of printed or hybrid circuits

Industry

CPC
G01R31/304

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/304of printed or hybrid circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for identifying PCB core-layer properties
- Patent number 11,644,501
- Issue date May 9, 2023
- International Business Machines Corporation
- Tao Song
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Printed circuit board assembly for aircraft engine, and method moni...
- Patent number 11,500,011
- Issue date Nov 15, 2022
- Pratt & Whitney Canada Corp.
- Reza Pedrami
- G01 - MEASURING TESTING
Information Patent Grant
System and method of production testing of impedance of radio frequ...
- Patent number 11,226,371
- Issue date Jan 18, 2022
- Silicon Laboratories Inc.
- Yuwono Kurnia Rahman
- G01 - MEASURING TESTING
Information Patent Grant
Feedback control of mounted chip production
- Patent number 10,546,226
- Issue date Jan 28, 2020
- AVERY DENNISON RETAIL INFORMATION SERVICES LLC
- Ian J. Forster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for detecting damage of electric product using di...
- Patent number 10,386,404
- Issue date Aug 20, 2019
- UNIST(ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- Daeil Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing electrical connections on a printe...
- Patent number 9,638,742
- Issue date May 2, 2017
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact testing of printed electronics
- Patent number 9,360,519
- Issue date Jun 7, 2016
- Corning Incorporated
- Robert Addison Boudreau
- G01 - MEASURING TESTING
Information Patent Grant
Low capacitance probe for testing circuit assembly
- Patent number 8,760,185
- Issue date Jun 24, 2014
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Grant
Test method for passive device embedded printed circuit board
- Patent number 8,482,310
- Issue date Jul 9, 2013
- Samsung Electro-Mechanics Co., Ltd.
- Hyun-Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact testing of printed electronics
- Patent number 8,378,702
- Issue date Feb 19, 2013
- Corning Incorporated
- Robert Addison Boudreau
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing printed circuit and method therefor
- Patent number 8,179,143
- Issue date May 15, 2012
- Test Research, Inc.
- Shang-Tsang Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method of circuit substrate
- Patent number 8,072,600
- Issue date Dec 6, 2011
- Microinspection, Inc.
- Tak Eun
- G01 - MEASURING TESTING
Information Patent Grant
Testing BGA solder joints by localized pulsed-heat thermography
- Patent number 7,845,849
- Issue date Dec 7, 2010
- Avaya Inc.
- Jae Choi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for repeatable drive strength assessments of h...
- Patent number 7,725,783
- Issue date May 25, 2010
- International Business Machines Corporation
- Moises Cases
- G11 - INFORMATION STORAGE
Information Patent Grant
X-ray tube and nondestructive inspection equipment
- Patent number 7,668,297
- Issue date Feb 23, 2010
- Hamamatsu Photonics K.K.
- Tutomu Inazuru
- G01 - MEASURING TESTING
Information Patent Grant
Radio frequency identification labels and systems and methods for m...
- Patent number 7,619,520
- Issue date Nov 17, 2009
- William Berson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting circuit boards
- Patent number 7,529,338
- Issue date May 5, 2009
- FocalSpot, Inc.
- Leon Fung
- G01 - MEASURING TESTING
Information Patent Grant
System for fault determinations for high frequency electronic circuits
- Patent number 7,496,466
- Issue date Feb 24, 2009
- Huntron, Inc.
- Alexander T. Farkas
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting array of liquid crystal display and apparatus t...
- Patent number 7,399,965
- Issue date Jul 15, 2008
- AU Optronics Corp.
- Ting-Hui Huang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Test method of embedded capacitor and test system thereof
- Patent number 7,308,377
- Issue date Dec 11, 2007
- Industrial Technology Research Institute
- Uei-Ming Jow
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspection
- Patent number 7,138,805
- Issue date Nov 21, 2006
- OHT, Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Methods of improving reliability of an electro-optical module
- Patent number 7,129,722
- Issue date Oct 31, 2006
- Cypress Semiconductor Corp.
- Brenor Brophy
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis of integrated circuits
- Patent number 7,019,511
- Issue date Mar 28, 2006
- Advanced Micro Devices, Inc.
- Jeffrey D. Birdsley
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method and apparatus for measurement of sheet resistanc...
- Patent number 7,019,513
- Issue date Mar 28, 2006
- Vladimir Faifer
- G01 - MEASURING TESTING
Information Patent Grant
Circuit pattern inspection apparatus, circuit pattern inspection me...
- Patent number 6,995,566
- Issue date Feb 7, 2006
- OHT, Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Circuit pattern inspection device, circuit pattern inspection metho...
- Patent number 6,943,559
- Issue date Sep 13, 2005
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced pad design for substrate
- Patent number 6,940,168
- Issue date Sep 6, 2005
- International Business Machines Corporation
- John Joseph Garrity
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray inspection method and apparatus used for the same
- Patent number 6,823,040
- Issue date Nov 23, 2004
- Techno Enami Corporation
- Akira Teraoka
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact electrical testing employing a CA...
- Patent number 6,759,850
- Issue date Jul 6, 2004
- Orbotech Ltd.
- Benyamin Harzanu
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced pad design for substrate
- Patent number 6,720,665
- Issue date Apr 13, 2004
- International Business Machines Corporation
- John Joseph Garrity
