related to cooling

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CPC
G01R31/2877

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2877related to cooling

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 12,345,756
- Issue date Jul 1, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in system with multiple plugs on the test board
- Patent number 12,345,758
- Issue date Jul 1, 2025
- Meritech CO., Ltd.
- Byung Gook Chang
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing method for semiconductor device
- Patent number 12,339,313
- Issue date Jun 24, 2025
- Renesas Electronics Corporation
- Osamu Mizoguchi
- G01 - MEASURING TESTING
Information Patent Grant
Heat exchange method using fluorinated compounds having a low GWP
- Patent number 12,325,819
- Issue date Jun 10, 2025
- Solvay Specialty Polymers Italy S.p.A.
- Emanuela Antenucci
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Protecting method for preventing solder crack failure in electronic...
- Patent number 12,328,827
- Issue date Jun 10, 2025
- SOLID STATE STORAGE TECHNOLOGY CORPORATION
- Tsung-Lung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Small-sized fast cold and hot shock test devices
- Patent number 12,313,674
- Issue date May 27, 2025
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Thermal mitigation for an electronic speaker device and associated...
- Patent number 12,317,460
- Issue date May 27, 2025
- Google LLC
- Emil Rahim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Coolant supplying apparatus, and temperature controlling apparatus...
- Patent number 12,276,694
- Issue date Apr 15, 2025
- Semes Co., Ltd.
- Young Joo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 12,276,693
- Issue date Apr 15, 2025
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,259,428
- Issue date Mar 25, 2025
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal head comprising a plurality of adapters for independent the...
- Patent number 12,259,427
- Issue date Mar 25, 2025
- AEM Singapore Pte, LTD.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Pogo pin cooling system and method and electronic device testing ap...
- Patent number 12,253,541
- Issue date Mar 18, 2025
- CHROMA ATE INC.
- I-Shih Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 12,210,056
- Issue date Jan 28, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 12,203,979
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Small-sized fast cold and hot shock test devices
- Patent number 12,061,225
- Issue date Aug 13, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assemblies with liquid cooled frame for semiconductor i...
- Patent number 12,032,000
- Issue date Jul 9, 2024
- Smiths Interconnect Americas, Inc.
- Quynh Ngoc Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,000,885
- Issue date Jun 4, 2024
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,940,487
- Issue date Mar 26, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,485
- Issue date Mar 26, 2024
- Tokyo Electron Limited
- Naoki Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryogenic wafer testing system
- Patent number 11,927,621
- Issue date Mar 12, 2024
- High Precision Devices, Inc.
- Michael Snow
- G01 - MEASURING TESTING
Information Patent Grant
System and method of testing a semiconductor device
- Patent number 11,885,846
- Issue date Jan 30, 2024
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-input multi-zone thermal control for device testing
- Patent number 11,852,678
- Issue date Dec 26, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Cooling unit, objective lens module, semiconductor inspection devic...
- Patent number 11,841,393
- Issue date Dec 12, 2023
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 11,841,392
- Issue date Dec 12, 2023
- Advantest Test Solutiions, Inc.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 11,835,549
- Issue date Dec 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Grant
Test system with a thermal head comprising a plurality of adapters...
- Patent number 11,828,795
- Issue date Nov 28, 2023
- AEM Holdings Ltd.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Thermal mitigation for an electronic speaker device and associated...
- Patent number 11,832,426
- Issue date Nov 28, 2023
- Google LLC
- Emil Rahim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Two-Phase Helium Convection Loop for Cryogenic Cooling
- Publication number 20250224441
- Publication date Jul 10, 2025
- Massachusetts Institute of Technology
- John CUMMINGS
- G01 - MEASURING TESTING
Information Patent Application
CHIP COOLING MODULE AND CHIP TESTING APPARATUS HAVING SAME
- Publication number 20250216445
- Publication date Jul 3, 2025
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING A...
- Publication number 20250216444
- Publication date Jul 3, 2025
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
MULTI ZONE TEMPERATURE CONTROL FOR DEVICES UNDER TEST
- Publication number 20250208197
- Publication date Jun 26, 2025
- Intel Corporation
- Gregorio R. MURTAGIAN
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...
- Publication number 20250180638
- Publication date Jun 5, 2025
- Advantest Corporation
- Natan CHEJANOVSKY
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...
- Publication number 20250180633
- Publication date Jun 5, 2025
- Advantest Corporation
- Natan CHEJANOVSKY
- G01 - MEASURING TESTING
Information Patent Application
PROBE TESTING APPARATUS, PROBE TESTING SYSTEM AND PROBE CARD
- Publication number 20250172609
- Publication date May 29, 2025
- RENESAS ELECTRONICS CORPORATION
- Hisayoshi HANAI
- G01 - MEASURING TESTING
Information Patent Application
COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS
- Publication number 20250164549
- Publication date May 22, 2025
- Advantest Corporation
- Yasufumi Yoda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST
- Publication number 20250155495
- Publication date May 15, 2025
- Byeong-gyu CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR BURN-IN MACHINE COOLING SYSTEM
- Publication number 20250130275
- Publication date Apr 24, 2025
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250123323
- Publication date Apr 17, 2025
- Samsung Electronics Co., Ltd.
- Haewook PARK
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTO...
- Publication number 20250116698
- Publication date Apr 10, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Hsuan CHANG
- G01 - MEASURING TESTING
Information Patent Application
TEST ENVIRONMENT CONTROL SYSTEM
- Publication number 20250116699
- Publication date Apr 10, 2025
- YISHI Industrial Co.,Ltd
- WEN-HSIN LEE
- G01 - MEASURING TESTING
Information Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
- Publication number 20250102565
- Publication date Mar 27, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076367
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY SYSTEM AND RELATED METHOD
- Publication number 20250035700
- Publication date Jan 30, 2025
- GLOBALFOUNDRIES U.S. Inc.
- Jae Hoon Kim
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...
- Publication number 20250027988
- Publication date Jan 23, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
- Publication number 20240385237
- Publication date Nov 21, 2024
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND METHODS
- Publication number 20240369620
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jyu-Hua HSIAO
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...
- Publication number 20240369622
- Publication date Nov 7, 2024
- Samsung Electronics Co., Ltd.
- SUNHEE KIM
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361379
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361378
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
- Publication number 20240329120
- Publication date Oct 3, 2024
- AEM SINGAPORE PTE. LTD.
- Thomas P. JONES
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES
- Publication number 20240329121
- Publication date Oct 3, 2024
- KIUTRA GMBH
- Jan Spallek
- G01 - MEASURING TESTING
Information Patent Application
DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...
- Publication number 20240302430
- Publication date Sep 12, 2024
- Advantest Corporation
- Brad EMBERGER
- G01 - MEASURING TESTING
Information Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
- Publication number 20240230752
- Publication date Jul 11, 2024
- AEM Singapore Pte, LTD.
- Thomas P. JONES
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES
- Publication number 20240201249
- Publication date Jun 20, 2024
- Bouchaib Hraimel
- G01 - MEASURING TESTING
Information Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...
- Publication number 20240183897
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF ELECTRONIC EQUIPMENT
- Publication number 20240183899
- Publication date Jun 6, 2024
- Total Quality Systems
- Bryan Steadman
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT
- Publication number 20240175917
- Publication date May 30, 2024
- Intel Corporation
- Ruben NUNEZ BLANCO
- H01 - BASIC ELECTRIC ELEMENTS

