Protecting

Industry

CPC
G01B9/02052

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02052Protecting

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Chamber for vibrational and environmental isolation of thin wafers
- Patent number 11,555,791
- Issue date Jan 17, 2023
- Corning Incorporated
- John Weston Frankovich
- G01 - MEASURING TESTING
Information Patent Grant
Retro-reflective interferometer
- Patent number 11,092,478
- Issue date Aug 17, 2021
- X-BEAMER TECHNOLOGIES LTD.
- Igal Zlochin
- G01 - MEASURING TESTING
Information Patent Grant
Pressure insensitive interferometer
- Patent number 10,352,685
- Issue date Jul 16, 2019
- Geospace Technologies Corporation
- Willard Womack
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to reduce pressure and thermal sensitivity of high precis...
- Patent number 10,209,057
- Issue date Feb 19, 2019
- Baker Hughes, a GE company, LLC
- Carl M. Edwards
- E21 - EARTH DRILLING MINING
Information Patent Grant
Durable single mode fiber probe with optimized reference reflectivity
- Patent number 9,175,944
- Issue date Nov 3, 2015
- The Johns Hopkins University
- Jin U. Kang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for improving the temperature stability and mi...
- Patent number 8,621,945
- Issue date Jan 7, 2014
- KLA Tencor
- An Andrew Zeng
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for effective isolation of an interferometer
- Patent number 8,474,782
- Issue date Jul 2, 2013
- Baker Hughes Incorporated
- David Dixon
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
System and method for determining positions of structures on a subs...
- Patent number 7,978,340
- Issue date Jul 12, 2011
- Vistec Semiconductor Systems GmbH
- Hans-Artur Boesser
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring machine for measuring structures on a substrate
- Patent number 7,961,334
- Issue date Jun 14, 2011
- Vistec Semiconductor Systems GmbH
- Hans-Artur Boesser
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining positions of structures on a substrate
- Patent number 7,948,635
- Issue date May 24, 2011
- Vistec Semiconductor Systems GmbH
- Katrin Pietsch
- G01 - MEASURING TESTING
Information Patent Grant
Precision length standard for coherent laser radar
- Patent number 7,925,134
- Issue date Apr 12, 2011
- Nikon Metrology NV
- Anthony Slotwinski
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry system chamber viewing window
- Patent number 7,719,693
- Issue date May 18, 2010
- The Aerospace Corporation
- Jon V. Osborn
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and device for measuring wall thickness of a pipe in a pipe-...
- Patent number 7,116,428
- Issue date Oct 3, 2006
- SMS Meer GmbH
- Martin Sauerland
- G01 - MEASURING TESTING
Information Patent Grant
Compensating for effects of non-isotropic gas mixtures in interfero...
- Patent number 7,042,574
- Issue date May 9, 2006
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Compensating for effects of variations in gas refractivity in inter...
- Patent number 6,842,256
- Issue date Jan 11, 2005
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometric measuring instrument and laser interference...
- Patent number 6,697,162
- Issue date Feb 24, 2004
- Mitutoyo Corporation
- Hisayoshi Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method of supporting reference plate for lightwave interferometer
- Patent number 6,556,304
- Issue date Apr 29, 2003
- Fuji Photo Optical Co., Ltd.
- Hiroshi Shibamoto
- G01 - MEASURING TESTING
Information Patent Grant
Stage control method using a temperature
- Patent number 6,407,799
- Issue date Jun 18, 2002
- Nikon Corporation
- Hideaki Hara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Displaceable X/Y coordinate measurement table
- Patent number 6,347,458
- Issue date Feb 19, 2002
- Leica Microsystems Wetzlar GmbH
- Ulrich Kaczynski
- G01 - MEASURING TESTING
Information Patent Grant
Length measuring machine and method using laser beams
- Patent number 6,034,773
- Issue date Mar 7, 2000
- Mitutoyo Corporation
- Kunitoshi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Stage apparatus and a stage control method
- Patent number 5,959,732
- Issue date Sep 28, 1999
- Nikon Corporation
- Hideaki Hara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Distance measuring device based on laser interference with a baffle...
- Patent number 5,875,031
- Issue date Feb 23, 1999
- Nikon Corporation
- Soichi Owa
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer having a sheath for the laser beam
- Patent number 5,708,505
- Issue date Jan 13, 1998
- Nikon Corporation
- Michael Reid Sogard
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Laser interferometer for measuring object displacement over large d...
- Patent number 5,638,177
- Issue date Jun 10, 1997
- Renishaw plc
- Raymond J. Chaney
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring position of an X-Y stage
- Patent number 5,552,888
- Issue date Sep 3, 1996
- Nikon Precision, Inc.
- Michael R. Sogard
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Stage-position measuring apparatus
- Patent number 5,469,260
- Issue date Nov 21, 1995
- Nikon Corporation
- Shinichi Takagi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Laser referencing system for refractively scanning interferometer
- Patent number 5,155,551
- Issue date Oct 13, 1992
- Research Cottrell Technologies, Inc.
- D. Warren Vidrine
- G01 - MEASURING TESTING
