strain

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CPC
G01N2223/607

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/607strain

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
- Patent number 11,846,593
- Issue date Dec 19, 2023
- PROTO PATENTS LTD.
- James Pineault
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for evaluating rotor-mast fatigue damage
- Patent number 11,738,887
- Issue date Aug 29, 2023
- Textron Innovations Inc.
- Steve Cates
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Thin film analyzing device and thin film analyzing method
- Patent number 11,508,630
- Issue date Nov 22, 2022
- Kioxia Corporation
- Yuki Wakisaka
- B24 - GRINDING POLISHING
Information Patent Grant
Situ monitoring of stress for additively manufactured components
- Patent number 11,292,198
- Issue date Apr 5, 2022
- Hamilton Sundstrand Corporation
- Joseph V. Mantese
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Method for measuring stress
- Patent number 11,221,304
- Issue date Jan 11, 2022
- Kobe Steel, Ltd.
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for computed laminography x-ray fluorescence imaging
- Patent number 11,143,605
- Issue date Oct 12, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring stress
- Patent number 10,914,692
- Issue date Feb 9, 2021
- Kobe Steel, Ltd.
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
“4D” dynamic tomography system
- Patent number 10,739,281
- Issue date Aug 11, 2020
- Centre National de la Recherche Scientifique
- François Hild
- G01 - MEASURING TESTING
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,658,154
- Issue date May 19, 2020
- International Business Machines Corporation
- Marc Adam Bergendahl
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
- Patent number 10,648,932
- Issue date May 12, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
- Patent number 10,620,141
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
- Patent number 10,613,042
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based fatigue inspection of downhole component
- Patent number 10,539,518
- Issue date Jan 21, 2020
- Weatherford Technology Holdings, LLC
- Robert P. Badrak
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction device and method to measure stress with 2D detec...
- Patent number 10,416,102
- Issue date Sep 17, 2019
- Bob Baoping He
- G01 - MEASURING TESTING
Information Patent Grant
X-ray stress analysis apparatus, method, and program
- Patent number 10,401,310
- Issue date Sep 3, 2019
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining strain distribution in a sample
- Patent number 10,209,206
- Issue date Feb 19, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining lattice parameters of a strain...
- Patent number 10,132,765
- Issue date Nov 20, 2018
- Infineon Technologies Austria AG
- Marija Borna Tutuc
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring depth of damage of wafer
- Patent number 9,857,319
- Issue date Jan 2, 2018
- LG SILTRON INCORPORATED
- Kyu Hyung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strain mapping in TEM using precession electron diffraction
- Patent number 9,568,442
- Issue date Feb 14, 2017
- Drexel University
- Mitra Lenore Taheri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing an un-distorted dark field strain map at high s...
- Patent number 9,551,674
- Issue date Jan 24, 2017
- GLOBALFOUNDRIES, INC.
- Yun-Yu Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,900
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet of Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
High-temperature strain cell for tomographic imaging
- Patent number 9,057,681
- Issue date Jun 16, 2015
- The Regents of the University of California
- Alastair A. MacDowell
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive examination of structures having embedded particles
- Patent number 9,042,516
- Issue date May 26, 2015
- The Boeing Company
- James A. Grossnickle
- G01 - MEASURING TESTING
Information Patent Grant
X-ray stress measurement apparatus
- Patent number 8,855,266
- Issue date Oct 7, 2014
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of CMOS device channel strain by X-ray diffraction
- Patent number 8,716,037
- Issue date May 6, 2014
- International Business Machines Corporation
- Thomas N. Adam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...
- Publication number 20230160843
- Publication date May 25, 2023
- SINTOKOGIO, LTD.
- Yuji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
BALL-MAPPING SYSTEM AND METHOD OF OPERATING THE SAME
- Publication number 20220034826
- Publication date Feb 3, 2022
- PROTO PATENTS LTD.
- James PINEAULT
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING
- Publication number 20210080408
- Publication date Mar 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
FATIGUE LEVEL ESTIMATION METHOD AND CREATING METHOD FOR DATABASE FO...
- Publication number 20210025863
- Publication date Jan 28, 2021
- JTEKT Corporation
- Yousuke NAGANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING RESIDUAL STRESS
- Publication number 20200340933
- Publication date Oct 29, 2020
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Mariko MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING STRESS
- Publication number 20200141885
- Publication date May 7, 2020
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Hiroyuki TAKAMATSU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING STRESS
- Publication number 20200072769
- Publication date Mar 5, 2020
- KABUSHIKI KAISHA KOBE SEIKO SHO (KOBE STEEL, LTD)
- Hiroyuki TAKAMATSU
- G01 - MEASURING TESTING
Information Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
- Publication number 20190094158
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
- Publication number 20190094160
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
- Publication number 20190094159
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Based Fatigue Inspection of Downhole Component
- Publication number 20180328870
- Publication date Nov 15, 2018
- Weatherford Technology Holdings, LLC.
- Robert P. Badrak
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Determining Lattice Parameters of a Strain...
- Publication number 20170343491
- Publication date Nov 30, 2017
- Infineon Technologies Austria AG
- Marija Borna Tutuc
- G01 - MEASURING TESTING
Information Patent Application
"4D" DYNAMIC TOMOGRAPHY SYSTEM
- Publication number 20170131223
- Publication date May 11, 2017
- Centre National de la Recherche Scientifique
- François HILD
- G01 - MEASURING TESTING
Information Patent Application
STRESS ANALYSIS APPARATUS, METHOD, AND PROGRAM
- Publication number 20170082561
- Publication date Mar 23, 2017
- Rigaku Corporation
- Shoichi YASUKAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING DEPTH OF DAMAGE OF WAFER
- Publication number 20160238544
- Publication date Aug 18, 2016
- LG SILTRON INCORPORATED
- Kyu Hyung LEE
- G01 - MEASURING TESTING
Information Patent Application
Strain Mapping in TEM Using Precession Electron Diffraction
- Publication number 20160139063
- Publication date May 19, 2016
- Drexel University
- Mitra Lenore Taheri
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140307854
- Publication date Oct 16, 2014
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140254763
- Publication date Sep 11, 2014
- DANMARKS TEKNISKE UNIVERSITET
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION
- Publication number 20140159161
- Publication date Jun 12, 2014
- International Business Machines Corporation
- Thomas N. Adam
- G01 - MEASURING TESTING
Information Patent Application
HIGH-TEMPERATURE STRAIN CELL FOR TOMOGRAPHIC IMAGING
- Publication number 20140161223
- Publication date Jun 12, 2014
- The Regents of the University of California
- Alastair A. MacDowell
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE EXAMINATION OF STRUCTURES HAVING EMBEDDED PARTICLES
- Publication number 20140098936
- Publication date Apr 10, 2014
- The Boeing Company
- James A. Grossnickle
- G01 - MEASURING TESTING
Information Patent Application
Evaluation System and Evaluation Method of Plastic Strain
- Publication number 20130089182
- Publication date Apr 11, 2013
- Hitachi, Ltd
- Yun WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANALYZING RUBBER COMPOUND WITH FILLER PARTICLES
- Publication number 20130051656
- Publication date Feb 28, 2013
- Wakana Ito
- G01 - MEASURING TESTING
Information Patent Application
X-RAY STRESS MEASUREMENT APPARATUS
- Publication number 20130039469
- Publication date Feb 14, 2013
- Rigaku Corporation
- Shoichi Yasukawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION
- Publication number 20120146050
- Publication date Jun 14, 2012
- International Business Machines Corporation
- THOMAS N. ADAM
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring an amount of strain of a bonded strained wafer
- Publication number 20070166845
- Publication date Jul 19, 2007
- Shin-Etsu Handotai Co., Ltd.
- Isao Yokokawa
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring short-wavelength characteristic X-r...

