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Optical projection comparators
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G01B9/08
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B9/00
Instruments as specified in the subgroups and characterised by the use of optical measuring means
Current Industry
G01B9/08
Optical projection comparators
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method of predicting gravity-free shape of glass sheet and method o...
Patent number
11,614,323
Issue date
Mar 28, 2023
Corning Incorporated
Sang-ho Lim
G01 - MEASURING TESTING
Information
Patent Grant
Metrology system
Patent number
11,486,689
Issue date
Nov 1, 2022
DWFritz Automation, Inc.
Derek Aqui
G01 - MEASURING TESTING
Information
Patent Grant
Meta projector and electronic apparatus including the same
Patent number
11,449,178
Issue date
Sep 20, 2022
Samsung Electronics Co., Ltd.
Seunghoon Han
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Meta projector and electronic apparatus including the same
Patent number
11,042,243
Issue date
Jun 22, 2021
Samsung Electronics Co., Ltd.
Seunghoon Han
G02 - OPTICS
Information
Patent Grant
Trigger management device for measurement equipment
Patent number
10,830,618
Issue date
Nov 10, 2020
DWFritz Automation, Inc.
Robert Batten
G01 - MEASURING TESTING
Information
Patent Grant
Metrology system
Patent number
10,598,521
Issue date
Mar 24, 2020
DWFritz Automation, Inc.
Derek Aqui
G01 - MEASURING TESTING
Information
Patent Grant
Virtual component alignment
Patent number
10,191,475
Issue date
Jan 29, 2019
Rolls-Royce PLC
Paul David Addicott
G05 - CONTROLLING REGULATING
Information
Patent Grant
Reducing interference between multiple infra-red depth cameras
Patent number
10,049,458
Issue date
Aug 14, 2018
Microsoft Technology Licensing, LLC
Shahram Izadi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for dimensional analysis of an object
Patent number
9,351,697
Issue date
May 31, 2016
General Electric Company
Thomas James Batzinger
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Low-altitude altimeter and method
Patent number
9,008,869
Issue date
Apr 14, 2015
University of Kansas
Christopher T. Allen
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Low-altitude altimeter and method
Patent number
8,583,296
Issue date
Nov 12, 2013
University of Kansas
Christopher T. Allen
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Method of inspecting test parts with an optical comparator having d...
Patent number
8,400,633
Issue date
Mar 19, 2013
Quality Vision International, Inc.
Edward T. Polidor
G01 - MEASURING TESTING
Information
Patent Grant
Optical comparator with digital gage
Patent number
8,269,970
Issue date
Sep 18, 2012
Quality Vision International, Inc.
Edward T. Polidor
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic sensor arrangement and process for monitoring a surv...
Patent number
7,897,911
Issue date
Mar 1, 2011
Sick AG
Christoph Meyer
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Optical measuring machine
Patent number
7,528,968
Issue date
May 5, 2009
Mitutoyo Corporation
Sadayuki Matsumiya
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection system based on spatial filtering using a refrac...
Patent number
6,885,449
Issue date
Apr 26, 2005
Qinetiq Limited
Gary Cook
G01 - MEASURING TESTING
Information
Patent Grant
Endoscope
Patent number
6,152,870
Issue date
Nov 28, 2000
Richard Wolf GmbH
Jorg Diener
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Projection measuring instrument
Patent number
6,147,758
Issue date
Nov 14, 2000
Mitutoyo Corporation
Kenji Okabe
G01 - MEASURING TESTING
Information
Patent Grant
High speed opto-electronic gage and method for gaging
Patent number
6,055,329
Issue date
Apr 25, 2000
Sherikon, Inc.
Asif Mufti
G01 - MEASURING TESTING
Information
Patent Grant
Optical cavity sensor
Patent number
5,889,590
Issue date
Mar 30, 1999
General Electric Company
Anil Raj Duggal
G01 - MEASURING TESTING
Information
Patent Grant
Flexible disk mode observer
Patent number
5,825,409
Issue date
Oct 20, 1998
Iomega Corporation
Yiping Ma
G11 - INFORMATION STORAGE
Information
Patent Grant
Optical measuring apparatus and measuring method of the same
Patent number
5,576,832
Issue date
Nov 19, 1996
Mitutoyo Corporation
Fumio Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Simplified mirror system for contour projector
Patent number
5,402,192
Issue date
Mar 28, 1995
Optical Gaging Products, Inc.
Boris Gelman
G02 - OPTICS
Information
Patent Grant
Method and means for projecting images in a contour projector
Patent number
5,402,193
Issue date
Mar 28, 1995
Optical Gaging Products, Inc.
