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CPC
G01R1/06755

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06755Material aspects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Securing a probe to a device under test
- Patent number 12,055,578
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for high-frequency applications with improved current...
- Patent number 12,044,703
- Issue date Jul 23, 2024
- Technoprobe S.p.A.
- Raffaele Vallauri
- G01 - MEASURING TESTING
Information Patent Grant
Clad wire and method for producing clad wires
- Patent number 12,020,829
- Issue date Jun 25, 2024
- Heraeus Deutschland GmbH & Co. KG
- Marc Rättig
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin having gripping structure
- Patent number 12,000,863
- Issue date Jun 4, 2024
- TSE CO., LTD.
- Seung Bae An
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Ceramic, probe guiding member, probe card, and socket for package i...
- Patent number 11,940,466
- Issue date Mar 26, 2024
- FERROTEC MATERIAL TECHNOLOGIES CORPORATION
- Wataru Yamagishi
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe for process Raman spectroscopy and method of use
- Patent number 11,940,464
- Issue date Mar 26, 2024
- Endress+Hauser Optical Analysis, Inc.
- Carsten Uerpmann
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device
- Patent number 11,828,773
- Issue date Nov 28, 2023
- Kabushiki Kaisha Nihon Micronics
- Akihiro Shuto
- G01 - MEASURING TESTING
Information Patent Grant
Ethylene sensor and method of making same
- Patent number 11,788,998
- Issue date Oct 17, 2023
- KING FAISAL UNIVERSITY
- Nagih Mohammed Shaalan
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pogo pin-free testing device for IC chip test and testing method of...
- Patent number 11,740,260
- Issue date Aug 29, 2023
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation apparatus for semiconductor device
- Patent number 11,709,199
- Issue date Jul 25, 2023
- HITACHI HIGH-TECH CORPORATION
- Tomohisa Ohtaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-frequency data differential testing probe
- Patent number 11,698,390
- Issue date Jul 11, 2023
- Signal Microwave, LLC
- William Rosas
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever-type probe with multiple metallic coatings
- Patent number 11,543,431
- Issue date Jan 3, 2023
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency data differential testing probe
- Patent number 11,543,434
- Issue date Jan 3, 2023
- Signal Microwave, LLC
- William Rosas
- G01 - MEASURING TESTING
Information Patent Grant
Multi-conductor transmission line probe
- Patent number 11,486,898
- Issue date Nov 1, 2022
- FormFactor, Inc.
- Tim Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Contact device for electrical test
- Patent number 11,442,079
- Issue date Sep 13, 2022
- ISC CO., LTD.
- Young Bae Chung
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and electrical connection jig
- Patent number 11,415,599
- Issue date Aug 16, 2022
- Nidec-Read Corporation
- Masami Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Probe member for pogo pin, method of manufacturing the probe member...
- Patent number 11,385,259
- Issue date Jul 12, 2022
- ISC CO., LTD.
- Young Bae Chung
- G01 - MEASURING TESTING
Information Patent Grant
Precipitation-hardening Ag—Pd—Cu—In—B alloy
- Patent number 11,371,119
- Issue date Jun 28, 2022
- Tokuriki Honten Co., Ltd.
- Ryu Shishino
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Silicon probe for millimeter-wave and terahertz measurement and cha...
- Patent number 11,333,682
- Issue date May 17, 2022
- Huawei Technologies Canada Co., Ltd.
- Haotian Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head for testing electronic devices
- Patent number 11,307,222
- Issue date Apr 19, 2022
- Technoprobe S.p.A.
- Fabio Morgana
- G01 - MEASURING TESTING
Information Patent Grant
Functional prober chip
- Patent number 11,280,825
- Issue date Mar 22, 2022
- Xallent LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Platinum-nickel-based alloys, products, and methods of making and u...
- Patent number 11,279,989
- Issue date Mar 22, 2022
- Deringer-Ney, Inc.
- Patrick Bowen
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Shielding for probing system
- Patent number 11,262,400
- Issue date Mar 1, 2022
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Resistive test-probe tips
- Patent number 11,079,408
- Issue date Aug 3, 2021
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and rectangular probe thereof
- Patent number 11,041,883
- Issue date Jun 22, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Chih-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Palladium-based alloys
- Patent number 11,041,228
- Issue date Jun 22, 2021
- Deringer-Ney, Inc.
- Arthur S. Klein
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,016,122
- Issue date May 25, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Interposers having cuts through an insulating substrate
- Patent number 10,962,571
- Issue date Mar 30, 2021
- Texas Instruments Incorporated
