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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating materials by wave or particle radiation
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G01N2223/3308
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
Patent number
12,099,025
Issue date
Sep 24, 2024
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Rotational X-ray inspection system and method
Patent number
12,061,156
Issue date
Aug 13, 2024
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
X-ray automated calibration and monitoring
Patent number
12,044,634
Issue date
Jul 23, 2024
John Bean Technologies Corporation
Jeffrey C. Gill
G01 - MEASURING TESTING
Information
Patent Grant
Material detection in x-ray security screening
Patent number
12,019,035
Issue date
Jun 25, 2024
Rapiscan Holdings, Inc.
Simon Archambault
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray unit technology modules and automated application training
Patent number
11,988,617
Issue date
May 21, 2024
John Bean Technologies Corporation
Jeffrey C. Gill
G01 - MEASURING TESTING
Information
Patent Grant
Static CT detection device
Patent number
11,925,183
Issue date
Mar 12, 2024
Tsinghua University
Zhiqiang Chen
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Multi-channel static CT device
Patent number
11,906,447
Issue date
Feb 20, 2024
Nuctech Company Limited
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method and device therefor
Patent number
11,885,752
Issue date
Jan 30, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Grant
X-ray collimator and related X-ray inspection apparatus
Patent number
11,854,712
Issue date
Dec 26, 2023
DUE2LAB S.R.L.
Nicola Zambelli
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Detection system for X-ray inspection of an object
Patent number
11,817,231
Issue date
Nov 14, 2023
Carl Zeiss SMT GmbH
Johannes Ruoff
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
Real-time inline digital tomosynthesis system
Patent number
11,774,377
Issue date
Oct 3, 2023
JPI Healthcare CO., LTD.
Kyong-Woo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Tray inserts and image quality, systems, methods and algorithms for...
Patent number
11,734,816
Issue date
Aug 22, 2023
Battelle Memorial Institute
Joseph Matthew Cochran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
Patent number
11,703,465
Issue date
Jul 18, 2023
Kioxia Corporation
Nobuhito Kuge
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam detection apparatus for semiconductor device and elec...
Patent number
11,703,467
Issue date
Jul 18, 2023
ZHONGKE JINGYUAN ELECTRON LIMITED, BEIJING
Lei Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device, inspection method, and method for producing obje...
Patent number
11,639,904
Issue date
May 2, 2023
Nikon Corporation
Takeshi Ohbayashi
G01 - MEASURING TESTING
Information
Patent Grant
CT scanner and method for performing a CT examination of an object
Patent number
11,609,189
Issue date
Mar 21, 2023
BIOMETIC S.R.L.
Thomas Prenn
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Apparatus for selecting products on the basis of their composition...
Patent number
11,442,031
Issue date
Sep 13, 2022
DE.TEC.TOR S.r.l.
Giuseppe Pitta′
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for performing a tomographic examination of an...
Patent number
11,428,648
Issue date
Aug 30, 2022
Microtec S.R.L.
Enrico Ursella
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tray inserts and image quality, systems, methods and algorithm for...
Patent number
11,430,109
Issue date
Aug 30, 2022
Battelle Memorial Institute
Joseph Matthew Cochran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for determining the microstructure of a metal pro...
Patent number
11,249,037
Issue date
Feb 15, 2022
SMS group GMBH
Mostafa Biglari
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Method of detecting an anomaly in a single crystal structure
Patent number
11,099,143
Issue date
Aug 24, 2021
Rolls-Royce PLC
Jacqueline Griffiths
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection device
Patent number
11,079,345
Issue date
Aug 3, 2021
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for CT scanning of longer whole cores
Patent number
11,073,485
Issue date
Jul 27, 2021
Saudi Arabian Oil Company
Sinan Caliskan
G01 - MEASURING TESTING
Information
Patent Grant
Stationary tomographic X-ray imaging systems for automatically sort...
Patent number
10,976,271
Issue date
Apr 13, 2021
Rapiscan Systems, Inc.
Edward James Morton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vehicle cabin inspection system and method
Patent number
10,900,911
Issue date
Jan 26, 2021
SMITHS HEIMANN SAS
Agathe Brabant
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection device, X-ray inspection method, and method of man...
Patent number
10,809,208
Issue date
Oct 20, 2020
Nikon Corporation
Hirotomo Yashima
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting a defect and apparatus for performing the same
Patent number
10,782,254
Issue date
Sep 22, 2020
Samsung Electronics Co., Ltd.
Hyon-Seok Song
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation phase contrast imaging apparatus
Patent number
10,739,280
Issue date
Aug 11, 2020
SHIMADZU CORPORATION
Takahiro Doki
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for CT scanning of longer whole cores
Patent number
10,724,972
Issue date
Jul 28, 2020
Saudi Arabian Oil Company
Sinan Caliskan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20240319117
Publication date
Sep 26, 2024
ISHIDA CO., LTD.
Kota TOMINAGA
G01 - MEASURING TESTING
Information
Patent Application
Material Detection in X-Ray Security Screening
Publication number
20240302300
Publication date
Sep 12, 2024
Rapiscan Holdings, Inc.
