Littrow mirror spectrometers

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CPC
G01J3/22

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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G01J3/22Littrow mirror spectrometers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Spectrally-resolved raman water lidar
- Patent number 11,402,511
- Issue date Aug 2, 2022
- Wuhan University
- Fuchao Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature insensitive filter
- Patent number 11,360,262
- Issue date Jun 14, 2022
- Universiteit Gent
- Roeland Baets
- G02 - OPTICS
Information Patent Grant
Spatial heterodyne spectrometer
- Patent number 10,908,023
- Issue date Feb 2, 2021
- LightMachinery Inc.
- John H. Hunter
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer arrangement, method for producing a two-dimensional sp...
- Patent number 10,718,666
- Issue date Jul 21, 2020
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometric device with a plurality of spectral measurement...
- Patent number 10,527,493
- Issue date Jan 7, 2020
- AIRBUS DEFENCE AND SPACE SAS
- Frédéric Pasternak
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength dispersing device
- Patent number 10,061,083
- Issue date Aug 28, 2018
- Lumentum Operations LLC
- Sheldon McLaughlin
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 9,851,251
- Issue date Dec 26, 2017
- MICRO-EPSILON Optronic GmbH
- Tobias Otto
- G01 - MEASURING TESTING
Information Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
- Patent number 9,612,155
- Issue date Apr 4, 2017
- Electronic Photonic IC Inc. (EPIC Inc.)
- Seng-Tiong Ho
- G02 - OPTICS
Information Patent Grant
Spectral apparatus, detection apparatus, light source apparatus, re...
- Patent number 9,594,253
- Issue date Mar 14, 2017
- Canon Kabushiki Kaisha
- Takashi Sukegawa
- G02 - OPTICS
Information Patent Grant
Wavelength dispersing device
- Patent number 9,354,365
- Issue date May 31, 2016
- Lumentum Operations LLC
- Sheldon McLaughlin
- G01 - MEASURING TESTING
Information Patent Grant
Multiband spatial heterodyne spectrometer and associated methods
- Patent number 8,922,783
- Issue date Dec 30, 2014
- Bodkin Design and Engineering LLC
- Andrew Bodkin
- G01 - MEASURING TESTING
Information Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
- Patent number 8,854,620
- Issue date Oct 7, 2014
- Optonet Inc.
- Seng-Tiong Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Curved grating spectrometer and wavelength multiplexer or demultipl...
- Patent number 8,462,338
- Issue date Jun 11, 2013
- Seng-Tiong Ho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multiband spatial heterodyne spectrometer and associated methods
- Patent number 8,154,732
- Issue date Apr 10, 2012
- Bodkin Design and Engineering, LLC
- Andrew Bodkin
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer assembly
- Patent number 8,102,527
- Issue date Jan 24, 2012
- Leibniz-Institut fur Analytische
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Time-resolved spectroscopic measurement apparatus
- Patent number 8,059,272
- Issue date Nov 15, 2011
- Ecole Polytechnique Federale de Lausanne
- Jean-Daniel Ganiere
- G01 - MEASURING TESTING
Information Patent Grant
Curved grating spectrometer with very high wavelength resolution
- Patent number 7,623,235
- Issue date Nov 24, 2009
- Seng-Tiong Ho
- G01 - MEASURING TESTING
Information Patent Grant
Gas cell
- Patent number 7,564,558
- Issue date Jul 21, 2009
- Senseair AB
- Hahs Evald Goran Martin
- G01 - MEASURING TESTING
Information Patent Grant
Littrow spectrometer and a spectral domain optical coherence tomogr...
- Patent number 7,456,957
- Issue date Nov 25, 2008
- Carl Zeiss Meditec, Inc.
- Matthew J. Everett
- G01 - MEASURING TESTING
Information Patent Grant
Curved grating spectrometer with very high wavelength resolution
- Patent number 7,283,233
- Issue date Oct 16, 2007
- Seng-Tiong Ho
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution littrow spectrometer and method for the quasi-simul...
- Patent number 6,717,670
- Issue date Apr 6, 2004
- Gesellschaft zur Förderung der Spektrochemie und angewandten Spectroskopie e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
High resolution spectral measurement device
- Patent number 6,713,770
- Issue date Mar 30, 2004
- Cymer, Inc.
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Grant
Convolution method for measuring laser bandwidth
- Patent number 6,603,549
- Issue date Aug 5, 2003
- Cymer, Inc.
- Steven F. Haas
- G01 - MEASURING TESTING
Information Patent Grant
Compact littrow-type scanning spectrometer
- Patent number 6,597,452
- Issue date Jul 22, 2003
- Jobin Yvon, Inc.
- Wu Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 6,573,989
- Issue date Jun 3, 2003
- Komatsu Ltd.
- Toru Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
High resolution etalon-grating spectrometer
- Patent number 6,538,737
- Issue date Mar 25, 2003
- Cymer, Inc.
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Grant
High resolution etalon-grating monochromator
- Patent number 6,480,275
