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G01R31/2877
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2877
related to cooling
Industries
Overview
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People
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Thermal solution for massively parallel testing
Patent number
11,940,487
Issue date
Mar 26, 2024
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,485
Issue date
Mar 26, 2024
Tokyo Electron Limited
Naoki Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cryogenic wafer testing system
Patent number
11,927,621
Issue date
Mar 12, 2024
High Precision Devices, Inc.
Michael Snow
G01 - MEASURING TESTING
Information
Patent Grant
System and method of testing a semiconductor device
Patent number
11,885,846
Issue date
Jan 30, 2024
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing electronic devices
Patent number
11,860,221
Issue date
Jan 2, 2024
AEHR Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-input multi-zone thermal control for device testing
Patent number
11,852,678
Issue date
Dec 26, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Cooling unit, objective lens module, semiconductor inspection devic...
Patent number
11,841,393
Issue date
Dec 12, 2023
Hamamatsu Photonics K.K.
Tomonori Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
Patent number
11,841,392
Issue date
Dec 12, 2023
Advantest Test Solutiions, Inc.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Thermal array with gimbal features and enhanced thermal performance
Patent number
11,835,549
Issue date
Dec 5, 2023
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Grant
Test system with a thermal head comprising a plurality of adapters...
Patent number
11,828,795
Issue date
Nov 28, 2023
AEM Holdings Ltd.
Thomas P. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Thermal mitigation for an electronic speaker device and associated...
Patent number
11,832,426
Issue date
Nov 28, 2023
Google LLC
Emil Rahim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Temperature compensated current source for cryogenic electronic tes...
Patent number
11,789,065
Issue date
Oct 17, 2023
Northrop Grumman Systems Corporation
Scott F. Allwine
G01 - MEASURING TESTING
Information
Patent Grant
Temperature adjustment method for mounting base, inspection device,...
Patent number
11,762,011
Issue date
Sep 19, 2023
Tokyo Electron Limited
Shigeru Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,761,704
Issue date
Sep 19, 2023
Tokyo Electron Limited
Jun Fujihara
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Grant
Test site configuration in an automated test system
Patent number
11,754,596
Issue date
Sep 12, 2023
Teradyne, Inc.
Michael O. McKenna
G01 - MEASURING TESTING
Information
Patent Grant
System and method for semiconductor device random telegraph sequenc...
Patent number
11,674,995
Issue date
Jun 13, 2023
Cirrus Logic, Inc.
Aleksey S. Khenkin
G01 - MEASURING TESTING
Information
Patent Grant
Test system with a thermal head comprising a plurality of adapters...
Patent number
11,656,272
Issue date
May 23, 2023
AEM Holdings Ltd.
Thomas P. Jones
G01 - MEASURING TESTING
Information
Patent Grant
High current device testing apparatus and systems
Patent number
11,656,273
Issue date
May 23, 2023
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Grant
Planar ring radiation barrier for cryogenic wafer test system
Patent number
11,639,957
Issue date
May 2, 2023
Northrop Grumman Systems Corporation
Kelsey McCusker
G01 - MEASURING TESTING
Information
Patent Grant
Thermal switch for rapid thermal coupling and decoupling of devices...
Patent number
11,592,472
Issue date
Feb 28, 2023
Intel Corporation
Joe F. Walczyk
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor package test system and semiconductor package fabrica...
Patent number
11,592,478
Issue date
Feb 28, 2023
Samsung Electronics Co., Ltd.
Jaehong Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test carrier and electronic component testing apparatus
Patent number
11,579,187
Issue date
Feb 14, 2023
Advantest Corporation
Toshiyuki Kiyokawa
G01 - MEASURING TESTING
Information
Patent Grant
Multi-input multi-zone thermal control for device testing
Patent number
11,573,262
Issue date
Feb 7, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G05 - CONTROLLING REGULATING
Information
Patent Grant
Thermal solution for massively parallel testing
Patent number
11,549,981
Issue date
Jan 10, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
System and method of testing a semiconductor device
Patent number
11,543,450
Issue date
Jan 3, 2023
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Test handler and semiconductor device equipment including same
Patent number
11,513,151
Issue date
Nov 29, 2022
Samsung Electronics Co., Ltd.
Yeong Seok Kim
G01 - MEASURING TESTING
Information
Patent Grant
Thermal interface formed by condensate
Patent number
11,508,643
Issue date
Nov 22, 2022
International Business Machines Corporation
Mark D. Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
Patent number
11,493,551
Issue date
Nov 8, 2022
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Prober with cooling mechanism for directly cooling a device under test
Patent number
11,480,611
Issue date
Oct 25, 2022
Infineon Technologies AG
Andreas Gneupel
G01 - MEASURING TESTING
Information
Patent Grant
Dual sided thermal management solutions for integrated circuit pack...
Patent number
11,460,499
Issue date
Oct 4, 2022
Intel Corporation
Henning Braunisch
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
Publication number
20240142492
Publication date
May 2, 2024
CHROMA ATE INC.
