related to heating

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CPC
G01R31/2875

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2875related to heating

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 12,345,756
- Issue date Jul 1, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in system with multiple plugs on the test board
- Patent number 12,345,758
- Issue date Jul 1, 2025
- Meritech CO., Ltd.
- Byung Gook Chang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for adapting temperatures of semiconductor compon...
- Patent number 12,339,312
- Issue date Jun 24, 2025
- Robert Bosch GmbH
- Karl Oberdieck
- G01 - MEASURING TESTING
Information Patent Grant
Heat exchange method using fluorinated compounds having a low GWP
- Patent number 12,325,819
- Issue date Jun 10, 2025
- Solvay Specialty Polymers Italy S.p.A.
- Emanuela Antenucci
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Protecting method for preventing solder crack failure in electronic...
- Patent number 12,328,827
- Issue date Jun 10, 2025
- SOLID STATE STORAGE TECHNOLOGY CORPORATION
- Tsung-Lung Lin
- G01 - MEASURING TESTING
Information Patent Grant
System and method of testing for RF-induced electromigration in sem...
- Patent number 12,313,672
- Issue date May 27, 2025
- Power Technology Solutions LLC
- Stephen Ludvik
- G01 - MEASURING TESTING
Information Patent Grant
Small-sized fast cold and hot shock test devices
- Patent number 12,313,674
- Issue date May 27, 2025
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,292,484
- Issue date May 6, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 12,282,057
- Issue date Apr 22, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 12,276,693
- Issue date Apr 15, 2025
- Advantest Corporation
- Matthias Werner
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in electronics tester
- Patent number 12,265,136
- Issue date Apr 1, 2025
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,259,428
- Issue date Mar 25, 2025
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Thermal head comprising a plurality of adapters for independent the...
- Patent number 12,259,427
- Issue date Mar 25, 2025
- AEM Singapore Pte, LTD.
- Thomas P. Jones
- G01 - MEASURING TESTING
Information Patent Grant
Work press assembly for test handler
- Patent number 12,241,929
- Issue date Mar 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Grant
Heating structure and wafer test device
- Patent number 12,237,184
- Issue date Feb 25, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test system support component exchange system and method
- Patent number 12,235,315
- Issue date Feb 25, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Paul Ferrari
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 12,216,154
- Issue date Feb 4, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Massively independent testers system
- Patent number 12,153,085
- Issue date Nov 26, 2024
- Hsu Kai Yang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 12,117,483
- Issue date Oct 15, 2024
- Tokyo Electron Limited
- Kentaro Konishi
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Thermal control wafer with integrated heating-sensing elements
- Patent number 12,085,609
- Issue date Sep 10, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Heat spreaders for use in semiconductor device testing, such as bur...
- Patent number 12,078,672
- Issue date Sep 3, 2024
- Micron Technology, Inc.
- Xiaopeng Qu
- G01 - MEASURING TESTING
Information Patent Grant
Control method of inspection apparatus and inspection apparatus
- Patent number 12,075,537
- Issue date Aug 27, 2024
- Tokyo Electron Limited
- Hiroaki Agawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Support device, test system, and method of controlling support device
- Patent number 12,061,226
- Issue date Aug 13, 2024
- Tokyo Electron Limited
- Kentaro Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Integrated heater and temperature measurement
- Patent number 12,061,227
- Issue date Aug 13, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Small-sized fast cold and hot shock test devices
- Patent number 12,061,225
- Issue date Aug 13, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control wafer with integrated heating-sensing elements
- Patent number 12,013,432
- Issue date Jun 18, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. Ostrowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for thermal control of devices in an electronics...
- Patent number 12,007,451
- Issue date Jun 11, 2024
- AEHR Test Systems
- Jovan Jovanovic
- G01 - MEASURING TESTING
Information Patent Grant
Test socket having an automated lid
- Patent number 12,007,411
- Issue date Jun 11, 2024
- Teradyne, Inc.
- John P. Toscano
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing device with coupled control of thermal s...
- Patent number 12,000,884
