Timing aspects

Industry

CPC
G01R31/31937

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31937Timing aspects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Integrated transmitter slew rate calibration
- Patent number 11,955,971
- Issue date Apr 9, 2024
- RAMBUS INC.
- Robert E. Palmer
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 11,835,580
- Issue date Dec 5, 2023
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for eliminating fake faults in gate-level simulation
- Patent number 11,668,749
- Issue date Jun 6, 2023
- Silicon Motion, Inc.
- Chia-Cheng Pai
- G01 - MEASURING TESTING
Information Patent Grant
Configurable multiplier-free multirate filter
- Patent number 11,658,643
- Issue date May 23, 2023
- Raytheon Company
- Antoine Rouphael
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring and evaluating a test signal generated by a device under...
- Patent number 11,632,200
- Issue date Apr 18, 2023
- ROKU, INC.
- Nermin Osmanovic
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 11,609,262
- Issue date Mar 21, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Error rate measuring apparatus and error rate measuring method
- Patent number 11,579,192
- Issue date Feb 14, 2023
- Anritsu Corporation
- Hisao Kidokoro
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-channel timing calibration device and method
- Patent number 11,531,065
- Issue date Dec 20, 2022
- Youngtek Electronics Corporation
- Ching-Yung Tseng
- G01 - MEASURING TESTING
Information Patent Grant
Setup time and hold time detection system and detection method
- Patent number 11,506,714
- Issue date Nov 22, 2022
- DigWise Technology Corporation, LTD
- Shih-Hao Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High speed debug-delay compensation in external tool
- Patent number 11,360,143
- Issue date Jun 14, 2022
- STMICROELECTRONICS INTERNATIONAL N.V.
- Avneep Kumar Goyal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple input signature register analysis for digital circuitry
- Patent number 11,209,481
- Issue date Dec 28, 2021
- Texas Instruments Incorporated
- Naman Maheshwari
- G01 - MEASURING TESTING
Information Patent Grant
Millimeter wave active load pull using low frequency phase and ampl...
- Patent number 11,199,568
- Issue date Dec 14, 2021
- Maury Microwave, Inc.
- Giampiero Esposito
- G01 - MEASURING TESTING
Information Patent Grant
Glitch profiling in an integrated circuit
- Patent number 11,164,648
- Issue date Nov 2, 2021
- NXP USA, INC.
- Nihaar N. Mahatme
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and evaluating a test signal generated by a device under...
- Patent number 11,153,043
- Issue date Oct 19, 2021
- ROKU, INC.
- Nermin Osmanovic
- G01 - MEASURING TESTING
Information Patent Grant
Degradation monitoring of semiconductor chips
- Patent number 11,131,706
- Issue date Sep 28, 2021
- International Business Machines Corporation
- Keith A. Jenkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test circuits and related methods
- Patent number 11,112,455
- Issue date Sep 7, 2021
- Texas Instruments Incorporated
- Jacco van Oevelen
- G01 - MEASURING TESTING
Information Patent Grant
Optimized testing of quantum-logic circuits
- Patent number 11,042,812
- Issue date Jun 22, 2021
- International Business Machines Corporation
- Pawel Jasionowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for calibrating an automated test equipment
- Patent number 11,041,902
- Issue date Jun 22, 2021
- Advantest Corporation
- Bernhard Roth
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and evaluating a test signal generated by a device under...
- Patent number 11,038,635
- Issue date Jun 15, 2021
- ROKU, INC.
- Nermin Osmanovic
- G01 - MEASURING TESTING
Information Patent Grant
High precision time measurement apparatus
- Patent number 10,969,430
- Issue date Apr 6, 2021
- Novelda ASA
- Tor Sverre Lande
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, semiconductor system, and control method of s...