- Issue date Nov 12, 2002
- Cymer, Inc.
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Grant
Compact high resolution grating spectrometer
- Patent number 6,061,129
- Issue date May 9, 2000
- Cymer, Inc.
- Alexander I. Ershov
- G01 - MEASURING TESTING
Information Patent Grant
Echelle polychromator
- Patent number 5,448,351
- Issue date Sep 5, 1995
- Bodenseewerk Perkin-Elmer GmbH
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Stray-light suppressor for Littrow spectroscope
- Patent number 4,717,254
- Issue date Jan 5, 1988
- Ando Electric Co., Ltd.
- Toshizo Masuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE INSENSITIVE FILTER
- Publication number 20210063638
- Publication date Mar 4, 2021
- Universiteit Gent
- Roeland BAETS
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL HETERODYNE SPECTROMETER
- Publication number 20210003450
- Publication date Jan 7, 2021
- LightMachinery Inc.
- John H. Hunter
- G01 - MEASURING TESTING
Information Patent Application
SPECTROPHOTOMETRIC DEVICE WITH A PLURALITY OF SPECTRAL MEASUREMENT...
- Publication number 20190339125
- Publication date Nov 7, 2019
- AIRBUS DEFENCE AND SPACE SAS
- Frédéric PASTERNAK
- G02 - OPTICS
Information Patent Application
SPECTROMETER ARRANGEMENT, METHOD FOR PRODUCING A TWO-DIMENSIONAL SP...
- Publication number 20190186992
- Publication date Jun 20, 2019
- Analytik Jena AG
- Stefan MÜNCH
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20170067780
- Publication date Mar 9, 2017
- MICRO-EPSILON OPTRONIC GMBH
- Tobias Otto
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL APPARATUS, DETECTION APPARATUS, LIGHT SOURCE APPARATUS, RE...
- Publication number 20140363338
- Publication date Dec 11, 2014
- Canon Kabushiki Kaisha
- Takashi SUKEGAWA
- G02 - OPTICS
Information Patent Application
WAVELENGTH DISPERSING DEVICE
- Publication number 20140139922
- Publication date May 22, 2014
- Sheldon MCLAUGHLIN
- G02 - OPTICS
Information Patent Application
Multiband Spatial Heterodyne Spectrometer And Associated Methods
- Publication number 20140029004
- Publication date Jan 30, 2014
- Andrew Bodkin
- G01 - MEASURING TESTING
Information Patent Application
Curved Grating Spectrometer and Wavelength Multiplexer or Demultipl...
- Publication number 20130272695
- Publication date Oct 17, 2013
- Seng-Tiong Ho
- G02 - OPTICS
Information Patent Application
MULTIBAND SPATIAL HETERODYNE SPECTROMETER AND ASSOCIATED METHODS
- Publication number 20100321688
- Publication date Dec 23, 2010
- Andrew Bodkin
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer Assembly
- Publication number 20100171953
- Publication date Jul 8, 2010
- Gesellschaft zur Forderung der analytischen Wissenschaften e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH DISPERSING DEVICE
- Publication number 20090273840
- Publication date Nov 5, 2009
- Sheldon MCLAUGHLIN
- G02 - OPTICS
Information Patent Application
CURVED GRATING SPECTROMETER WITH VERY HIGH WAVELENGTH RESOLUTION
- Publication number 20080285919
- Publication date Nov 20, 2008
- Seng-Tiong Ho
- G01 - MEASURING TESTING
Information Patent Application
Time-Resolved Spectroscopic Measurement Apparatus
- Publication number 20080074664
- Publication date Mar 27, 2008
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE
- Jean-Daniel Ganiere
- G01 - MEASURING TESTING
Information Patent Application
Angle-tunable transmissive grating
- Publication number 20070160325
- Publication date Jul 12, 2007
- Hyungbin Son
- G02 - OPTICS
Information Patent Application
Littrow spectrometer and a spectral domain optical coherence tomogr...
- Publication number 20070030483
- Publication date Feb 8, 2007
- Matthew J. Everett
- G02 - OPTICS
Information Patent Application
Gas cell
- Publication number 20050287041
- Publication date Dec 29, 2005
- Hahs Evald Goran Martin
- G01 - MEASURING TESTING
Information Patent Application
High-resolution littrow spectrometer and method for the quasi-simul...
- Publication number 20020180969
- Publication date Dec 5, 2002
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Convolution method for measuring laser bandwidth
- Publication number 20020122176
- Publication date Sep 5, 2002
- Steven F. Haas
- G01 - MEASURING TESTING
Information Patent Application
High resolution spectral measurement device
- Publication number 20020121608
- Publication date Sep 5, 2002
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Application
High resolution etalon-grating spectrometer
- Publication number 20020101589
- Publication date Aug 1, 2002
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Application
High resolution etalon-grating monochromator
- Publication number 20020101588
- Publication date Aug 1, 2002
- Richard L. Sandstrom
- G01 - MEASURING TESTING
Information Patent Application
Spectroscope for measuring spectral distribution
- Publication number 20010052980
- Publication date Dec 20, 2001
- Akifumi Tada
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer
- Publication number 20010024275
- Publication date Sep 27, 2001
- Toru Suzuki
- G01 - MEASURING TESTING

