multiple-sample chamber, multiplicity of materials

Industry

CPC
G01N2223/64

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/64multiple-sample chamber, multiplicity of materials

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Detection method, apparatus and system
- Patent number 12,326,408
- Issue date Jun 10, 2025
- Nuctech Company Limited
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting quality of tire member
- Patent number 12,325,202
- Issue date Jun 10, 2025
- The Yokohama Rubber Co., Ltd.
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Systems and methods for analyzing core using x-ray fluorescence
- Patent number 12,325,345
- Issue date Jun 10, 2025
- Veracio Ltd.
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Calibration sample set and method for li-ion battery gauging systems
- Patent number 12,320,762
- Issue date Jun 3, 2025
- Thermo Fisher Scientific Messtechnik GmbH
- Alexander Britting
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,311,236
- Issue date May 27, 2025
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
X-ray inspection apparatus and X-ray inspection method
- Patent number 12,313,572
- Issue date May 27, 2025
- Anritsu Corporation
- Masaru Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for defects detection and classification using...
- Patent number 12,307,668
- Issue date May 20, 2025
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus and article handling system
- Patent number 12,292,392
- Issue date May 6, 2025
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Article inspection verification system
- Patent number 12,287,347
- Issue date Apr 29, 2025
- Anritsu Corporation
- Eiji Asai
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Foreign matter inspection device
- Patent number 12,276,623
- Issue date Apr 15, 2025
- Hamamatsu Photonics K.K.
- Kunihiko Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device with integrated x-ray and weighing device
- Patent number 12,209,976
- Issue date Jan 28, 2025
- Wipotec GmbH
- Theo Düppre
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System and method for inspecting fused plastic pipes
- Patent number 12,203,873
- Issue date Jan 21, 2025
- WorldWide Nondestructive Testing, Inc.
- Kevin P. Bohne
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Performance evaluation method for elastic material
- Patent number 12,203,904
- Issue date Jan 21, 2025
- Sumitomo Rubber Industries, Ltd.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Structure information acquisition method and structure information...
- Patent number 12,196,690
- Issue date Jan 14, 2025
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluation device
- Patent number 12,188,885
- Issue date Jan 7, 2025
- Kioxia Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Disinfection apparatus for transport containers of an inspection ar...
- Patent number 12,178,932
- Issue date Dec 31, 2024
- Smiths Detection Germany GmbH
- Gregor Hess
- G01 - MEASURING TESTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Quality control method for a cable specimen
- Publication number 20250172505
- Publication date May 29, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
Digitally Addressable Sample Irradiator
- Publication number 20250172508
- Publication date May 29, 2025
- Stellarray, Incorporated
- Mark Eaton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250172510
- Publication date May 29, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPI...
- Publication number 20250164417
- Publication date May 22, 2025
- Kabushiki Kaisha Toshiba
- Akira TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20250162487
- Publication date May 22, 2025
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
Methods And Systems For Spectral Measurements Based On Perturbed Sp...
- Publication number 20250164411
- Publication date May 22, 2025
- KLA Corporation
- William McGahan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENT SCREEN, X-RAY DETECTOR, AND X-RAY INSPECTION DEVI...
- Publication number 20250164651
- Publication date May 22, 2025
- Kabushiki Kaisha Toshiba
- Eiji OYAIZU
- G01 - MEASURING TESTING
Information Patent Application
RAIL DIAGNOSTIC INSPECTION APPARATUS
- Publication number 20250155383
- Publication date May 15, 2025
- TESMEC S.P.A.
- Silvestro Di Gioia
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137944
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20250137947
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ken GOTO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...
- Publication number 20250130181
- Publication date Apr 24, 2025
- Canon Kabushiki Kaisha
- NAOTO SHIBATA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250123222
- Publication date Apr 17, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20250116616
- Publication date Apr 10, 2025
- Anritsu Corporation
- Takashi KANAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER
- Publication number 20250108548
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
- Publication number 20250108576
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
- Publication number 20250105378
- Publication date Mar 27, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Sup KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME...
- Publication number 20250079030
- Publication date Mar 6, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD
- Publication number 20250052702
- Publication date Feb 13, 2025
- HÖRMANN KLATT CONVEYORS GMBH
- Peter Klatt
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
RADIATION INSPECTION SYSTEM
- Publication number 20250035568
- Publication date Jan 30, 2025
- Nuctech Company Limited
- Qiangqiang WANG
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD
- Publication number 20250027890
- Publication date Jan 23, 2025
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...
- Publication number 20250028253
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- YEN-FONG CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...
- Publication number 20250020600
- Publication date Jan 16, 2025
- GENERAL ELECTRIC COMPANY
- Mohamed Rahmane
- G01 - MEASURING TESTING
Information Patent Application
Substrate Alloy Influence Compensation
- Publication number 20250003897
- Publication date Jan 2, 2025
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander Britting
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...
- Publication number 20240410840
- Publication date Dec 12, 2024
- NewSouth Innovations Pty Limited
- Patrick BURR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING

multiple-sample chamber, multiplicity of materials

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detection method, apparatus and system

Method and system for inspecting quality of tire member

Systems and methods for analyzing core using x-ray fluorescence

Calibration sample set and method for li-ion battery gauging systems

Method and system utilizing imaging analysis for golf balls

X-ray inspection apparatus and X-ray inspection method

Methods and systems for defects detection and classification using...

Customizable axes of rotation for industrial radiography systems

X-ray inspection apparatus and article handling system

Article inspection verification system

Characterizing and measuring in small boxes using XPS with multiple...

Foreign matter inspection device

Material detection in X-ray security screening

Handheld inspection device and method of inspecting an infrastructu...

Inspection apparatus and inspection method

X-ray inspection apparatus

Inspection system for quality analysis of a product to be inspected

Inspection device with integrated x-ray and weighing device

System and method for inspecting fused plastic pipes

Performance evaluation method for elastic material

Method for measuring distribution of pores in electrode for seconda...

Structure information acquisition method and structure information...

Method and system for inspecting a structure across a cover layer c...

Spent or decommissioned accumulator treatment plant and process

Method and device for controlling output beam of ray machine in ima...

Evaluation device

System and method for inspecting defects of structure by using X-ray

Disinfection apparatus for transport containers of an inspection ar...

Utilize machine learning in selecting high quality averaged SEM ima...

Apparatus to operate a quality control in industrial production lin...

Patents Applicationslast 30 patents

Quality control method for a cable specimen

Digitally Addressable Sample Irradiator

X-RAY INSPECTION APPARATUS

ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPI...

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

Methods And Systems For Spectral Measurements Based On Perturbed Sp...

X-RAY FLUORESCENT SCREEN, X-RAY DETECTOR, AND X-RAY INSPECTION DEVI...

RAIL DIAGNOSTIC INSPECTION APPARATUS

X-RAY INSPECTION APPARATUS

X-RAY ANALYSIS APPARATUS

RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...

X-RAY INSPECTION APPARATUS

ARTICLE INSPECTION APPARATUS

METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER

METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER

Stack Cell for Easy Confirmation of Separator Folding, Separator In...

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME...

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

RADIATION INSPECTION SYSTEM

OBSERVATION DEVICE, AND CROSS-SECTIONAL IMAGE ACQUISITION METHOD

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR STRUCTURE AND METHOD...

APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...

Substrate Alloy Influence Compensation

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN