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Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength
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Industry
CPC
G03F1/22
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Parent Industries
G
PHYSICS
G03
Photography
G03F
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES
G03F1/00
Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles Mask blanks or pellicles therefor Containers specially adapted therefor Preparation thereof
Current Industry
G03F1/22
Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength
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