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CPC
G01N2223/643

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/643object on conveyor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device with integrated x-ray and weighing device
- Patent number 12,209,976
- Issue date Jan 28, 2025
- Wipotec GmbH
- Theo Düppre
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and device for controlling output beam of ray machine in ima...
- Patent number 12,188,882
- Issue date Jan 7, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Disinfection apparatus for transport containers of an inspection ar...
- Patent number 12,178,932
- Issue date Dec 31, 2024
- Smiths Detection Germany GmbH
- Gregor Hess
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to operate a quality control in industrial production lin...
- Patent number 12,181,429
- Issue date Dec 31, 2024
- DE.TEC.TOR S.r.l.
- Giuseppe Pitta'
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 12,056,840
- Issue date Aug 6, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in x-ray security screening
- Patent number 12,019,035
- Issue date Jun 25, 2024
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray unit technology modules and automated application training
- Patent number 11,988,617
- Issue date May 21, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection device, packaging machine, and package inspection method
- Patent number 11,933,742
- Issue date Mar 19, 2024
- CKD Corporation
- Takamasa Ohtani
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Static CT detection device
- Patent number 11,925,183
- Issue date Mar 12, 2024
- Tsinghua University
- Zhiqiang Chen
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray and metal detectable thermoset composites for use in food and...
- Patent number 11,920,029
- Issue date Mar 5, 2024
- Molded Fiber Glass Companies
- Routian Gao
- B32 - LAYERED PRODUCTS
Information Patent Grant
Multi-channel static CT device
- Patent number 11,906,447
- Issue date Feb 20, 2024
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting surface and surface inspection apparatus
- Patent number 11,906,446
- Issue date Feb 20, 2024
- Honda Motor Co., Ltd.
- Sanshiro Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analysing and/or sorting scrap metal
- Patent number 11,904,362
- Issue date Feb 20, 2024
- Hydro Aluminium Recycling Deutschland GmbH
- Ronald Gillner
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Calibration method and device therefor
- Patent number 11,885,752
- Issue date Jan 30, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scanning systems and related methods
- Patent number 11,807,466
- Issue date Nov 7, 2023
- IDSS Holdings, Inc.
- James Michael Connelly
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Tray inserts and image quality, systems, methods and algorithms for...
- Patent number 11,734,816
- Issue date Aug 22, 2023
- Battelle Memorial Institute
- Joseph Matthew Cochran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inline x-ray measurement apparatus and method
- Patent number 11,714,054
- Issue date Aug 1, 2023
- Illinois Tool Works Inc.
- Mark B. Kirschenman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Conveyor system and measuring device for determining water content...
- Patent number 11,714,053
- Issue date Aug 1, 2023
- Troxler Electronic Laboratories, Inc.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
X-ray scanning system and method
- Patent number 11,656,188
- Issue date May 23, 2023
- United Parcel Service of America, Inc.
- Wendie Patricia Hayler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample inspection system
- Patent number 11,624,717
- Issue date Apr 11, 2023
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
CT scanner and method for performing a CT examination of an object
- Patent number 11,609,189
- Issue date Mar 21, 2023
- BIOMETIC S.R.L.
- Thomas Prenn
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
X-ray inspection device
- Patent number 11,598,729
- Issue date Mar 7, 2023
- ISHIDA CO., LTD.
- Kazuyuki Sugimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD
- Publication number 20250052702
- Publication date Feb 13, 2025
- HÖRMANN KLATT CONVEYORS GMBH
- Peter Klatt
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
RADIATION INSPECTION SYSTEM
- Publication number 20250035568
- Publication date Jan 30, 2025
- Nuctech Company Limited
- Qiangqiang WANG
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FEEDING DEVICE FOR AN X-RAY INSPECTION DEVICE
- Publication number 20240369501
- Publication date Nov 7, 2024
- WIPOTEC GmbH
- Sebastian MORSCH
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
- Publication number 20240328964
- Publication date Oct 3, 2024
- Anritsu Corporation
- Itaru MIYAZAKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240319118
- Publication date Sep 26, 2024
- ISHIDA CO., LTD.
- Kota TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240310305
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240310304
- Publication date Sep 19, 2024
- TSINGHUA UNIVERSITY
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...
- Publication number 20240310301
- Publication date Sep 19, 2024
- Ishida Co., Ltd.
- Keisuke YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
Material Detection in X-Ray Security Screening
- Publication number 20240302300
- Publication date Sep 12, 2024
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems And Methods For Analyzing Core Using X-Ray Fluorescence
- Publication number 20240286541
- Publication date Aug 29, 2024
- Veracio Ltd
- Peter Kanck
- B60 - VEHICLES IN GENERAL
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240288592
- Publication date Aug 29, 2024
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
A METHOD AND SYSTEM FOR PERFORMING CHARACTERIZATION OF ONE OR MORE...
- Publication number 20240273905
- Publication date Aug 15, 2024
- VITO NV
- Roeland GEURTS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION
- Publication number 20240228181
- Publication date Jul 11, 2024
- Sortera Technologies Inc.
- Lakshmi Chellappan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20240219324
- Publication date Jul 4, 2024
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240219325
- Publication date Jul 4, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT
- Publication number 20240210333
- Publication date Jun 27, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION
- Publication number 20240133830
- Publication date Apr 25, 2024
- Sortera Technologies Inc.
- Lakshmi Chellappan
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE INSPECTION SYSTEM
- Publication number 20240114913
- Publication date Apr 11, 2024
- Anritsu Corporation
- Eiji ASAI
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Application
RAPID X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD
- Publication number 20240102944
- Publication date Mar 28, 2024
- JST POWER EQUIPMENT, INC.
- Haoning Liang
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING PHYSICAL PROPERTIES OF ITEMS INPUT TO AN X-RAY SCANNER...
- Publication number 20240102948
- Publication date Mar 28, 2024
- Analogic Corporation
- Steven Urchuk
- G01 - MEASURING TESTING

