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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Investigating materials by wave or particle radiation
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for inspecting defects of structure by using X-ray
Patent number
12,181,426
Issue date
Dec 31, 2024
NEUF Inc.
Myoung Chan Na
G01 - MEASURING TESTING
Information
Patent Grant
Method for analysis and determination of heavy metal occurrence key...
Patent number
12,159,691
Issue date
Dec 3, 2024
Central South University
Zhang Lin
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining the mineralogy of drill solids
Patent number
12,111,273
Issue date
Oct 8, 2024
Schlumberger Technology Corporation
Jonathan Mitchell
E21 - EARTH DRILLING MINING
Information
Patent Grant
Measurement of metal or alloy coating
Patent number
12,092,594
Issue date
Sep 17, 2024
Schlumberger Technology Corporation
Jill F. Geddes
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for non-destructive metrology of thin layers
Patent number
12,066,391
Issue date
Aug 20, 2024
NOVA MEASURING INSTRUMENTS, INC.
Wei Ti Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Rotational X-ray inspection system and method
Patent number
12,061,156
Issue date
Aug 13, 2024
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for generating three-dimensional images that en...
Patent number
12,056,840
Issue date
Aug 6, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of using a dissolvable deployment device for the transfer of...
Patent number
12,025,001
Issue date
Jul 2, 2024
Talgat Shokanov
E21 - EARTH DRILLING MINING
Information
Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
Patent number
12,025,573
Issue date
Jul 2, 2024
DELTA SUBSEA LLC
Scott P. Dingman
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
Patent number
12,007,341
Issue date
Jun 11, 2024
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for x-ray fluorescence analysis
Patent number
12,007,380
Issue date
Jun 11, 2024
Malvern Panalytical B.V.
Bruno Vrebos
G01 - MEASURING TESTING
Information
Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
Patent number
11,988,502
Issue date
May 21, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath Pois
G01 - MEASURING TESTING
Information
Patent Grant
Insert for screening tray
Patent number
11,977,037
Issue date
May 7, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Grant
System and methods for determining air content of fresh concrete, a...
Patent number
11,965,837
Issue date
Apr 23, 2024
COMMAND ALKON INCORPORATED
Denis Beaupre
G08 - SIGNALLING
Information
Patent Grant
Biological imaging method using X-ray fluorescence
Patent number
11,946,884
Issue date
Apr 2, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Dry ice cleaning and recycling device and method for connecting rod
Patent number
11,938,589
Issue date
Mar 26, 2024
GUANGDONG UNIVERSITY OF TECHNOLOGY
Guan Wang
B08 - CLEANING
Information
Patent Grant
Security inspection device and transfer method therefor
Patent number
11,933,934
Issue date
Mar 19, 2024
Nuctech Company Limited
Xuping Fan
G01 - MEASURING TESTING
Information
Patent Grant
Optical device
Patent number
11,921,038
Issue date
Mar 5, 2024
Asahi Kasei Microdevices Corporation
Kengo Sasayama
G01 - MEASURING TESTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
11,911,667
Issue date
Feb 27, 2024
Topgolf Callaway Brands Corp.
Megan Ilnicky
G01 - MEASURING TESTING
Information
Patent Grant
Screening system
Patent number
11,913,890
Issue date
Feb 27, 2024
Halo X Ray Technologies Limited
Anthony Dicken
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel static CT device
Patent number
11,906,447
Issue date
Feb 20, 2024
Nuctech Company Limited
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for non-destructive metrology of thin layers
Patent number
11,906,451
Issue date
Feb 20, 2024
Nova Ltd.
Wei Ti Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Calibration method and device therefor
Patent number
11,885,752
Issue date
Jan 30, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Grant
X-ray collimator and related X-ray inspection apparatus
Patent number
11,854,712
Issue date
Dec 26, 2023
DUE2LAB S.R.L.
Nicola Zambelli
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
Patent number
11,841,334
Issue date
Dec 12, 2023
Rigaku Corporation
Hideo Toraya
G01 - MEASURING TESTING
Information
Patent Grant
Fluidic carbon nanotube device
Patent number
11,826,754
Issue date
Nov 28, 2023
Lawrence Livermore National Security, LLC
Eric R. Meshot
B82 - NANO-TECHNOLOGY
Information
Patent Grant
System and method for inspecting defects of structure by using X-ray
Patent number
11,821,854
Issue date
Nov 21, 2023
NEUF Inc.
Myoung Chan Na
G01 - MEASURING TESTING
Information
Patent Grant
Deposition system and method
Patent number
11,823,964
Issue date
Nov 21, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Wen-Hao Cheng
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Radiation inspection apparatus comprising a radiation inspection de...
Patent number
11,822,043
Issue date
Nov 21, 2023
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and inspection method
Patent number
11,815,472
Issue date
Nov 14, 2023
NEC Corporation
Naoya Nakayama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Substrate Alloy Influence Compensation
Publication number
20250003897
Publication date
Jan 2, 2025
THERMO FISHER SCIENTIFIC MESSTECHNIK GMBH
Alexander Britting
G01 - MEASURING TESTING
Information
Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
Publication number
20250003895
Publication date
Jan 2, 2025
Canon Kabushiki Kaisha
Atsushi IWASHITA
G01 - MEASURING TESTING
Information
Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
Publication number
20240418633
Publication date
Dec 19, 2024
KLA Corporation
Shova Subedi
G01 - MEASURING TESTING
Information
Patent Application
DENOISING AND SUPER RESOLUTION
Publication number
20240412339
Publication date
Dec 12, 2024
Smiths Detection France S.A.S.
Najib GADI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
Publication number
20240412476
Publication date
Dec 12, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and Methods for Automatically Generating Synthetic X-Ray Sc...
Publication number
20240402097
Publication date
Dec 5, 2024
Rapiscan Holdings, Inc.
Mark Procter
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
Publication number
20240402098
Publication date
Dec 5, 2024
Rapiscan Holdings, Inc.
Brendan Edward Allman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
Publication number
20240401940
Publication date
Dec 5, 2024
NOVA MEASURING INSTRUMENTS INC.
Heath POIS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-RAY FLUORESCENCE ANALYZER
Publication number
20240393268
Publication date
Nov 28, 2024
Shimadzu Corporation
Yuji MORIHISA
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE DETECTOR AND IMAGE-CAPTURING APPARATUS COMPRISING THE SAME
Publication number
20240385126
Publication date
Nov 21, 2024
VIEWORKS CO., LTD.
Jungmin CHOI
G01 - MEASURING TESTING
Information
Patent Application
AN X-RAY FLUORESCENCE SYSTEM
Publication number
20240385129
Publication date
Nov 21, 2024
Commonwealth Scientific and Industrial Research Organisation
Brianna Ganly
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
Publication number
20240377340
Publication date
Nov 14, 2024
Greyscale AI
Brian Green
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR SCANNING A COMPONENT
Publication number
20240361218
Publication date
Oct 31, 2024
Rolls-Royce plc
Akhil MULLOTH
G01 - MEASURING TESTING
Information
Patent Application
Tray Insert for Screening Tray
Publication number
20240353354
Publication date
Oct 24, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
Publication number
20240309759
Publication date
Sep 19, 2024
Talgat Shokanov
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
Publication number
20240295508
Publication date
Sep 5, 2024
The Boeing Company
Nicholas C. Reasoner
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
Publication number
20240295509
Publication date
Sep 5, 2024
Rolls-Royce plc
Akhil MULLOTH
G01 - MEASURING TESTING
Information
Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
Publication number
20240297142
Publication date
Sep 5, 2024
NIPPON MICROMETAL CORPORATION
Daizo ODA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
Publication number
20240280514
Publication date
Aug 22, 2024
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
Publication number
20240272102
Publication date
Aug 15, 2024
TOPCON CORPORATION
Shigenori NAGANO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SCANNING OF OBJECTS IN A SCANNING APPARATUS
Publication number
20240219320
Publication date
Jul 4, 2024
Rolls-Royce plc
Akhil MULLOTH
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
Publication number
20240219319
Publication date
Jul 4, 2024
Rolls-Royce plc
Akhil MULLOTH
G01 - MEASURING TESTING
Information
Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
Publication number
20240210332
Publication date
Jun 27, 2024
TROXLER ELECTRONIC LABORATORIES, INC.
Wewage Hiran Linus Dep
G01 - MEASURING TESTING
Information
Patent Application
SENSOR ELEMENT FOR AN OPTOCHEMICAL SENSOR
Publication number
20240210368
Publication date
Jun 27, 2024
Andreas Löbbert
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20240159662
Publication date
May 16, 2024
ASAHI KASEI MICRODEVICES CORPORATION
Kengo SASAYAMA
G02 - OPTICS
Information
Patent Application
Calibration Method and Device Therefor
Publication number
20240134083
Publication date
Apr 25, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Application
LUBRICATING OIL ANALYSIS
Publication number
20240133859
Publication date
Apr 25, 2024
ExxonMobil Technology and Engineering Company
Andrew SATTERFIELD
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
Publication number
20240102949
Publication date
Mar 28, 2024
NEUF Inc.
Myoung Chan NA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
Publication number
20240093603
Publication date
Mar 21, 2024
Talgat Shokanov
E21 - EARTH DRILLING MINING
Information
Patent Application
Scanning Systems
Publication number
20240061143
Publication date
Feb 22, 2024
Rapiscan Systems, Inc.
Edward James Morton
G05 - CONTROLLING REGULATING