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Industry

CPC
G01R1/06722

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06722Spring-loaded

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods and compositions for increasing the potency of antifungal a...
- Patent number 12,280,032
- Issue date Apr 22, 2025
- Pacific Northwest Research Institute
- Catherine Ludlow
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Elastic electrical contact device and contact conductor thereof
- Patent number 12,259,406
- Issue date Mar 25, 2025
- SUNLIT PRECISION TECHNOLOGY CO., LTD.
- Wen-Han Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,241,913
- Issue date Mar 4, 2025
- NHK Spring Co., Ltd.
- Hajime Arai
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,782
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,781
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Vehicular camera testing system using spring-loaded electrical conn...
- Patent number 12,184,830
- Issue date Dec 31, 2024
- Magna Electronics Inc.
- Anthony N. Rinaldo
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Compliant probes including dual independently operable probe contac...
- Patent number 12,181,493
- Issue date Dec 31, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Contact pin with individually movable contact elements
- Patent number 12,163,981
- Issue date Dec 10, 2024
- Feinmetall GmbH
- Lutz Benedix
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam probes with decoupled structural and current carrying be...
- Patent number 12,146,898
- Issue date Nov 19, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Contact, inspection jig, inspection device, and method of manufactu...
- Patent number 12,135,336
- Issue date Nov 5, 2024
- Nidec-Read Corporation
- Norihiro Ota
- G01 - MEASURING TESTING
Information Patent Grant
Electrical component inspection instrument
- Patent number 12,105,117
- Issue date Oct 1, 2024
- Japan Aviation Electronics Industry, Limited
- Junji Oosaka
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid shielding sockets with impedance tuning for integrated circu...
- Patent number 12,085,587
- Issue date Sep 10, 2024
- Essai, Inc.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Grant
Compliant pin probes with extension springs, methods for making, an...
- Patent number 12,078,657
- Issue date Sep 3, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,066,462
- Issue date Aug 20, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact and socket having spring contact embedded therein
- Patent number 12,061,212
- Issue date Aug 13, 2024
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 12,055,561
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Norihiro Ota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact terminal, inspection jig, and inspection apparatus
- Patent number 12,055,562
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Yusuke Yokota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC socket includes a base part with a contact pin and a sheet membe...
- Patent number 12,050,234
- Issue date Jul 30, 2024
- Enplas Corporation
- Kazutaka Koshiishi
- G01 - MEASURING TESTING
Information Patent Grant
High performance outer cylindrical spring pin
- Patent number 12,000,864
- Issue date Jun 4, 2024
- Jungdon Cho
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit
- Patent number 11,994,535
- Issue date May 28, 2024
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact and test socket with same
- Patent number 11,982,688
- Issue date May 14, 2024
- Hicon Co., Ltd.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig, and inspection device
- Patent number 11,933,837
- Issue date Mar 19, 2024
- Nidec-Read Corporation
- Minoru Kato
- G01 - MEASURING TESTING
Information Patent Grant
Compliant pin probes with flat extension springs, methods for makin...
- Patent number 11,906,549
- Issue date Feb 20, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing one or more devices-under-test...
- Patent number 11,899,059
- Issue date Feb 13, 2024
- Advantest Corporation
- Marc Mössinger
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing one or more devices-under-test...
- Patent number 11,899,058
- Issue date Feb 13, 2024
- Advantest Corporation
- Marc Mössinger
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and probe unit
- Patent number 11,874,300
- Issue date Jan 16, 2024
- NHK Spring Co., Ltd.
- Kazuya Souma
- G01 - MEASURING TESTING
Information Patent Grant
Probes with multiple springs, methods for making, and methods for u...
- Patent number 11,867,721
- Issue date Jan 9, 2024
- Microfabrica Inc.
- Ming Ting Wu
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial contact having an open-curve shape
- Patent number 11,855,376
- Issue date Dec 26, 2023
- Teradyne, Inc.
- Roger A. Sinsheimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe and socket for testing electrical component
- Patent number 11,841,380
- Issue date Dec 12, 2023
- Enplas Corporation
- Inoue Yuta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE
- Publication number 20250138049
- Publication date May 1, 2025
- Kabushiki Kaisha Nihon Micronics
- Akihiro SHUTO
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN WITH MULTI-STAGE BRUSH SETS
- Publication number 20250130254
- Publication date Apr 24, 2025
- IWIN SOLUTION CORPORATION
- Sangyang PAK
- G01 - MEASURING TESTING
Information Patent Application
REMOVABLE HIGH-SPEED SIGNAL MEASUREMENT DEVICE
- Publication number 20250093383
- Publication date Mar 20, 2025
- International Business Machines Corporation
- Kyle Olson
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD
- Publication number 20250060393
- Publication date Feb 20, 2025
- YOKOWO CO., LTD.
- Yusuke SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SOCKET
- Publication number 20250052782
- Publication date Feb 13, 2025
- YOKOWO CO., LTD
- Hirotaka TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...
- Publication number 20250044321
- Publication date Feb 6, 2025
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
Electrical and Optical Semiconductor Probe Head
- Publication number 20240385216
- Publication date Nov 21, 2024
- Teramount Ltd.
- Hesham Taha
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF
- Publication number 20240377436
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRA...
- Publication number 20240377433
- Publication date Nov 14, 2024
- Smiths Interconnect Americas, Inc.
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE...
- Publication number 20240353442
- Publication date Oct 24, 2024
- Korea University Research and Business Foundation
- Moonil Kim
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND INSPECTION SOCKET
- Publication number 20240353444
- Publication date Oct 24, 2024
- Yamaichi Electronics Co., Ltd.
- Seiya YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...
- Publication number 20240345131
- Publication date Oct 17, 2024
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Senlin JIN
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCU...
- Publication number 20240345132
- Publication date Oct 17, 2024
- ESSAI, INC.
- Nasser Barabi
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC WIRE CONNECTION APPARATUS FOR CIRCUIT BOARD TESTING
- Publication number 20240329081
- Publication date Oct 3, 2024
- Samsung SDI Co., Ltd.
- Imsu CHOI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND SOCKET FOR ELECTRICAL COMPONENT TESTING
- Publication number 20240329082
- Publication date Oct 3, 2024
- ENPLAS CORPORATION
- Yuta INOUE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240329080
- Publication date Oct 3, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL PROBE CARD AND TESTING METHOD
- Publication number 20240310412
- Publication date Sep 19, 2024
- PANJIT INTERNATIONAL INC.
- CHUNG-HSIUNG HO
- G01 - MEASURING TESTING
Information Patent Application
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...
- Publication number 20240310433
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD WITH REPLACEABLE PROBE BOARD
- Publication number 20240310410
- Publication date Sep 19, 2024
- Xallent Inc.
- Kwame Amponsah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT UNIT
- Publication number 20240302409
- Publication date Sep 12, 2024
- NHK Spring Co, Ltd.
- Tsuyoshi Inuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET
- Publication number 20240295584
- Publication date Sep 5, 2024
- YOKOWO CO., LTD.
- Daisuke HOSOKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST PIN
- Publication number 20240288470
- Publication date Aug 29, 2024
- AWESOMENICS INC.
- Woo Yoel JEONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING CONTACT PROBE AND CONTACT PROBE
- Publication number 20240272201
- Publication date Aug 15, 2024
- NHK Spring Co., Ltd.
- Yoshio Yamada
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND PROBE UNIT
- Publication number 20240264200
- Publication date Aug 8, 2024
- NHK Spring Co., Ltd.
- Kazuya Soma
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN WITH ADJUSTABLE ELASTIC FORCE
- Publication number 20240264201
- Publication date Aug 8, 2024
- OKINS ELECTRONICS CO., LTD
- Jin Kook JUN
- G01 - MEASURING TESTING
Information Patent Application
SPRING PROBE CONTACT ASSEMBLY
- Publication number 20240241153
- Publication date Jul 18, 2024
- Johnstech International Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOCKET DEVICE FOR TESTING ICs
- Publication number 20240230715
- Publication date Jul 11, 2024
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS
- Publication number 20240219448
- Publication date Jul 4, 2024
- Global Unichip Corporation
- Chih-Chieh LIAO
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT IN A TESTING APPARATUS FOR INTEGRATED CIRCUITS
- Publication number 20240159796
- Publication date May 16, 2024
- JF Microtechnology Sdn. Bhd.
- Wei Kuong FOONG
- G01 - MEASURING TESTING
Information Patent Application
POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...
- Publication number 20240151746
- Publication date May 9, 2024
- CHROMA ATE INC.
- I-Shih TSENG
- G01 - MEASURING TESTING

