Probes

Industry

CPC
G01R27/2676

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2676Probes

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
TDR measuring apparatus for determining the dielectric constant
- Patent number 11,656,194
- Issue date May 23, 2023
- IMKO Micromodultechnik GmbH
- Timo Camek
- G01 - MEASURING TESTING
Information Patent Grant
High speed calibration method for impedance tuner
- Patent number 11,604,224
- Issue date Mar 14, 2023
- Christos Tsironis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tuning of narrowband near-field probes
- Patent number 11,585,840
- Issue date Feb 21, 2023
- Raytheon Company
- Thomas G. Lavedas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Anisotropic constitutive parameters for launching a Zenneck surface...
- Patent number 11,555,840
- Issue date Jan 17, 2023
- CPG TECHNOLOGIES, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic constitutive parameters for launching a Zenneck surface...
- Patent number 11,340,275
- Issue date May 24, 2022
- CPG TECHNOLOGIES, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Grant
Electrical probe structure
- Patent number 10,670,627
- Issue date Jun 2, 2020
- CHROMA ATE INC.
- Mao-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric measurement probe for curved surfaces
- Patent number 10,649,016
- Issue date May 12, 2020
- The United States of America as represented by the Secretary of the Navy
- David F Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Guided wave radar level gauge system with dual transmission line pr...
- Patent number 10,295,393
- Issue date May 21, 2019
- ROSEMOUNT TANK RADAR AB
- Mikael Eriksson
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Device and method for resonant high-speed microscopic impedance probe
- Patent number 7,451,646
- Issue date Nov 18, 2008
- The Regents of the University of California
- Andrew N. Cleland
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measurement of dielectric constant of thin fi...
- Patent number 7,285,963
- Issue date Oct 23, 2007
- Solid State Measurements, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant measuring apparatus, dielectric constant measur...
- Patent number 7,218,600
- Issue date May 15, 2007
- Pioneer Corporation
- Yasuo Cho
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-contact measurement of microwave capacita...
- Patent number 7,102,363
- Issue date Sep 5, 2006
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive level detector with optimized electrode geometry
- Patent number 6,318,172
- Issue date Nov 20, 2001
- ABB Research Ltd.
- John Anthony Byatt
- G01 - MEASURING TESTING
Information Patent Grant
Bulls-eye mid-frequency impedance probe
- Patent number 6,201,400
- Issue date Mar 13, 2001
- The Boeing Company
- Arthur C. Lind
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic inductive probe
- Patent number 5,793,214
- Issue date Aug 11, 1998
- Hewlett-Packard Company
- Hideki Wakamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Soil penetrometer
- Patent number 5,663,649
- Issue date Sep 2, 1997
- Her Majesty The Queen in right of Canada, as represented by Agriculture and A...
- Clarke Topp
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Grant
Electromagnetic inductive probe
- Patent number 5,659,251
- Issue date Aug 19, 1997
- Hewlett-Packard Company
- Hideki Wakamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Moisture and salinity sensor and method of use
- Patent number 5,418,466
- Issue date May 23, 1995
- Keith Watson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for measuring the dielectric and geometric pr...
- Patent number 5,223,796
- Issue date Jun 29, 1993
- Axiomatics Corporation
- Francis A. Waldman
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant measurement probe assembly and apparatus and me...
- Patent number 5,157,337
- Issue date Oct 20, 1992
- The United States of America as represented by the Secretary of the Navy
- Michael M. Neel
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric probe; method and apparatus including its use
- Patent number 4,723,908
- Issue date Feb 9, 1988
- David E. Kranbuehl
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Electrode for measuring the relative permittivity of a substance
- Patent number 4,677,522
- Issue date Jun 30, 1987
- Sture V. Persson
- G01 - MEASURING TESTING
Information Patent Grant
Microwave probe for detecting oil level
- Patent number 4,543,823
- Issue date Oct 1, 1985
- General Motors Corporation
- Louis L. Nagy
- G01 - MEASURING TESTING
Information Patent Grant
Microwave probe for measurement of dielectric constants
- Patent number 4,544,880
- Issue date Oct 1, 1985
- General Motors Corporation
- Louis L. Nagy
- G01 - MEASURING TESTING
Information Patent Grant
Microwave probe for measurement of dielectric constants
- Patent number 4,503,384
- Issue date Mar 5, 1985
- General Motors Corporation
- Louis L. Nagy
- G01 - MEASURING TESTING
Information Patent Grant
3826980
- Patent number 3,826,980
- Issue date Jul 30, 1974
- G01 - MEASURING TESTING
Information Patent Grant
3778706
- Patent number 3,778,706
- Issue date Dec 11, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3675121
- Patent number 3,675,121
- Issue date Jul 4, 1972
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sensor
- Publication number 20240402144
- Publication date Dec 5, 2024
- Croptide Ltd
- Daniel James Bloomer
- G01 - MEASURING TESTING
Information Patent Application
In-situ evaluation method and system for loess collapsibility based...
- Publication number 20230251221
- Publication date Aug 10, 2023
- CHINA JIKAN RESEARCH INSTITUTE OF ENGINEERING INVESTIGATIONS AND DESIGN, Co.,Ltd
- Jie Cao
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...
- Publication number 20220214389
- Publication date Jul 7, 2022
- CPG Technologies, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Application
TUNING OF NARROWBAND NEAR-FIELD PROBES
- Publication number 20220065911
- Publication date Mar 3, 2022
- Raytheon Company
- Thomas G. Lavedas
- G01 - MEASURING TESTING
Information Patent Application
TDR MEASURING APPARATUS FOR DETERMINING THE DIELECTRIC CONSTANT
- Publication number 20210270761
- Publication date Sep 2, 2021
- Imko Micromodultechnik GmbH
- Timo CAMEK
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...
- Publication number 20210172988
- Publication date Jun 10, 2021
- CPG Technologies, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING SOLIDS CONTENT USING DIELECTRIC PROPERTIES
- Publication number 20190025234
- Publication date Jan 24, 2019
- Halliburton Energy Services, Inc.
- Glenn Howard Weightman
- E21 - EARTH DRILLING MINING
Information Patent Application
PROBE CARD FOR MEASURING MICRO-CAPACITANCE
- Publication number 20170336451
- Publication date Nov 23, 2017
- MiraMEMS Sensing Technology Co., Ltd.
- YUE HONG CHEN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Metamaterial Particles for Near-Field Sensing Applications
- Publication number 20120086463
- Publication date Apr 12, 2012
- Muhammed S. Boybay
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND A METHOD FOR DETERMINING TISSUE PARAMETERS
- Publication number 20110077509
- Publication date Mar 31, 2011
- ROHDE &SCHWARZ GMBH & CO. KG
- Martin Leibfritz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEVICE AND METHOD FOR RESONANT HIGH-SPEED MICROSCOPIC IMPEDANCE PROBE
- Publication number 20080224922
- Publication date Sep 18, 2008
- The Regents of the University of California.
- Andrew N. Cleland
- G01 - MEASURING TESTING
Information Patent Application
Method and system for measurement of dielectric constant of thin fi...
- Publication number 20050230619
- Publication date Oct 20, 2005
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-contact measurement of microwave capacita...
- Publication number 20050225333
- Publication date Oct 13, 2005
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Dielectric constant measuring apparatus, dielectric constant measur...
- Publication number 20040263185
- Publication date Dec 30, 2004
- Yasuo Cho
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

TDR measuring apparatus for determining the dielectric constant

High speed calibration method for impedance tuner

Tuning of narrowband near-field probes

Anisotropic constitutive parameters for launching a Zenneck surface...

Anisotropic constitutive parameters for launching a Zenneck surface...

Electrical probe structure

Dielectric measurement probe for curved surfaces

Guided wave radar level gauge system with dual transmission line pr...

Device and method for resonant high-speed microscopic impedance probe

Method and system for measurement of dielectric constant of thin fi...

Dielectric constant measuring apparatus, dielectric constant measur...

Method and system for non-contact measurement of microwave capacita...

Capacitive level detector with optimized electrode geometry

Bulls-eye mid-frequency impedance probe

Electromagnetic inductive probe

Soil penetrometer

Electromagnetic inductive probe

Moisture and salinity sensor and method of use

Apparatus and methods for measuring the dielectric and geometric pr...

Dielectric constant measurement probe assembly and apparatus and me...

Dielectric probe; method and apparatus including its use

Electrode for measuring the relative permittivity of a substance

Microwave probe for detecting oil level

Microwave probe for measurement of dielectric constants

Microwave probe for measurement of dielectric constants

3826980

3778706

3675121

Patents Applicationslast 30 patents

Sensor

In-situ evaluation method and system for loess collapsibility based...

ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...

TUNING OF NARROWBAND NEAR-FIELD PROBES

TDR MEASURING APPARATUS FOR DETERMINING THE DIELECTRIC CONSTANT

ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...

DETERMINING SOLIDS CONTENT USING DIELECTRIC PROPERTIES

PROBE CARD FOR MEASURING MICRO-CAPACITANCE

Metamaterial Particles for Near-Field Sensing Applications

MEASURING DEVICE AND A METHOD FOR DETERMINING TISSUE PARAMETERS

DEVICE AND METHOD FOR RESONANT HIGH-SPEED MICROSCOPIC IMPEDANCE PROBE

Method and system for measurement of dielectric constant of thin fi...

Method and system for non-contact measurement of microwave capacita...

Dielectric constant measuring apparatus, dielectric constant measur...