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G01R1/06738
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R1/00
Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
Current Industry
G01R1/06738
related to tip portion
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Contact probe
Patent number
11,959,940
Issue date
Apr 16, 2024
Yokowo Co., Ltd.
Kenichi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Probes that define retroreflectors, probe systems that include the...
Patent number
11,927,603
Issue date
Mar 12, 2024
FormFactor, Inc.
Quan Yuan
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing a measurement probe, and measurement probe
Patent number
11,921,131
Issue date
Mar 5, 2024
Rohde & Schwarz GmbH & Co. KG
Alexander Kunze
G01 - MEASURING TESTING
Information
Patent Grant
Contact assembly array and testing system having contact assembly a...
Patent number
11,906,576
Issue date
Feb 20, 2024
Johnstech International Corporation
Valts Treibergs
G01 - MEASURING TESTING
Information
Patent Grant
Compliant pin probes with flat extension springs, methods for makin...
Patent number
11,906,549
Issue date
Feb 20, 2024
Microfabrica Inc.
Ming Ting Wu
G01 - MEASURING TESTING
Information
Patent Grant
Probe system for QFP integrated circuit device test tooling
Patent number
11,906,550
Issue date
Feb 20, 2024
Essai, Inc.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive test needle for measuring electrically conductive layers...
Patent number
11,774,495
Issue date
Oct 3, 2023
ATG LUTHER & MAELZER GMBH
Stefan Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Multi-member test probe structure
Patent number
11,774,489
Issue date
Oct 3, 2023
Intel Corporation
Pooya Tadayon
G01 - MEASURING TESTING
Information
Patent Grant
Probes with planar unbiased spring elements for electronic componen...
Patent number
11,761,982
Issue date
Sep 19, 2023
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Grant
Probe pin
Patent number
11,630,128
Issue date
Apr 18, 2023
GENED CO., LTD.
Byung Sung Lee
G01 - MEASURING TESTING
Information
Patent Grant
Probe, inspection jig, inspection device, and method for manufactur...
Patent number
11,454,650
Issue date
Sep 27, 2022
Nidec-Read Corporation
Hidekazu Yamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Integrated pogo pin enabling integrated housing
Patent number
11,454,649
Issue date
Sep 27, 2022
Sangyang Pak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Contact device for electrical test
Patent number
11,442,079
Issue date
Sep 13, 2022
ISC CO., LTD.
Young Bae Chung
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
Patent number
11,442,080
Issue date
Sep 13, 2022
Technoprobe S.p.A.
Roberto Crippa
G01 - MEASURING TESTING
Information
Patent Grant
Electrical contactor and electrical connecting apparatus
Patent number
11,372,022
Issue date
Jun 28, 2022
Kabushiki Kaisha Nihon Micronics
Yasutaka Kishi
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe and inspecting socket including the same
Patent number
11,360,118
Issue date
Jun 14, 2022
Yamaichi Electronics Co., Ltd.
Katsumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Probe device of floating structure
Patent number
11,320,460
Issue date
May 3, 2022
Phoenixon Controls Inc.
Ki Sool Nah
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe for a testing head for testing electronic devices
Patent number
11,307,222
Issue date
Apr 19, 2022
Technoprobe S.p.A.
Fabio Morgana
G01 - MEASURING TESTING
Information
Patent Grant
Probe head and conductive probe thereof
Patent number
11,300,586
Issue date
Apr 12, 2022
Premtek International Inc.
YaJu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Probe on carrier architecture for vertical probe arrays
Patent number
11,293,947
Issue date
Apr 5, 2022
FormFactor, Inc.
Mukesh Selvaraj
G01 - MEASURING TESTING
Information
Patent Grant
Contacting device, head unit for the same, and methods for manufact...
Patent number
11,268,982
Issue date
Mar 8, 2022
Equip-Test Kft.
Géza Kádár
G01 - MEASURING TESTING
Information
Patent Grant
Probes having improved mechanical and/or electrical properties for...
Patent number
11,262,383
Issue date
Mar 1, 2022
Microfabrica Inc.
Garret R. Smalley
G01 - MEASURING TESTING
Information
Patent Grant
Probe for testing an electrical property of a test sample
Patent number
11,215,638
Issue date
Jan 4, 2022
CAPRES A/S
Lior Shiv
G01 - MEASURING TESTING
Information
Patent Grant
3D chip testing through micro-C4 interface
Patent number
11,193,953
Issue date
Dec 7, 2021
International Business Machines Corporation
Victor A. Garibay
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe pin and electronic device using the same
Patent number
11,187,722
Issue date
Nov 30, 2021
Omron Corporation
Hirotada Teranishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-frequency layered testing probe
Patent number
11,175,311
Issue date
Nov 16, 2021
Signal Microwave, LLC
William Rosas
G01 - MEASURING TESTING
Information
Patent Grant
Electrical test probes having decoupled electrical and mechanical d...
Patent number
11,156,637
Issue date
Oct 26, 2021
FormFactor, Inc.
January Kister
G01 - MEASURING TESTING
Information
Patent Grant
Contact probe for testing head
Patent number
11,131,690
Issue date
Sep 28, 2021
Technoprobe S.p.A.