object on conveyor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inspection device with integrated x-ray and weighing device

Spent or decommissioned accumulator treatment plant and process

Method and device for controlling output beam of ray machine in ima...

Disinfection apparatus for transport containers of an inspection ar...

Apparatus to operate a quality control in industrial production lin...

Methods and systems for generating three-dimensional images that en...

X-ray automated calibration and monitoring

Material detection in x-ray security screening

X-ray unit technology modules and automated application training

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection device, packaging machine, and package inspection method

Inspection apparatus and inspection method

Static CT detection device

Inspection apparatus and inspection method

X-ray and metal detectable thermoset composites for use in food and...

Multi-channel static CT device

Method of inspecting surface and surface inspection apparatus

Method and device for analysing and/or sorting scrap metal

Calibration method and device therefor

X-ray collimator and related X-ray inspection apparatus

Scanning systems and related methods

Tray inserts and image quality, systems, methods and algorithms for...

Inline x-ray measurement apparatus and method

Conveyor system and measuring device for determining water content...

X-ray scanning system and method

Sample inspection system

CT scanner and method for performing a CT examination of an object

X-ray inspection device

Patents Applicationslast 30 patents

SECURITY INSPECTION SYSTEM AND SECURITY INSPECTION METHOD

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

RADIATION INSPECTION SYSTEM

Methods and Systems for Generating Three-Dimensional Images that En...

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

FEEDING DEVICE FOR AN X-RAY INSPECTION DEVICE

INSPECTION APPARATUS AND INSPECTION METHOD

RAY SCANNING APPARATUS

INSPECTION SYSTEM AND INSPECTION METHOD

INSPECTION SYSTEM AND METHOD

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM

X-RAY INSPECTION APPARATUS

INSPECTION SYSTEM AND METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...

Material Detection in X-Ray Security Screening

Systems And Methods For Analyzing Core Using X-Ray Fluorescence

X-RAY INSPECTION APPARATUS

A METHOD AND SYSTEM FOR PERFORMING CHARACTERIZATION OF ONE OR MORE...

CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION

X-RAY INSPECTION DEVICE

INSPECTION SYSTEM AND INSPECTION METHOD

RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

Calibration Method and Device Therefor

CORRECTION TECHNIQUES FOR MATERIAL CLASSIFICATION

ARTICLE INSPECTION SYSTEM

RAPID X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD

DETERMINING PHYSICAL PROPERTIES OF ITEMS INPUT TO AN X-RAY SCANNER...