- Thiha Shwe
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393368
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...
- Publication number 20240393367
- Publication date Nov 28, 2024
- MPI CORPORATION
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
MEMS PROBE MODULE STRUCTURE
- Publication number 20240377434
- Publication date Nov 14, 2024
- TAIWAN MASK CORPORATION
- SHANG-KUANG WU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETO-OPTIC MAGNETOMETER
- Publication number 20240295616
- Publication date Sep 5, 2024
- Arizona Board of Regents on behalf of The University of Arizona
- Sasaan Showghi
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD FOR FABRICATING THE SAME
- Publication number 20240248118
- Publication date Jul 25, 2024
- LEENO INDUSTRIAL INC.
- Geunsu KIM
- G01 - MEASURING TESTING
Information Patent Application
ALLOY MATERIAL FOR PROBE PINS
- Publication number 20240167125
- Publication date May 23, 2024
- ISHIFUKU METAL INDUSTRY CO., LTD.
- Yasunori EGAWA
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
HIGH-IMPEDANCE DIFFERENTIAL FLEXIBLE PROBE TIP
- Publication number 20240118314
- Publication date Apr 11, 2024
- Tektronix, Inc.
- Julie A. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...
- Publication number 20240110943
- Publication date Apr 4, 2024
- Microfabrica Inc.
- Onnik Yaglioglu
- G01 - MEASURING TESTING
Information Patent Application
Methods of Reinforcing Plated Metal Structures and Independently Mo...
- Publication number 20240094247
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Onnik Yaglioglu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE JOINT AND SPRING PROBE COMPRISING THE SAME
- Publication number 20240085458
- Publication date Mar 14, 2024
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD, PROBE ASSEMBLY AND SPRING PROBE STRUCTURE INCLUDING THE...
- Publication number 20240085455
- Publication date Mar 14, 2024
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240069066
- Publication date Feb 29, 2024
- LEENO INDUSTRIAL INC.
- Woesuk YANG
- G01 - MEASURING TESTING
Information Patent Application
TUNGSTEN WIRE, AND TUNGSTEN WIRE PROCESSING METHOD AND ELECTROLYTIC...
- Publication number 20240052461
- Publication date Feb 15, 2024
- Kabushiki Kaisha Toshiba
- Hitoshi AOYAMA
- B22 - CASTING POWDER METALLURGY
Information Patent Application
PROBE HEAD AND PROBE ASSEMBLY
- Publication number 20240036073
- Publication date Feb 1, 2024
- AZOTH STUDIO LTD. CO.
- Zhou Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM
- Publication number 20240014061
- Publication date Jan 11, 2024
- KIOXIA Corporation
- Tatsuro HITOMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micromachined Mechanical Part and Methods of Fabrication Thereof
- Publication number 20230296645
- Publication date Sep 21, 2023
- THE UNIVERSITY COURT OF THE UNIVERSITY OF GLASGOW
- Thomas McMullen
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PALLADIUM-COPPER-SILVER ALLOY
- Publication number 20230273240
- Publication date Aug 31, 2023
- Heraeus Deutschland GmbH & Co. KG
- Jonas FECHER
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
PROBE PIN HAVING IMPROVED GRIPPING STRUCTURE
- Publication number 20230266361
- Publication date Aug 24, 2023
- TSE CO., LTD.
- Seung Bae AN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME
- Publication number 20230221351
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- BYUNGWOOK CHOI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE FOR PROCESS RAMAN SPECTROSCOPY AND METHOD OF USE
- Publication number 20230194568
- Publication date Jun 22, 2023
- KAISER OPTICAL SYSTEMS INC.
- Carsten Uerpmann
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN-FREE TESTING DEVICE FOR IC CHIP TEST AND TESTING METHOD OF...
- Publication number 20230160925
- Publication date May 25, 2023
- GLOBAL UNICHIP CORPORATION
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE CARD HAVING SAME
- Publication number 20230143340
- Publication date May 11, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...
- Publication number 20230028352
- Publication date Jan 26, 2023
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD FOR FABRICATING THE SAME
- Publication number 20220413008
- Publication date Dec 29, 2022
- LEENO INDUSTRIAL INC.
- Geunsu KIM
- G01 - MEASURING TESTING
Information Patent Application
Cantilever-Type Probe with Multiple Metallic Coatings
- Publication number 20220214375
- Publication date Jul 7, 2022
- KLA Corporation
- Hongshuo Zou
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING DEVICE
- Publication number 20220074971
- Publication date Mar 10, 2022
- Kabushiki Kaisha Nihon Micronics
- Akihiro SHUTO
- G01 - MEASURING TESTING
Information Patent Application
SECURING A PROBE TO A DEVICE UNDER TEST
- Publication number 20220011361
- Publication date Jan 13, 2022
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Multi-Conductor Transmission Line Probe
- Publication number 20210389348
- Publication date Dec 16, 2021
- FormFactor, Inc.
- Tim Lesher
- G01 - MEASURING TESTING