Albert G. Choate
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Defect inspection system for phase shift masks
Patent number
5,353,116
Issue date
Oct 4, 1994
Sharp Kabushiki Kaisha
Makoto Tanigawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Projection inspecting machine
Patent number
5,307,098
Issue date
Apr 26, 1994
Kabushiki Kaisha Topcon
Yukio Okita
G02 - OPTICS
Information
Patent Grant
Multi-axis optical projector
Patent number
5,278,632
Issue date
Jan 11, 1994
Teledyne Industries Inc.
Vernon H. Shotwell
G01 - MEASURING TESTING
Information
Patent Grant
Optical reticle inspection system and method
Patent number
5,164,794
Issue date
Nov 17, 1992
General Signal Corporation
David A. Markle
G01 - MEASURING TESTING
Information
Patent Grant
Hand-held drill bit tester
Patent number
5,155,556
Issue date
Oct 13, 1992
Anthony J. Foanio
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Device for evaluating wrinkles in a double rolled seam
Patent number
5,104,226
Issue date
Apr 14, 1992
Abbott Laboratories
Bernard Eble
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METROLOGY SYSTEM
Publication number
20220316851
Publication date
Oct 6, 2022
DWFritz Automation, Inc.
Derek Aqui
G01 - MEASURING TESTING
Information
Patent Application
META PROJECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME
Publication number
20210311588
Publication date
Oct 7, 2021
Samsung Electronics Co., Ltd.
Seunghoon Han
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY SYSTEM
Publication number
20200209021
Publication date
Jul 2, 2020
DWFritz Automation, Inc.
Derek Aqui
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY SYSTEM
Publication number
20190265012
Publication date
Aug 29, 2019
DWFritz Automation, Inc.
Derek Aqui
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF PREDICTING GRAVITY-FREE SHAPE OF GLASS SHEET AND METHOD O...
Publication number
20190120613
Publication date
Apr 25, 2019
Sang-ho Lim
G01 - MEASURING TESTING
Information
Patent Application
META PROJECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME
Publication number
20190034035
Publication date
Jan 31, 2019
Samsung Electronics Co., Ltd.
Seunghoon Han
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REDUCING INTERFERENCE BETWEEN MULTIPLE INFRA-RED DEPTH CAMERAS
Publication number
20160163054
Publication date
Jun 9, 2016
Microsoft Technology Licensing, LLC
Shahram Izadi
G01 - MEASURING TESTING
Information
Patent Application
Real-Time Multi-Point Diffraction-Based Imaging System For Strain M...
Publication number
20150276386
Publication date
Oct 1, 2015
NANYANG POLYTECHNIC
Oh Tiong Keng
G01 - MEASURING TESTING
Information
Patent Application
SPATIALLY SELF-SIMILAR PATTERNED ILLUMINATION FOR DEPTH IMAGING
Publication number
20150253123
Publication date
Sep 10, 2015
Chiaro Technologies LLC
Benjamin Braker
G01 - MEASURING TESTING
Information
Patent Application
LOW-ALTITUDE ALTIMETER AND METHOD
Publication number
20140058593
Publication date
Feb 27, 2014
University of Kansas
Christopher T. ALLEN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MANUALLY CONFIRMING ELECTRONICALLY STORED...
Publication number
20130176419
Publication date
Jul 11, 2013
Baxley Equipment Co.
Pat Conry
G01 - MEASURING TESTING
Information
Patent Application
LOW-ALTITUDE ALTIMETER AND METHOD
Publication number
20130151040
Publication date
Jun 13, 2013
Christopher T. ALLEN
G01 - MEASURING TESTING
Information
Patent Application
Method of Inspecting Test Parts with an Optical Comparator Having D...
Publication number
20120307246
Publication date
Dec 6, 2012
Quality Vision International, Inc.
Edward T. Polidor
G01 - MEASURING TESTING
Information
Patent Application
Reducing Interference Between Multiple Infra-Red Depth Cameras
Publication number
20120194650
Publication date
Aug 2, 2012
Microsoft Corporation
Shahram Izadi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL COMPARATOR WITH DIGITAL GAGE
Publication number
20110001973
Publication date
Jan 6, 2011
Quality Vision International, Inc.
Edward T. Polidor
G01 - MEASURING TESTING
Information
Patent Application
Optoelectronic sensor arrangement and process for monitoring a surv...
Publication number
20080284594
Publication date
Nov 20, 2008
SICK AG
Christof Meyer
G08 - SIGNALLING
Information
Patent Application
Optical measuring machine
Publication number
20080252904
Publication date
Oct 16, 2008
Mitutoyo Corporation
Sadayuki Matsumiya
G02 - OPTICS
Information
Patent Application
Image comparator
Publication number
20030164945
Publication date
Sep 4, 2003
Wen-Tsao Lee
G01 - MEASURING TESTING