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the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
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Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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H01L2224/29117
the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
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Method and apparatus for creating a bond between objects based on f...
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Feb 2, 2021
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Dec 10, 2019
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Method for applying a bonding layer
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10,438,925
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Oct 8, 2019
EV Group E. Thallner GmbH
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Jun 18, 2019
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10,068,829
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Sep 4, 2018
Mitsubishi Materials Corporation
Sotaro Oi
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Apr 3, 2018
Robert Bosch GmbH
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Electronic devices with semiconductor die attached with sintered me...
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9,875,987
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Jan 23, 2018
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Lakshminarayan Viswanathan
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Method for applying a bonding layer
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9,627,349
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Apr 18, 2017
EV Group E. Thallner GmbH
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Electronic devices with semiconductor die coupled to a thermally co...
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Mar 7, 2017
NXP USA, INC.
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Package systems
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9,355,896
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Aug 18, 2015
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Method for manufacturing a component having an electrical through-c...
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May 19, 2015
Robert Bosch GmbH
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Package systems having an opening in a substrate thereof and manufa...
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Apr 7, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
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8,686,571
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Apr 1, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Hsin-Ting Huang
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Package systems having a eutectic bonding material and manufacturin...
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8,674,495
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FREESCALE SEMICONDUCTOR, INC.
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Feb 19, 2013
Taiwan Semiconductor Manufacturing Co., Ltd.
Jung-Huei Peng
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Substrate bonding with metal germanium silicon material
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8,058,143
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Nov 15, 2011
FREESCALE SEMICONDUCTOR, INC.
Ruben B. Montez
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Process for the laminar joining of silicon semiconductor slices
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5,693,574
Issue date
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Deutsche Aerospace AG
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H01 - BASIC ELECTRIC ELEMENTS
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Sep 21, 2023
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Satoru Ikeda
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Publication number
20210167035
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Seyed Amir Paknejad
H01 - BASIC ELECTRIC ELEMENTS
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Publication number
20190252556
Publication date
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STMicroelectronics S.r.l
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G01 - MEASURING TESTING
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Panasonic Intellectual Property Management Co., Ltd.
KAZUKI SAKAI
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Publication date
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Semiconductor Manufacturing International (Shanghai) Corporation
Jin Guang CHENG
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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H01 - BASIC ELECTRIC ELEMENTS
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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PIONEER MICRO TECHNOLOGY CORPORATION
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Achim Trautmann
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Publication date
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
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Publication number
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Publication date
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RUBEN B. MONTEZ
B81 - MICRO-STRUCTURAL TECHNOLOGY
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Publication number
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Publication date
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COMMISSARIAT A L'ENERGIE ATOMIQUE
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H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor composite apparatus, method for manufacturing the sem...
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Publication date
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Mitsuhiko Ogihara
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