Material aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Securing a probe to a device under test

Contact probe for high-frequency applications with improved current...

Clad wire and method for producing clad wires

Probe pin having gripping structure

Probe head for reduced-pitch applications

Ceramic, probe guiding member, probe card, and socket for package i...

Optical probe for process Raman spectroscopy and method of use

Electrical connecting device

Ethylene sensor and method of making same

Pogo pin-free testing device for IC chip test and testing method of...

Evaluation apparatus for semiconductor device

High-frequency data differential testing probe

Cantilever-type probe with multiple metallic coatings

High-frequency data differential testing probe

Multi-conductor transmission line probe

Contact device for electrical test

Contact probe and relative probe head of an apparatus for testing e...

Contact probe and electrical connection jig

Probe member for pogo pin, method of manufacturing the probe member...

Precipitation-hardening Ag—Pd—Cu—In—B alloy

Silicon probe for millimeter-wave and terahertz measurement and cha...

Contact probe for a testing head for testing electronic devices

Functional prober chip

Platinum-nickel-based alloys, products, and methods of making and u...

Shielding for probing system

Resistive test-probe tips

Probe card device and rectangular probe thereof

Palladium-based alloys

Contact probe and relative probe head of an apparatus for testing e...

Interposers having cuts through an insulating substrate

Patents Applicationslast 30 patents

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

PROBE SYSTEM FOR TESTING OF DEVICES UNDER TEST INTEGRATED ON A SEMI...

MEMS PROBE MODULE STRUCTURE

MAGNETO-OPTIC MAGNETOMETER

TEST SOCKET AND METHOD FOR FABRICATING THE SAME

ALLOY MATERIAL FOR PROBE PINS

HIGH-IMPEDANCE DIFFERENTIAL FLEXIBLE PROBE TIP

METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...

Methods of Reinforcing Plated Metal Structures and Independently Mo...

PROBE JOINT AND SPRING PROBE COMPRISING THE SAME

PROBE HEAD, PROBE ASSEMBLY AND SPRING PROBE STRUCTURE INCLUDING THE...

TEST SOCKET AND METHOD OF MANUFACTURING THE SAME

TUNGSTEN WIRE, AND TUNGSTEN WIRE PROCESSING METHOD AND ELECTROLYTIC...

PROBE HEAD AND PROBE ASSEMBLY

CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM

Micromachined Mechanical Part and Methods of Fabrication Thereof

PALLADIUM-COPPER-SILVER ALLOY

PROBE PIN HAVING IMPROVED GRIPPING STRUCTURE

PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME

OPTICAL PROBE FOR PROCESS RAMAN SPECTROSCOPY AND METHOD OF USE

POGO PIN-FREE TESTING DEVICE FOR IC CHIP TEST AND TESTING METHOD OF...

PROBE HEAD AND PROBE CARD HAVING SAME

CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...

PROBE HEAD FOR REDUCED-PITCH APPLICATIONS

TEST SOCKET AND METHOD FOR FABRICATING THE SAME

Cantilever-Type Probe with Multiple Metallic Coatings

ELECTRICAL CONNECTING DEVICE

SECURING A PROBE TO A DEVICE UNDER TEST

Multi-Conductor Transmission Line Probe