multiple-sample chamber, multiplicity of materials

Industry

CPC
G01N2223/64

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/64multiple-sample chamber, multiplicity of materials

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Structure information acquisition method and structure information...
- Patent number 12,196,690
- Issue date Jan 14, 2025
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluation device
- Patent number 12,188,885
- Issue date Jan 7, 2025
- Kioxia Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Disinfection apparatus for transport containers of an inspection ar...
- Patent number 12,178,932
- Issue date Dec 31, 2024
- Smiths Detection Germany GmbH
- Gregor Hess
- G01 - MEASURING TESTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system, determination processing apparatus, and inspecti...
- Patent number 12,105,033
- Issue date Oct 1, 2024
- JGC CORPORATION
- Teruaki Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radio-opaque fillers in multiple layers of golf balls
- Patent number 12,090,371
- Issue date Sep 17, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- G01 - MEASURING TESTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 12,056,840
- Issue date Aug 6, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and associated apparatus
- Patent number 12,038,394
- Issue date Jul 16, 2024
- E M & I (Maritime) Limited
- Daniel Constantinis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,023,555
- Issue date Jul 2, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Correction method, correction apparatus, radiography system, and co...
- Patent number 12,025,574
- Issue date Jul 2, 2024
- FUJIFILM Corporation
- Kengo Nomura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Material detection in x-ray security screening
- Patent number 12,019,035
- Issue date Jun 25, 2024
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-scale inspection and intelligent diagnosis system and method...
- Patent number 12,013,485
- Issue date Jun 18, 2024
- Shandong University
- Shucai Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device
- Patent number 12,013,351
- Issue date Jun 18, 2024
- ISHIDA CO., LTD.
- Ryota Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
X-ray unit technology modules and automated application training
- Patent number 11,988,617
- Issue date May 21, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method to use artificial intelligence to enhance visual inspection...
- Patent number 11,988,630
- Issue date May 21, 2024
- Robert Bosch GmbH
- Craig Magera
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Live flaw detection system for multi-bundled conductor splicing sle...
- Patent number 11,959,866
- Issue date Apr 16, 2024
- STATE GRID HUNAN ELECTRIC COMPANY LIMITED
- Dehua Zou
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...
- Publication number 20250020600
- Publication date Jan 16, 2025
- GENERAL ELECTRIC COMPANY
- Mohamed Rahmane
- G01 - MEASURING TESTING
Information Patent Application
Substrate Alloy Influence Compensation
- Publication number 20250003897
- Publication date Jan 2, 2025
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander Britting
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...
- Publication number 20240410840
- Publication date Dec 12, 2024
- NewSouth Innovations Pty Limited
- Patrick BURR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
- Publication number 20240385126
- Publication date Nov 21, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...
- Publication number 20240387448
- Publication date Nov 21, 2024
- TOKYO ELECTRON LIMITED
- Francisco MACHUCA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FEEDING DEVICE FOR AN X-RAY INSPECTION DEVICE
- Publication number 20240369501
- Publication date Nov 7, 2024
- WIPOTEC GmbH
- Sebastian MORSCH
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL AND ELECTRODE DEFECT DETECTION METHOD
- Publication number 20240354932
- Publication date Oct 24, 2024
- LG ELECTRONICS INC.
- Duho LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
- Publication number 20240328964
- Publication date Oct 3, 2024
- Anritsu Corporation
- Itaru MIYAZAKI
- G01 - MEASURING TESTING
Information Patent Application
Process and device for the spatially resolved localization of defec...
- Publication number 20240328973
- Publication date Oct 3, 2024
- Sri Ranjini ARUMUGAM
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240319118
- Publication date Sep 26, 2024
- ISHIDA CO., LTD.
- Kota TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319112
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Bicheng LIU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240310305
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240310304
- Publication date Sep 19, 2024
- TSINGHUA UNIVERSITY
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...
- Publication number 20240310301
- Publication date Sep 19, 2024
- Ishida Co., Ltd.
- Keisuke YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...
- Publication number 20240302305
- Publication date Sep 12, 2024
- Sumitomo Electric Industries, Ltd.
- Yutaka HOSHINA
- G01 - MEASURING TESTING
Information Patent Application
Material Detection in X-Ray Security Screening
- Publication number 20240302300
- Publication date Sep 12, 2024
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
- Publication number 20240295508
- Publication date Sep 5, 2024
- The Boeing Company
- Nicholas C. Reasoner
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240295509
- Publication date Sep 5, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING

multiple-sample chamber, multiplicity of materials

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring distribution of pores in electrode for seconda...

Structure information acquisition method and structure information...

Method and system for inspecting a structure across a cover layer c...

Spent or decommissioned accumulator treatment plant and process

Method and device for controlling output beam of ray machine in ima...

Evaluation device

System and method for inspecting defects of structure by using X-ray

Disinfection apparatus for transport containers of an inspection ar...

Utilize machine learning in selecting high quality averaged SEM ima...

Apparatus to operate a quality control in industrial production lin...

System, method, and apparatus for x-ray backscatter inspection of p...

System for estimating the occurrence of defects, and computer-reada...

Inspection system, determination processing apparatus, and inspecti...

Radio-opaque fillers in multiple layers of golf balls

Estimating heights of defects in a wafer by scaling a 3D model usin...

Methods and systems for generating three-dimensional images that en...

X-ray automated calibration and monitoring

Inspection method and associated apparatus

Method and system utilizing imaging analysis for golf balls

Correction method, correction apparatus, radiography system, and co...

Material detection in x-ray security screening

Multi-scale inspection and intelligent diagnosis system and method...

Inspection device

Sample holder, system and method

X-ray unit technology modules and automated application training

Characterizing and measuring in small boxes using XPS with multiple...

Method to use artificial intelligence to enhance visual inspection...

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Live flaw detection system for multi-bundled conductor splicing sle...

Patents Applicationslast 30 patents

APPARATUSES, SYSTEMS, AND METHODS FOR THREE-DIMENSIONAL, IN-SITU IN...

Substrate Alloy Influence Compensation

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

Methods and Systems for Generating Three-Dimensional Images that En...

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME

ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

FEEDING DEVICE FOR AN X-RAY INSPECTION DEVICE

INSPECTION APPARATUS AND INSPECTION METHOD

RAY SCANNING APPARATUS

INSPECTION SYSTEM AND INSPECTION METHOD

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

TERMINAL AND ELECTRODE DEFECT DETECTION METHOD

INSPECTION SYSTEM AND METHOD

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM

Process and device for the spatially resolved localization of defec...

X-RAY INSPECTION APPARATUS

INSPECTION SYSTEM AND METHOD

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...

DATA ANALYSIS DEVICE, DATA ANALYIS METHOD, PROGRAM, AND RECORDING M...

Material Detection in X-Ray Security Screening

METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS