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G01R31/2875
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/2875
related to heating
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Patents Grants
last 30 patents
Information
Patent Grant
Work press assembly for test handler
Patent number
12,241,929
Issue date
Mar 4, 2025
Taiwan Semiconductor Manufacturing Company, Ltd
Yi-Neng Chang
G01 - MEASURING TESTING
Information
Patent Grant
Heating structure and wafer test device
Patent number
12,237,184
Issue date
Feb 25, 2025
SEMIGHT INSTRUMENTS CO., LTD
Zhe Lian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test system support component exchange system and method
Patent number
12,235,315
Issue date
Feb 25, 2025
ADVANTEST TEST SOLUTIONS, INC.
Paul Ferrari
G01 - MEASURING TESTING
Information
Patent Grant
Active thermal interposer device
Patent number
12,216,154
Issue date
Feb 4, 2025
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Massively independent testers system
Patent number
12,153,085
Issue date
Nov 26, 2024
Hsu Kai Yang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and inspection method
Patent number
12,117,483
Issue date
Oct 15, 2024
Tokyo Electron Limited
Kentaro Konishi
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Grant
Thermal control wafer with integrated heating-sensing elements
Patent number
12,085,609
Issue date
Sep 10, 2024
AEM SINGAPORE PTE. LTD.
Carl L. Ostrowski
G01 - MEASURING TESTING
Information
Patent Grant
Heat spreaders for use in semiconductor device testing, such as bur...
Patent number
12,078,672
Issue date
Sep 3, 2024
Micron Technology, Inc.
Xiaopeng Qu
G01 - MEASURING TESTING
Information
Patent Grant
Control method of inspection apparatus and inspection apparatus
Patent number
12,075,537
Issue date
Aug 27, 2024
Tokyo Electron Limited
Hiroaki Agawa
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Support device, test system, and method of controlling support device
Patent number
12,061,226
Issue date
Aug 13, 2024
Tokyo Electron Limited
Kentaro Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Integrated heater and temperature measurement
Patent number
12,061,227
Issue date
Aug 13, 2024
AEM SINGAPORE PTE. LTD.
Carl L. Ostrowski
G01 - MEASURING TESTING
Information
Patent Grant
Small-sized fast cold and hot shock test devices
Patent number
12,061,225
Issue date
Aug 13, 2024
HITOP INSTRUMENT (JIANGSU) CO., LTD.
Dongxi Liu
G01 - MEASURING TESTING
Information
Patent Grant
Thermal control wafer with integrated heating-sensing elements
Patent number
12,013,432
Issue date
Jun 18, 2024
AEM SINGAPORE PTE. LTD.
Carl L. Ostrowski
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for thermal control of devices in an electronics...
Patent number
12,007,451
Issue date
Jun 11, 2024
AEHR Test Systems
Jovan Jovanovic
G01 - MEASURING TESTING
Information
Patent Grant
Test socket having an automated lid
Patent number
12,007,411
Issue date
Jun 11, 2024
Teradyne, Inc.
John P. Toscano
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit testing device with coupled control of thermal s...
Patent number
12,000,884
Issue date
Jun 4, 2024
Delta Design, Inc.
Jerry Ihor Tustaniwskyj
G01 - MEASURING TESTING
Information
Patent Grant
Multiplexed thermal control wafer and coldplate
Patent number
12,000,885
Issue date
Jun 4, 2024
AEM SINGAPORE PTE. LTD.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid circuit thermal test vehicles, systems, and methods
Patent number
11,965,928
Issue date
Apr 23, 2024
Juniper Networks, Inc.
Marshall J. Lise
G01 - MEASURING TESTING
Information
Patent Grant
Thermal solution for massively parallel testing
Patent number
11,940,487
Issue date
Mar 26, 2024
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor test device including temperature control module and...
Patent number
11,927,623
Issue date
Mar 12, 2024
SK Hynix Inc.
Nack Hyun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in board including strip socket with integrated heating for hi...
Patent number
11,913,989
Issue date
Feb 27, 2024
Microchip Technology Incorporated
Joseph Rascon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test system
Patent number
11,852,677
Issue date
Dec 26, 2023
Tokyo Electron Limited
Kentaro Konishi
G01 - MEASURING TESTING
Information
Patent Grant
Active thermal interposer device
Patent number
11,846,669
Issue date
Dec 19, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
Patent number
11,841,392
Issue date
Dec 12, 2023
Advantest Test Solutiions, Inc.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Placement table, testing device, and testing method
Patent number
11,828,794
Issue date
Nov 28, 2023
Tokyo Electron Limited
Shigeru Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Test system with a thermal head comprising a plurality of adapters...
Patent number
11,828,795
Issue date
Nov 28, 2023
AEM Holdings Ltd.
Thomas P. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Integrated heater and temperature measurement
Patent number
11,828,796
Issue date
Nov 28, 2023
AEM Holdings Ltd.
Carl L. Ostrowski
G01 - MEASURING TESTING
Information
Patent Grant
Thermal head for independent control of zones
Patent number
11,796,589
Issue date
Oct 24, 2023
AEM Holdings Ltd.
Thomas P. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Lifetime estimating system and method for heating source, and inspe...
Patent number
11,796,400
Issue date
Oct 24, 2023
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Test system including active thermal interposer device
Patent number
11,774,492
Issue date
Oct 3, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE
Publication number
20250093407
Publication date
Mar 20, 2025
XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...
Publication number
20250093405
Publication date
Mar 20, 2025
Microtest S.p.A.
Giuseppe AMELIO
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20250093408
Publication date
Mar 20, 2025
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
Publication number
20250076367
Publication date
Mar 6, 2025
Advantest Corporation
Aritomo Kikuchi
G01 - MEASURING TESTING
Information
Patent Application
THERMAL CONTROL WAFER WITH INTEGRATED HEATING-SENSING ELEMENTS
Publication number
20250067797
Publication date
Feb 27, 2025
AEM SINGAPORE PTE. LTD.
Carl L. OSTROWSKI
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...
Publication number
20250027988
Publication date
Jan 23, 2025
Advantest Corporation
Yuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...
Publication number
20250012853
Publication date
Jan 9, 2025
Intel Corporation
David Daniel Wieneke
G01 - MEASURING TESTING
Information
Patent Application
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...
Publication number
20250012854
Publication date
Jan 9, 2025
Samsung Electronics Co., Ltd.
Jihyun CHOI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER
Publication number
20240426938
Publication date
Dec 26, 2024
Aehr Test Systems
Jovan Jovanovic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
Publication number
20240426939
Publication date
Dec 26, 2024
Aehr Test Systems
Jovan Jovanovic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...
Publication number
20240402240
Publication date
Dec 5, 2024
Advantest Corporation
Yuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
Publication number
20240385237
Publication date
Nov 21, 2024
AEM SINGAPORE PTE. LTD.
See Jean Chan
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED HEATER AND TEMPERATURE MEASUREMENT
Publication number
20240369621
Publication date
Nov 7, 2024
AEM SINGAPORE PTE. LTD.
Carl L. OSTROWSKI
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...
Publication number
20240369622
Publication date
Nov 7, 2024
Samsung Electronics Co., Ltd.
SUNHEE KIM
G01 - MEASURING TESTING
Information
Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
Publication number
20240361379
Publication date
Oct 31, 2024
HITOP INSTRUMENT (JIANGSU) CO., LTD.
Dongxi LIU
G01 - MEASURING TESTING
Information
Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
Publication number
20240361378
Publication date
Oct 31, 2024
HITOP INSTRUMENT (JIANGSU) CO., LTD.
Dongxi LIU
G01 - MEASURING TESTING
Information
Patent Application
WORK PRESS ASSEMBLY FOR TEST HANDLER
Publication number
20240353477
Publication date
Oct 24, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Yi-Neng Chang
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT TESTING METHOD
Publication number
20240329119
Publication date
Oct 3, 2024
Realtek Semiconductor Corp.
Yu-Chen Hsieh
G01 - MEASURING TESTING
Information
Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
Publication number
20240329120
Publication date
Oct 3, 2024
AEM SINGAPORE PTE. LTD.
Thomas P. JONES
G01 - MEASURING TESTING
Information
Patent Application
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...
Publication number
20240310433
Publication date
Sep 19, 2024
SEMIGHT INSTRUMENTS CO., LTD
Zhe LIAN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
Publication number
20240302451
Publication date
Sep 12, 2024
Aehr Test Systems
Jovan Jovanovic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASSIVELY INDEPENDENT TESTERS SYSTEM
Publication number
20240302429
Publication date
Sep 12, 2024
Hsu Kai YANG
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CONTROL APPARATUS, TEST APPARATUS, TEMPERATURE CONTROL...
Publication number
20240288491
Publication date
Aug 29, 2024
Advantest Corporation
Aritomo KIKUCHI
G01 - MEASURING TESTING
Information
Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
Publication number
20240230752
Publication date
Jul 11, 2024
AEM Singapore Pte, LTD.
Thomas P. JONES
G01 - MEASURING TESTING
Information
Patent Application
TEST SUBSTRATE, TEST APPARATUS, AND TEST METHOD FOR SEMICONDUCTOR I...
Publication number
20240192269
Publication date
Jun 13, 2024
KIOXIA Corporation
Taisuke ICHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
WAFER SCALE ACTIVE THERMAL INTERPOSER WITH THERMAL ISOLATION STRUCT...
Publication number
20240183897
Publication date
Jun 6, 2024
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
Publication number
20240183898
Publication date
Jun 6, 2024
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR STRUCTURE
Publication number
20240168084
Publication date
May 23, 2024
United Microelectronics Corp.
Jih-Shun Chiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
Publication number
20240142514
Publication date
May 2, 2024
HITOP INSTRUMENT (JIANGSU) CO., LTD.
Dongxi LIU
G01 - MEASURING TESTING
Information
Patent Application
THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THE...
Publication number
20240133946
Publication date
Apr 25, 2024
AEM Holdings Ltd.
Thomas P. JONES
G01 - MEASURING TESTING