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Testing semiconductor operation lifetime or reliability
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G01R31/2642
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2642
Testing semiconductor operation lifetime or reliability
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor apparatus, image capturing apparatus, image capturing...
Patent number
11,953,541
Issue date
Apr 9, 2024
Canon Kabushiki Kaisha
Kei Ochiai
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Test method for tolerance against the hot carrier effect
Patent number
11,953,542
Issue date
Apr 9, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yifei Pan
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and system for predicting insulated gate bipolar transistor...
Patent number
11,953,538
Issue date
Apr 9, 2024
WUHAN UNIVERSITY
Yigang He
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device for managing degree of degradation
Patent number
11,946,967
Issue date
Apr 2, 2024
Samsung Electronics Co., Ltd.
Dong-Uk Ryu
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Compressor, monitoring system, and method of monitoring compressor
Patent number
11,933,291
Issue date
Mar 19, 2024
Hitachi Industrial Equipment Systems Co., Ltd.
Tomofumi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Power semi-conductor module, mask, measurement method, computer sof...
Patent number
11,927,619
Issue date
Mar 12, 2024
Mitsubishi Electric Corporation
Nicolas Degrenne
G01 - MEASURING TESTING
Information
Patent Grant
Reliability evaluation method and system of microgrid inverter IGBT...
Patent number
11,913,986
Issue date
Feb 27, 2024
WUHAN UNIVERSITY
Yigang He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Testing machine and testing method
Patent number
11,892,499
Issue date
Feb 6, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Kang Lv
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and control method for inspection apparatus
Patent number
11,874,319
Issue date
Jan 16, 2024
Tokyo Electron Limited
Hiroyuki Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing electronic devices
Patent number
11,860,221
Issue date
Jan 2, 2024
AEHR Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test circuits and semiconductor test methods
Patent number
11,860,217
Issue date
Jan 2, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
ChihCheng Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for assessing the thermal loading of a converter
Patent number
11,846,668
Issue date
Dec 19, 2023
Schneider Electric Power Drives GmbH
Michael Hartmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Differential aging monitor circuits and techniques for assessing ag...
Patent number
11,821,935
Issue date
Nov 21, 2023
Infineon Technologies AG
Dirk Hammerschmidt
G01 - MEASURING TESTING
Information
Patent Grant
In situ threshold voltage determination of a semiconductor device
Patent number
11,821,936
Issue date
Nov 21, 2023
NXP USA, INC.
Jerry Rudiak
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Lifetime estimating system and method for heating source, and inspe...
Patent number
11,796,400
Issue date
Oct 24, 2023
Tokyo Electron Limited
Masahito Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Usage metering to prevent IC counterfeit
Patent number
11,789,062
Issue date
Oct 17, 2023
International Business Machines Corporation
Effendi Leobandung
G01 - MEASURING TESTING
Information
Patent Grant
Temperature control system including contactor assembly
Patent number
11,774,486
Issue date
Oct 3, 2023
DELTA DESIGN INC.
Jerry Ihor Tustaniwskyj
G01 - MEASURING TESTING
Information
Patent Grant
Chamber module and test handler including the same
Patent number
11,762,009
Issue date
Sep 19, 2023
Semes Co., Ltd.
Hyon Jin Lee
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for wafer-level testing
Patent number
11,754,621
Issue date
Sep 12, 2023
Taiwan Semiconductor Manufacturing Company Ltd.
Jun He
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and techniques for assessing aging effects in semiconducto...
Patent number
11,733,288
Issue date
Aug 22, 2023
Infineon Technologies AG
Bernhard Gstoettenbauer
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing lifetime of surface state carrier of semiconductor
Patent number
11,719,739
Issue date
Aug 8, 2023
Tongji University
Qian Cheng
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Semiconductor device defect analysis method
Patent number
11,668,743
Issue date
Jun 6, 2023
Samsung Electronics Co., Ltd.
Hakgyun Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monitoring semiconductor reliability and predicting device failure...
