related to cooling

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G01R31/2877

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2877related to cooling

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Small-sized fast cold and hot shock test devices
- Patent number 12,061,225
- Issue date Aug 13, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assemblies with liquid cooled frame for semiconductor i...
- Patent number 12,032,000
- Issue date Jul 9, 2024
- Smiths Interconnect Americas, Inc.
- Quynh Ngoc Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,000,885
- Issue date Jun 4, 2024
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,940,487
- Issue date Mar 26, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,485
- Issue date Mar 26, 2024
- Tokyo Electron Limited
- Naoki Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryogenic wafer testing system
- Patent number 11,927,621
- Issue date Mar 12, 2024
- High Precision Devices, Inc.
- Michael Snow
- G01 - MEASURING TESTING
Information Patent Grant
System and method of testing a semiconductor device
- Patent number 11,885,846
- Issue date Jan 30, 2024
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 11,852,678
- Issue date Dec 26, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Cooling unit, objective lens module, semiconductor inspection devic...
- Patent number 11,841,393
- Issue date Dec 12, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 11,841,392
- Issue date Dec 12, 2023
- Advantest Test Solutiions, Inc.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 11,835,549
- Issue date Dec 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Test system with a thermal head comprising a plurality of adapters...
- Patent number 11,828,795
- Issue date Nov 28, 2023
- AEM Holdings Ltd.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Thermal mitigation for an electronic speaker device and associated...
- Patent number 11,832,426
- Issue date Nov 28, 2023
- Google LLC
- Emil Rahim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature compensated current source for cryogenic electronic tes...
- Patent number 11,789,065
- Issue date Oct 17, 2023
- Northrop Grumman Systems Corporation
- Scott F. Allwine
- G01 - MEASURING TESTING
Information Patent Grant
Temperature adjustment method for mounting base, inspection device,...
- Patent number 11,762,011
- Issue date Sep 19, 2023
- Tokyo Electron Limited
- Shigeru Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,761,704
- Issue date Sep 19, 2023
- Tokyo Electron Limited
- Jun Fujihara
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Test site configuration in an automated test system
- Patent number 11,754,596
- Issue date Sep 12, 2023
- Teradyne, Inc.
- Michael O. McKenna
- G01 - MEASURING TESTING
Information Patent Grant
System and method for semiconductor device random telegraph sequenc...
- Patent number 11,674,995
- Issue date Jun 13, 2023
- Cirrus Logic, Inc.
- Aleksey S. Khenkin
- G01 - MEASURING TESTING
Information Patent Grant
Test system with a thermal head comprising a plurality of adapters...
- Patent number 11,656,272
- Issue date May 23, 2023
- AEM Holdings Ltd.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
High current device testing apparatus and systems
- Patent number 11,656,273
- Issue date May 23, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
- Patent number 11,639,957
- Issue date May 2, 2023
- Northrop Grumman Systems Corporation
- Kelsey McCusker
- G01 - MEASURING TESTING
Information Patent Grant
Thermal switch for rapid thermal coupling and decoupling of devices...
- Patent number 11,592,472
- Issue date Feb 28, 2023
- Intel Corporation
- Joe F. Walczyk
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test system and semiconductor package fabrica...
- Patent number 11,592,478
- Issue date Feb 28, 2023
- Samsung Electronics Co., Ltd.
- Jaehong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test carrier and electronic component testing apparatus
- Patent number 11,579,187
- Issue date Feb 14, 2023
- Advantest Corporation
- Toshiyuki Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 11,573,262
- Issue date Feb 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,549,981
- Issue date Jan 10, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
System and method of testing a semiconductor device
- Patent number 11,543,450
- Issue date Jan 3, 2023
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test handler and semiconductor device equipment including same
- Patent number 11,513,151
- Issue date Nov 29, 2022
- Samsung Electronics Co., Ltd.
- Yeong Seok Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
- Publication number 20240385237
- Publication date Nov 21, 2024
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND METHODS
- Publication number 20240369620
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jyu-Hua HSIAO
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...
- Publication number 20240369622
- Publication date Nov 7, 2024
- Samsung Electronics Co., Ltd.
- SUNHEE KIM
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361379
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361378
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
- Publication number 20240329120
- Publication date Oct 3, 2024
- AEM SINGAPORE PTE. LTD.
- Thomas P. JONES
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...
- Publication number 20240302430
- Publication date Sep 12, 2024
- Advantest Corporation
- Brad EMBERGER
- G01 - MEASURING TESTING
Information Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
- Publication number 20240230752
- Publication date Jul 11, 2024
- AEM Singapore Pte, LTD.
- Thomas P. JONES
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES
- Publication number 20240201249
- Publication date Jun 20, 2024
- Bouchaib Hraimel
- G01 - MEASURING TESTING
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...
- Publication number 20240183897
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC EQUIPMENT
- Publication number 20240183899
- Publication date Jun 6, 2024
- Total Quality Systems
- Bryan Steadman
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT
- Publication number 20240175917
- Publication date May 30, 2024
- Intel Corporation
- Ruben NUNEZ BLANCO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thermal Mitigation for An Electronic Speaker Device and Associated...
- Publication number 20240155818
- Publication date May 9, 2024
- Google LLC
- Emil Rahim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240142492
- Publication date May 2, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240142514
- Publication date May 2, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
- Publication number 20240133946
- Publication date Apr 25, 2024
- AEM Holdings Ltd.
- Thomas P. JONES
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20240133943
- Publication date Apr 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...
- Publication number 20240103069
- Publication date Mar 28, 2024
- RENESAS ELECTRONICS CORPORATION
- Osamu MIZOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TEST SYSTEM BY FEEDBACK CONTROL
- Publication number 20240053399
- Publication date Feb 15, 2024
- Samsung Electronics Co., Ltd.
- Gibong LEE
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
- Publication number 20240036104
- Publication date Feb 1, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD
- Publication number 20240003966
- Publication date Jan 4, 2024
- Meritech Co., Ltd.
- BYUNG GOOK CHANG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20230417826
- Publication date Dec 28, 2023
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING...
- Publication number 20230400506
- Publication date Dec 14, 2023
- CHROMA ATE INC.
- Chin-Yi OUYANG
- G01 - MEASURING TESTING
Information Patent Application
TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THE...
- Publication number 20230393188
- Publication date Dec 7, 2023
- Advantest Test Solutions, Inc.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS...
- Publication number 20230314500
- Publication date Oct 5, 2023
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20230305053
- Publication date Sep 28, 2023
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20230296667
- Publication date Sep 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G05 - CONTROLLING REGULATING
Information Patent Application
TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...
- Publication number 20230296666
- Publication date Sep 21, 2023
- Advantest Corporation
- Yuya Yamada
- F28 - HEAT EXCHANGE IN GENERAL

