Logic probes

Industry

CPC
G01R19/16557

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof

Current Industry

G01R19/16557Logic probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for diagnosing open-circuit fault of power switch...
- Patent number 11,874,336
- Issue date Jan 16, 2024
- WUHAN UNIVERSITY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit for an active discharge circuit of an X-capacitor...
- Patent number 11,750,010
- Issue date Sep 5, 2023
- STMicroelectronics S.r.l.
- Massimiliano Gobbi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Voltage sensing circuit
- Patent number 11,733,274
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Leon Zlotnik
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for automatic thermal bias of transistors in mu...
- Patent number 11,601,097
- Issue date Mar 7, 2023
- Benson Amps, Inc.
- Christopher Benson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System for measuring voltage using pulse width modulator or voltage...
- Patent number 11,549,973
- Issue date Jan 10, 2023
- Keysight Technologies, Inc.
- Paul L. Corredoura
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit for an active discharge circuit of an X-capacitor...
- Patent number 10,890,606
- Issue date Jan 12, 2021
- STMicroelectronics S.r.l.
- Massimiliano Gobbi
- G01 - MEASURING TESTING
Information Patent Grant
Differential signal measurement system and method
- Patent number 10,877,092
- Issue date Dec 29, 2020
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 10,837,990
- Issue date Nov 17, 2020
- Renesas Electronics Corporation
- Toshiharu Saito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Discrete input determining circuit and method
- Patent number 10,690,702
- Issue date Jun 23, 2020
- GE Aviation Systems LLC
- Douglas Clayton Smythe
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement system, differential logic probe, single ended...
- Patent number 10,416,203
- Issue date Sep 17, 2019
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Battery status detection method and network device using the same
- Patent number 10,374,267
- Issue date Aug 6, 2019
- Sercomm Corporation
- Chien-Yu Chang
- G01 - MEASURING TESTING
Information Patent Grant
Detection circuit for an active discharge circuit of an X-capacitor...
- Patent number 10,345,348
- Issue date Jul 9, 2019
- STMicroelectronics S.r.l.
- Massimiliano Gobbi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Bidirectional voltage differentiator circuit
- Patent number 9,891,250
- Issue date Feb 13, 2018
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Yijun Duan
- G01 - MEASURING TESTING
Information Patent Grant
Bidirectional voltage differentiator circuit
- Patent number 9,726,698
- Issue date Aug 8, 2017
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Yijun Duan
- G01 - MEASURING TESTING
Information Patent Grant
Bidirectional voltage differentiator circuit
- Patent number 9,366,701
- Issue date Jun 14, 2016
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Yijun Duan
- G01 - MEASURING TESTING
Information Patent Grant
Increased reliability in the processing of digital signals
- Patent number 8,738,331
- Issue date May 27, 2014
- ABB Technology AG
- Hans Björklund
- G01 - MEASURING TESTING
Information Patent Grant
Signal comparison circuit
- Patent number 7,782,095
- Issue date Aug 24, 2010
- Faraday Technology Corp.
- Wen-Ching Hsiung
- G01 - MEASURING TESTING
Information Patent Grant
Detector of differential threshold voltage
- Patent number 7,692,453
- Issue date Apr 6, 2010
- Atmel Corporation
- Sami Ajram
- G01 - MEASURING TESTING
Information Patent Grant
Polarity-insensitive signal detect circuit for use with any signal...
- Patent number 7,689,122
- Issue date Mar 30, 2010
- Finisar Corporation
- Tim Moran
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detector circuit
- Patent number 7,605,616
- Issue date Oct 20, 2009
- Spansion LLC
- Koji Shimbayashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Terminator circuit, test apparatus, test head, and communication de...
- Patent number 7,459,897
- Issue date Dec 2, 2008
- Advantest Corporation
- Toshiaki Awaji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Input circuit
- Patent number 7,414,434
- Issue date Aug 19, 2008
- Rohm Co., Ltd.
- Takashi Fujimura
- G01 - MEASURING TESTING
Information Patent Grant
High-speed comparator
- Patent number 7,262,639
- Issue date Aug 28, 2007
- Broadcom Corporation
- Jan Mulder
- G01 - MEASURING TESTING
Information Patent Grant
Comparator with offset compensation
- Patent number 7,208,980
- Issue date Apr 24, 2007
- Broadcom Corporation
- Jan Mulder
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting a mode of operation of an integrate...
- Patent number 7,183,792
- Issue date Feb 27, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G11 - INFORMATION STORAGE
Information Patent Grant
High-speed signal level detector
- Patent number 7,034,579
- Issue date Apr 25, 2006
- Texas Instruments Incorporated
- Jin-sheng Wang
- G01 - MEASURING TESTING
Information Patent Grant
High speed envelope detector and method
- Patent number 6,980,006
- Issue date Dec 27, 2005
- Cadence Design Systems, Inc.
- Trung Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Input buffer and method for voltage level detection
- Patent number 6,700,416
- Issue date Mar 2, 2004
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Grant
Input buffer and method for voltage level detection
- Patent number 6,545,510
- Issue date Apr 8, 2003
- Micron Technology, Inc.
- Timothy B. Cowles
- G01 - MEASURING TESTING
Information Patent Grant
Signal detector with improved noise immunity
- Patent number 6,104,215
- Issue date Aug 15, 2000
- Sun Microsystems, Inc.
- Frederick R. Schindler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VOLTAGE DETECTION APPARATUS AND METHOD FOR DETERMINING WHETHER HIGH...
- Publication number 20240069076
- Publication date Feb 29, 2024
- Hefei Institutes of Physical Sciences, Chinese Academy of Sciences