Spring-loaded

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and compositions for increasing the potency of antifungal a...

Elastic electrical contact device and contact conductor thereof

Contact probe, probe holder and probe unit

Probes with planar unbiased spring elements for electronic componen...

Probes with planar unbiased spring elements for electronic componen...

Vehicular camera testing system using spring-loaded electrical conn...

Compliant probes including dual independently operable probe contac...

Contact pin with individually movable contact elements

Multi-beam probes with decoupled structural and current carrying be...

Testing apparatus

Contact, inspection jig, inspection device, and method of manufactu...

Electrical component inspection instrument

Hybrid shielding sockets with impedance tuning for integrated circu...

Compliant pin probes with extension springs, methods for making, an...

Probes with planar unbiased spring elements for electronic componen...

Spring contact and socket having spring contact embedded therein

Contact terminal, inspection jig, and inspection device

Contact terminal, inspection jig, and inspection apparatus

IC socket includes a base part with a contact pin and a sheet membe...

High performance outer cylindrical spring pin

Probe unit

Spring contact and test socket with same

Inspection jig, and inspection device

Compliant pin probes with flat extension springs, methods for makin...

Automated test equipment for testing one or more devices-under-test...

Automated test equipment for testing one or more devices-under-test...

Contact probe and probe unit

Probes with multiple springs, methods for making, and methods for u...

Coaxial contact having an open-curve shape

Contact probe and socket for testing electrical component

Patents Applicationslast 30 patents

PROBE

POGO PIN WITH MULTI-STAGE BRUSH SETS

REMOVABLE HIGH-SPEED SIGNAL MEASUREMENT DEVICE

PROBE HEAD

INSPECTION SOCKET

CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRIS...

Electrical and Optical Semiconductor Probe Head

PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF

TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRA...

PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE...

PROBE AND INSPECTION SOCKET

PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...

HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCU...

AUTOMATIC WIRE CONNECTION APPARATUS FOR CIRCUIT BOARD TESTING

CONTACT PROBE AND SOCKET FOR ELECTRICAL COMPONENT TESTING

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

UNIVERSAL PROBE CARD AND TESTING METHOD

PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...

PROBE HEAD WITH REPLACEABLE PROBE BOARD

MEASUREMENT UNIT

SOCKET

TEST PIN

METHOD OF MANUFACTURING CONTACT PROBE AND CONTACT PROBE

CONTACT PROBE AND PROBE UNIT

POGO PIN WITH ADJUSTABLE ELASTIC FORCE

SPRING PROBE CONTACT ASSEMBLY

SOCKET DEVICE FOR TESTING ICs

TESTING APPARATUS

SPRING CONTACT IN A TESTING APPARATUS FOR INTEGRATED CIRCUITS

POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING AP...