turbine blades

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CPC
G01N2223/63

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/63turbine blades

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for quantifying amine compound constituting separator active...
- Patent number 12,350,628
- Issue date Jul 8, 2025
- LG Chem, Ltd.
- Bo Ri Lee
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,337,215
- Issue date Jun 24, 2025
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 12,247,915
- Issue date Mar 11, 2025
- Asahi Kasei Microdevices Corporation
- Kengo Sasayama
- G02 - OPTICS
Information Patent Grant
Carbon-based optical sensor element for measuring greenhouse gas co...
- Patent number 12,235,230
- Issue date Feb 25, 2025
- NATIONAL INSTITUTE OF METEOROLOGICAL SCIENCES
- Young Suk Oh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 12,221,884
- Issue date Feb 11, 2025
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
Deposition system and method
- Patent number 12,211,756
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fabricating thin film liquid cells
- Patent number 12,209,979
- Issue date Jan 28, 2025
- Universiteit Leiden
- Pauline Marthe Gerardina Van Deursen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Method for analysis and determination of heavy metal occurrence key...
- Patent number 12,159,691
- Issue date Dec 3, 2024
- Central South University
- Zhang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 12,056,840
- Issue date Aug 6, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of using a dissolvable deployment device for the transfer of...
- Patent number 12,025,001
- Issue date Jul 2, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
- Patent number 12,007,341
- Issue date Jun 11, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Insert for screening tray
- Patent number 11,977,037
- Issue date May 7, 2024
- Rapiscan Holdings, Inc.
- Philippe Desjeans-Gauthier
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for determining air content of fresh concrete, a...
- Patent number 11,965,837
- Issue date Apr 23, 2024
- COMMAND ALKON INCORPORATED
- Denis Beaupre
- G08 - SIGNALLING
Information Patent Grant
Biological imaging method using X-ray fluorescence
- Patent number 11,946,884
- Issue date Apr 2, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Dry ice cleaning and recycling device and method for connecting rod
- Patent number 11,938,589
- Issue date Mar 26, 2024
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Guan Wang
- B08 - CLEANING
Information Patent Grant
Security inspection device and transfer method therefor
- Patent number 11,933,934
- Issue date Mar 19, 2024
- Nuctech Company Limited
- Xuping Fan
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 11,921,038
- Issue date Mar 5, 2024
- Asahi Kasei Microdevices Corporation
- Kengo Sasayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...
- Publication number 20250237621
- Publication date Jul 24, 2025
- SAMSUNG DISPLAY CO., LTD.
- Won Hyuk JANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ELECTRODE PLATE TESTING
- Publication number 20250198952
- Publication date Jun 19, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Bingyang Zhan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING A COMPONENT
- Publication number 20250189463
- Publication date Jun 12, 2025
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
MANIPULATOR HEAD AND VACUUM SYSTEM
- Publication number 20250180496
- Publication date Jun 5, 2025
- SPECS SURFACE NANO ANALYSIS GMBH
- Kai KUNZE
- G01 - MEASURING TESTING
Information Patent Application
METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA
- Publication number 20250164653
- Publication date May 22, 2025
- Shanghai United Imaging Healthcare Co., Ltd.
- Zhi SHI
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...
- Publication number 20250137946
- Publication date May 1, 2025
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN...
- Publication number 20250130182
- Publication date Apr 24, 2025
- RTX Corporation
- Lei Chen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING AND DISPLAYING MATERIAL TYPES...
- Publication number 20250095333
- Publication date Mar 20, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Ji Wook JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHIC ANALYSIS METHOD
- Publication number 20250035567
- Publication date Jan 30, 2025
- SAFRAN AIRCRAFT ENGINES
- Pierre Alfred Jean DUCHENE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Substrate Alloy Influence Compensation
- Publication number 20250003897
- Publication date Jan 2, 2025
- THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
- Alexander Britting
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DENOISING AND SUPER RESOLUTION
- Publication number 20240412339
- Publication date Dec 12, 2024
- Smiths Detection France S.A.S.
- Najib GADI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Automatically Generating Synthetic X-Ray Sc...
- Publication number 20240402097
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20240393268
- Publication date Nov 28, 2024
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
- Publication number 20240385126
- Publication date Nov 21, 2024
- VIEWORKS CO., LTD.
- Jungmin CHOI
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY FLUORESCENCE SYSTEM
- Publication number 20240385129
- Publication date Nov 21, 2024
- Commonwealth Scientific and Industrial Research Organisation
- Brianna Ganly
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SCANNING A COMPONENT
- Publication number 20240361218
- Publication date Oct 31, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
Tray Insert for Screening Tray
- Publication number 20240353354
- Publication date Oct 24, 2024
- Rapiscan Holdings, Inc.
- Philippe Desjeans-Gauthier
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
- Publication number 20240295508
- Publication date Sep 5, 2024
- The Boeing Company
- Nicholas C. Reasoner
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240295509
- Publication date Sep 5, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
- Publication number 20240280514
- Publication date Aug 22, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING

turbine blades

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for quantifying amine compound constituting separator active...

Method and system utilizing imaging analysis for golf balls

Method for quantitatively characterizing dendrite segregation and d...

Device for closing the input opening in the sample chamber in an x-...

Single piece droplet generation and injection device for serial cry...

Characterizing and measuring in small boxes using XPS with multiple...

Handheld inspection device and method of inspecting an infrastructu...

Optical device

Carbon-based optical sensor element for measuring greenhouse gas co...

Detecting downhole fluid composition utilizing photon emission

Deposition system and method

Fabricating thin film liquid cells

System and method for inspecting defects of structure by using X-ray

Method for analysis and determination of heavy metal occurrence key...

Systems and methods for determining the mineralogy of drill solids

Measurement of metal or alloy coating

Method and system for non-destructive metrology of thin layers

Rotational X-ray inspection system and method

Methods and systems for generating three-dimensional images that en...

Method of using a dissolvable deployment device for the transfer of...

Systems, apparatuses, and methods for measuring submerged surfaces

Apparatus and method for x-ray fluorescence analysis

X-ray baggage and parcel inspection system with efficient third-par...

Characterizing and measuring in small boxes using XPS with multiple...

Insert for screening tray

System and methods for determining air content of fresh concrete, a...

Biological imaging method using X-ray fluorescence

Dry ice cleaning and recycling device and method for connecting rod

Security inspection device and transfer method therefor

Optical device

Patents Applicationslast 30 patents

THIN FILM THICKNESS MEASURING DEVICE AND THIN FILM THICKNESS MEASUR...

DEVICE FOR ELECTRODE PLATE TESTING

METHOD FOR SCANNING A COMPONENT

MANIPULATOR HEAD AND VACUUM SYSTEM

METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA

INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN...

APPARATUS AND METHOD FOR IDENTIFYING AND DISPLAYING MATERIAL TYPES...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

TOMOGRAPHIC ANALYSIS METHOD

Substrate Alloy Influence Compensation

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

Methods and Systems for Generating Three-Dimensional Images that En...

DENOISING AND SUPER RESOLUTION

Systems and Methods for Automatically Generating Synthetic X-Ray Sc...

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

X-RAY FLUORESCENCE ANALYZER

VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME

AN X-RAY FLUORESCENCE SYSTEM

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

SYSTEM AND METHOD FOR SCANNING A COMPONENT

Tray Insert for Screening Tray

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

BONDING WIRE FOR SEMICONDUCTOR DEVICES

X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...