- Patent number 10,884,035
- Issue date Jan 5, 2021
- Renesas Electronics Corporation
- Kazuki Fukuoka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining the integrity of a computing device
- Patent number 10,884,059
- Issue date Jan 5, 2021
- Hand Held Products, Inc.
- H. Sprague Ackley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating channel delay skew of automatic test equipment
- Patent number 10,866,282
- Issue date Dec 15, 2020
- MONTAGE TECHNOLOGY CO., LTD.
- Yong Wang
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observation system and method for waveform observation
- Patent number 10,749,643
- Issue date Aug 18, 2020
- Denso Corporation
- Hironobu Akita
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting low voltage differential signal
- Patent number 10,705,140
- Issue date Jul 7, 2020
- BOE Technology Group Co., Ltd.
- Qin Tan
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Tuning a testing apparatus for measuring skew
- Patent number 10,684,319
- Issue date Jun 16, 2020
- International Business Machines Corporation
- Layne A. Berge
- G01 - MEASURING TESTING
Information Patent Grant
Importance sampling method for multiple failure regions
- Patent number 10,627,446
- Issue date Apr 21, 2020
- Samsung Electronics Co., Ltd.
- Nuo Xu
- G01 - MEASURING TESTING
Information Patent Grant
Time-aligning communication channels
- Patent number 10,564,219
- Issue date Feb 18, 2020
- Teradyne, Inc.
- Tushar K. Gohel
- G01 - MEASURING TESTING
Information Patent Grant
Data management with spectrum analyzers
- Patent number 10,499,353
- Issue date Dec 3, 2019
- Research Electronics International, LLC
- Bruce R. Barsumian
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for measuring a propagation delay and transmittan...
- Patent number 10,488,463
- Issue date Nov 26, 2019
- INSPIRAIN TECHNOLOGIES PTE LTD
- Harshang Nileshkumar Pandya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING A CONTROL DEVICE USING A TEST ASSEMBLY
- Publication number 20240337695
- Publication date Oct 10, 2024
- dSPACE GmbH
- Remigiusz SEILER
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
- Publication number 20240085475
- Publication date Mar 14, 2024
- MEDIATEK SINGAPORE PTE LTD
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
- Publication number 20240077533
- Publication date Mar 7, 2024
- MEDIATEK SINGAPORE PTE LTD
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRAINING METHOD AND TEST APPARATUS USING THE SAME
- Publication number 20230417832
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Kwang Kyu KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM
- Publication number 20230288476
- Publication date Sep 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Huan LU
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Measurement of a Parameter of a DUT
- Publication number 20230147947
- Publication date May 11, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Hsien Tsai
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20230129176
- Publication date Apr 27, 2023
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
SETUP TIME AND HOLD TIME DETECTION SYSTEM AND DETECTION METHOD
- Publication number 20220326304
- Publication date Oct 13, 2022
- DigWise Technology Corporation, LTD
- Shih-Hao CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED TRANSMITTER SLEW RATE CALIBRATION
- Publication number 20220255550
- Publication date Aug 11, 2022
- Rambus Inc.
- Robert E. Palmer
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE MULTIPLIER-FREE MULTIRATE FILTER
- Publication number 20220231670
- Publication date Jul 21, 2022
- Raytheon Company
- Antoine Rouphael
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MULTI-CHANNEL TIMING CALIBRATION DEVICE AND METHOD
- Publication number 20220146575
- Publication date May 12, 2022
- YOUNGTEK ELECTRONICS CORPORATION
- Ching-Yung Tseng
- G01 - MEASURING TESTING
Information Patent Application