- Issue date Jun 4, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed thermal control wafer and coldplate
- Patent number 12,000,885
- Issue date Jun 4, 2024
- AEM SINGAPORE PTE. LTD.
- Samer Kabbani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEM, METHOD OF UTILIZING PROBE SYSTEM, METHOD OF TESTING U...
- Publication number 20250237696
- Publication date Jul 24, 2025
- MPI CORPORATION
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...
- Publication number 20250224442
- Publication date Jul 10, 2025
- MEDIATEK INC.
- Yu-Lin Yang
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN BOARD AND BURN-IN TEST METHOD USING THE SAME
- Publication number 20250224440
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Seonhaeng LEE
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...
- Publication number 20250224443
- Publication date Jul 10, 2025
- MEDIATEK INC.
- Yu-Lin Yang
- G01 - MEASURING TESTING
Information Patent Application
MULTI ZONE TEMPERATURE CONTROL FOR DEVICES UNDER TEST
- Publication number 20250208197
- Publication date Jun 26, 2025
- Intel Corporation
- Gregorio R. MURTAGIAN
- G01 - MEASURING TESTING
Information Patent Application
Tamper-Aware Age Sensor
- Publication number 20250208199
- Publication date Jun 26, 2025
- IMEC vzw
- Javier Diaz Fortuny
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT INSPECTION DEVICE AND ELECTRONIC COMPONENT INS...
- Publication number 20250208198
- Publication date Jun 26, 2025
- CENTRUM TECHNOLOGY CORP.
- Tong-Yi CHUANG
- G01 - MEASURING TESTING
Information Patent Application
WORK PRESS ASSEMBLY FOR TEST HANDLER
- Publication number 20250199059
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER PACKAGE, MOUNTING METHOD, AND BURN-IN TEST APPARATUS
- Publication number 20250199060
- Publication date Jun 19, 2025
- KIOXIA Corporation
- Masaki YOSHIMURA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...
- Publication number 20250180638
- Publication date Jun 5, 2025
- Advantest Corporation
- Natan CHEJANOVSKY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING THERMAL CONDITIONING OF AN INTEGRAT...
- Publication number 20250172608
- Publication date May 29, 2025
- SMART Modular Technologies, Inc.
- Reuben Chang
- G01 - MEASURING TESTING
Information Patent Application
PROBE TESTING APPARATUS, PROBE TESTING SYSTEM AND PROBE CARD
- Publication number 20250172609
- Publication date May 29, 2025
- RENESAS ELECTRONICS CORPORATION
- Hisayoshi HANAI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST
- Publication number 20250155495
- Publication date May 15, 2025
- Byeong-gyu CHOI
- G01 - MEASURING TESTING
Information Patent Application
TEST ENVIRONMENT CONTROL SYSTEM
- Publication number 20250116699
- Publication date Apr 10, 2025
- YISHI Industrial Co.,Ltd
- WEN-HSIN LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE
- Publication number 20250093407
- Publication date Mar 20, 2025
- XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...
- Publication number 20250093405
- Publication date Mar 20, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20250093408
- Publication date Mar 20, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...
- Publication number 20250076367
- Publication date Mar 6, 2025
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
THERMAL CONTROL WAFER WITH INTEGRATED HEATING-SENSING ELEMENTS
- Publication number 20250067797
- Publication date Feb 27, 2025
- AEM SINGAPORE PTE. LTD.
- Carl L. OSTROWSKI
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...
- Publication number 20250027988
- Publication date Jan 23, 2025
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...
- Publication number 20250012853
- Publication date Jan 9, 2025
- Intel Corporation
- David Daniel Wieneke
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...
- Publication number 20250012854
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Jihyun CHOI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER
- Publication number 20240426938
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...
- Publication number 20240426939
- Publication date Dec 26, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...
- Publication number 20240402240
- Publication date Dec 5, 2024
- Advantest Corporation
- Yuya Yamada
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...
- Publication number 20240385237
- Publication date Nov 21, 2024
- AEM SINGAPORE PTE. LTD.
- See Jean Chan
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED HEATER AND TEMPERATURE MEASUREMENT
- Publication number 20240369621
- Publication date Nov 7, 2024
- AEM SINGAPORE PTE. LTD.
- Carl L. OSTROWSKI
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...
- Publication number 20240369622
- Publication date Nov 7, 2024
- Samsung Electronics Co., Ltd.
- SUNHEE KIM
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361379
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361378
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING

related to heating

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated test cell using active thermal interposer (ATI) with par...

Burn-in system with multiple plugs on the test board

Method and device for adapting temperatures of semiconductor compon...

Heat exchange method using fluorinated compounds having a low GWP

Protecting method for preventing solder crack failure in electronic...

System and method of testing for RF-induced electromigration in sem...

Small-sized fast cold and hot shock test devices

Method and system for thermal control of devices in an electronics...

Electronic component handling apparatus and electronic component te...

Electronic component handling apparatus, electronic component testi...

Method and system for thermal control of devices in electronics tester

Multiplexed thermal control wafer and coldplate

Thermal head comprising a plurality of adapters for independent the...

Work press assembly for test handler

Heating structure and wafer test device

Test system support component exchange system and method

Active thermal interposer device

Massively independent testers system

Inspection system and inspection method

Thermal control wafer with integrated heating-sensing elements

Heat spreaders for use in semiconductor device testing, such as bur...

Control method of inspection apparatus and inspection apparatus

Support device, test system, and method of controlling support device

Integrated heater and temperature measurement

Small-sized fast cold and hot shock test devices

Thermal control wafer with integrated heating-sensing elements

Method and system for thermal control of devices in an electronics...

Test socket having an automated lid

Integrated circuit testing device with coupled control of thermal s...

Multiplexed thermal control wafer and coldplate

Patents Applicationslast 30 patents

PROBE SYSTEM, METHOD OF UTILIZING PROBE SYSTEM, METHOD OF TESTING U...

Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...

BURN-IN BOARD AND BURN-IN TEST METHOD USING THE SAME

Dynamic Voltage Stress Condition Optimization Method and Dynamic Vo...

MULTI ZONE TEMPERATURE CONTROL FOR DEVICES UNDER TEST

Tamper-Aware Age Sensor

ELECTRONIC COMPONENT INSPECTION DEVICE AND ELECTRONIC COMPONENT INS...

WORK PRESS ASSEMBLY FOR TEST HANDLER

INTERPOSER PACKAGE, MOUNTING METHOD, AND BURN-IN TEST APPARATUS

AUTOMATED TEST EQUIPMENT, METHOD FOR TESTING A DEVICE UNDER TEST AN...

SYSTEMS AND METHODS FOR TESTING THERMAL CONDITIONING OF AN INTEGRAT...

PROBE TESTING APPARATUS, PROBE TESTING SYSTEM AND PROBE CARD

APPARATUS FOR TESTING SEMICONDUCTOR DEVICE TEST

TEST ENVIRONMENT CONTROL SYSTEM

METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTE

SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...

ACTIVE THERMAL INTERPOSER DEVICE

SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TEST...

THERMAL CONTROL WAFER WITH INTEGRATED HEATING-SENSING ELEMENTS

TEMPERATURE ADJUSTMENT SYSTEM AND ELECTRONIC COMPONENT TESTING APPA...

METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...

TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTER

METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS...

TEMPERATURE ADJUSTING SYSTEM, CONTROLLER, ELECTRONIC DEVICE HANDLIN...

DEVICE AND THERMAL TESTER FOR THERMAL TESTING DIES OF AN INTEGRATED...

INTEGRATED HEATER AND TEMPERATURE MEASUREMENT

HIGH TEMPERATURE TEST DEVICE OF SEMICONDUCTOR MEMORY MODULE AND MET...

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES