST ACCESS PORT OPERATIONS
Publication number
20230194604
Publication date
Jun 22, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Data Gating Using Scan Enable Pin
Publication number
20230194606
Publication date
Jun 22, 2023
Apple Inc.
FNU Rajeev Kumar
G01 - MEASURING TESTING
Information
Patent Application
WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE
Publication number
20230160959
Publication date
May 25, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230160958
Publication date
May 25, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED TEST CIRCUIT, TEST ASSEMBLY AND METHOD FOR TESTING AN IN...
Publication number
20230138651
Publication date
May 4, 2023
INFINEON TECHNOLOGIES AG
Tobias Kilian
G01 - MEASURING TESTING
Information
Patent Application
Stacked Integrated Circuit Device
Publication number
20230116320
Publication date
Apr 13, 2023
Graphcore Limited
Stephen FELIX
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FPGA CHIP WITH PROTECTED JTAG INTERFACE
Publication number
20230090760
Publication date
Mar 23, 2023
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Siung Siew Liew
G01 - MEASURING TESTING