Information Patent Grant
Laser interferometer for inspecting the surface of a specimen
- Patent number 5,127,734
- Issue date Jul 7, 1992
- Fuji Photo Optical Co., Ltd.
- Shigenori Ohi
- G01 - MEASURING TESTING
Information Patent Grant
Ruggedized compact interferometer requiring minimum isolation from...
- Patent number 4,693,603
- Issue date Sep 15, 1987
- Midac Corporation
- Gerald L. Auth
- G01 - MEASURING TESTING
Information Patent Grant
Precision measuring apparatus having a measuring interval sealed fr...
- Patent number 4,377,036
- Issue date Mar 22, 1983
- Dr. Johannes Heidenhain GmbH
- Holmer Dangschat
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SAFETY DEVICE
- Publication number 20240245298
- Publication date Jul 25, 2024
- Canon U.S.A., Inc.
- Badr Elmaanaoui
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE INSENSITIVE INTERFEROMETER
- Publication number 20170363412
- Publication date Dec 21, 2017
- PGS GEOPHYSICAL AS
- Willard Womack
- G02 - OPTICS
Information Patent Application
APPARATUS TO REDUCE PRESSURE AND THERMAL SENSITIVITY OF HIGH PRECIS...
- Publication number 20170082422
- Publication date Mar 23, 2017
- BAKER HUGHES INCORPORATED
- CARL M. EDWARDS
- G01 - MEASURING TESTING
Information Patent Application
DURABLE SINGLE MODE FIBER PROBE WITH OPTIMIZED REFERENCE REFLECTIVITY
- Publication number 20140160485
- Publication date Jun 12, 2014
- The Johns Hopkins University
- Jin U. Kang
- G02 - OPTICS
Information Patent Application
OPTICAL MODULE
- Publication number 20140078508
- Publication date Mar 20, 2014
- FUJITSU OPTICAL COMPONENTS LIMITED
- Hirofumi AOTA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETER SYSTEM WITH DAMPED VIBRATION AND NOISE EFFEC...
- Publication number 20120307255
- Publication date Dec 6, 2012
- Chang Seok KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPAATUS FOR IMPROVING THE TEMPERATURE STABILITY AND MIN...
- Publication number 20120118061
- Publication date May 17, 2012
- KLA-Tencor Corporation
- An Andrew Zeng
- G05 - CONTROLLING REGULATING
Information Patent Application
System and Method for Effective Isolation of an Interferometer
- Publication number 20110261361
- Publication date Oct 27, 2011
- BAKER HUGHES INCORPORATED
- David Dixon
- G01 - MEASURING TESTING
Information Patent Application
PRECISION LENGTH STANDARD FOR COHERENT LASER RADAR
- Publication number 20090323077
- Publication date Dec 31, 2009
- METRIS USA, INC.
- Anthony Slotwinski
- G01 - MEASURING TESTING
Information Patent Application
Method for determining positions of structures on a substrate
- Publication number 20090109443
- Publication date Apr 30, 2009
- Vistec Semiconductor Systems GmbH
- Katrin Pietsch
- G01 - MEASURING TESTING
Information Patent Application
Coordinate measuring machine for measuring structures on a substrate
- Publication number 20090031572
- Publication date Feb 5, 2009
- Vistec Semiconductor Systems GmbH
- Hans-Artur Boesser
- G01 - MEASURING TESTING
Information Patent Application
System and method for determining positions of structures on a subs...
- Publication number 20090033508
- Publication date Feb 5, 2009
- Vistec Semiconductor Systems GmbH
- Hans-Artur Boesser
- G01 - MEASURING TESTING
Information Patent Application
Interferometry system chamber viewing window
- Publication number 20080259344
- Publication date Oct 23, 2008
- Jon V. Osborn
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR REDUCING CONVECTION CURRENT EFFECTS IN THE OP...
- Publication number 20080236306
- Publication date Oct 2, 2008
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING THE POSITION OF AN OBJECT WITH A LASER INTE...
- Publication number 20070103696
- Publication date May 10, 2007
- Vistec Semiconductor Systems GmbH
- Harald Pohlmann
- G01 - MEASURING TESTING
Information Patent Application
Precision length standard for coherent laser radar
- Publication number 20060280415
- Publication date Dec 14, 2006
- Anthony Slotwinski
- G01 - MEASURING TESTING
Information Patent Application
Interferometry measurement in disturbed environments
- Publication number 20060256345
- Publication date Nov 16, 2006
- KLA-Tencor Technologies Corp.
- Romain Sappey
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring wall thickness of a pipe in a pipe-...
- Publication number 20050162662
- Publication date Jul 28, 2005
- SMS Meer GmbH
- Martin Sauerland
- G01 - MEASURING TESTING
Information Patent Application
Coherent beam device for observing and measuring sample
- Publication number 20050146730
- Publication date Jul 7, 2005
- Junji Endo
- G01 - MEASURING TESTING
Information Patent Application
Compensating for effects of variations in gas refractivity in inter...
- Publication number 20030151750
- Publication date Aug 14, 2003
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Compensating for effects of non-isotropic gas mixtures in interfero...
- Publication number 20030128369
- Publication date Jul 10, 2003
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measuring arrangement for superimposing at least tw...
- Publication number 20020122181
- Publication date Sep 5, 2002
- Medizinisches Laserzentrum Lubeck GmbH
- Peter Koch
- G01 - MEASURING TESTING
Information Patent Application
A STAGE CONTROL METHOD USING A TEMPERATURE
- Publication number 20020015139
- Publication date Feb 7, 2002
- HIDEAKI HARA
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Chamber for vibrational and environmental isolation of thin wafers

