related to temperature

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CPC
G01R31/2874

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2874related to temperature

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electronic device testing apparatus and electronic device testing m...
- Patent number 12,180,018
- Issue date Dec 31, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for performing multiple tests on a device under test
- Patent number 12,181,515
- Issue date Dec 31, 2024
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Alignment mechanism
- Patent number 12,140,625
- Issue date Nov 12, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation module and evaluation method for evaluating multichip mo...
- Patent number 12,111,348
- Issue date Oct 8, 2024
- Robert Bosch GmbH
- Lin Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip carrier, chip testing module, and chip handling module
- Patent number 12,112,964
- Issue date Oct 8, 2024
- CHROMA ATE INC.
- Sheng-Hung Wang
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Electronic device pick-and-place system and electronic device testi...
- Patent number 12,103,789
- Issue date Oct 1, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor device, semiconductor device, an...
- Patent number 12,078,659
- Issue date Sep 3, 2024
- Renesas Electronics Corporation
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing an integrated circuit (IC) device at a testing t...
- Patent number 12,066,483
- Issue date Aug 20, 2024
- Texas Instruments Incorporated
- Genesis Benjamin Carr
- G01 - MEASURING TESTING
Information Patent Grant
Small-sized fast cold and hot shock test devices
- Patent number 12,061,225
- Issue date Aug 13, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for temperature stress test for memory chips
- Patent number 12,044,723
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module including semiconductor package and semiconduc...
- Patent number 12,025,656
- Issue date Jul 2, 2024
- Samsung Electronics Co., Ltd.
- Seyoung Won
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Burn-in board and burn-in apparatus
- Patent number 11,994,552
- Issue date May 28, 2024
- Advantest Corporation
- Hiroaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature test apparatus and temperature test method
- Patent number 11,994,550
- Issue date May 28, 2024
- Anritsu Corporation
- Tomonori Morita
- G01 - MEASURING TESTING
Information Patent Grant
Exposure monitor device
- Patent number 11,988,708
- Issue date May 21, 2024
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, transfer method, chamber and frame for semiconductor bur...
- Patent number 11,982,706
- Issue date May 14, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat Tan
- G01 - MEASURING TESTING
Information Patent Grant
Chip tray positioning device
- Patent number 11,970,342
- Issue date Apr 30, 2024
- CHROMA ATE INC.
- Chien-Ming Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of testing adverse device conditions
- Patent number 11,965,927
- Issue date Apr 23, 2024
- Apple Inc.
- Jay Mayur Khandhar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of analyzing semiconductor structure
- Patent number 11,959,958
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yi Min Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for testing functionality and performance of a...
- Patent number 11,953,544
- Issue date Apr 9, 2024
- THE ADT SECURITY CORPORATION
- Jeron E. Bornstein
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor module including semiconductor package and semiconduc...
- Patent number 11,953,545
- Issue date Apr 9, 2024
- Samsung Electronics Co., Ltd.
- Seyoung Won
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature control and method for devices under test and image sen...
- Patent number 11,932,498
- Issue date Mar 19, 2024
- CHROMA ATE INC.
- Chin-Yi Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Socket side thermal system
- Patent number 11,879,910
- Issue date Jan 23, 2024
- Delta Design, Inc.
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including temperature sensing circuit
- Patent number 11,860,045
- Issue date Jan 2, 2024
- SK Hynix Inc.
- Dahoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of testing an object within a dry gas environment
- Patent number 11,860,083
- Issue date Jan 2, 2024
- Samsung Electronics Co, Ltd.
- Dahm Yu
- G01 - MEASURING TESTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,846,669
- Issue date Dec 19, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Battery SOH determination circuit
- Patent number 11,835,584
- Issue date Dec 5, 2023
- Analog Devices International Unlimited Company
- Jeremy R. Gorbold
- G01 - MEASURING TESTING
Information Patent Grant
Method for open-loop or closed-loop control of the temperature of a...
- Patent number 11,821,941
- Issue date Nov 21, 2023
- ATT ADVANCED TEMPERATURE TEST SYSTEM GMBH
- Markus Eibl
- G01 - MEASURING TESTING
Information Patent Grant
Allocation of test resources to perform a test of memory components
- Patent number 11,808,806
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for controlling unit specific junction tempera...
- Patent number 11,808,813
- Issue date Nov 7, 2023
- Intel Corporation