X-ray beam shaping apparatus and method

Method for improving an EBSD/TKD map

Ball-mapping system comprising a sample stage and a sample holder f...

Method and system for evaluating rotor-mast fatigue damage

Apparatus for inspecting semiconductor device and method for inspec...

Thin film analyzing device and thin film analyzing method

Situ monitoring of stress for additively manufactured components

Method for measuring stress

System and method for computed laminography x-ray fluorescence imaging

Method for measuring stress

“4D” dynamic tomography system

System and method for performing nano beam diffraction analysis

Measuring and analyzing residual stresses and their gradients in ma...

Measuring and analyzing residual stresses and their gradients in ma...

Measuring and analyzing residual stresses and their gradients in ma...

X-ray based fatigue inspection of downhole component

X-ray diffraction device and method to measure stress with 2D detec...

X-ray stress analysis apparatus, method, and program

Method and system for determining strain distribution in a sample

Method and apparatus for determining lattice parameters of a strain...

Method of measuring depth of damage of wafer

Strain mapping in TEM using precession electron diffraction

Method of producing an un-distorted dark field strain map at high s...

X-ray diffraction method of mapping grain structures in a crystalli...

X-ray diffraction method of mapping grain structures in a crystalli...

High-temperature strain cell for tomographic imaging

Nondestructive examination of structures having embedded particles

X-ray stress measurement apparatus

Measurement of CMOS device channel strain by X-ray diffraction

Patents Applicationslast 30 patents

METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...

BALL-MAPPING SYSTEM AND METHOD OF OPERATING THE SAME

SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING

FATIGUE LEVEL ESTIMATION METHOD AND CREATING METHOD FOR DATABASE FO...

METHOD FOR MEASURING RESIDUAL STRESS

METHOD FOR MEASURING STRESS

METHOD FOR MEASURING STRESS

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...

X-Ray Based Fatigue Inspection of Downhole Component

Method and Apparatus for Determining Lattice Parameters of a Strain...

"4D" DYNAMIC TOMOGRAPHY SYSTEM

STRESS ANALYSIS APPARATUS, METHOD, AND PROGRAM

METHOD OF MEASURING DEPTH OF DAMAGE OF WAFER

Strain Mapping in TEM Using Precession Electron Diffraction

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION

HIGH-TEMPERATURE STRAIN CELL FOR TOMOGRAPHIC IMAGING

NONDESTRUCTIVE EXAMINATION OF STRUCTURES HAVING EMBEDDED PARTICLES

Evaluation System and Evaluation Method of Plastic Strain

METHOD FOR ANALYZING RUBBER COMPOUND WITH FILLER PARTICLES

X-RAY STRESS MEASUREMENT APPARATUS

MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION

Method for measuring an amount of strain of a bonded strained wafer