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR IDENTIFYING PCB CORE-LAYER PROPERTIES
- Publication number 20220091181
- Publication date Mar 24, 2022
- International Business Machines Corporation
- Tao Song
- G01 - MEASURING TESTING
Information Patent Application
PRINTED CIRCUIT BOARD ASSEMBLY FOR AIRCRAFT ENGINE, AND METHOD OF M...
- Publication number 20210341530
- Publication date Nov 4, 2021
- Pratt & Whitney Canada Corp.
- Reza PEDRAMI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PRODUCTION TESTING OF IMPEDANCE OF RADIO FREQU...
- Publication number 20210148973
- Publication date May 20, 2021
- Silicon Laboratories Inc.
- Yuwono Kurnia Rahman
- G01 - MEASURING TESTING
Information Patent Application
System For Determining Mounting State of Pins of Electrical Connector
- Publication number 20180241168
- Publication date Aug 23, 2018
- Tyco Electronics (Shanghai) Co. Ltd.
- Lei Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR DETECTING DAMAGE OF ELECTRIC PRODUCT USING DI...
- Publication number 20180203055
- Publication date Jul 19, 2018
- UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- Daeil Kwon
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT TESTING OF PRINTED ELECTRONICS
- Publication number 20130127487
- Publication date May 23, 2013
- Robert Addison Boudreau
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD FOR PASSIVE DEVICE EMBEDDED PRINTED CIRCUIT BOARD
- Publication number 20110215828
- Publication date Sep 8, 2011
- Samsung Electro-Mechanics CO., LTD.
- Hyun-Ho KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING ELECTRICAL CONNECTIONS ON A PRINTE...
- Publication number 20110204910
- Publication date Aug 25, 2011
- Teradyne, Inc.
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
LOW CAPACITANCE PROBE FOR TESTING CIRCUIT ASSEMBLY
- Publication number 20110148450
- Publication date Jun 23, 2011
- Anthony J. Suto
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT TESTING OF PRINTED ELECTRONICS
- Publication number 20100283499
- Publication date Nov 11, 2010
- Robert Addison Bourdreau
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING PRINTED CIRCUIT AND METHOD THEREFOR
- Publication number 20100090679
- Publication date Apr 15, 2010
- Test Research, Inc
- Shang-Tsang YEH
- G01 - MEASURING TESTING
Information Patent Application
Inspection method of circuit substrate
- Publication number 20100002232
- Publication date Jan 7, 2010
- MICROINSPECTION, INC.
- Tak Eun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TUBE AND NONDESTRUCTIVE INSPECTION EQUIPMENT
- Publication number 20090052626
- Publication date Feb 26, 2009
- Hamamatsu Photonics K. K.
- Tutomu Inazuru
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR REPEATABLE DRIVE STRENGTH ASSESSMENTS OF H...
- Publication number 20090021264
- Publication date Jan 22, 2009
- International Business Machines Corporation
- Moises Cases
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR FAULT DETERMINATIONS FOR HIGH FREQUENCY ELECTRONIC CIRCUITS
- Publication number 20080177486
- Publication date Jul 24, 2008
- Alexander T. Farkas
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING CIRCUIT BOARDS
- Publication number 20070195927
- Publication date Aug 23, 2007
- Leon Fung
- G01 - MEASURING TESTING
Information Patent Application
Test method of embedded capacitor and test system thereof
- Publication number 20070168148
- Publication date Jul 19, 2007
- Industrial Technology Research Institute
- Uei-Ming Jow
- G01 - MEASURING TESTING
Information Patent Application
Radio frequency identification labels and systems and methods for m...
- Publication number 20060170436
- Publication date Aug 3, 2006
- William Berson
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting array of liquid crystal display and apparatus t...
- Publication number 20060163476
- Publication date Jul 27, 2006
- Quanta Display Inc.
- Ting-Hui Huang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Non-contact electrical probe utilizing charged fluid droplets
- Publication number 20060139040
- Publication date Jun 29, 2006
- Michael James Nystrom
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
System and method of testing and utilizing a fluid stream
- Publication number 20060139041
- Publication date Jun 29, 2006
- Michael James Nystrom
- G01 - MEASURING TESTING
Information Patent Application
Circuit pattern inspection device, circuit pattern inspection metho...
- Publication number 20040164755
- Publication date Aug 26, 2004
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Circuit pattern inspection apparatus, circuit pattern inspection me...
- Publication number 20040150409
- Publication date Aug 5, 2004
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
System and method for non-contact electrical testing employing a CA...
- Publication number 20030011380
- Publication date Jan 16, 2003
- Benyamin Harzanu
- G01 - MEASURING TESTING
Information Patent Application
Device and method for inspection
- Publication number 20020163342
- Publication date Nov 7, 2002
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspection
- Publication number 20020135390
- Publication date Sep 26, 2002
- Tatuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Application
Automatic X-ray determination of solder joint and view delta Z valu...
- Publication number 20020015520
- Publication date Feb 7, 2002
- Paul A. Roder
- G01 - MEASURING TESTING
Information Patent Application
Circuit board testing apparatus and method
- Publication number 20010013783
- Publication date Aug 16, 2001
- Munehiro Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Enhanced pad design for substrate
- Publication number 20010010321
- Publication date Aug 2, 2001
- John Joseph Garrity
- G01 - MEASURING TESTING
Information Patent Application
Enhanced pad design for substrate
- Publication number 20010001508
- Publication date May 24, 2001
- John Joseph Garrity
- G01 - MEASURING TESTING

of printed or hybrid circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for identifying PCB core-layer properties

Printed circuit board assembly for aircraft engine, and method moni...

System and method of production testing of impedance of radio frequ...

Feedback control of mounted chip production

Device and method for detecting damage of electric product using di...

Method and apparatus for testing electrical connections on a printe...

Non-contact testing of printed electronics

Low capacitance probe for testing circuit assembly

Test method for passive device embedded printed circuit board

Non-contact testing of printed electronics

Apparatus for testing printed circuit and method therefor

Inspection method of circuit substrate

Testing BGA solder joints by localized pulsed-heat thermography

Method and apparatus for repeatable drive strength assessments of h...

X-ray tube and nondestructive inspection equipment

Radio frequency identification labels and systems and methods for m...

Method and apparatus for inspecting circuit boards

System for fault determinations for high frequency electronic circuits

Method of detecting array of liquid crystal display and apparatus t...

Test method of embedded capacitor and test system thereof

Device and method for inspection

Methods of improving reliability of an electro-optical module

Optical analysis of integrated circuits

Non-contact method and apparatus for measurement of sheet resistanc...

Circuit pattern inspection apparatus, circuit pattern inspection me...

Circuit pattern inspection device, circuit pattern inspection metho...

Enhanced pad design for substrate

X-ray inspection method and apparatus used for the same

System and method for non-contact electrical testing employing a CA...

Enhanced pad design for substrate

Patents Applicationslast 30 patents

METHOD FOR IDENTIFYING PCB CORE-LAYER PROPERTIES

PRINTED CIRCUIT BOARD ASSEMBLY FOR AIRCRAFT ENGINE, AND METHOD OF M...

SYSTEM AND METHOD OF PRODUCTION TESTING OF IMPEDANCE OF RADIO FREQU...

System For Determining Mounting State of Pins of Electrical Connector

DEVICE AND METHOD FOR DETECTING DAMAGE OF ELECTRIC PRODUCT USING DI...

NON-CONTACT TESTING OF PRINTED ELECTRONICS

TEST METHOD FOR PASSIVE DEVICE EMBEDDED PRINTED CIRCUIT BOARD

METHOD AND APPARATUS FOR TESTING ELECTRICAL CONNECTIONS ON A PRINTE...

LOW CAPACITANCE PROBE FOR TESTING CIRCUIT ASSEMBLY

NON-CONTACT TESTING OF PRINTED ELECTRONICS

APPARATUS FOR TESTING PRINTED CIRCUIT AND METHOD THEREFOR

Inspection method of circuit substrate

X-RAY TUBE AND NONDESTRUCTIVE INSPECTION EQUIPMENT

METHOD AND APPARATUS FOR REPEATABLE DRIVE STRENGTH ASSESSMENTS OF H...

SYSTEM FOR FAULT DETERMINATIONS FOR HIGH FREQUENCY ELECTRONIC CIRCUITS

METHOD AND APPARATUS FOR INSPECTING CIRCUIT BOARDS

Test method of embedded capacitor and test system thereof

Radio frequency identification labels and systems and methods for m...

Method of detecting array of liquid crystal display and apparatus t...

Non-contact electrical probe utilizing charged fluid droplets

System and method of testing and utilizing a fluid stream

Circuit pattern inspection device, circuit pattern inspection metho...

Circuit pattern inspection apparatus, circuit pattern inspection me...

System and method for non-contact electrical testing employing a CA...

Device and method for inspection

Method and apparatus for inspection

Automatic X-ray determination of solder joint and view delta Z valu...

Circuit board testing apparatus and method

Enhanced pad design for substrate

Enhanced pad design for substrate