related to cooling

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated test cell using active thermal interposer (ATI) with par...

Burn-in system with multiple plugs on the test board

Electrical testing method for semiconductor device

Heat exchange method using fluorinated compounds having a low GWP

Protecting method for preventing solder crack failure in electronic...

Small-sized fast cold and hot shock test devices

Thermal mitigation for an electronic speaker device and associated...

Electronic component handling apparatus and electronic component te...

Coolant supplying apparatus, and temperature controlling apparatus...

Electronic component handling apparatus, electronic component testi...

Multiplexed thermal control wafer and coldplate

Thermal head comprising a plurality of adapters for independent the...

Pogo pin cooling system and method and electronic device testing ap...

Thermal array with gimbal features and enhanced thermal performance

Multi-input multi-zone thermal control for device testing

Apparatus for testing electronic devices

Small-sized fast cold and hot shock test devices

Test socket assemblies with liquid cooled frame for semiconductor i...

Multiplexed thermal control wafer and coldplate

Thermal solution for massively parallel testing

Inspection apparatus and inspection method

Cryogenic wafer testing system

System and method of testing a semiconductor device

Apparatus for testing electronic devices

Multi-input multi-zone thermal control for device testing

Cooling unit, objective lens module, semiconductor inspection devic...

Integrated test cell using active thermal interposer (ATI) with par...

Thermal array with gimbal features and enhanced thermal performance

Test system with a thermal head comprising a plurality of adapters...

Thermal mitigation for an electronic speaker device and associated...

Patents Applicationslast 30 patents

Two-Phase Helium Convection Loop for Cryogenic Cooling

CHIP COOLING MODULE AND CHIP TESTING APPARATUS HAVING SAME

ANTI-CONDENSATION LOW-TEMPERATURE TESTING MODULE AND CHIP TESTING A...

MULTI ZONE TEMPERATURE CONTROL FOR DEVICES UNDER TEST

AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...

AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...

PROBE TESTING APPARATUS, PROBE TESTING SYSTEM AND PROBE CARD

COOLING PLATE, WIRING BOARD ASSEMBLY AND DEVICE TESTING APPARATUS

APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST

SEMICONDUCTOR BURN-IN MACHINE COOLING SYSTEM

SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR TESTING APPARATUS AND METHOD FOR TESTING SEMICONDUCTO...

TEST ENVIRONMENT CONTROL SYSTEM

MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

TEST TRAY SYSTEM AND RELATED METHOD

TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...

DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...

WAFER TEST SYSTEM AND METHODS

HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...

APPARATUS FOR TESTING AND/OR OPERATING ELECTRONIC DEVICES

DEVICE COOLING ENCLOSURE AND ADAPTER FOR HOUSING DEVICES OF DIFFERE...

THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...

SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES

WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...

TESTING OF ELECTRONIC EQUIPMENT

ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT