Optical projection comparators

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CPC
G01B9/08

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/08Optical projection comparators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Metrology system
- Patent number 12,146,736
- Issue date Nov 19, 2024
- INDUSTRIAL METROLOGY SOLUTIONS LLC
- Derek Aqui
- G01 - MEASURING TESTING
Information Patent Grant
Optical edge detection based on high efficiency dielectric metasurface
- Patent number 12,092,790
- Issue date Sep 17, 2024
- The Regents of the University of California
- Junxiao Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method of predicting gravity-free shape of glass sheet and method o...
- Patent number 11,614,323
- Issue date Mar 28, 2023
- Corning Incorporated
- Sang-ho Lim
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system
- Patent number 11,486,689
- Issue date Nov 1, 2022
- DWFritz Automation, Inc.
- Derek Aqui
- G01 - MEASURING TESTING
Information Patent Grant
Meta projector and electronic apparatus including the same
- Patent number 11,449,178
- Issue date Sep 20, 2022
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Meta projector and electronic apparatus including the same
- Patent number 11,042,243
- Issue date Jun 22, 2021
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- G02 - OPTICS
Information Patent Grant
Trigger management device for measurement equipment
- Patent number 10,830,618
- Issue date Nov 10, 2020
- DWFritz Automation, Inc.
- Robert Batten
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system
- Patent number 10,598,521
- Issue date Mar 24, 2020
- DWFritz Automation, Inc.
- Derek Aqui
- G01 - MEASURING TESTING
Information Patent Grant
Virtual component alignment
- Patent number 10,191,475
- Issue date Jan 29, 2019
- Rolls-Royce PLC
- Paul David Addicott
- G05 - CONTROLLING REGULATING
Information Patent Grant
Reducing interference between multiple infra-red depth cameras
- Patent number 10,049,458
- Issue date Aug 14, 2018
- Microsoft Technology Licensing, LLC
- Shahram Izadi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for dimensional analysis of an object
- Patent number 9,351,697
- Issue date May 31, 2016
- General Electric Company
- Thomas James Batzinger
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Low-altitude altimeter and method
- Patent number 9,008,869
- Issue date Apr 14, 2015
- University of Kansas
- Christopher T. Allen
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Low-altitude altimeter and method
- Patent number 8,583,296
- Issue date Nov 12, 2013
- University of Kansas
- Christopher T. Allen
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Method of inspecting test parts with an optical comparator having d...
- Patent number 8,400,633
- Issue date Mar 19, 2013
- Quality Vision International, Inc.
- Edward T. Polidor
- G01 - MEASURING TESTING
Information Patent Grant
Optical comparator with digital gage
- Patent number 8,269,970
- Issue date Sep 18, 2012
- Quality Vision International, Inc.
- Edward T. Polidor
- G01 - MEASURING TESTING
Information Patent Grant
Optoelectronic sensor arrangement and process for monitoring a surv...
- Patent number 7,897,911
- Issue date Mar 1, 2011
- Sick AG
- Christoph Meyer
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Optical measuring machine
- Patent number 7,528,968
- Issue date May 5, 2009
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system based on spatial filtering using a refrac...
- Patent number 6,885,449
- Issue date Apr 26, 2005
- Qinetiq Limited
- Gary Cook
- G01 - MEASURING TESTING
Information Patent Grant
Endoscope
- Patent number 6,152,870
- Issue date Nov 28, 2000
- Richard Wolf GmbH
- Jorg Diener
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Projection measuring instrument
- Patent number 6,147,758
- Issue date Nov 14, 2000
- Mitutoyo Corporation
- Kenji Okabe
- G01 - MEASURING TESTING
Information Patent Grant
High speed opto-electronic gage and method for gaging
- Patent number 6,055,329
- Issue date Apr 25, 2000
- Sherikon, Inc.
- Asif Mufti
- G01 - MEASURING TESTING
Information Patent Grant
Optical cavity sensor
- Patent number 5,889,590
- Issue date Mar 30, 1999
- General Electric Company
- Anil Raj Duggal
- G01 - MEASURING TESTING
Information Patent Grant
Flexible disk mode observer
- Patent number 5,825,409
- Issue date Oct 20, 1998
- Iomega Corporation
- Yiping Ma
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical measuring apparatus and measuring method of the same
- Patent number 5,576,832
- Issue date Nov 19, 1996
- Mitutoyo Corporation
- Fumio Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Simplified mirror system for contour projector
- Patent number 5,402,192
- Issue date Mar 28, 1995
- Optical Gaging Products, Inc.
- Boris Gelman
- G02 - OPTICS
Information Patent Grant
Method and means for projecting images in a contour projector
- Patent number 5,402,193
- Issue date Mar 28, 1995
- Optical Gaging Products, Inc.
- Albert G. Choate
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Defect inspection system for phase shift masks
- Patent number 5,353,116
- Issue date Oct 4, 1994
- Sharp Kabushiki Kaisha
- Makoto Tanigawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Projection inspecting machine
- Patent number 5,307,098
- Issue date Apr 26, 1994
- Kabushiki Kaisha Topcon
- Yukio Okita
- G02 - OPTICS
Information Patent Grant
Multi-axis optical projector
- Patent number 5,278,632
- Issue date Jan 11, 1994
- Teledyne Industries Inc.
- Vernon H. Shotwell
- G01 - MEASURING TESTING
Information Patent Grant
Optical reticle inspection system and method
- Patent number 5,164,794
- Issue date Nov 17, 1992
- General Signal Corporation
- David A. Markle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE SHAPE MEASURING APPARATUS AND SURFACE SHAPE MEASURING METHOD
- Publication number 20240393105
- Publication date Nov 28, 2024
- Resonac Corporation
- Koji YUKIMATSU
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM
- Publication number 20220316851
- Publication date Oct 6, 2022
- DWFritz Automation, Inc.
- Derek Aqui
- G01 - MEASURING TESTING
Information Patent Application
META PROJECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME
- Publication number 20210311588
- Publication date Oct 7, 2021
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY SYSTEM
- Publication number 20200209021
- Publication date Jul 2, 2020
- DWFritz Automation, Inc.
- Derek Aqui
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM
- Publication number 20190265012
- Publication date Aug 29, 2019
- DWFritz Automation, Inc.
- Derek Aqui
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREDICTING GRAVITY-FREE SHAPE OF GLASS SHEET AND METHOD O...
- Publication number 20190120613
- Publication date Apr 25, 2019
- Sang-ho Lim
- G01 - MEASURING TESTING
Information Patent Application
META PROJECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME
- Publication number 20190034035
- Publication date Jan 31, 2019
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCING INTERFERENCE BETWEEN MULTIPLE INFRA-RED DEPTH CAMERAS
- Publication number 20160163054
- Publication date Jun 9, 2016
- Microsoft Technology Licensing, LLC
- Shahram Izadi
- G01 - MEASURING TESTING
Information Patent Application
Real-Time Multi-Point Diffraction-Based Imaging System For Strain M...
- Publication number 20150276386
- Publication date Oct 1, 2015
- NANYANG POLYTECHNIC
- Oh Tiong Keng
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING
- Publication number 20150253123
- Publication date Sep 10, 2015
- Chiaro Technologies LLC
- Benjamin Braker
- G01 - MEASURING TESTING
Information Patent Application
LOW-ALTITUDE ALTIMETER AND METHOD
- Publication number 20140058593
- Publication date Feb 27, 2014
- University of Kansas
- Christopher T. ALLEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MANUALLY CONFIRMING ELECTRONICALLY STORED...
- Publication number 20130176419
- Publication date Jul 11, 2013
- Baxley Equipment Co.
- Pat Conry
- G01 - MEASURING TESTING
Information Patent Application
LOW-ALTITUDE ALTIMETER AND METHOD
- Publication number 20130151040
- Publication date Jun 13, 2013
- Christopher T. ALLEN
- G01 - MEASURING TESTING
Information Patent Application
Method of Inspecting Test Parts with an Optical Comparator Having D...
- Publication number 20120307246
- Publication date Dec 6, 2012
- Quality Vision International, Inc.
- Edward T. Polidor
- G01 - MEASURING TESTING
Information Patent Application
Reducing Interference Between Multiple Infra-Red Depth Cameras
- Publication number 20120194650
- Publication date Aug 2, 2012
- Microsoft Corporation
- Shahram Izadi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL COMPARATOR WITH DIGITAL GAGE
- Publication number 20110001973
- Publication date Jan 6, 2011
- Quality Vision International, Inc.
- Edward T. Polidor
- G01 - MEASURING TESTING
Information Patent Application
Optoelectronic sensor arrangement and process for monitoring a surv...
- Publication number 20080284594
- Publication date Nov 20, 2008
- SICK AG
- Christof Meyer
- G08 - SIGNALLING
Information Patent Application
Optical measuring machine
- Publication number 20080252904
- Publication date Oct 16, 2008
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G02 - OPTICS
Information Patent Application
Image comparator
- Publication number 20030164945
- Publication date Sep 4, 2003
- Wen-Tsao Lee
- G01 - MEASURING TESTING

