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G01R31/2874
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2874
related to temperature
Industries
Overview
Organizations
People
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Chip tray positioning device
Patent number
11,970,342
Issue date
Apr 30, 2024
CHROMA ATE INC.
Chien-Ming Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods of testing adverse device conditions
Patent number
11,965,927
Issue date
Apr 23, 2024
Apple Inc.
Jay Mayur Khandhar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of analyzing semiconductor structure
Patent number
11,959,958
Issue date
Apr 16, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Yi Min Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for testing functionality and performance of a...
Patent number
11,953,544
Issue date
Apr 9, 2024
THE ADT SECURITY CORPORATION
Jeron E. Bornstein
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor module including semiconductor package and semiconduc...
Patent number
11,953,545
Issue date
Apr 9, 2024
Samsung Electronics Co., Ltd.
Seyoung Won
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Temperature control and method for devices under test and image sen...
Patent number
11,932,498
Issue date
Mar 19, 2024
CHROMA ATE INC.
Chin-Yi Ouyang
G01 - MEASURING TESTING
Information
Patent Grant
Socket side thermal system
Patent number
11,879,910
Issue date
Jan 23, 2024
Delta Design, Inc.
Jerry Ihor Tustaniwskyj
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device including temperature sensing circuit
Patent number
11,860,045
Issue date
Jan 2, 2024
SK Hynix Inc.
Dahoo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of testing an object within a dry gas environment
Patent number
11,860,083
Issue date
Jan 2, 2024
Samsung Electronics Co, Ltd.
Dahm Yu
G01 - MEASURING TESTING
Information
Patent Grant
Active thermal interposer device
Patent number
11,846,669
Issue date
Dec 19, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Battery SOH determination circuit
Patent number
11,835,584
Issue date
Dec 5, 2023
Analog Devices International Unlimited Company
Jeremy R. Gorbold
G01 - MEASURING TESTING
Information
Patent Grant
Method for open-loop or closed-loop control of the temperature of a...
Patent number
11,821,941
Issue date
Nov 21, 2023
ATT ADVANCED TEMPERATURE TEST SYSTEM GMBH
Markus Eibl
G01 - MEASURING TESTING
Information
Patent Grant
System for designing thermal sensor arrangement
Patent number
11,810,813
Issue date
Nov 7, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Jaw-Juinn Horng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Allocation of test resources to perform a test of memory components
Patent number
11,808,806
Issue date
Nov 7, 2023
Micron Technology, Inc.
Aswin Thiruvengadam
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for controlling unit specific junction tempera...
Patent number
11,808,813
Issue date
Nov 7, 2023
Intel Corporation
Mahesh Deshmane
G01 - MEASURING TESTING
Information
Patent Grant
Alignment mechanism
Patent number
11,802,908
Issue date
Oct 31, 2023
Delta Design, Inc.
Jerry Ihor Tustaniwskyj
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test system including active thermal interposer device
Patent number
11,774,492
Issue date
Oct 3, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for energy diagnostics to identify equipment ma...
Patent number
11,762,010
Issue date
Sep 19, 2023
Sacramento Municipal Utility District
Lucas Krall
G01 - MEASURING TESTING
Information
Patent Grant
Temperature adjustment method for mounting base, inspection device,...
Patent number
11,762,011
Issue date
Sep 19, 2023
Tokyo Electron Limited
Shigeru Kasai
G01 - MEASURING TESTING
Information
Patent Grant
Probing apparatus with temperature-adjusting mechanism
Patent number
11,754,619
Issue date
Sep 12, 2023
Star Technologies, Inc.
Choon Leong Lou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
DUT placement and handling for active thermal interposer device
Patent number
11,754,620
Issue date
Sep 12, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Temperature test apparatus and temperature test method
Patent number
11,754,609
Issue date
Sep 12, 2023
Anritsu Corporation
Takeshi Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Thermal conditioning of electronic devices under test based on exte...
Patent number
11,726,137
Issue date
Aug 15, 2023
ELES Semiconductor Equipment S.p.A.
Fabrizio Scocchetti
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus, control method, and storage medium
Patent number
11,719,744
Issue date
Aug 8, 2023
Tokyo Electron Limited
Hiroyuki Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
Patent number
11,719,743
Issue date
Aug 8, 2023
Kes Systems, Inc.
Ballson Gopal
G01 - MEASURING TESTING
Information
Patent Grant
Contact resistor test method and device
Patent number
11,703,531
Issue date
Jul 18, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Shih-Chieh Lin
G01 - MEASURING TESTING
Information
Patent Grant
Built-in self-test circuit and temperature measurement circuit incl...
Patent number
11,686,766
Issue date
Jun 27, 2023
Samsung Electronics Co., Ltd.
Junhee Shin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Exposure monitor device
Patent number
11,686,763
Issue date
Jun 27, 2023
Analog Devices International Unlimited Company
Edward John Coyne
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for early lifetime failure detection system
Patent number
11,662,376
Issue date
May 30, 2023
Intel Corporation
Ketul B. Sutaria
G01 - MEASURING TESTING
Information
Patent Grant
Temperature control circuit, memory storage device and temperature...
Patent number
11,635,777
Issue date
Apr 25, 2023
Phison Electronics Corp.
Jia-Huei Yeh
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AN...
Publication number
20240142497
Publication date
May 2, 2024
RENESAS ELECTRONICS CORPORATION
Masaaki TANIMURA
G01 - MEASURING TESTING
Information
Patent Application
SMALL-SIZED FAST COLD AND HOT SHOCK TEST DEVICES
Publication number
20240142514
Publication date
May 2, 2024
HITOP INSTRUMENT (JIANGSU) CO., LTD.
Dongxi LIU
G01 - MEASURING TESTING
Information
Patent Application
TEST BOARD FOR SEMICONDUCTOR DEVICES
Publication number
20240094283
Publication date
Mar 21, 2024
ATECO INC.
Taek Seon LEE
G01 - MEASURING TESTING
Information
Patent Application
ALIGNMENT MECHANISM
Publication number
20240061036
Publication date
Feb 22, 2024
Delta Design, Inc.
Jerry Ihor TUSTANIWSKYJ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MODULAR WAFER-CHUCK SYSTEM
Publication number
20240063037
Publication date
Feb 22, 2024
ATT Advanced Temperature Test Systems GmbH
Markus Eibl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPOSITE TESTING MACHINE AND METHOD FOR USING COMPOSITE TESTING MA...
Publication number
20240053398
Publication date
Feb 15, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
YUNGSHIUAN CHEN
G11 - INFORMATION STORAGE
Information
Patent Application
APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...
Publication number
20240053397
Publication date
Feb 15, 2024
MSV SYSTEMS & SERVICES PTE LTD
Teck Huat TAN
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20240003967
Publication date
Jan 4, 2024
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
CONTROL OF AN AUTOMATED TEST EQUIPMENT BASED ON TEMPERATURE
Publication number
20230384361
Publication date
Nov 30, 2023
Advantest Corporation
Jens EDELMANN
G01 - MEASURING TESTING
Information
Patent Application
WAFER TEST SYSTEM AND OPERATING METHOD THEREOF
Publication number
20230384365
Publication date
Nov 30, 2023
SK HYNIX INC.
Dong Kil KIM
G01 - MEASURING TESTING
Information
Patent Application
REDUCING DIGITAL TEMPERATURE SENSOR ERROR WITH MACHINE LEARNING
Publication number
20230366923
Publication date
Nov 16, 2023
Intel Corporation
Sarah Shahraini
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EXPOSURE MONITOR DEVICE
Publication number
20230366924
Publication date
Nov 16, 2023
Analog Devices International Unlimited Company
Edward John Coyne
G01 - MEASURING TESTING
Information
Patent Application
TEST METHOD AND MANUFACTURING METHOD
Publication number
20230343652
Publication date
Oct 26, 2023
Advantest Corporation
Takeo MIURA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...
Publication number
20230288480
Publication date
Sep 14, 2023
Intel Corporation
Mahesh DESHMANE
G01 - MEASURING TESTING
Information
Patent Application
BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCL...
Publication number
20230280398
Publication date
Sep 7, 2023
Samsung Electronics Co., Ltd.
Junhee Shin
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING MULTIPLE...
Publication number
20230280394
Publication date
Sep 7, 2023
Advantest Corporation
Matthias WERNER
G01 - MEASURING TESTING
Information
Patent Application
Calibration Arrangement and Corresponding Calibration Method, and C...
Publication number
20230280396
Publication date
Sep 7, 2023
ERS electronic GmbH
Klemens Reitinger
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING A SYNCHRO...
Publication number
20230266380
Publication date
Aug 24, 2023
Advantest Corporation
Matthias WERNER
G01 - MEASURING TESTING
Information
Patent Application
Over the air test chamber with optimized air circulation
Publication number
20230266383
Publication date
Aug 24, 2023
Rohde& Schwarz GmbH & Co. KG
Ralf Meissner
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE...
Publication number
20230228805
Publication date
Jul 20, 2023
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Application
REMOTE MAPPING OF CIRCUIT SPEED VARIATION DUE TO PROCESS, VOLTAGE A...
Publication number
20230224365
Publication date
Jul 13, 2023
Taiwan Semiconductor Manufacturing Company Limited
Bogdan TUTUIANU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ESTIMATION OF LIFE OF SWITCHING DEVICES
Publication number
20230194593
Publication date
Jun 22, 2023
EATON INTELLIGENT POWER LIMITED
Deepak Balaji Somayajula
G05 - CONTROLLING REGULATING
Information
Patent Application
APPRATUS FOR PERFORMING MULTIPLE TESTS ON A DEVICE UNDER TEST
Publication number
20230184821
Publication date
Jun 15, 2023
NANYA TECHNOLOGY CORPORATION
Chien-Hwa SU
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE...
Publication number
20230184823
Publication date
Jun 15, 2023
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20230129112
Publication date
Apr 27, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Energy Diagnostics To Identify Equipment Ma...
Publication number
20230122964
Publication date
Apr 20, 2023
Sacramento Municipal Utility District
Lucas Krall
G01 - MEASURING TESTING
Information
Patent Application
Temperature control system, temperature control method and image se...
Publication number
20230098042
Publication date
Mar 30, 2023
CHROMA ATE INC.
Chin-Yi OUYANG
G01 - MEASURING TESTING
Information
Patent Application
DESIGN-FOR-TEST CIRCUIT FOR EVALUATING BIAS TEMPERATURE INSTABILITY...
Publication number
20230079961
Publication date
Mar 16, 2023
Shanghai Huali Integrated Circuit Corporation
Zhenan Lai
G01 - MEASURING TESTING
Information
Patent Application
MEMORY TEMPERATURE CONTROLLING METHOD AND MEMORY TEMPERATURE CONTRO...
Publication number
20230074401
Publication date
Mar 9, 2023
Hefei Core Storage Electronic Limited
Biao Zhang
G01 - MEASURING TESTING
Information
Patent Application
CHIP TESTING APPARATUS
Publication number
20230048515
Publication date
Feb 16, 2023
ONE TEST SYSTEMS
CHEN-LUNG TSAI
G01 - MEASURING TESTING