ERROR RATE MEASURING APPARATUS AND ERROR RATE MEASURING METHOD
- Publication number 20220074987
- Publication date Mar 10, 2022
- Anritsu Corporation
- Hisao KIDOKORO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ELIMINATING FAKE FAULTS IN GATE-LEVEL SIMULATION
- Publication number 20220065931
- Publication date Mar 3, 2022
- SILICON MOTION, INC.
- Chia-Cheng PAI
- G01 - MEASURING TESTING
Information Patent Application
Measuring and Evaluating a Test Signal Generated by a Device Under...
- Publication number 20210306116
- Publication date Sep 30, 2021
- Roku, Inc.
- Nermin Osmanovic
- G01 - MEASURING TESTING
Information Patent Application
MEASURING AND EVALUATING A TEST SIGNAL GENERATED BY A DEVICE UNDER...
- Publication number 20210126748
- Publication date Apr 29, 2021
- ROKU, INC.
- Nermin Osmanovic
- G01 - MEASURING TESTING
Information Patent Application
GLITCH PROFILING IN AN INTEGRATED CIRCUIT
- Publication number 20200402602
- Publication date Dec 24, 2020
- NXP USA, Inc.
- Nihaar N. Mahatme
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUITS AND RELATED METHODS
- Publication number 20200271722
- Publication date Aug 27, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Jacco van Oevelen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MILLIMETER WAVE ACTIVE LOAD PULL USING LOW FREQUENCY PHASE AND AMPL...
- Publication number 20200103447
- Publication date Apr 2, 2020
- Maury Microwave, Inc.
- Giampiero Esposito
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...
- Publication number 20200041547
- Publication date Feb 6, 2020
- RENESAS ELECTRONICS CORPORATION
- Kazuki FUKUOKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALIBRATING CHANNEL DELAY SKEW OF AUTOMATIC TEST EQUIPMENT
- Publication number 20200018795
- Publication date Jan 16, 2020
- MONTAGE TECHNOLOGY CO., LTD.
- Yong WANG
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZED TESTING OF QUANTUM-LOGIC CIRCUITS
- Publication number 20190310316
- Publication date Oct 10, 2019
- International Business Machines Corporation
- Pawel Jasionowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAVEFORM OBSERVATION SYSTEM AND METHOD FOR WAVEFORM OBSERVATION
- Publication number 20190296867
- Publication date Sep 26, 2019
- Hironobu AKITA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMPORTANCE SAMPLING METHOD FOR MULTIPLE FAILURE REGIONS
- Publication number 20190265296
- Publication date Aug 29, 2019
- Samsung Electronics Co., Ltd.
- Nuo Xu
- G01 - MEASURING TESTING
Information Patent Application
On-Die Aging Measurements for Dynamic Timing Modeling
- Publication number 20190146028
- Publication date May 16, 2019
- Intel Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE INTEGRITY OF A COMPUTING DEVICE
- Publication number 20190113571
- Publication date Apr 18, 2019
- HAND HELD PRODUCTS, INC.
- H. Sprague Ackley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE INPUT SIGNATURE REGISTER ANALYSIS FOR DIGITAL CIRCUITRY
- Publication number 20190113566
- Publication date Apr 18, 2019
- TEXAS INSTRUMENTS INCORPORATED
- NAMAN MAHESHWARI
- G01 - MEASURING TESTING
Information Patent Application
CLOCK SELECTION CIRCUIT AND TEST CLOCK GENERATION CIRCUIT FOR LBIST...
- Publication number 20190064268
- Publication date Feb 28, 2019
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR ADDING JITTERS TO THE EDGES OF A PULSE SEQUENCE
- Publication number 20180364307
- Publication date Dec 20, 2018
- University of Electronic Science and Technology of China
- Zaiming FU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING A PROPAGATION DELAY AND TRANSMITTAN...
- Publication number 20180328990
- Publication date Nov 15, 2018
- INSPIRAIN TECHNOLOGIES PTE LTD.
- Harshang Nileshkumar Pandya
- G01 - MEASURING TESTING
Information Patent Application
REDUCING COMPLEXITY WHEN TESTING QUANTUM-LOGIC CIRCUITS
- Publication number 20180299507
- Publication date Oct 18, 2018
- International Business Machines Corporation
- Pawel Jasionowski
- H03 - BASIC ELECTRONIC CIRCUITRY