- Hua LI
- G01 - MEASURING TESTING
Information Patent Application
LiDAR System with Active Fault Monitoring
- Publication number 20220291359
- Publication date Sep 15, 2022
- OPSYS Tech Ltd.
- Noam Tziony
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DIAGNOSING OPEN-CIRCUIT FAULT OF POWER SWITCH...
- Publication number 20220146592
- Publication date May 12, 2022
- WUHAN UNIVERSITY
- Yigang HE
- G01 - MEASURING TESTING
Information Patent Application
Devices and Methods for Automatic Thermal Bias of Transistors in Mu...
- Publication number 20220085768
- Publication date Mar 17, 2022
- BENSON AMPS, INC.
- Christopher Benson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETECTION CIRCUIT FOR AN ACTIVE DISCHARGE CIRCUIT OF AN X-CAPACITOR...
- Publication number 20210080491
- Publication date Mar 18, 2021
- STMicroelectronics S.r.l.
- Massimiliano Gobbi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DETECTION CIRCUIT FOR AN ACTIVE DISCHARGE CIRCUIT OF AN X-CAPACITOR...
- Publication number 20190369146
- Publication date Dec 5, 2019
- STMicroelectronics S.r.l.
- Massimiliano Gobbi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DISCRETE INPUT DETERMINING CIRCUIT AND METHOD
- Publication number 20190346488
- Publication date Nov 14, 2019
- GE AVIATION SYSTEMS LLC
- Douglas Clayton SMYTHE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DIFFERENTIAL SIGNAL MEASUREMENT SYSTEM AND METHOD
- Publication number 20190271741
- Publication date Sep 5, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20190178920
- Publication date Jun 13, 2019
- RENESAS ELECTRONICS CORPORATION
- Toshiharu SAITO
- G08 - SIGNALLING
Information Patent Application
TEST AND MEASUREMENT SYSTEM, DIFFERENTIAL LOGIC PROBE, SINGLE ENDED...
- Publication number 20180284165
- Publication date Oct 4, 2018
- Rohde& Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
SWITCHING REGULATOR WITH IMPROVED EFFICIENCY AND METHOD THEREOF
- Publication number 20170317587
- Publication date Nov 2, 2017
- Chengdu Monolithic Power Systems Co., Ltd.
- Xudong Zhang
- G01 - MEASURING TESTING
Information Patent Application
BIDIRECTIONAL VOLTAGE DIFFERENTIATOR CIRCUIT
- Publication number 20170299638
- Publication date Oct 19, 2017
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Yijun Duan
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT FOR AN ACTIVE DISCHARGE CIRCUIT OF AN X-CAPACITOR...
- Publication number 20160124029
- Publication date May 5, 2016
- STMicroelectronics S.r.l.
- Massimiliano Gobbi
- G01 - MEASURING TESTING
Information Patent Application
BIDIRECTIONAL VOLTAGE DIFFERENTIATOR CIRCUIT
- Publication number 20160100468
- Publication date Apr 7, 2016
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Yi Jun Duan
- G01 - MEASURING TESTING
Information Patent Application
BIDIRECTIONAL VOLTAGE DIFFERENTIATOR CIRCUIT
- Publication number 20130169188
- Publication date Jul 4, 2013
- STMicroelectronics (Shenzhen) R&D Co. Ltd.
- Yijun Duan
- G01 - MEASURING TESTING
Information Patent Application
PHASE DETECTION APPARATUS FOR ALTERNATOR AND METHOD THEREOF
- Publication number 20120306476
- Publication date Dec 6, 2012
- ACTRON TECHNOLOGY CORPORATION
- Tung-Jung Liu
- G01 - MEASURING TESTING
Information Patent Application
INCREASED RELIABILITY IN THE PROCESSING OF DIGITAL SIGNALS
- Publication number 20100289551
- Publication date Nov 18, 2010
- ABB TECHNOLOGY AG
- Hans Björklund
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL COMPARISON CIRCUIT
- Publication number 20090134913
- Publication date May 28, 2009
- Faraday Technology Corp.
- Wen-Ching Hsiung
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Voltage detector circuit
- Publication number 20080094052
- Publication date Apr 24, 2008
- Koji Shimbayashi
- G01 - MEASURING TESTING
Information Patent Application
Input Circuit
- Publication number 20080036495
- Publication date Feb 14, 2008
- ROHM CO., LTD.
- Takashi Fujimura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Terminator circuit, test apparatus, test head, and communication de...
- Publication number 20070257658
- Publication date Nov 8, 2007
- Advantest Corporation
- Toshiaki Awaji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DETECTOR OF DIFFERENTIAL THRESHOLD VOLTAGE
- Publication number 20070200599
- Publication date Aug 30, 2007
- ATMEL CORPORATION
- Sami Ajram
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and system for detecting a mode of operation of an integrate...
- Publication number 20070182603
- Publication date Aug 9, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G01 - MEASURING TESTING
Information Patent Application
Method and system for detecting a mode of operation of an integrate...
- Publication number 20070164778
- Publication date Jul 19, 2007
- Micron Technology, Inc.
- Kenneth W. Marr
- G01 - MEASURING TESTING
Information Patent Application
Method and system for detecting a mode of operation of an integrate...
- Publication number 20060208758
- Publication date Sep 21, 2006
- Kenneth W. Marr
- G01 - MEASURING TESTING
Information Patent Application
Comparator with offset compensation
- Publication number 20060164125
- Publication date Jul 27, 2006
- Broadcom Corporation
- Jan Mulder
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
High-speed comparator
- Publication number 20060164126
- Publication date Jul 27, 2006
- Broadcom Corporation
- Jan Mulder
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Polarity-insensitive signal detect circuit for use with any signal...
- Publication number 20050194996
- Publication date Sep 8, 2005
- Tim Moran
- G01 - MEASURING TESTING
Information Patent Application
High Speed signal level detector
- Publication number 20050134327
- Publication date Jun 23, 2005
- Jin-sheng Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and system for detecting a mode of operation of an integrate...
- Publication number 20040199841
- Publication date Oct 7, 2004
- Kenneth W. Marr
- G01 - MEASURING TESTING

Logic probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for diagnosing open-circuit fault of power switch...

Detection circuit for an active discharge circuit of an X-capacitor...

Voltage sensing circuit

Devices and methods for automatic thermal bias of transistors in mu...

System for measuring voltage using pulse width modulator or voltage...

Detection circuit for an active discharge circuit of an X-capacitor...

Differential signal measurement system and method

Semiconductor device

Discrete input determining circuit and method

Test and measurement system, differential logic probe, single ended...

Battery status detection method and network device using the same

Detection circuit for an active discharge circuit of an X-capacitor...

Bidirectional voltage differentiator circuit

Bidirectional voltage differentiator circuit

Bidirectional voltage differentiator circuit

Increased reliability in the processing of digital signals

Signal comparison circuit

Detector of differential threshold voltage

Polarity-insensitive signal detect circuit for use with any signal...

Voltage detector circuit

Terminator circuit, test apparatus, test head, and communication de...

Input circuit

High-speed comparator

Comparator with offset compensation

Method and system for detecting a mode of operation of an integrate...

High-speed signal level detector

High speed envelope detector and method

Input buffer and method for voltage level detection

Input buffer and method for voltage level detection

Signal detector with improved noise immunity

Patents Applicationslast 30 patents

VOLTAGE DETECTION APPARATUS AND METHOD FOR DETERMINING WHETHER HIGH...

LiDAR System with Active Fault Monitoring

METHOD AND SYSTEM FOR DIAGNOSING OPEN-CIRCUIT FAULT OF POWER SWITCH...

Devices and Methods for Automatic Thermal Bias of Transistors in Mu...

DETECTION CIRCUIT FOR AN ACTIVE DISCHARGE CIRCUIT OF AN X-CAPACITOR...

DETECTION CIRCUIT FOR AN ACTIVE DISCHARGE CIRCUIT OF AN X-CAPACITOR...

DISCRETE INPUT DETERMINING CIRCUIT AND METHOD

DIFFERENTIAL SIGNAL MEASUREMENT SYSTEM AND METHOD

SEMICONDUCTOR DEVICE

TEST AND MEASUREMENT SYSTEM, DIFFERENTIAL LOGIC PROBE, SINGLE ENDED...

SWITCHING REGULATOR WITH IMPROVED EFFICIENCY AND METHOD THEREOF

BIDIRECTIONAL VOLTAGE DIFFERENTIATOR CIRCUIT

DETECTION CIRCUIT FOR AN ACTIVE DISCHARGE CIRCUIT OF AN X-CAPACITOR...

BIDIRECTIONAL VOLTAGE DIFFERENTIATOR CIRCUIT

BIDIRECTIONAL VOLTAGE DIFFERENTIATOR CIRCUIT

PHASE DETECTION APPARATUS FOR ALTERNATOR AND METHOD THEREOF

INCREASED RELIABILITY IN THE PROCESSING OF DIGITAL SIGNALS

SIGNAL COMPARISON CIRCUIT

Voltage detector circuit

Input Circuit

Terminator circuit, test apparatus, test head, and communication de...

DETECTOR OF DIFFERENTIAL THRESHOLD VOLTAGE

Method and system for detecting a mode of operation of an integrate...

Method and system for detecting a mode of operation of an integrate...

Method and system for detecting a mode of operation of an integrate...

Comparator with offset compensation

High-speed comparator

Polarity-insensitive signal detect circuit for use with any signal...

High Speed signal level detector

Method and system for detecting a mode of operation of an integrate...