I-Shih TSENG
G01 - MEASURING TESTING
Information
Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
Publication number
20240142514
Publication date
May 2, 2024
HITOP INSTRUMENT (JIANGSU) CO., LTD.
Dongxi LIU
G01 - MEASURING TESTING
Information
Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
Publication number
20240133946
Publication date
Apr 25, 2024
AEM Holdings Ltd.
Thomas P. JONES
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
Publication number
20240133943
Publication date
Apr 25, 2024
ADVANTEST TEST SOLUTIONS, INC.
Karthik RANGANATHAN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
Publication number
20240103068
Publication date
Mar 28, 2024
Aehr Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING...
Publication number
20240103069
Publication date
Mar 28, 2024
RENESAS ELECTRONICS CORPORATION
Osamu MIZOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR WAFER TEST SYSTEM BY FEEDBACK CONTROL
Publication number
20240053399
Publication date
Feb 15, 2024
Samsung Electronics Co., Ltd.
Gibong LEE
G01 - MEASURING TESTING
Information
Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
Publication number
20240036104
Publication date
Feb 1, 2024
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Application
BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD
Publication number
20240003966
Publication date
Jan 4, 2024
Meritech Co., Ltd.
BYUNG GOOK CHANG
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
Publication number
20230417826
Publication date
Dec 28, 2023
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING...
Publication number
20230400506
Publication date
Dec 14, 2023
CHROMA ATE INC.
Chin-Yi OUYANG
G01 - MEASURING TESTING
Information
Patent Application
TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THE...
Publication number
20230393188
Publication date
Dec 7, 2023
Advantest Test Solutions, Inc.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS...
Publication number
20230314500
Publication date
Oct 5, 2023
Advantest Corporation
Aritomo Kikuchi
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
Publication number
20230305053
Publication date
Sep 28, 2023
Advantest Corporation
Yuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
Publication number
20230296667
Publication date
Sep 21, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G05 - CONTROLLING REGULATING
Information
Patent Application
TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARAT...
Publication number
20230296666
Publication date
Sep 21, 2023
Advantest Corporation
Yuya Yamada
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Application
LEAK TESTING SYSTEMS AND METHODS THEREOF
Publication number
20230258711
Publication date
Aug 17, 2023
Sciemetric Instruments Inc.
Steven WHITE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CONTROLLING REFRIGERATION LOOP EXPANSION VALV...
Publication number
20230236242
Publication date
Jul 27, 2023
LTI Holdings, Inc.
Eric ZAHL
G01 - MEASURING TESTING
Information
Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
Publication number
20230236241
Publication date
Jul 27, 2023
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Application
THERMAL SOLUTION FOR MASSIVELY PARALLEL TESTING
Publication number
20230228812
Publication date
Jul 20, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT CHIP HAVING BACK-SURFACE TOPOGRAPHY FOR ENHANCED...
Publication number
20230184833
Publication date
Jun 15, 2023
International Business Machines Corporation
Mark D. Schultz
G01 - MEASURING TESTING
Information
Patent Application
MODULAR AND ADJUSTABLE THERMAL LOAD TEST VEHICLE
Publication number
20230152369
Publication date
May 18, 2023
Microsoft Technology Licensing, LLC
Dennis TRIEU
G01 - MEASURING TESTING
Information
Patent Application
HIGH CURRENT DEVICE TESTING APPARATUS AND SYSTEMS
Publication number
20230143240
Publication date
May 11, 2023
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICE
Publication number
20230122944
Publication date
Apr 20, 2023
SK HYNIX INC.
Gyung Jin KIM
G01 - MEASURING TESTING
Information
Patent Application
MULTI-INPUT MULTI-ZONE THERMAL CONTROL FOR DEVICE TESTING
Publication number
20230103082
Publication date
Mar 30, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
TEST SOCKET ASSEMBLIES WITH LIQUID COOLED FRAME FOR SEMICONDUCTOR I...
Publication number
20230047762
Publication date
Feb 16, 2023
Smiths Interconnect Americas, Inc.
Quynh Ngoc Nguyen
G01 - MEASURING TESTING
Information
Patent Application
TEST CARRIER AND ELECTRONIC COMPONENT TESTING APPARATUS
Publication number
20230023699
Publication date
Jan 26, 2023
Advantest Corporation
Toshiyuki Kiyokawa
G01 - MEASURING TESTING
Information
Patent Application
Cryogenic Wafer Testing System
Publication number
20230014966
Publication date
Jan 19, 2023
High Precision Devices, Inc.
Michael Snow
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RADIATION BARRIER FOR CRYOGENIC WAFER TEST SYSTEM
Publication number
20230003791
Publication date
Jan 5, 2023
Northrop Grumman Systems Corporation
KELSEY McCUSKER
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
Publication number
20220299563
Publication date
Sep 22, 2022
ADVANTEST TEST SOLUTIONS, INC.
Karthik RANGANATHAN
G01 - MEASURING TESTING