Timing aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated transmitter slew rate calibration

Circuit and method to measure simulation to silicon timing correlation

Method for eliminating fake faults in gate-level simulation

Configurable multiplier-free multirate filter

Measuring and evaluating a test signal generated by a device under...

On-die aging measurements for dynamic timing modeling

Error rate measuring apparatus and error rate measuring method

Multi-channel timing calibration device and method

Setup time and hold time detection system and detection method

High speed debug-delay compensation in external tool

Multiple input signature register analysis for digital circuitry

Millimeter wave active load pull using low frequency phase and ampl...

Glitch profiling in an integrated circuit

Measuring and evaluating a test signal generated by a device under...

Degradation monitoring of semiconductor chips

Built-in self-test circuits and related methods

Optimized testing of quantum-logic circuits

Method and device for calibrating an automated test equipment

Measuring and evaluating a test signal generated by a device under...

High precision time measurement apparatus

Semiconductor device, semiconductor system, and control method of s...

Determining the integrity of a computing device

Method for calibrating channel delay skew of automatic test equipment

Waveform observation system and method for waveform observation

Method and device for detecting low voltage differential signal

Tuning a testing apparatus for measuring skew

Importance sampling method for multiple failure regions

Time-aligning communication channels

Data management with spectrum analyzers

Method and system for measuring a propagation delay and transmittan...

Patents Applicationslast 30 patents

TESTING A CONTROL DEVICE USING A TEST ASSEMBLY

CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION

CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION

TRAINING METHOD AND TEST APPARATUS USING THE SAME

METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM

Systems and Methods for Measurement of a Parameter of a DUT

On-Die Aging Measurements for Dynamic Timing Modeling

SETUP TIME AND HOLD TIME DETECTION SYSTEM AND DETECTION METHOD

INTEGRATED TRANSMITTER SLEW RATE CALIBRATION

CONFIGURABLE MULTIPLIER-FREE MULTIRATE FILTER

MULTI-CHANNEL TIMING CALIBRATION DEVICE AND METHOD

ERROR RATE MEASURING APPARATUS AND ERROR RATE MEASURING METHOD

METHOD FOR ELIMINATING FAKE FAULTS IN GATE-LEVEL SIMULATION

Measuring and Evaluating a Test Signal Generated by a Device Under...

MEASURING AND EVALUATING A TEST SIGNAL GENERATED BY A DEVICE UNDER...

GLITCH PROFILING IN AN INTEGRATED CIRCUIT

BUILT-IN SELF-TEST CIRCUITS AND RELATED METHODS

MILLIMETER WAVE ACTIVE LOAD PULL USING LOW FREQUENCY PHASE AND AMPL...

SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND CONTROL METHOD OF S...

METHOD FOR CALIBRATING CHANNEL DELAY SKEW OF AUTOMATIC TEST EQUIPMENT

OPTIMIZED TESTING OF QUANTUM-LOGIC CIRCUITS

WAVEFORM OBSERVATION SYSTEM AND METHOD FOR WAVEFORM OBSERVATION

IMPORTANCE SAMPLING METHOD FOR MULTIPLE FAILURE REGIONS

On-Die Aging Measurements for Dynamic Timing Modeling

DETERMINING THE INTEGRITY OF A COMPUTING DEVICE

MULTIPLE INPUT SIGNATURE REGISTER ANALYSIS FOR DIGITAL CIRCUITRY

CLOCK SELECTION CIRCUIT AND TEST CLOCK GENERATION CIRCUIT FOR LBIST...

APPARATUS FOR ADDING JITTERS TO THE EDGES OF A PULSE SEQUENCE

METHOD AND SYSTEM FOR MEASURING A PROPAGATION DELAY AND TRANSMITTAN...

REDUCING COMPLEXITY WHEN TESTING QUANTUM-LOGIC CIRCUITS