Giuseppe Crippa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-member test probe structure
Patent number
11,061,068
Issue date
Jul 13, 2021
Intel Corporation
Pooya Tadayon
G01 - MEASURING TESTING
Information
Patent Grant
Contact pin and electric component socket
Patent number
11,050,178
Issue date
Jun 29, 2021
Enplas Corporation
Akira Miura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE CARD NEEDLE SHAPE AND METHOD OF MANUFACTURING
Publication number
20240151743
Publication date
May 9, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Ting-Yu CHIU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PRODUCING A PROBE CARD
Publication number
20240110948
Publication date
Apr 4, 2024
Exaddon AG
Kun-Hsien LIN
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240103042
Publication date
Mar 28, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Compliant Probes with Enhanced Pointing Stability and Including At...
Publication number
20240103038
Publication date
Mar 28, 2024
Microfabrica Inc.
Ming Ting Wu
G01 - MEASURING TESTING
Information
Patent Application
Compliant Probes Including Dual Independently Operable Probe Contac...
Publication number
20240094250
Publication date
Mar 21, 2024
Microfabrica Inc.
Ming Ting Wu
G01 - MEASURING TESTING
Information
Patent Application
Multi-Beam Probes with Decoupled Structural and Current Carrying Be...
Publication number
20240094259
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240094255
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240094256
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240094257
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Probes with Planar Unbiased Spring Elements for Electronic Componen...
Publication number
20240094258
Publication date
Mar 21, 2024
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
Probes Having Improved Mechanical and/or Electrical Properties for...
Publication number
20240094253
Publication date
Mar 21, 2024
Microfabrica Inc.
Garret R. Smalley
G01 - MEASURING TESTING
Information
Patent Application
COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD
Publication number
20240085454
Publication date
Mar 14, 2024
Federal Institute of Metrology METAS
Johannes Hoffmann
G01 - MEASURING TESTING
Information
Patent Application
PROBE JOINT AND SPRING PROBE COMPRISING THE SAME
Publication number
20240085458
Publication date
Mar 14, 2024
AZOTH STUDIO LTD. CO.
Zhou Yi Lin
G01 - MEASURING TESTING
Information
Patent Application
PROBE PIN AND METHOD OF MANUFACTURING PROBE PIN
Publication number
20240053382
Publication date
Feb 15, 2024
PT&K CO., LTD.
Tae Yoon KIM
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
Publication number
20240044940
Publication date
Feb 8, 2024
TECHNOPROBE S.P.A.
Roberto CRIPPA
G01 - MEASURING TESTING
Information
Patent Application
PROBE HEAD AND PROBE ASSEMBLY
Publication number
20240036073
Publication date
Feb 1, 2024
AZOTH STUDIO LTD. CO.
Zhou Yi Lin
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDI...
Publication number
20240027495
Publication date
Jan 25, 2024
TECHNOPROBE S.P.A.
Riccardo VETTORI
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICE AND METHOD, AND NON-TRANSITORY COMPUTER-READABLE REC...
Publication number
20240019483
Publication date
Jan 18, 2024
TOKYO ELECTRON LIMITED
Shinjiro WATANABE
G01 - MEASURING TESTING
Information
Patent Application
Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...
Publication number
20230400509
Publication date
Dec 14, 2023
ATG LUTHER & MAELZER GMBH
Stefan Weiss
G01 - MEASURING TESTING
Information
Patent Application
PROBE DEVICE, PROBE SYSTEM INCLUDING THE PROBE DEVICE AND OPERATING...
Publication number
20230400480
Publication date
Dec 14, 2023
STAR TECHNOLOGIES, INC.
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
CONTACT, INSPECTION JIG, INSPECTION DEVICE, AND METHOD OF MANUFACTU...
Publication number
20230349950
Publication date
Nov 2, 2023
NIDEC-READ CORPORATION
Norihiro OTA
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTIVE PROBE, METHOD OF MANUFACTURING THE SAME, AND PROBE CARD...
Publication number
20230333141
Publication date
Oct 19, 2023
Global Unichip Corporation
Chih-Chieh LIAO
G01 - MEASURING TESTING
Information
Patent Application
Pin-Type Probes for Contacting Electronic Circuits and Methods for...
Publication number
20230324435
Publication date
Oct 12, 2023
Microfabrica Inc.
Arun S. Veeramani
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
Publication number
20230314476
Publication date
Oct 5, 2023
TECHNOPROBE S.P.A.
Riccardo VETTORI
G01 - MEASURING TESTING
Information
Patent Application
PROBE STRUCTURE
Publication number
20230314475
Publication date
Oct 5, 2023
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE FOR A PROBE HEAD
Publication number
20230288447
Publication date
Sep 14, 2023
TECHNOPROBE S.P.A.
Stefano FELICI
G01 - MEASURING TESTING
Information
Patent Application
PROBE PIN HAVING IMPROVED GRIPPING STRUCTURE
Publication number
20230266361
Publication date
Aug 24, 2023
TSE CO., LTD.
Seung Bae AN
G01 - MEASURING TESTING
Information
Patent Application
PROBE OF PROBE CARD USE, AND METHOD FOR MANUFACTURING THE SAME
Publication number
20230258689
Publication date
Aug 17, 2023
JAPAN ELECTRONIC MATERIALS CORPORATION
Kazumasa OKUBO
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
Publication number
20230251286
Publication date
Aug 10, 2023
NHK Spring Co., Ltd.
Hajime Arai
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD AND SEMICONDUCTOR TEST METHOD USING THE SAME
Publication number
20230221351
Publication date
Jul 13, 2023
Samsung Electronics Co., Ltd.
BYUNGWOOK CHOI
G01 - MEASURING TESTING