Optical projection comparators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Metrology system

Optical edge detection based on high efficiency dielectric metasurface

Method of predicting gravity-free shape of glass sheet and method o...

Metrology system

Meta projector and electronic apparatus including the same

Meta projector and electronic apparatus including the same

Trigger management device for measurement equipment

Metrology system

Virtual component alignment

Reducing interference between multiple infra-red depth cameras

Method and system for dimensional analysis of an object

Low-altitude altimeter and method

Low-altitude altimeter and method

Method of inspecting test parts with an optical comparator having d...

Optical comparator with digital gage

Optoelectronic sensor arrangement and process for monitoring a surv...

Optical measuring machine

Optical inspection system based on spatial filtering using a refrac...

Endoscope

Projection measuring instrument

High speed opto-electronic gage and method for gaging

Optical cavity sensor

Flexible disk mode observer

Optical measuring apparatus and measuring method of the same

Simplified mirror system for contour projector

Method and means for projecting images in a contour projector

Defect inspection system for phase shift masks

Projection inspecting machine

Multi-axis optical projector

Optical reticle inspection system and method

Patents Applicationslast 30 patents

SURFACE SHAPE MEASURING APPARATUS AND SURFACE SHAPE MEASURING METHOD

METROLOGY SYSTEM

META PROJECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME

METROLOGY SYSTEM

METROLOGY SYSTEM

METHOD OF PREDICTING GRAVITY-FREE SHAPE OF GLASS SHEET AND METHOD O...

META PROJECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME

REDUCING INTERFERENCE BETWEEN MULTIPLE INFRA-RED DEPTH CAMERAS

Real-Time Multi-Point Diffraction-Based Imaging System For Strain M...

SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING

LOW-ALTITUDE ALTIMETER AND METHOD

APPARATUS AND METHOD FOR MANUALLY CONFIRMING ELECTRONICALLY STORED...

LOW-ALTITUDE ALTIMETER AND METHOD

Method of Inspecting Test Parts with an Optical Comparator Having D...

Reducing Interference Between Multiple Infra-Red Depth Cameras

OPTICAL COMPARATOR WITH DIGITAL GAGE

Optoelectronic sensor arrangement and process for monitoring a surv...

Optical measuring machine

Image comparator