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H01L2224/749
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H
ELECTRICITY
H01
Electric elements
H01L
SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
H01L2224/00
Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
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H01L2224/749
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Patents Grants
last 30 patents
Information
Patent Grant
Injection molded solder head with improved sealing performance
Patent number
12,166,008
Issue date
Dec 10, 2024
International Business Machines Corporation
Sayuri Hada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for eutectic bonding
Patent number
9,935,077
Issue date
Apr 3, 2018
Robert Bosch GmbH
Ralf Hausner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for forming bumps, semiconductor device and method for manuf...
Patent number
8,962,470
Issue date
Feb 24, 2015
Fujitsu Limited
Masataka Mizukoshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and method of patterning resin insulation laye...
Patent number
8,405,218
Issue date
Mar 26, 2013
Denso Corporation
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bonding method and apparatus
Patent number
7,659,148
Issue date
Feb 9, 2010
Panasonic Corporation
Tatsuo Sasaoka
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Head assembly, disk unit, and bonding method and apparatus
Patent number
7,347,347
Issue date
Mar 25, 2008
Fujitsu Limited
Hidehiko Kira
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Flip chip bonder
Patent number
7,222,772
Issue date
May 29, 2007
Disco Corporation
Kazuhisa Arai
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Integrated circuit contactor, and method and apparatus for producti...
Patent number
7,174,629
Issue date
Feb 13, 2007
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Head assembly having integrated circuit chip covered by layer which...
Patent number
6,885,522
Issue date
Apr 26, 2005
Fujitsu Limited
Hidehiko Kira
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Integrated circuit contactor, and method and apparatus for producti...
Patent number
6,555,764
Issue date
Apr 29, 2003
Fujitsu Limited
Shigeyuki Maruyama
G01 - MEASURING TESTING
Information
Patent Grant
Methods of making bondable contacts and a tool for making such cont...
Patent number
6,527,163
Issue date
Mar 4, 2003
Tessera, Inc.
Hamid Eslampour
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating an electronic circuit device and apparatus fo...
Patent number
6,227,436
Issue date
May 8, 2001
Hitachi, Ltd.
Toru Nishikawa
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of fabricating electronic circuit device and apparatus for p...
Patent number
5,816,473
Issue date
Oct 6, 1998
Hitachi, Ltd.
Toru Nishikawa
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor integrated circuit device and fabrication method thereof
Patent number
5,616,520
Issue date
Apr 1, 1997
Hitachi, Ltd.
Masahiko Nishiuma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating electronic circuit device and apparatus for p...
Patent number
5,341,980
Issue date
Aug 30, 1994
Hitachi, Ltd.
Toru Nishikawa
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
INJECTION MOLDED SOLDER HEAD WITH IMPROVED SEALING PERFORMANCE
Publication number
20230154887
Publication date
May 18, 2023
International Business Machines Corporation
Sayuri Hada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BULK SOLDER REMOVAL ON PROCESSOR PACKAGING
Publication number
20170179066
Publication date
Jun 22, 2017
Russell S. Aoki
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SHAPING OF CONTACT STRUCTURES FOR SEMICONDUCTOR TEST, AND ASSOCIATE...
Publication number
20170023617
Publication date
Jan 26, 2017
TRANSLARITY, INC.
Jens Ruffler
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR EUTECTIC BONDING
Publication number
20150235982
Publication date
Aug 20, 2015
ROBERT BOSCH GmbH
Ralf HAUSNER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Bonded System with Coated Copper Conductor
Publication number
20140197539
Publication date
Jul 17, 2014
INFINEON TECHNOLOGIES AG
Reinhold Bayerer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF PATTERNNING RESIN INSULATION LAY...
Publication number
20110198733
Publication date
Aug 18, 2011
DENSO CORPORATION
Manabu Tomisaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR FORMING BUMPS, SEMICONDUCTOR DEVICE AND METHOD FOR MANUF...
Publication number
20090186425
Publication date
Jul 23, 2009
Fujitsu Limited
Masataka Mizukoshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Bonding method and apparatus
Publication number
20070193682
Publication date
Aug 23, 2007
Matsushita Electric Industrial Co., Ltd.
Tatsuo Sasaoka
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method for forming bumps, semiconductor device and method for manuf...
Publication number
20050161814
Publication date
Jul 28, 2005
FUJITSU LIMITED
Masataka Mizukoshi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Head assembly, disk unit, and bonding method and apparatus
Publication number
20050057856
Publication date
Mar 17, 2005
FUJITSU LIMITED
Hidehiko Kira
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Application
Flip chip bonder
Publication number
20040206800
Publication date
Oct 21, 2004
Kazuhisa Arai
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Integrated circuit contactor, and method and apparatus for producti...
Publication number
20030132027
Publication date
Jul 17, 2003
FUJITSU LIMITED
Shigeyuki Maruyama
G01 - MEASURING TESTING