- Mahesh Deshmane
- G01 - MEASURING TESTING
Information Patent Grant
System for designing thermal sensor arrangement
- Patent number 11,810,813
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Jaw-Juinn Horng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A...
- Publication number 20240426896
- Publication date Dec 26, 2024
- The ADT Security Corporation
- Jeron E. BORNSTEIN
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ANALYSIS
- Publication number 20240426901
- Publication date Dec 26, 2024
- The Regents of the University of Michigan
- Al-Thaddeus Avestruz
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...
- Publication number 20240402021
- Publication date Dec 5, 2024
- TOKYO ELECTRON LIMITED
- Tomohiro OTA
- G01 - MEASURING TESTING
Information Patent Application
LIFETIME INDICATOR SYSTEM
- Publication number 20240377453
- Publication date Nov 14, 2024
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361379
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240361378
- Publication date Oct 31, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE
- Publication number 20240337685
- Publication date Oct 10, 2024
- Teledyne LeCroy, Inc.
- Matthew Weinstein
- G01 - MEASURING TESTING
Information Patent Application
PROBER AND TEMPERATURE MEASUREMENT METHOD
- Publication number 20240329118
- Publication date Oct 3, 2024
- TOKYO SEIMITSU CO., LTD.
- Hiroo Tamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING DEVICE AND TESTING METHOD THEREOF
- Publication number 20240302428
- Publication date Sep 12, 2024
- WINBOND ELECTRONICS CORP.
- Kuan-Cheng Chang
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE
- Publication number 20240295600
- Publication date Sep 5, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
IC NOISE IMMUNITY DETECTION DEVICE AND IC NOISE IMMUNITY DETECTION...
- Publication number 20240280631
- Publication date Aug 22, 2024
- Mitsubishi Electric Corporation
- Yusuke YAMAKAJI
- G01 - MEASURING TESTING
Information Patent Application
A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS
- Publication number 20240264222
- Publication date Aug 8, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING PERFORMANCE OF DEVICE
- Publication number 20240248133
- Publication date Jul 25, 2024
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
MULTIPHASE THERMAL INTERFACE COMPONENT, METHOD OF FORMING THE SAME...
- Publication number 20240192268
- Publication date Jun 13, 2024
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING SEMICONDUCTOR STRUCTURE
- Publication number 20240192262
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- Yi Min LIU
- G01 - MEASURING TESTING
Information Patent Application
THERMAL CONDUCTION BASED BATCH TESTING SYSTEM
- Publication number 20240194281
- Publication date Jun 13, 2024
- Micron Technology, Inc.
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING AN INTEGRATED CIRCUIT (IC) DEVICE AT A TESTING T...
- Publication number 20240159821
- Publication date May 16, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Genesis Benjamin Carr
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...
- Publication number 20240142497
- Publication date May 2, 2024
- RENESAS ELECTRONICS CORPORATION
- Masaaki TANIMURA
- G01 - MEASURING TESTING
Information Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
- Publication number 20240142514
- Publication date May 2, 2024
- HITOP INSTRUMENT (JIANGSU) CO., LTD.
- Dongxi LIU
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD FOR SEMICONDUCTOR DEVICES
- Publication number 20240094283
- Publication date Mar 21, 2024
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT MECHANISM
- Publication number 20240061036
- Publication date Feb 22, 2024
- Delta Design, Inc.
- Jerry Ihor TUSTANIWSKYJ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODULAR WAFER-CHUCK SYSTEM
- Publication number 20240063037
- Publication date Feb 22, 2024
- ATT Advanced Temperature Test Systems GmbH
- Markus Eibl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE TESTING MACHINE AND METHOD FOR USING COMPOSITE TESTING MA...
- Publication number 20240053398
- Publication date Feb 15, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- YUNGSHIUAN CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...
- Publication number 20240053397
- Publication date Feb 15, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat TAN
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20240003967
- Publication date Jan 4, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
CONTROL OF AN AUTOMATED TEST EQUIPMENT BASED ON TEMPERATURE
- Publication number 20230384361
- Publication date Nov 30, 2023
- Advantest Corporation
- Jens EDELMANN
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20230384365
- Publication date Nov 30, 2023
- SK HYNIX INC.
- Dong Kil KIM
- G01 - MEASURING TESTING
Information Patent Application
REDUCING DIGITAL TEMPERATURE SENSOR ERROR WITH MACHINE LEARNING
- Publication number 20230366923
- Publication date Nov 16, 2023
- Intel Corporation
- Sarah Shahraini
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXPOSURE MONITOR DEVICE
- Publication number 20230366924
- Publication date Nov 16, 2023
- Analog Devices International Unlimited Company
- Edward John Coyne
- G01 - MEASURING TESTING

related to temperature

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic device testing apparatus and electronic device testing m...

Apparatus for performing multiple tests on a device under test

Alignment mechanism

Evaluation module and evaluation method for evaluating multichip mo...

Chip carrier, chip testing module, and chip handling module

Electronic device pick-and-place system and electronic device testi...

Method of inspecting semiconductor device, semiconductor device, an...

Method for testing an integrated circuit (IC) device at a testing t...

Small-sized fast cold and hot shock test devices

Circuit for temperature stress test for memory chips

Semiconductor module including semiconductor package and semiconduc...

Burn-in board and burn-in apparatus

Temperature test apparatus and temperature test method

Exposure monitor device

Apparatus, transfer method, chamber and frame for semiconductor bur...

Chip tray positioning device

Systems and methods of testing adverse device conditions

Method of analyzing semiconductor structure

Systems and methods for testing functionality and performance of a...

Semiconductor module including semiconductor package and semiconduc...

Temperature control and method for devices under test and image sen...

Socket side thermal system

Semiconductor device including temperature sensing circuit

Apparatus and method of testing an object within a dry gas environment

Active thermal interposer device

Battery SOH determination circuit

Method for open-loop or closed-loop control of the temperature of a...

Allocation of test resources to perform a test of memory components

Apparatus and method for controlling unit specific junction tempera...

System for designing thermal sensor arrangement

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A...

TEMPERATURE ANALYSIS

TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...

LIFETIME INDICATOR SYSTEM

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

TEMPERATURE COMPENSATION OF OPTICALLY ISOLATED PROBE

PROBER AND TEMPERATURE MEASUREMENT METHOD

TESTING DEVICE AND TESTING METHOD THEREOF

CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE

IC NOISE IMMUNITY DETECTION DEVICE AND IC NOISE IMMUNITY DETECTION...

A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS

SYSTEM FOR TESTING PERFORMANCE OF DEVICE

MULTIPHASE THERMAL INTERFACE COMPONENT, METHOD OF FORMING THE SAME...

METHOD OF ANALYZING SEMICONDUCTOR STRUCTURE

THERMAL CONDUCTION BASED BATCH TESTING SYSTEM

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

METHOD FOR TESTING AN INTEGRATED CIRCUIT (IC) DEVICE AT A TESTING T...

METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...

SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES

TEST BOARD FOR SEMICONDUCTOR DEVICES

ALIGNMENT MECHANISM

MODULAR WAFER-CHUCK SYSTEM

COMPOSITE TESTING MACHINE AND METHOD FOR USING COMPOSITE TESTING MA...

APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...

ACTIVE THERMAL INTERPOSER DEVICE

CONTROL OF AN AUTOMATED TEST EQUIPMENT BASED ON TEMPERATURE

WAFER TEST SYSTEM AND OPERATING METHOD THEREOF

REDUCING DIGITAL TEMPERATURE SENSOR ERROR WITH MACHINE LEARNING

EXPOSURE MONITOR DEVICE