Retro-reflective interferometer

Pressure insensitive interferometer

Apparatus to reduce pressure and thermal sensitivity of high precis...

Durable single mode fiber probe with optimized reference reflectivity

Method and apparatus for improving the temperature stability and mi...

System and method for effective isolation of an interferometer

System and method for determining positions of structures on a subs...

Coordinate measuring machine for measuring structures on a substrate

Method for determining positions of structures on a substrate

Precision length standard for coherent laser radar

Interferometry system chamber viewing window

Method and device for measuring wall thickness of a pipe in a pipe-...

Compensating for effects of non-isotropic gas mixtures in interfero...

Compensating for effects of variations in gas refractivity in inter...

Optical interferometric measuring instrument and laser interference...

Method of supporting reference plate for lightwave interferometer

Stage control method using a temperature

Displaceable X/Y coordinate measurement table

Length measuring machine and method using laser beams

Stage apparatus and a stage control method

Distance measuring device based on laser interference with a baffle...

Laser interferometer having a sheath for the laser beam

Laser interferometer for measuring object displacement over large d...

Apparatus for measuring position of an X-Y stage

Stage-position measuring apparatus

Laser referencing system for refractively scanning interferometer

Laser interferometer for inspecting the surface of a specimen

Ruggedized compact interferometer requiring minimum isolation from...

Precision measuring apparatus having a measuring interval sealed fr...

Patents Applicationslast 30 patents

OPTICAL SAFETY DEVICE

PRESSURE INSENSITIVE INTERFEROMETER

APPARATUS TO REDUCE PRESSURE AND THERMAL SENSITIVITY OF HIGH PRECIS...

DURABLE SINGLE MODE FIBER PROBE WITH OPTIMIZED REFERENCE REFLECTIVITY

OPTICAL MODULE

OPTICAL INTERFEROMETER SYSTEM WITH DAMPED VIBRATION AND NOISE EFFEC...

METHOD AND APPAATUS FOR IMPROVING THE TEMPERATURE STABILITY AND MIN...

System and Method for Effective Isolation of an Interferometer

PRECISION LENGTH STANDARD FOR COHERENT LASER RADAR

Method for determining positions of structures on a substrate

Coordinate measuring machine for measuring structures on a substrate

System and method for determining positions of structures on a subs...

Interferometry system chamber viewing window

SYSTEM AND METHOD FOR REDUCING CONVECTION CURRENT EFFECTS IN THE OP...

APPARATUS FOR MEASURING THE POSITION OF AN OBJECT WITH A LASER INTE...

Precision length standard for coherent laser radar

Interferometry measurement in disturbed environments

Method and device for measuring wall thickness of a pipe in a pipe-...

Coherent beam device for observing and measuring sample

Compensating for effects of variations in gas refractivity in inter...

Compensating for effects of non-isotropic gas mixtures in interfero...

Interferometric measuring arrangement for superimposing at least tw...

A STAGE CONTROL METHOD USING A TEMPERATURE