Littrow mirror spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectrally-resolved raman water lidar

Temperature insensitive filter

Spatial heterodyne spectrometer

Spectrometer arrangement, method for producing a two-dimensional sp...

Spectrophotometric device with a plurality of spectral measurement...

Wavelength dispersing device

Spectrometer

Curved grating spectrometer and wavelength multiplexer or demultipl...

Spectral apparatus, detection apparatus, light source apparatus, re...

Wavelength dispersing device

Multiband spatial heterodyne spectrometer and associated methods

Curved grating spectrometer and wavelength multiplexer or demultipl...

Curved grating spectrometer and wavelength multiplexer or demultipl...

Multiband spatial heterodyne spectrometer and associated methods

Spectrometer assembly

Time-resolved spectroscopic measurement apparatus

Curved grating spectrometer with very high wavelength resolution

Gas cell

Littrow spectrometer and a spectral domain optical coherence tomogr...

Curved grating spectrometer with very high wavelength resolution

High-resolution littrow spectrometer and method for the quasi-simul...

High resolution spectral measurement device

Convolution method for measuring laser bandwidth

Compact littrow-type scanning spectrometer

Spectrometer

High resolution etalon-grating spectrometer

High resolution etalon-grating monochromator

Compact high resolution grating spectrometer

Echelle polychromator

Stray-light suppressor for Littrow spectroscope

Patents Applicationslast 30 patents

TEMPERATURE INSENSITIVE FILTER

SPATIAL HETERODYNE SPECTROMETER

SPECTROPHOTOMETRIC DEVICE WITH A PLURALITY OF SPECTRAL MEASUREMENT...

SPECTROMETER ARRANGEMENT, METHOD FOR PRODUCING A TWO-DIMENSIONAL SP...

SPECTROMETER

SPECTRAL APPARATUS, DETECTION APPARATUS, LIGHT SOURCE APPARATUS, RE...

WAVELENGTH DISPERSING DEVICE

Multiband Spatial Heterodyne Spectrometer And Associated Methods

Curved Grating Spectrometer and Wavelength Multiplexer or Demultipl...

MULTIBAND SPATIAL HETERODYNE SPECTROMETER AND ASSOCIATED METHODS

Spectrometer Assembly

WAVELENGTH DISPERSING DEVICE

CURVED GRATING SPECTROMETER WITH VERY HIGH WAVELENGTH RESOLUTION

Time-Resolved Spectroscopic Measurement Apparatus

Angle-tunable transmissive grating

Littrow spectrometer and a spectral domain optical coherence tomogr...

Gas cell

High-resolution littrow spectrometer and method for the quasi-simul...

Convolution method for measuring laser bandwidth

High resolution spectral measurement device

High resolution etalon-grating spectrometer

High resolution etalon-grating monochromator

Spectroscope for measuring spectral distribution

Spectrometer