turbine blades

Industry

CPC
G01N2223/63

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/63turbine blades

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Measurement of metal or alloy coating
- Patent number 12,092,594
- Issue date Sep 17, 2024
- Schlumberger Technology Corporation
- Jill F. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 12,066,391
- Issue date Aug 20, 2024
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 12,056,840
- Issue date Aug 6, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of using a dissolvable deployment device for the transfer of...
- Patent number 12,025,001
- Issue date Jul 2, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
- Patent number 12,007,341
- Issue date Jun 11, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Insert for screening tray
- Patent number 11,977,037
- Issue date May 7, 2024
- Rapiscan Holdings, Inc.
- Philippe Desjeans-Gauthier
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for determining air content of fresh concrete, a...
- Patent number 11,965,837
- Issue date Apr 23, 2024
- COMMAND ALKON INCORPORATED
- Denis Beaupre
- G08 - SIGNALLING
Information Patent Grant
Biological imaging method using X-ray fluorescence
- Patent number 11,946,884
- Issue date Apr 2, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Dry ice cleaning and recycling device and method for connecting rod
- Patent number 11,938,589
- Issue date Mar 26, 2024
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Guan Wang
- B08 - CLEANING
Information Patent Grant
Security inspection device and transfer method therefor
- Patent number 11,933,934
- Issue date Mar 19, 2024
- Nuctech Company Limited
- Xuping Fan
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 11,921,038
- Issue date Mar 5, 2024
- Asahi Kasei Microdevices Corporation
- Kengo Sasayama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 11,911,667
- Issue date Feb 27, 2024
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel static CT device
- Patent number 11,906,447
- Issue date Feb 20, 2024
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-destructive metrology of thin layers
- Patent number 11,906,451
- Issue date Feb 20, 2024
- Nova Ltd.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method and device therefor
- Patent number 11,885,752
- Issue date Jan 30, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 11,841,334
- Issue date Dec 12, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Fluidic carbon nanotube device
- Patent number 11,826,754
- Issue date Nov 28, 2023
- Lawrence Livermore National Security, LLC
- Eric R. Meshot
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 11,821,854
- Issue date Nov 21, 2023
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Deposition system and method
- Patent number 11,823,964
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Radiation inspection apparatus comprising a radiation inspection de...
- Patent number 11,822,043
- Issue date Nov 21, 2023
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 11,815,472
- Issue date Nov 14, 2023
- NEC Corporation
- Naoya Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer and a method for performing an x-ray fl...
- Patent number 11,815,480
- Issue date Nov 14, 2023
- Outotec (Finland) Oy
- Tommi Koskinen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for measuring total cross-sectional phase fractio...
- Patent number 11,808,719
- Issue date Nov 7, 2023
- SEA PIONEERS TECHNOLOGIES CO., LTD.
- Jige Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Tray Insert for Screening Tray
- Publication number 20240353354
- Publication date Oct 24, 2024
- Rapiscan Holdings, Inc.
- Philippe Desjeans-Gauthier
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240309759
- Publication date Sep 19, 2024
- Talgat Shokanov
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
- Publication number 20240295508
- Publication date Sep 5, 2024
- The Boeing Company
- Nicholas C. Reasoner
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240295509
- Publication date Sep 5, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
- Publication number 20240280514
- Publication date Aug 22, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
- Publication number 20240272102
- Publication date Aug 15, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF OBJECTS IN A SCANNING APPARATUS
- Publication number 20240219320
- Publication date Jul 4, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS
- Publication number 20240219319
- Publication date Jul 4, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ELEMENT FOR AN OPTOCHEMICAL SENSOR
- Publication number 20240210368
- Publication date Jun 27, 2024
- Andreas Löbbert
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20240159662
- Publication date May 16, 2024
- ASAHI KASEI MICRODEVICES CORPORATION
- Kengo SASAYAMA
- G02 - OPTICS
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
LUBRICATING OIL ANALYSIS
- Publication number 20240133859
- Publication date Apr 25, 2024
- ExxonMobil Technology and Engineering Company
- Andrew SATTERFIELD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
- Publication number 20240102949
- Publication date Mar 28, 2024
- NEUF Inc.
- Myoung Chan NA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...
- Publication number 20240093603
- Publication date Mar 21, 2024
- Talgat Shokanov
- E21 - EARTH DRILLING MINING
Information Patent Application
Scanning Systems
- Publication number 20240061143
- Publication date Feb 22, 2024
- Rapiscan Systems, Inc.
- Edward James Morton
- G05 - CONTROLLING REGULATING
Information Patent Application
A SCREENING SYSTEM
- Publication number 20240044813
- Publication date Feb 8, 2024
- Halo X Ray Technologies Limited
- Anthony DICKEN
- G01 - MEASURING TESTING
Information Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
- Publication number 20240044815
- Publication date Feb 8, 2024
- NEC Corporation
- Masahiro KAJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
- Publication number 20240044816
- Publication date Feb 8, 2024
- NEC Corporation
- Masahiro KAJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
- Publication number 20240044814
- Publication date Feb 8, 2024
- NEC Corporation
- Masahiro KAJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
- Publication number 20240044817
- Publication date Feb 8, 2024
- NEC Corporation
- Masahiro KAJI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED PROCESS AND SYSTEM FOR MEASUREMENT AND TREATMENT OF TOXI...
- Publication number 20230407199
- Publication date Dec 21, 2023
- Petrochina Company Limited
- Guangyou ZHU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20230408430
- Publication date Dec 21, 2023
- NOVA MEASURING INSTRUMENTS, INC.
- Wei Ti Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULATION DEVICE FOR ELECTRON-EXCITED ATMOSPHERIC RADIATION
- Publication number 20230394990
- Publication date Dec 7, 2023
- Hefei Institutes of Physical Science, CAS
- Congming DAI
- G01 - MEASURING TESTING
Information Patent Application
DEPOSITION SYSTEM AND METHOD
- Publication number 20230386942
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wen-Hao CHENG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Pattern Measurement Device
- Publication number 20230375338
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Long ZHANG
- G01 - MEASURING TESTING
Information Patent Application
DRY ICE CLEANING AND RECYCLING DEVICE AND METHOD FOR CONNECTING ROD
- Publication number 20230294242
- Publication date Sep 21, 2023
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Guan WANG
- B08 - CLEANING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20230298295
- Publication date Sep 21, 2023
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING ATOM USING FOUR-COLOR X-RAY EQUIPMENT
- Publication number 20230266256
- Publication date Aug 24, 2023
- Republic of Korea (Chief of Presidential Security Service)
- Je Hwan JEON
- G01 - MEASURING TESTING

turbine blades

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for determining the mineralogy of drill solids

Measurement of metal or alloy coating

Method and system for non-destructive metrology of thin layers

Rotational X-ray inspection system and method

Methods and systems for generating three-dimensional images that en...

Method of using a dissolvable deployment device for the transfer of...

Systems, apparatuses, and methods for measuring submerged surfaces

Apparatus and method for x-ray fluorescence analysis

X-ray baggage and parcel inspection system with efficient third-par...

Characterizing and measuring in small boxes using XPS with multiple...

Insert for screening tray

System and methods for determining air content of fresh concrete, a...

Biological imaging method using X-ray fluorescence

Dry ice cleaning and recycling device and method for connecting rod

Security inspection device and transfer method therefor

Optical device

Method and system utilizing imaging analysis for golf balls

Screening system

Multi-channel static CT device

Method and system for non-destructive metrology of thin layers

Calibration method and device therefor

X-ray collimator and related X-ray inspection apparatus

Quantitative phase analysis device, quantitative phase analysis met...

Fluidic carbon nanotube device

System and method for inspecting defects of structure by using X-ray

Deposition system and method

Radiation inspection apparatus comprising a radiation inspection de...

Inspection system and inspection method

X-ray fluorescence analyzer and a method for performing an x-ray fl...

Device and method for measuring total cross-sectional phase fractio...

Patents Applicationslast 30 patents

Tray Insert for Screening Tray

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

BONDING WIRE FOR SEMICONDUCTOR DEVICES

X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...

NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...

METHOD FOR SCANNING OF OBJECTS IN A SCANNING APPARATUS

METHOD FOR SCANNING OF AN OBJECT IN A SCANNING APPARATUS

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

SENSOR ELEMENT FOR AN OPTOCHEMICAL SENSOR

OPTICAL DEVICE

Calibration Method and Device Therefor

LUBRICATING OIL ANALYSIS

SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY

METHOD OF USING A DISSOLVABLE DEPLOYMENT DEVICE FOR THE TRANSFER OF...

Scanning Systems

A SCREENING SYSTEM

SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...

SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...

SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...

SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...

INTEGRATED PROCESS AND SYSTEM FOR MEASUREMENT AND TREATMENT OF TOXI...

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

SIMULATION DEVICE FOR ELECTRON-EXCITED ATMOSPHERIC RADIATION

DEPOSITION SYSTEM AND METHOD

Pattern Measurement Device

DRY ICE CLEANING AND RECYCLING DEVICE AND METHOD FOR CONNECTING ROD

Methods and Systems for Generating Three-Dimensional Images that En...

METHOD FOR DETERMINING ATOM USING FOUR-COLOR X-RAY EQUIPMENT