Patent number
11,650,244
Issue date
May 16, 2023
Alan Paul Aronoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analyzing apparatus, analysis method, and computer-readable medium
Patent number
11,635,458
Issue date
Apr 25, 2023
Fuji Electric Co., Ltd.
Norihiro Komiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
On-die aging measurements for dynamic timing modeling
Patent number
11,609,262
Issue date
Mar 21, 2023
Intel Corporation
Dheeraj Subbareddy
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and method of operating the same
Patent number
11,573,261
Issue date
Feb 7, 2023
Samsung Electronics Co., Ltd.
Jeong-Goo Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate support and inspection apparatus
Patent number
11,557,494
Issue date
Jan 17, 2023
Tokyo Electron Limited
Masahito Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Degradation phenomenon treatment method based on photovoltaic modul...
Patent number
11,502,643
Issue date
Nov 15, 2022
HUAWEI DIGITAL POWER TECHNOLOGIES CO., LTD.
Tao Luo
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Semiconductor device and test method thereof
Patent number
11,495,498
Issue date
Nov 8, 2022
SK Hynix Inc.
Jihwan Kim
G01 - MEASURING TESTING
Information
Patent Grant
Predicting failure parameters of semiconductor devices subjected to...
Patent number
11,493,548
Issue date
Nov 8, 2022
UChicago Argonne, LLC
Moinuddin Ahmed
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING APPARATUS AND TESTING METHOD
Publication number
20240142510
Publication date
May 2, 2024
Fuji Electric Co., Ltd.
Mitsuru YOSHIDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...
Publication number
20240110970
Publication date
Apr 4, 2024
DENSO CORPORATION
Masataka DEGUCHI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
Publication number
20240103068
Publication date
Mar 28, 2024
Aehr Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method And Apparatus For Monitoring The Condition Of A Power Semico...
Publication number
20240088782
Publication date
Mar 14, 2024
ABB Schweiz AG
Olli Alkkiomäki
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF
Publication number
20240003961
Publication date
Jan 4, 2024
SK HYNIX INC.
Min Cheol KIM
G01 - MEASURING TESTING
Information
Patent Application
LOW CURRENT LEAKAGE MEASUREMENT ON A HIGH CURRENT UNIFIED STATIC AN...
Publication number
20230408577
Publication date
Dec 21, 2023
KEITHLEY INSTRUMENTS, LLC
Gregory Sobolewski
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS
Publication number
20230408573
Publication date
Dec 21, 2023
MELLANOX TECHNOLOGIES, LTD.
Tatyana ANTONENKO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND DEVICE FOR WAFER-LEVEL TESTING
Publication number
20230366925
Publication date
Nov 16, 2023
Taiwan Semiconductor Manufacturing company Ltd.
JUN HE
G01 - MEASURING TESTING
Information
Patent Application
Monitoring Semiconductor Reliability and Predicting Device Failure...
Publication number
20230280392
Publication date
Sep 7, 2023
Alan Paul Aronoff
G01 - MEASURING TESTING
Information
Patent Application
DIRECTLY IMPINGING PRESSURE MODULATED SPRAY COOLING AND METHODS OF...
Publication number
20230260870
Publication date
Aug 17, 2023
Intel Corporation
Prabhakar SUBRAHMANYAM
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
In Situ Threshold Voltage Determination Of A Semiconductor Device
Publication number
20230221363
Publication date
Jul 13, 2023
NXP USA, Inc.
Jerry Rudiak
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SYSTEMS AND METHODS TO MONITOR LEAKAGE CURRENT
Publication number
20230213574
Publication date
Jul 6, 2023
STMicroelectronics S.r.l
Romeo Letor
G01 - MEASURING TESTING
Information
Patent Application
ESTIMATION OF LIFE OF SWITCHING DEVICES
Publication number
20230194593
Publication date
Jun 22, 2023
EATON INTELLIGENT POWER LIMITED
Deepak Balaji Somayajula
G05 - CONTROLLING REGULATING
Information
Patent Application
CIRCUITS AND TECHNIQUES FOR PREDICTING END OF LIFE BASED ON IN SITU...
Publication number
20230168295
Publication date
Jun 1, 2023
INFINEON TECHNOLOGIES AG
Georg Georgakos
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITS AND TECHNIQUES FOR ASSESSING AGING EFFECTS IN SEMICONDUCTO...
Publication number
20230168293
Publication date
Jun 1, 2023
INFINEON TECHNOLOGIES AG
Bernhard Gstoettenbauer
G01 - MEASURING TESTING
Information
Patent Application
DIFFERENTIAL AGING MONITOR CIRCUITS AND TECHNIQUES FOR ASSESSING AG...
Publication number
20230168294
Publication date
Jun 1, 2023
INFINEON TECHNOLOGIES AG
Dirk Hammerschmidt
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR SUBSTRATE YIELD PREDICTION BASED ON SPECTRA DATA FRO...
Publication number
20230160960
Publication date
May 25, 2023
Onto Innovation
Xin Song
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
USAGE METERING TO PREVENT IC COUNTERFEIT
Publication number
20230152365
Publication date
May 18, 2023
International Business Machines Corporation
Effendi Leobandung
G01 - MEASURING TESTING
Information
Patent Application
THERMAL TESTING SYSTEM HAVING SAFETY FEATURE(S) AND MULTIPLE INDEPE...
Publication number
20230143199
Publication date
May 11, 2023
Microsoft Technology Licensing, LLC
Quang Thanh TRAN
G01 - MEASURING TESTING
Information
Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
Publication number
20230129176
Publication date
Apr 27, 2023
Intel Corporation
Dheeraj Subbareddy
G01 - MEASURING TESTING
Information
Patent Application
ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICE
Publication number
20230096094
Publication date
Mar 30, 2023
MASCHINENFABRIK REINHAUSEN GMBH
Angus Bryant
G01 - MEASURING TESTING
Information
Patent Application
TEST METHOD FOR TOLERANCE AGAINST THE HOT CARRIER EFFECT
Publication number
20230068128
Publication date
Mar 2, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yifei PAN
G11 - INFORMATION STORAGE
Information
Patent Application
TEST CIRCUITS AND SEMICONDUCTOR TEST METHODS
Publication number
20230058289
Publication date
Feb 23, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
ChihCheng Liu
G01 - MEASURING TESTING
Information
Patent Application
TEST CIRCUITS AND SEMICONDUCTOR TEST METHODS
Publication number
20230057528
Publication date
Feb 23, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
ChihCheng Liu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING ABNORMITY, METHOD FOR REPAIRING AND SYSTEM FOR...
Publication number
20230016663
Publication date
Jan 19, 2023
Changxin Memory Technologies, Inc.
Shisheng WANG
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CONTROL SYSTEM INCLUDING CONTACTOR ASSEMBLY
Publication number
20230003786
Publication date
Jan 5, 2023
Delta Design, Inc.
Jerry Ihor TUSTANIWSKYJ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING INTERMITTENT OPERATING LIFE OF GaN-...
Publication number
20220381815
Publication date
Dec 1, 2022
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
Chang CHEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PREDICTING INSULATED GATE BIPOLAR TRANSISTOR...
Publication number
20220341986
Publication date
Oct 27, 2022
WUHAN UNIVERSITY
Yigang HE
G01 - MEASURING TESTING
Information
Patent Application
ANALYZING APPARATUS, ANALYSIS METHOD, AND COMPUTER-READABLE MEDIUM
Publication number
20220334171
Publication date
Oct 20, 2022
Fuji Electric Co., Ltd.
Norihiro KOMIYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING IGBT MODULE AGING BASED ON MIN...
Publication number
20220334170
Publication date
Oct 20, 2022
WUHAN UNIVERSITY
Yigang HE
G06 - COMPUTING CALCULATING COUNTING