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Measuring optical phase difference Determining degree of coherence Measuring optical wavelength
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Parent Industries
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PHYSICS
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Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
Current Industry
G01J9/00
Measuring optical phase difference Determining degree of coherence Measuring optical wavelength
Sub Industries
G01J9/02
by interferometric methods
G01J9/0215
by shearing interferometric methods
G01J9/0246
Measuring optical wavelength
G01J9/04
by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
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Patents Grants
last 30 patents
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Patent Grant
Device and method for measuring wavelength for laser device
Patent number
11,971,307
Issue date
Apr 30, 2024
Beijing RSLaserOpto-Electronics Technology Co. Ltd
Guangyi Liu
G01 - MEASURING TESTING
Information
Patent Grant
Blocking element of short wavelengths in LED-type light sources
Patent number
11,960,109
Issue date
Apr 16, 2024
Universidad Complutense de Madrid
Celia Sanchez Ramos
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Wavefront sensors and wavefront shape determination using related i...
Patent number
11,953,381
Issue date
Apr 9, 2024
UNIVERSITE DE PARIS
Marc Guillon
G01 - MEASURING TESTING
Information
Patent Grant
Microscope for quantitative wavefront measurements, microscope modu...
Patent number
11,933,676
Issue date
Mar 19, 2024
Universitat de Valencia
Manuel Martínez Corral
G02 - OPTICS
Information
Patent Grant
Interferometer and optical instrument with integrated optical compo...
Patent number
11,933,609
Issue date
Mar 19, 2024
Yokogawa Electric Corporation
Nobuhide Yamada
G01 - MEASURING TESTING
Information
Patent Grant
System and method for increasing coherence length in lidar systems
Patent number
11,927,698
Issue date
Mar 12, 2024
Aeva, Inc.
Richard L. Sebastian
G01 - MEASURING TESTING
Information
Patent Grant
Liquid crystal phase modulation device
Patent number
11,927,863
Issue date
Mar 12, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Benoît Racine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for and method of sensing alignment marks
Patent number
11,899,380
Issue date
Feb 13, 2024
ASML Holding N.V.
Krishanu Shome
G01 - MEASURING TESTING
Information
Patent Grant
Atmospheric characterization systems and methods
Patent number
11,879,981
Issue date
Jan 23, 2024
BLUEHALO, LLC
Levi Judah Smolin
G01 - MEASURING TESTING
Information
Patent Grant
Wavefront sensor and method of reconstructing distorted wavefronts
Patent number
11,874,178
Issue date
Jan 16, 2024
King Abdullah University of Science and Technology
Congli Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Decoherence processing method and system, and coherent light receiv...
Patent number
11,867,565
Issue date
Jan 9, 2024
Ningbo ABAX Sensing Electronic Technology Co., Ltd.
Shuyu Lei
G01 - MEASURING TESTING
Information
Patent Grant
Determination of measurement error in an etalon
Patent number
11,860,036
Issue date
Jan 2, 2024
Cymer, LLC
Russell Allen Burdt
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring phase of extreme ultraviolet (EU...
Patent number
11,852,583
Issue date
Dec 26, 2023
Samsung Electronics Co., Ltd.
Jongju Park
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for detecting absolute or relative temperature an...
Patent number
11,846,559
Issue date
Dec 19, 2023
Adtran Networks SE
Benjamin Wohlfeil
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System, method and apparatus for high speed non-mechanical atmosphe...
Patent number
11,835,839
Issue date
Dec 5, 2023
EXCITING TECHNOLOGY LLC
Paul F. McManamon
G02 - OPTICS
Information
Patent Grant
Wavefront sensor and associated metrology apparatus
Patent number
11,815,402
Issue date
Nov 14, 2023
ASML Netherlands B.V.
Sietse Thijmen Van Der Post
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Quantitative phase image generating method, quantitative phase imag...
Patent number
11,808,929
Issue date
Nov 7, 2023
Nikon Corporation
Shota Tsuchida
G01 - MEASURING TESTING
Information
Patent Grant
Phase-sensitive compressed ultrafast photography systems and methods
Patent number
11,792,381
Issue date
Oct 17, 2023
California Institute of Technology
Lihong Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Color wheel phase detection method and system, and projection device
Patent number
11,781,915
Issue date
Oct 10, 2023
Appotronics Corporation Limited
Zhengde Zhang
G01 - MEASURING TESTING
Information
Patent Grant
System for inspecting surfaces of an optical wave using a graduated...