Simon Archambault
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS
Publication number
20240295510
Publication date
Sep 5, 2024
GILARDONI S.P.A.
Davide Baratto
G01 - MEASURING TESTING
Information
Patent Application
RAY SCANNING APPARATUS
Publication number
20240248048
Publication date
Jul 25, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
RAY SCANNING APPARATUS
Publication number
20240248049
Publication date
Jul 25, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC IMAGE ACQUIRING DEVICE, RADIOGRAPHIC IMAGE ACQUIRING S...
Publication number
20240210331
Publication date
Jun 27, 2024
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
Publication number
20240142392
Publication date
May 2, 2024
MULTICT IMAGING LTD
Nathan HERMONY
G01 - MEASURING TESTING
Information
Patent Application
Calibration Method and Device Therefor
Publication number
20240134083
Publication date
Apr 25, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
Publication number
20240094147
Publication date
Mar 21, 2024
Rapiscan Holdings, Inc.
Mark Procter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Rotational X-ray Inspection System and Method
Publication number
20240044812
Publication date
Feb 8, 2024
Viken Detection Corporation
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INSPECTING A SAMPLE, AND MULTI-ELECTRON BEAM INSPECTION S...
Publication number
20230133404
Publication date
May 4, 2023
Applied Materials, Inc.
Bernhard G. MUELLER
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL DETECTION IN X-RAY SECURITY SCREENING
Publication number
20230017006
Publication date
Jan 19, 2023
VOTI INC.
Simon Archambault
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...
Publication number
20220412901
Publication date
Dec 29, 2022
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin ZHENG
G01 - MEASURING TESTING
Information
Patent Application
SPENT OR DECOMMISSIONED ACCUMULATOR TREATMENT PLANT AND PROCESS
Publication number
20220416323
Publication date
Dec 29, 2022
ENGITEC TECHNOLOGIES S.P.A.
Gianfranco DIEGOLI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BELOW-GROUND COMPUTED TOMOGRAPHY CARGO INSPECTION SYSTEM AND METHOD
Publication number
20220390391
Publication date
Dec 8, 2022
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
Tray Inserts and Image Quality, Systems, Methods and Algorithms for...
Publication number
20220392044
Publication date
Dec 8, 2022
Battelle Memorial Institute
Joseph Matthew Cochran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REAL-TIME INLINE DIGITAL TOMOSYNTHESIS SYSTEM
Publication number
20220365005
Publication date
Nov 17, 2022
JPI Healthcare CO., LTD.
Kyong-Woo KIM
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON BEAM DETECTION APPARATUS FOR SEMICONDUCTOR DEVICE AND ELEC...
Publication number
20220317071
Publication date
Oct 6, 2022
ZHONGKE JINGYUAN ELECTRON LIMITED, BEIJING
Lei JIANG
G01 - MEASURING TESTING
Information
Patent Application
HIGH-ENERGY X-RAY IMAGING SYSTEM
Publication number
20220260745
Publication date
Aug 18, 2022
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
TRAY INSERTS AND IMAGE QUALITY, SYSTEMS, METHODS AND ALGORITHM FOR...
Publication number
20220005174
Publication date
Jan 6, 2022
Battelle Memorial Institute
Joseph Matthew Cochran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR ANALYSING A ROD-SHAPED SMOKING ARTICLE
Publication number
20210235745
Publication date
Aug 5, 2021
MPRD LTD
Matthew James COX
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR PERFORMING A TOMOGRAPHIC EXAMINATION OF AN...
Publication number
20210116395
Publication date
Apr 22, 2021
MICROTEC S.R.L.
ENRICO URSELLA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY INSPECTION DEVICE
Publication number
20210063326
Publication date
Mar 4, 2021
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR SELECTING PRODUCTS ON THE BASIS OF THEIR COMPOSITION...
Publication number
20210063328
Publication date
Mar 4, 2021
DE.TEC.TOR S.r.l.
Giuseppe PITTA'
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for CT Scanning of Longer Whole Cores
Publication number
20200191731
Publication date
Jun 18, 2020
Saudi Arabian Oil Company
Sinan Caliskan
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for CT Scanning of Longer Whole Cores
Publication number
20190360946
Publication date
Nov 28, 2019
SAUDI ARABIAN OIL COMPANY
Sinan Caliskan
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETECTING A DEFECT AND APPARATUS FOR PERFORMING THE SAME
Publication number
20190162681
Publication date
May 30, 2019
Samsung Electronics Co., Ltd.
Hyon-Seok SONG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
High Speed Pipe Inspection System
Publication number
20190079028
Publication date
Mar 14, 2019
The Boeing Company
Gary Ernest Georgeson
G01 - MEASURING TESTING
Information
Patent Application
RADIATION PHASE CONTRAST IMAGING APPARATUS
Publication number
20190072501
Publication date
Mar 7, 2019
Shimadzu Corporation
Takahiro DOKI
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING THE LEACHING PROFILE OF A CUTTER ON A DRILLING TOOL
Publication number
20170307547
Publication date
Oct 26, 2017
Halliburton Energy Services, Inc.
Qi LIANG
G01 - MEASURING TESTING