related to cooling

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for testing electronic devices

Small-sized fast cold and hot shock test devices

Test socket assemblies with liquid cooled frame for semiconductor i...

Multiplexed thermal control wafer and coldplate

Thermal solution for massively parallel testing

Inspection apparatus and inspection method

Cryogenic wafer testing system

System and method of testing a semiconductor device

Apparatus for testing electronic devices

Multi-input multi-zone thermal control for device testing

Cooling unit, objective lens module, semiconductor inspection devic...

Integrated test cell using active thermal interposer (ATI) with par...

Thermal array with gimbal features and enhanced thermal performance

Test system with a thermal head comprising a plurality of adapters...

Thermal mitigation for an electronic speaker device and associated...

Temperature compensated current source for cryogenic electronic tes...

Temperature adjustment method for mounting base, inspection device,...

Inspection apparatus and inspection method

Test site configuration in an automated test system

System and method for semiconductor device random telegraph sequenc...

Test system with a thermal head comprising a plurality of adapters...

High current device testing apparatus and systems

Planar ring radiation barrier for cryogenic wafer test system

Thermal switch for rapid thermal coupling and decoupling of devices...

Semiconductor package test system and semiconductor package fabrica...

Test carrier and electronic component testing apparatus

Multi-input multi-zone thermal control for device testing

Thermal solution for massively parallel testing

System and method of testing a semiconductor device

Test handler and semiconductor device equipment including same

Patents Applicationslast 30 patents

DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...

WAFER TEST SYSTEM AND METHODS

HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...

THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...

SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES

WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...

TESTING OF ELECTRONIC EQUIPMENT

ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT

Thermal Mitigation for An Electronic Speaker Device and Associated...

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...

SEMICONDUCTOR WAFER TEST SYSTEM BY FEEDBACK CONTROL

THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE

BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING...

TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THE...

TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS...

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...