related to layers

Industry

CPC
G01R1/06761

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06761related to layers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a probe tip and a probe tip manufactured by...
- Patent number 12,210,038
- Issue date Jan 28, 2025
- TSE CO., LTD.
- Young Min Lee
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Probe sheet with contact tip on stacked multi-layer and method of m...
- Patent number 12,181,494
- Issue date Dec 31, 2024
- PROTEC MEMS TECHNOLOGY INC
- Yong Ho Cho
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor probe
- Patent number 12,078,658
- Issue date Sep 3, 2024
- Chien Cheng Tien
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming probe head structure
- Patent number 12,019,097
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Sheet connector, sheet set, electrical inspection device, and elect...
- Patent number 12,007,410
- Issue date Jun 11, 2024
- Mitsui Chemicals, Inc.
- Katsunori Nishiura
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam vertical probes with independent arms formed of a high c...
- Patent number 12,000,865
- Issue date Jun 4, 2024
- Microfabrica Inc.
- Uri Frodis
- G01 - MEASURING TESTING
Information Patent Grant
Probes having improved mechanical and/or electrical properties for...
- Patent number 11,982,689
- Issue date May 14, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Grant
Probe test card and method of manufacturing the same
- Patent number 11,933,818
- Issue date Mar 19, 2024
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a measurement probe, and measurement probe
- Patent number 11,921,131
- Issue date Mar 5, 2024
- Rohde & Schwarz GmbH & Co. KG
- Alexander Kunze
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip assembly for testing optical components
- Patent number 11,885,830
- Issue date Jan 30, 2024
- Lumentum Operations LLC
- Sean Burns
- G01 - MEASURING TESTING
Information Patent Grant
Testing head with improved frequency property
- Patent number 11,828,774
- Issue date Nov 28, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe arrays and improved methods for making using tempora...
- Patent number 11,828,775
- Issue date Nov 28, 2023
- Microfabrica Inc.
- Michael S. Lockard
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam probe arrays and methods for making such arrays inclu...
- Patent number 11,821,918
- Issue date Nov 21, 2023
- Microfabrica Inc.
- Michael S. Lockard
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing probes for testing integrated electronic c...
- Patent number 11,796,568
- Issue date Oct 24, 2023
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer, multi-material micro-scale and millimeter-scale device...
- Patent number 11,630,127
- Issue date Apr 18, 2023
- University of Southern California
- Ming Ting Wu
- B32 - LAYERED PRODUCTS
Information Patent Grant
Probe assembly
- Patent number 11,543,430
- Issue date Jan 3, 2023
- MPI CORPORATION
- Ming-Hsiang Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probe test card and method of manufacturing the same
- Patent number 11,543,433
- Issue date Jan 3, 2023
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Metal probe structure and method for fabricating the same
- Patent number 11,474,128
- Issue date Oct 18, 2022
- Princo Corp.
- Yi-Lin Chu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Cylindrical body and method for producing same
- Patent number 11,408,915
- Issue date Aug 9, 2022
- Nidec-Read Corporation
- Masami Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe pins with etched tips for electrical die test
- Patent number 11,340,258
- Issue date May 24, 2022
- Intel Corporation
- Joseph D. Stanford
- G01 - MEASURING TESTING
Information Patent Grant
Functional prober chip
- Patent number 11,280,825
- Issue date Mar 22, 2022
- Xallent LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probes having improved mechanical and/or electrical properties for...
- Patent number 11,262,383
- Issue date Mar 1, 2022
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Grant
Resistivity probes with curved portions
- Patent number 11,249,110
- Issue date Feb 15, 2022
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device
- Patent number 11,221,351
- Issue date Jan 11, 2022
- Princo Corp.
- Chih-kuang Yang
- G01 - MEASURING TESTING
Information Patent Grant
Probe
- Patent number 11,204,370
- Issue date Dec 21, 2021
- Kabushiki Kaisha Nihon Micronics
- Mika Nasu
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing probes for testing integrated electronic circuits
- Patent number 11,169,180
- Issue date Nov 9, 2021
- STMicroelectronics S.r.l.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Grant
Insulator applied in a probe base and the probe base
- Patent number 11,143,675
- Issue date Oct 12, 2021
- C.C.P. CONTACT PROBES CO., LTD.
- Chien-Yu Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for testing head
- Patent number 11,131,690
- Issue date Sep 28, 2021
- Technoprobe S.p.A.
- Giuseppe Crippa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device
- Patent number 11,073,537
- Issue date Jul 27, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with embedded skate
- Patent number 11,054,443
- Issue date Jul 6, 2021
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...
- Publication number 20250044321
- Publication date Feb 6, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME
- Publication number 20250035670
- Publication date Jan 30, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...
- Publication number 20250020691
- Publication date Jan 16, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING...
- Publication number 20240426872
- Publication date Dec 26, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE
- Publication number 20240385221
- Publication date Nov 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- HAO-YEN CHENG
- G01 - MEASURING TESTING
Information Patent Application
PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR
- Publication number 20240319228
- Publication date Sep 26, 2024
- Jung Gyun BAEK
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD STRUCTURE
- Publication number 20240302410
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Yi LIN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN
- Publication number 20240280609
- Publication date Aug 22, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBE SHEET WITH CONTACT TIP ON STACKED MULTI-LAYER AND METHOD OF M...
- Publication number 20240230717
- Publication date Jul 11, 2024
- PROTEC MEMS TECHNOLOGY INC
- Yong Ho CHO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20240219447
- Publication date Jul 4, 2024
- CHROMA ATE INC.
- WEI-CHIH CHEN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR
- Publication number 20240192253
- Publication date Jun 13, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR
- Publication number 20240183881
- Publication date Jun 6, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND PROBE CARD
- Publication number 20240168056
- Publication date May 23, 2024
- Kabushiki Kaisha Nihon Micronics
- Mika NASU
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...
- Publication number 20240110943
- Publication date Apr 4, 2024
- Microfabrica Inc.
- Onnik Yaglioglu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING A PROBE CARD
- Publication number 20240110948
- Publication date Apr 4, 2024
- Exaddon AG
- Kun-Hsien LIN
- G01 - MEASURING TESTING
Information Patent Application
Multi-Beam Vertical Probes with Independent Arms Formed of a High C...
- Publication number 20240103040
- Publication date Mar 28, 2024
- Microfabrica Inc.
- Uri Frodis
- G01 - MEASURING TESTING
Information Patent Application
Shielded Probes for Semiconductor Testing, Methods for Using, and M...
- Publication number 20240094252
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Jia Li
- G01 - MEASURING TESTING
Information Patent Application
Probe Arrays and Improved Methods for Making and Using Longitudinal...
- Publication number 20240094261
- Publication date Mar 21, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
Probes Having Improved Mechanical and/or Electrical Properties for...
- Publication number 20240094253
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Application
Methods of Reinforcing Plated Metal Structures and Independently Mo...
- Publication number 20240094247
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Onnik Yaglioglu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD
- Publication number 20240085454
- Publication date Mar 14, 2024
- Federal Institute of Metrology METAS
- Johannes Hoffmann
- G01 - MEASURING TESTING
Information Patent Application
STRIP-SHAPED COMPOSITE MATERIAL FOR PROBE NEEDLES
- Publication number 20240061016
- Publication date Feb 22, 2024
- Heraeus Deutschland GmbH & Co. KG
- Jonas FECHER
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE ARRAYS AND IMPROVED METHODS FOR MAKING USING TEMPORA...
- Publication number 20240061017
- Publication date Feb 22, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...
- Publication number 20240019463
- Publication date Jan 18, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
PROBES FOR TESTING INTEGRATED ELECTRONIC CIRCUITS AND CORRESPONDING...
- Publication number 20240012029
- Publication date Jan 11, 2024
- STMicroelectronics S.r.l
- Alberto PAGANI
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
CONTACT PROBE
- Publication number 20230393171
- Publication date Dec 7, 2023
- Yokowo Co., Ltd.
- Kenichi SATO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING A PROBE TIP AND A PROBE TIP MANUFACTURED BY...
- Publication number 20230366912
- Publication date Nov 16, 2023
- TSE CO., LTD.
- Young Min LEE
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Pin-Type Probes for Contacting Electronic Circuits and Methods for...
- Publication number 20230324435
- Publication date Oct 12, 2023
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Application
Multi-Layer, Multi-Material Micro-Scale and Millimeter-Scale Device...
- Publication number 20230324436
- Publication date Oct 12, 2023
- University of Southern California
- Ming Ting Wu
- B32 - LAYERED PRODUCTS
Information Patent Application
TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
- Publication number 20230324438
- Publication date Oct 12, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING

related to layers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of manufacturing a probe tip and a probe tip manufactured by...

Probe sheet with contact tip on stacked multi-layer and method of m...

Semiconductor probe

Method for forming probe head structure

Sheet connector, sheet set, electrical inspection device, and elect...

Multi-beam vertical probes with independent arms formed of a high c...

Probes having improved mechanical and/or electrical properties for...

Probe test card and method of manufacturing the same

Method for manufacturing a measurement probe, and measurement probe

Probe tip assembly for testing optical components

Testing head with improved frequency property

Vertical probe arrays and improved methods for making using tempora...

Buckling beam probe arrays and methods for making such arrays inclu...

Method for manufacturing probes for testing integrated electronic c...

Multi-layer, multi-material micro-scale and millimeter-scale device...

Probe assembly

Probe test card and method of manufacturing the same

Metal probe structure and method for fabricating the same

Cylindrical body and method for producing same

Probe pins with etched tips for electrical die test

Functional prober chip

Probes having improved mechanical and/or electrical properties for...

Resistivity probes with curved portions

Probe card device

Probe

Method for producing probes for testing integrated electronic circuits

Insulator applied in a probe base and the probe base

Contact probe for testing head

Probe card device

Probe tip with embedded skate

Patents Applicationslast 30 patents

CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...

ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME

ELECTRO-CONDUCTIVE CONTACT PIN, MANUFACTURING METHOD THEREFOR, AND...

METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING...

CANTILEVER PROBE CARD DEVICE AND LIGHT ABSORPTION PROBE

PROBE MEMBER FOR INSPECTION, AND MANUFACTURING METHOD THEREFOR

PROBE HEAD STRUCTURE

ELECTRICALLY CONDUCTIVE CONTACT PIN

PROBE SHEET WITH CONTACT TIP ON STACKED MULTI-LAYER AND METHOD OF M...

WAFER INSPECTION SYSTEM

ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR

ELECTRICALLY CONDUCTIVE CONTACT PIN AND MANUFACTURING METHOD THEREFOR

PROBE AND PROBE CARD

METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...

METHOD FOR PRODUCING A PROBE CARD

Multi-Beam Vertical Probes with Independent Arms Formed of a High C...

Shielded Probes for Semiconductor Testing, Methods for Using, and M...

Probe Arrays and Improved Methods for Making and Using Longitudinal...

Probes Having Improved Mechanical and/or Electrical Properties for...

Methods of Reinforcing Plated Metal Structures and Independently Mo...

COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD

STRIP-SHAPED COMPOSITE MATERIAL FOR PROBE NEEDLES

VERTICAL PROBE ARRAYS AND IMPROVED METHODS FOR MAKING USING TEMPORA...

BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...

PROBES FOR TESTING INTEGRATED ELECTRONIC CIRCUITS AND CORRESPONDING...

CONTACT PROBE

METHOD OF MANUFACTURING A PROBE TIP AND A PROBE TIP MANUFACTURED BY...

Pin-Type Probes for Contacting Electronic Circuits and Methods for...

Multi-Layer, Multi-Material Micro-Scale and Millimeter-Scale Device...

TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY