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Specific types of tests or tests for a specific type of fault
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G01R31/281
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/281
Specific types of tests or tests for a specific type of fault
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Patents Grants
last 30 patents
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Patent Grant
Charging pile and testing device, system and method thereof
Patent number
12,344,113
Issue date
Jul 1, 2025
SUNGROW POWER SUPPLY CO., LTD.
Hongchuang Chen
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Semiconductor test device and system and test method using the same
Patent number
12,332,298
Issue date
Jun 17, 2025
Samsung Electronics Co., Ltd.
Meehyun Lim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-contact circuit testing systems and methods
Patent number
12,282,041
Issue date
Apr 22, 2025
COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
Mark Bates
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid circuit board
Patent number
12,282,053
Issue date
Apr 22, 2025
COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
Mark Bates
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
System and method for fault sequence recording
Patent number
12,235,319
Issue date
Feb 25, 2025
Texas Instruments Incorporated
Abhinay Patil
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Module type sensor for detecting voltage and current of radio frequ...
Patent number
12,228,605
Issue date
Feb 18, 2025
NEWPOWERPLASMA CO., LTD.
Jinjoong Kim
G01 - MEASURING TESTING
Information
Patent Grant
Display device and bonding detection method of display device
Patent number
12,224,215
Issue date
Feb 11, 2025
Chengdu BOE Optoelectronics Technology Co., Ltd.
Chienpang Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monitoring semiconductor reliability and predicting device failure...
Patent number
12,203,973
Issue date
Jan 21, 2025
Tartan Silicon Systems, Inc.
Alan Paul Aronoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flexible sideband support systems and methods
Patent number
12,203,978
Issue date
Jan 21, 2025
Advantest Corporation
Srdjan Malisic
G01 - MEASURING TESTING
Information
Patent Grant
Ball grid array current meter with a current sense wire
Patent number
12,174,240
Issue date
Dec 24, 2024
International Business Machines Corporation
Layne A. Berge
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Apparatus and method for tin whisker isolation and detection
Patent number
12,174,241
Issue date
Dec 24, 2024
International Business Machines Corporation
Matthew Doyle
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting defective back-drills in printed ci...
Patent number
12,153,084
Issue date
Nov 26, 2024
R & D Circuits, Inc.
Donald Eric Thompson
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for detecting and adjusting poor back drills in printed circ...
Patent number
12,135,347
Issue date
Nov 5, 2024
R&D Circuits
Michael Caprio
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Interface to full and reduced pin JTAG devices
Patent number
12,130,328
Issue date
Oct 29, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device and operation method of electronic device for det...
Patent number
12,130,325
Issue date
Oct 29, 2024
Samsung Electronics Co., Ltd.
Myeongjae Hong
G01 - MEASURING TESTING
Information
Patent Grant
Reconfigurable JTAG architecture for implementation of programmable...
Patent number
12,123,912
Issue date
Oct 22, 2024
University of Florida Research Foundation, Incorporated
Swarup Bhunia
G01 - MEASURING TESTING
Information
Patent Grant
Detecting a via stripping issue in a printed circuit board
Patent number
12,123,907
Issue date
Oct 22, 2024
Dell Products L.P.
Ching-Huei Chen
G01 - MEASURING TESTING
Information
Patent Grant
Sampling circuit
Patent number
12,119,962
Issue date
Oct 15, 2024
Nippon Telegraph and Telephone Corporation
Naoki Terao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for real-time fault detection
Patent number
12,099,084
Issue date
Sep 24, 2024
Maxim Integrated Products, Inc.
Daniel James Miller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and process for real-time detection of high-impedance fau...
Patent number
12,032,037
Issue date
Jul 9, 2024
Newsouth Innovations Pty Limited
Sirojan Tharmakulasingam
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
System of performing boundary scan test on pin through test point a...
Patent number
12,025,660
Issue date
Jul 2, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Qiu-Yue Duan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting semiconductor
Patent number
12,025,652
Issue date
Jul 2, 2024
Samsung Electronics Co., Ltd.
Mi-Sol Youn
G01 - MEASURING TESTING
Information
Patent Grant
Contact terminal, inspection jig, and inspection device
Patent number
12,013,416
Issue date
Jun 18, 2024
Nidec-Read Corporation
Michio Kaida
G01 - MEASURING TESTING
Information
Patent Grant
Carrier mechanism and processing equipment including the carrier me...
Patent number
11,988,705
Issue date
May 21, 2024
HON. PRECISION, INC.
Tzu-Wei Li
G01 - MEASURING TESTING
Information
Patent Grant
Trace level voltage sensor for multi-layer printed circuit boards
Patent number
11,988,706
Issue date
May 21, 2024
Quanta Computer Inc.
Yangtzu Lee
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device
Patent number
11,982,704
Issue date
May 14, 2024
E Ink Holdings Inc.
Ruei-Huan Rao
G01 - MEASURING TESTING
Information
Patent Grant
Integrity monitoring for flexible material
Patent number
11,969,030
Issue date
Apr 30, 2024
ARM Limited
Emre Ozer
A41 - WEARING APPAREL
Information
Patent Grant
Burn in board test device and system
Patent number
11,959,959
Issue date
Apr 16, 2024
Samsung Electronics Co., Ltd.
Seong Seob Shin
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-corrected control data for verifying of structural inte...
Patent number
11,946,891
Issue date
Apr 2, 2024
3M Innovative Properties Company
David H. Redinger
G05 - CONTROLLING REGULATING
Information
Patent Grant
Electrical connection test for unpopulated printed circuit boards
Patent number
11,940,481
Issue date
Mar 26, 2024
Dyconex AG
Daniel Luchsinger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONNECTING CONDITION DIAGNOSIS APPARATUS AND SYSTEM THEREOF
Publication number
20250208193
Publication date
Jun 26, 2025
HYUNDAI MOBIS CO., LTD.
Gyu Hyeon SEO
G01 - MEASURING TESTING
Information
Patent Application
TESTING SYSTEM FOR DETECTING A FAULT AND A LOCATION OF THE FAULT
Publication number
20250189573
Publication date
Jun 12, 2025
KARL STORZ Imaging Inc.
Maxim Jay Skender
G01 - MEASURING TESTING
Information
Patent Application
Methods for Verifying Integrity and Authenticity of a Printed Circu...
Publication number
20250180628
Publication date
Jun 5, 2025
Worcester Polytechnic Institute
Tahoura Mosavirik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRONIC DEVICE COMPRISING FLEXIBLE DISPLAY, AND METHOD FOR REDUC...
Publication number
20250181118
Publication date
Jun 5, 2025
Samsung Electronics Co., Ltd.
Junghyung KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING
Publication number
20250164554
Publication date
May 22, 2025
TEXAS INSTRUMENTS INCORPORATED
Abhinay Patil
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRONIC DEVICE INCLUDING DEW CONDENSATION SENSOR
Publication number
20250137962
Publication date
May 1, 2025
LG ELECTRONICS INC.
Kyungsup OH
G08 - SIGNALLING
Information
Patent Application
STRUCTURE AND METHOD FOR FAILURE DIAGNOSIS OF PCB BOARD FOR ARTICLE...
Publication number
20250128912
Publication date
Apr 24, 2025
Dongsub KIM
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...
Publication number
20250110175
Publication date
Apr 3, 2025
Intel Corporation
Rakesh KANDULA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETECTING DEFECTIVE BACK-DRILLS IN PRINTED CI...
Publication number
20250085332
Publication date
Mar 13, 2025
R&D Circuits, Inc.
Donald Thompson
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR AND METHOD OF FREQUENCY TESTING PRINTED CIRCUIT BOARD UN...
Publication number
20250067792
Publication date
Feb 27, 2025
Raytheon Company
Mark Ryan Northrup
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
Publication number
20250052811
Publication date
Feb 13, 2025
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSAL SOCKET TEST CARD
Publication number
20250052806
Publication date
Feb 13, 2025
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP.
MIN-HUANG WU
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL CONNECTOR MOUNTED TO BRITTLE SUBSTRATE
Publication number
20250044344
Publication date
Feb 6, 2025
Tektronix, Inc.
Forest E. Kernan
G01 - MEASURING TESTING
Information
Patent Application
CHANNEL IMPEDANCE MEASUREMENT INSTRUMENT
Publication number
20250004038
Publication date
Jan 2, 2025
Dell Products L.P.
Sandor Farkas
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC CONTROL UNIT AND METHOD FOR MONITORING SOLDER JOINTS OF...
Publication number
20240385236
Publication date
Nov 21, 2024
ROBERT BOSCH GmbH
Steffen Michelberger
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT BOARD AND MONITORING METHOD THEREFOR
Publication number
20240310431
Publication date
Sep 19, 2024
Wiwynn Corporation
Gong-Bo SONG
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
DETACHABLE MODULARIZED TEST PLATFORM
Publication number
20240230690
Publication date
Jul 11, 2024
Junming LI
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION
Publication number
20240219450
Publication date
Jul 4, 2024
International Business Machines Corporation
MATTHEW DOYLE
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS
Publication number
20240210465
Publication date
Jun 27, 2024
ROBERT BOSCH GmbH
Andreas Schmidtlein
G01 - MEASURING TESTING
Information
Patent Application
Integrity Verification System for Testing High Channel Count Neurom...
Publication number
20240206793
Publication date
Jun 27, 2024
Cadwell Laboratories, Inc.
Ethan Rhodes
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
DETACHABLE MODULARIZED TEST PLATFORM
Publication number
20240133906
Publication date
Apr 25, 2024
Junming LI
G01 - MEASURING TESTING
Information
Patent Application
PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...
Publication number
20240120241
Publication date
Apr 11, 2024
PANJIT INTERNATIONAL INC.
Chung-Hsiung HO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS
Publication number
20240027516
Publication date
Jan 25, 2024
Sreejit Chakravarty
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
Publication number
20230408574
Publication date
Dec 21, 2023
Samsung Electronics Co., Ltd.
Meehyun Lim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...
Publication number
20230400509
Publication date
Dec 14, 2023
ATG LUTHER & MAELZER GMBH
Stefan Weiss
G01 - MEASURING TESTING
Information
Patent Application
Flexible Sideband Support Systems and Methods
Publication number
20230400505
Publication date
Dec 14, 2023
Srdjan Malisic
G01 - MEASURING TESTING
Information
Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
Publication number
20230393195
Publication date
Dec 7, 2023
The Government of the United States, as Represented by the Secretary of the Army
Greg Rupper
G01 - MEASURING TESTING
Information
Patent Application
DETECTING A VIA STRIPPING ISSUE IN A PRINTED CIRCUIT BOARD
Publication number
20230341458
Publication date
Oct 26, 2023
Dell Products L.P.
Ching-Huei Chen
G01 - MEASURING TESTING
Information
Patent Application
Monitoring Semiconductor Reliability and Predicting Device Failure...
Publication number
20230280392
Publication date
Sep 7, 2023
Alan Paul Aronoff
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT BOARD AND PRODUCTION METHOD THEREFOR, CIRCUIT DEVICE AND PR...
Publication number
20230271424
Publication date
Aug 31, 2023
Hangzhou Chipjet Technology Co., LTD.
Shan Luo
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS