Specific types of tests or tests for a specific type of fault

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G01R31/281

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/281Specific types of tests or tests for a specific type of fault

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Channel impedance measurement instrument
- Patent number 12,366,601
- Issue date Jul 22, 2025
- Dell Products L.P.
- Sandor Farkas
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 12,360,159
- Issue date Jul 15, 2025
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
Device for and method of frequency testing printed circuit board un...
- Patent number 12,352,803
- Issue date Jul 8, 2025
- Raytheon Company
- Mark Ryan Northrup
- G01 - MEASURING TESTING
Information Patent Grant
Additively manufactured printed electronics tester
- Patent number 12,352,804
- Issue date Jul 8, 2025
- Honeywell Federal Manufacturing & Technologies, LLC
- Daniel Benjamin Hartley
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Charging pile and testing device, system and method thereof
- Patent number 12,344,113
- Issue date Jul 1, 2025
- SUNGROW POWER SUPPLY CO., LTD.
- Hongchuang Chen
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor test device and system and test method using the same
- Patent number 12,332,298
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact circuit testing systems and methods
- Patent number 12,282,041
- Issue date Apr 22, 2025
- COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
- Mark Bates
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid circuit board
- Patent number 12,282,053
- Issue date Apr 22, 2025
- COBHAM ADVANCED ELECTRONIC SOLUTIONS INC.
- Mark Bates
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for fault sequence recording
- Patent number 12,235,319
- Issue date Feb 25, 2025
- Texas Instruments Incorporated
- Abhinay Patil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Module type sensor for detecting voltage and current of radio frequ...
- Patent number 12,228,605
- Issue date Feb 18, 2025
- NEWPOWERPLASMA CO., LTD.
- Jinjoong Kim
- G01 - MEASURING TESTING
Information Patent Grant
Display device and bonding detection method of display device
- Patent number 12,224,215
- Issue date Feb 11, 2025
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Chienpang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 12,203,973
- Issue date Jan 21, 2025
- Tartan Silicon Systems, Inc.
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flexible sideband support systems and methods
- Patent number 12,203,978
- Issue date Jan 21, 2025
- Advantest Corporation
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Grant
Ball grid array current meter with a current sense wire
- Patent number 12,174,240
- Issue date Dec 24, 2024
- International Business Machines Corporation
- Layne A. Berge
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for tin whisker isolation and detection
- Patent number 12,174,241
- Issue date Dec 24, 2024
- International Business Machines Corporation
- Matthew Doyle
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting defective back-drills in printed ci...
- Patent number 12,153,084
- Issue date Nov 26, 2024
- R & D Circuits, Inc.
- Donald Eric Thompson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for detecting and adjusting poor back drills in printed circ...
- Patent number 12,135,347
- Issue date Nov 5, 2024
- R&D Circuits
- Michael Caprio
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and operation method of electronic device for det...
- Patent number 12,130,325
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Myeongjae Hong
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable JTAG architecture for implementation of programmable...
- Patent number 12,123,912
- Issue date Oct 22, 2024
- University of Florida Research Foundation, Incorporated
- Swarup Bhunia
- G01 - MEASURING TESTING
Information Patent Grant
Detecting a via stripping issue in a printed circuit board
- Patent number 12,123,907
- Issue date Oct 22, 2024
- Dell Products L.P.
- Ching-Huei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Sampling circuit
- Patent number 12,119,962
- Issue date Oct 15, 2024
- Nippon Telegraph and Telephone Corporation
- Naoki Terao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for real-time fault detection
- Patent number 12,099,084
- Issue date Sep 24, 2024
- Maxim Integrated Products, Inc.
- Daniel James Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and process for real-time detection of high-impedance fau...
- Patent number 12,032,037
- Issue date Jul 9, 2024
- Newsouth Innovations Pty Limited
- Sirojan Tharmakulasingam
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
System of performing boundary scan test on pin through test point a...
- Patent number 12,025,660
- Issue date Jul 2, 2024
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Qiu-Yue Duan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting semiconductor
- Patent number 12,025,652
- Issue date Jul 2, 2024
- Samsung Electronics Co., Ltd.
- Mi-Sol Youn
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 12,013,416
- Issue date Jun 18, 2024
- Nidec-Read Corporation
- Michio Kaida
- G01 - MEASURING TESTING
Information Patent Grant
Carrier mechanism and processing equipment including the carrier me...
- Patent number 11,988,705
- Issue date May 21, 2024
- HON. PRECISION, INC.
- Tzu-Wei Li
- G01 - MEASURING TESTING
Information Patent Grant
Trace level voltage sensor for multi-layer printed circuit boards
- Patent number 11,988,706
- Issue date May 21, 2024
- Quanta Computer Inc.
- Yangtzu Lee
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device
- Patent number 11,982,704
- Issue date May 14, 2024
- E Ink Holdings Inc.
- Ruei-Huan Rao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST DEVICE, ELECTRONIC DEVICE, AND OPERATING METHOD OF TEST DEVICE
- Publication number 20250231232
- Publication date Jul 17, 2025
- Samsung Electronics Co., Ltd.
- Ingoo Heo
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY TESTING USING FUNCTIONAL DEVICES
- Publication number 20250216440
- Publication date Jul 3, 2025
- Octavo Systems LLC
- Masood MURTUZA
- G01 - MEASURING TESTING
Information Patent Application
CONNECTING CONDITION DIAGNOSIS APPARATUS AND SYSTEM THEREOF
- Publication number 20250208193
- Publication date Jun 26, 2025
- HYUNDAI MOBIS CO., LTD.
- Gyu Hyeon SEO
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM FOR DETECTING A FAULT AND A LOCATION OF THE FAULT
- Publication number 20250189573
- Publication date Jun 12, 2025
- KARL STORZ Imaging Inc.
- Maxim Jay Skender
- G01 - MEASURING TESTING
Information Patent Application
Methods for Verifying Integrity and Authenticity of a Printed Circu...
- Publication number 20250180628
- Publication date Jun 5, 2025
- Worcester Polytechnic Institute
- Tahoura Mosavirik
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE COMPRISING FLEXIBLE DISPLAY, AND METHOD FOR REDUC...
- Publication number 20250181118
- Publication date Jun 5, 2025
- Samsung Electronics Co., Ltd.
- Junghyung KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING
- Publication number 20250164554
- Publication date May 22, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Abhinay Patil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE INCLUDING DEW CONDENSATION SENSOR
- Publication number 20250137962
- Publication date May 1, 2025
- LG ELECTRONICS INC.
- Kyungsup OH
- G08 - SIGNALLING
Information Patent Application
STRUCTURE AND METHOD FOR FAILURE DIAGNOSIS OF PCB BOARD FOR ARTICLE...
- Publication number 20250128912
- Publication date Apr 24, 2025
- Dongsub KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...
- Publication number 20250110175
- Publication date Apr 3, 2025
- Intel Corporation
- Rakesh KANDULA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING DEFECTIVE BACK-DRILLS IN PRINTED CI...
- Publication number 20250085332
- Publication date Mar 13, 2025
- R&D Circuits, Inc.
- Donald Thompson
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR AND METHOD OF FREQUENCY TESTING PRINTED CIRCUIT BOARD UN...
- Publication number 20250067792
- Publication date Feb 27, 2025
- Raytheon Company
- Mark Ryan Northrup
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20250052811
- Publication date Feb 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL SOCKET TEST CARD
- Publication number 20250052806
- Publication date Feb 13, 2025
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP.
- MIN-HUANG WU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTOR MOUNTED TO BRITTLE SUBSTRATE
- Publication number 20250044344
- Publication date Feb 6, 2025
- Tektronix, Inc.
- Forest E. Kernan
- G01 - MEASURING TESTING
Information Patent Application
CHANNEL IMPEDANCE MEASUREMENT INSTRUMENT
- Publication number 20250004038
- Publication date Jan 2, 2025
- Dell Products L.P.
- Sandor Farkas
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CONTROL UNIT AND METHOD FOR MONITORING SOLDER JOINTS OF...
- Publication number 20240385236
- Publication date Nov 21, 2024
- ROBERT BOSCH GmbH
- Steffen Michelberger
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD AND MONITORING METHOD THEREFOR
- Publication number 20240310431
- Publication date Sep 19, 2024
- Wiwynn Corporation
- Gong-Bo SONG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DETACHABLE MODULARIZED TEST PLATFORM
- Publication number 20240230690
- Publication date Jul 11, 2024
- Junming LI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION
- Publication number 20240219450
- Publication date Jul 4, 2024
- International Business Machines Corporation
- MATTHEW DOYLE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS
- Publication number 20240210465
- Publication date Jun 27, 2024
- ROBERT BOSCH GmbH
- Andreas Schmidtlein
- G01 - MEASURING TESTING
Information Patent Application
Integrity Verification System for Testing High Channel Count Neurom...
- Publication number 20240206793
- Publication date Jun 27, 2024
- Cadwell Laboratories, Inc.
- Ethan Rhodes
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DETACHABLE MODULARIZED TEST PLATFORM
- Publication number 20240133906
- Publication date Apr 25, 2024
- Junming LI
- G01 - MEASURING TESTING
Information Patent Application
PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...
- Publication number 20240120241
- Publication date Apr 11, 2024
- PANJIT INTERNATIONAL INC.
- Chung-Hsiung HO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS
- Publication number 20240027516
- Publication date Jan 25, 2024
- Sreejit Chakravarty
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20230408574
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...
- Publication number 20230400509
- Publication date Dec 14, 2023
- ATG LUTHER & MAELZER GMBH
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Application
Flexible Sideband Support Systems and Methods
- Publication number 20230400505
- Publication date Dec 14, 2023
- Srdjan Malisic
- G01 - MEASURING TESTING
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20230393195
- Publication date Dec 7, 2023
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
DETECTING A VIA STRIPPING ISSUE IN A PRINTED CIRCUIT BOARD
- Publication number 20230341458
- Publication date Oct 26, 2023
- Dell Products L.P.
- Ching-Huei Chen
- G01 - MEASURING TESTING

Specific types of tests or tests for a specific type of fault

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Channel impedance measurement instrument

Terahertz plasmonics for testing very large-scale integrated circui...

Device for and method of frequency testing printed circuit board un...

Additively manufactured printed electronics tester

Charging pile and testing device, system and method thereof

Semiconductor test device and system and test method using the same

Non-contact circuit testing systems and methods

Hybrid circuit board

System and method for fault sequence recording

Module type sensor for detecting voltage and current of radio frequ...

Display device and bonding detection method of display device

Monitoring semiconductor reliability and predicting device failure...

Flexible sideband support systems and methods

Ball grid array current meter with a current sense wire

Apparatus and method for tin whisker isolation and detection

System and method for detecting defective back-drills in printed ci...

Method for detecting and adjusting poor back drills in printed circ...

Interface to full and reduced pin JTAG devices

Electronic device and operation method of electronic device for det...

Reconfigurable JTAG architecture for implementation of programmable...

Detecting a via stripping issue in a printed circuit board

Sampling circuit

Systems and methods for real-time fault detection

Apparatus and process for real-time detection of high-impedance fau...

System of performing boundary scan test on pin through test point a...

Apparatus and method for inspecting semiconductor

Contact terminal, inspection jig, and inspection device

Carrier mechanism and processing equipment including the carrier me...

Trace level voltage sensor for multi-layer printed circuit boards

Electronic device

Patents Applicationslast 30 patents

TEST DEVICE, ELECTRONIC DEVICE, AND OPERATING METHOD OF TEST DEVICE

RELIABILITY TESTING USING FUNCTIONAL DEVICES

CONNECTING CONDITION DIAGNOSIS APPARATUS AND SYSTEM THEREOF

TESTING SYSTEM FOR DETECTING A FAULT AND A LOCATION OF THE FAULT

Methods for Verifying Integrity and Authenticity of a Printed Circu...

ELECTRONIC DEVICE COMPRISING FLEXIBLE DISPLAY, AND METHOD FOR REDUC...

SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING

ELECTRONIC DEVICE INCLUDING DEW CONDENSATION SENSOR

STRUCTURE AND METHOD FOR FAILURE DIAGNOSIS OF PCB BOARD FOR ARTICLE...

METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS US...

SYSTEM AND METHOD FOR DETECTING DEFECTIVE BACK-DRILLS IN PRINTED CI...

DEVICE FOR AND METHOD OF FREQUENCY TESTING PRINTED CIRCUIT BOARD UN...

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

UNIVERSAL SOCKET TEST CARD

ELECTRICAL CONNECTOR MOUNTED TO BRITTLE SUBSTRATE

CHANNEL IMPEDANCE MEASUREMENT INSTRUMENT

ELECTRONIC CONTROL UNIT AND METHOD FOR MONITORING SOLDER JOINTS OF...

CIRCUIT BOARD AND MONITORING METHOD THEREFOR

DETACHABLE MODULARIZED TEST PLATFORM

APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION

METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS

Integrity Verification System for Testing High Channel Count Neurom...

DETACHABLE MODULARIZED TEST PLATFORM

PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...

TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS

SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME

Test Needle, Test Probe, and Flying Probe Tester for Testing Printe...

Flexible Sideband Support Systems and Methods

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

DETECTING A VIA STRIPPING ISSUE IN A PRINTED CIRCUIT BOARD