Patent number
11,754,449
Issue date
Sep 12, 2023
Centre National de la Recherche Scientifique
François Henault
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength checker
Patent number
11,747,557
Issue date
Sep 5, 2023
Nippon Telegraph and Telephone Corporation
Takuya Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer system, method of determining a mode hop of a laser...
Patent number
11,719,529
Issue date
Aug 8, 2023
ASML Netherlands B.V.
Maarten Jozef Jansen
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for detecting wavefront error by modal-based opti...
Patent number
11,709,111
Issue date
Jul 25, 2023
Zhejiang University
Jian Bai
G01 - MEASURING TESTING
Information
Patent Grant
High bandwidth quantum random number generator
Patent number
11,709,657
Issue date
Jul 25, 2023
Kabushiki Kaisha Toshiba
Taofiq Paraiso
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reducing speckle in an excimer light source
Patent number
11,686,951
Issue date
Jun 27, 2023
Cymer, LLC
Wilhelmus Patrick Elisabeth Maria op 't Root
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Refractive scanning interferometer
Patent number
11,668,603
Issue date
Jun 6, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Grant
High precision optical locker
Patent number
11,662,508
Issue date
May 30, 2023
Lumentum Operations LLC
Adrian Perrin Janssen
G01 - MEASURING TESTING
Information
Patent Grant
Optical deflector parameter measurement device, method, and program
Patent number
11,656,073
Issue date
May 23, 2023
Nippon Telegraph and Telephone Corporation
Masahiro Ueno
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring phase of extreme ultraviolet (EU...
Patent number
11,635,371
Issue date
Apr 25, 2023
Samsung Electronics Co., Ltd.
Jongju Park
G01 - MEASURING TESTING
Information
Patent Grant
Blocking element of short wavelengths in LED-type light sources
Patent number
11,635,556
Issue date
Apr 25, 2023
Universidad Complutense de Madrid
Celia Sanchez Ramos
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Patents Applications
last 30 patents
Information
Patent Application
WAVEFRONT SENSORS WITH IRREGULAR APERTURE MASKS, DIFFUSERS, AND CAM...
Publication number
20240102865
Publication date
Mar 28, 2024
Quartus Engineering Incorporated
Peter Pilarz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Device for Detecting Absolute or Relative Temperature an...
Publication number
20240085267
Publication date
Mar 14, 2024
Adtran Networks SE
Benjamin Wohlfeil
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR EXTRACTING INFORMATION ON THE SPATIAL DISTRIB...
Publication number
20240040246
Publication date
Feb 1, 2024
Wooptix S.L.
Ricardo Oliva Garcia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR EXPANDING THE DYNAMIC RANGE OF MACH-ZEHNDER S...
Publication number
20240019310
Publication date
Jan 18, 2024
Shanghai Haina Data Technology Company Ltd.
Rui YIN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES AND METHODS FOR EXAMINING THE MOVEMENT OF CONSTITUENTS...
Publication number
20240011903
Publication date
Jan 11, 2024
PURDUE RESEARCH FOUNDATION
David D. NOLTE
G01 - MEASURING TESTING
Information
Patent Application
PHASE DETECTION TECHNIQUES FOR HALF-SHIELD PHASE-DETECT SENSORS
Publication number
20240003748
Publication date
Jan 4, 2024
ADVANCED MICRO DEVICES, INC.
Wei-Chih Hung
G02 - OPTICS
Information
Patent Application
QUANTITATIVE PHASE IMAGE GENERATING METHOD, QUANTITATIVE PHASE IMAG...
Publication number
20240004176
Publication date
Jan 4, 2024
Nikon Corporation
Shota TSUCHIDA
G02 - OPTICS
Information
Patent Application
OPTICAL-BASED FIRE DETECTION SYSTEMS AND METHODS
Publication number
20230400356
Publication date
Dec 14, 2023
The Boeing Company
Philipp A. Boettcher
G08 - SIGNALLING
Information
Patent Application
OPTICAL TRANSMITTER
Publication number
20230384514
Publication date
Nov 30, 2023
ROCKLEY PHOTONICS LIMITED
Yi Ho LEE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE WITH UNIVERSAL METASURFACE AND OPTICAL M...
Publication number
20230384152
Publication date
Nov 30, 2023
Korea Advanced Institute of Science and Technology
Jonghwa SHIN
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE SCANNING INTERFEROMETER
Publication number
20230375409
Publication date
Nov 23, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Application
MULTIBEAM 3-D FOCUS GENERATOR
Publication number
20230367134
Publication date
Nov 16, 2023
Carl Zeiss SMT GMBH
Markus Seesselberg
G01 - MEASURING TESTING
Information
Patent Application
PHASE SHIFT MEASURING DEVICE AND PHASE SHIFT MEASURING METHOD
Publication number
20230366741
Publication date
Nov 16, 2023
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Il Min LEE
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Gradient Interferometrically Locked Laser Source
Publication number
20230352899
Publication date
Nov 2, 2023
Nutronics, Inc.
Jeffrey D. Barchers
G02 - OPTICS
Information
Patent Application
LASER SOURCE, LIDAR SYSTEM AND METHOD FOR CONTROLLING A LASER SOURCE
Publication number
20230327402
Publication date
Oct 12, 2023
ams-OSRAM International GmbH
Hubert HALBRITTER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER...
Publication number
20230324164
Publication date
Oct 12, 2023
ASML NETHERLANDS B.V.
Maarten Jozef JANSEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Optical Sensor Module Including an Interferometric Sensor and Exten...
Publication number
20230314185
Publication date
Oct 5, 2023
Apple Inc.
Tong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM FOR INSPECTING SURFACES OF AN OPTICAL WAVE USING A GRADIENT...
Publication number
20230296813
Publication date
Sep 21, 2023
Centre National de la Recherche Scientifique
François HENAULT
G01 - MEASURING TESTING
Information
Patent Application
RECONSTRUCTION OF A WAVEFRONT OF A LIGHT BEAM CONTAINING OPTICAL VO...
Publication number
20230296444
Publication date
Sep 21, 2023
UNIVERSITÉ PARIS CITÉ
Marc GUILLON
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, LITHOGRAPHY APPARATUS AN...
Publication number
20230273011
Publication date
Aug 31, 2023
Canon Kabushiki Kaisha
Wataru Yamaguchi
G02 - OPTICS
Information
Patent Application
SYSTEM, METHOD AND APPARATUS FOR HIGH SPEED NON-MECHANICAL ATMOSPHE...
Publication number
20230259000
Publication date
Aug 17, 2023
Exciting Technology LLC
Paul F. McManamon
G02 - OPTICS
Information
Patent Application
REFLECTIVE HOLOGRAPHIC PHASE MASKS
Publication number
20230236494
Publication date
Jul 27, 2023
University of Central Florida Research Foundation, Inc.
Ivan Divliansky
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING PHASE OF EXTREME ULTRAVIOLET (EU...
Publication number
20230236124
Publication date
Jul 27, 2023
Samsung Electronics Co., Ltd.
Jongju Park
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR OPERATING OPTICAL WAVEMETER AND WAVEMETER...
Publication number
20230204430
Publication date
Jun 29, 2023
Huawei Technologies Canada Co., Ltd.
Trevor James HALL
G01 - MEASURING TESTING
Information
Patent Application
LIQUID CRYSTAL PHASE MODULATION DEVICE
Publication number
20230194944
Publication date
Jun 22, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Benoît RACINE
G01 - MEASURING TESTING
Information
Patent Application
Determining a Radiation Intensity and/or a Wavelength of Process Li...
Publication number
20230182233
Publication date
Jun 15, 2023
SIEMENS AKTIENGESELLSCHAFT
Frank Heinrichsdorff
B22 - CASTING POWDER METALLURGY
Information
Patent Application
Conformal imaging vibrometer using adaptive optics with scene-based...
Publication number
20230175893
Publication date
Jun 8, 2023
David Mort Pepper
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DIGITAL OPTICAL ABERRATION CORRECTION AND SPE...
Publication number
20230177655
Publication date
Jun 8, 2023
PXE COMPUTATIONAL IMAGING LTD
Yoav Berlatzky
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ACHROMATIC AND POLARIZATION ADAPTIVE OPTICS SYSTEM
Publication number
20230160752
Publication date
May 25, 2023
Arizona Board of Regents on behalf of The University of Arizona
Stanley Pau
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND OPTICAL SYSTEM FOR CHARACTERIZING DISPLAYS
Publication number
20230152162
Publication date
May 18, 2023
Wooptix S.L.
David CARMONA BALLESTER
H04 - ELECTRIC COMMUNICATION TECHNIQUE