using a second interferometer before or after measuring interferometer

Industry

CPC
G01B9/02065

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02065using a second interferometer before or after measuring interferometer

Industries

Patents Grantslast 30 patents

Information Patent Grant
Phase noise compensation system, and method
- Patent number 11,635,499
- Issue date Apr 25, 2023
- Qinetiq Limited
- David Arthur Orchard
- G01 - MEASURING TESTING
Information Patent Grant
System for performing dual path, two-dimensional optical coherence...
- Patent number 10,288,407
- Issue date May 14, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES, LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical sectioning apparatus using advanced optical interference mi...
- Patent number 10,151,572
- Issue date Dec 11, 2018
- ACUSOLUTIONS INC.
- Chien-Chung Tsai
- G02 - OPTICS
Information Patent Grant
Optical imaging device with image defect determination
- Patent number 9,996,014
- Issue date Jun 12, 2018
- Carl Zeiss SMT GmbH
- Rolf Freimann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometric distance sensing device and method with less depend...
- Patent number 9,791,259
- Issue date Oct 17, 2017
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Lun Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
System for performing dual path, two-dimensional optical coherence...
- Patent number 9,696,134
- Issue date Jul 4, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometric distance measuring method for measuring surfaces, a...
- Patent number 9,677,870
- Issue date Jun 13, 2017
- Hexagon Technology Center GmbH
- Thomas Jensen
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging device with image defect determination
- Patent number 9,235,131
- Issue date Jan 12, 2016
- Carl Zeiss SMT GmbH
- Rolf Freimann
- G01 - MEASURING TESTING
Information Patent Grant
Optical tomographic image acquisition apparatus and method of acqui...
- Patent number 9,207,064
- Issue date Dec 8, 2015
- Terumo Kabushiki Kaisha
- Toshiyuki Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 9,115,971
- Issue date Aug 25, 2015
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Grant
Swing-style and high signal-to-noise ratio demodulation devices and...
- Patent number 8,958,075
- Issue date Feb 17, 2015
- Tianjin University
- Tiegen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric path and/or rotation measuring device
- Patent number 8,830,482
- Issue date Sep 9, 2014
- Robert Bosch GmbH
- Pawel Drabarek
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging device with image defect determination
- Patent number 8,537,333
- Issue date Sep 17, 2013
- Carl Zeiss SMT GmbH
- Rolf Freimann
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring rotationally symmetric aspheric surface
- Patent number 8,526,009
- Issue date Sep 3, 2013
- FUJIFILM Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Optical tomographic image acquisition apparatus and method of acqui...
- Patent number 8,493,567
- Issue date Jul 23, 2013
- Terumo Kabushiki Kaisha
- Toshiyuki Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging apparatus and method
- Patent number 8,493,568
- Issue date Jul 23, 2013
- NATIONAL TAIWAN UNIVERSITY
- Yu-Ta Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method for finishing surface of preliminary polished glass substrate
- Patent number 8,460,843
- Issue date Jun 11, 2013
- Asahi Glass Company, Limited
- Koji Otsuka
- G01 - MEASURING TESTING
Information Patent Grant
Linear-carrier phase-mask interferometer
- Patent number 8,351,048
- Issue date Jan 8, 2013
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous frequency-shift mechanism in fizeau interferometer
- Patent number 8,345,258
- Issue date Jan 1, 2013
- 4 D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
System for optical coherence tomography
- Patent number 8,199,327
- Issue date Jun 12, 2012
- Agfa HealthCare N.V.
- Rainer Nebosis
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for finishing surface of preliminary polished glass substrate
- Patent number 7,998,645
- Issue date Aug 16, 2011
- Asahi Glass Company, Limited
- Koji Otsuka
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring device
- Patent number 7,889,354
- Issue date Feb 15, 2011
- Robert Bosch GmbH
- Stefan Franz
- G01 - MEASURING TESTING
Information Patent Grant
Method for finishing surface of preliminary polished glass substrate
- Patent number 7,803,280
- Issue date Sep 28, 2010
- Asahi Glass Company, Limited
- Koji Otsuka
- G01 - MEASURING TESTING
Information Patent Grant
Linear-carrier phase-mask interferometer
- Patent number 7,777,895
- Issue date Aug 17, 2010
- 4D Technology Corporation
- Brian S. Medower
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing an optical element
- Patent number 7,738,117
- Issue date Jun 15, 2010
- Carl Zeiss SMT AG
- Michael Altenberger
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous frequency-shift mechanism in Fizeau interferometer
- Patent number 7,675,628
- Issue date Mar 9, 2010
- 4D Technology Corporation
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for using a two-wave mixing ultrasonic detecti...
- Patent number 7,667,851
- Issue date Feb 23, 2010
- Lockheed Martin Corporation
- Marc Dubois
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring device
- Patent number 7,545,506
- Issue date Jun 9, 2009
- Robert Bosch GmbH
- Stefan Franz
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring device
- Patent number 7,525,666
- Issue date Apr 28, 2009
- Robert Bosch GmbH
- Michael Lindner
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring device
- Patent number 7,518,729
- Issue date Apr 14, 2009
- Robert Bosch GmbH
- Pawel Drabarek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System for Performing Dual Path, Two- Dimensional Optical Coherence...
- Publication number 20190226829
- Publication date Jul 25, 2019
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Device For Optically Measuring An Object
- Publication number 20190078870
- Publication date Mar 14, 2019
- Siemens Aktiengesellschaft
- Thomas Engel
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING HEIGHT IN THE PRESENCE OF THIN LAYERS
- Publication number 20180364028
- Publication date Dec 20, 2018
- UNITY SEMICONDUCTOR
- Jean-Philippe PIEL
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SECTIONING APPARATUS USING ADVANCED OPTICAL INTERFERENCE MI...
- Publication number 20180347960
- Publication date Dec 6, 2018
- AcuSolutions Inc.
- Chien-Chung TSAI
- G01 - MEASURING TESTING
Information Patent Application
System for Performing Dual Path, Two-Dimensional Optical Coherence...
- Publication number 20170261308
- Publication date Sep 14, 2017
- ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
- Yoel Arieli
- G01 - MEASURING TESTING
Information Patent Application
SWING-STYLE AND HIGH SIGNAL-TO-NOISE RATIO DEMODULATION DEVICES AND...
- Publication number 20140176959
- Publication date Jun 26, 2014
- Tiegen Liu
- G02 - OPTICS
Information Patent Application
INTERFEROMETRIC DISTANCE MEASURING METHOD FOR MEASURING SURFACES, A...
- Publication number 20140139846
- Publication date May 22, 2014
- HEXAGON TECHNOLOGY CENTER GMBH
- Thomas Jensen
- G01 - MEASURING TESTING
Information Patent Application
POSITION MONITORING SYSTEM WITH REDUCED NOISE
- Publication number 20140098375
- Publication date Apr 10, 2014
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING DEVICE WITH IMAGE DEFECT DETERMINATION
- Publication number 20140016108
- Publication date Jan 16, 2014
- Carl Zeiss SMT GMBH
- Rolf FREIMANN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TOMOGRAPHIC IMAGE ACQUISITION APPARATUS AND METHOD OF ACQUI...
- Publication number 20130278936
- Publication date Oct 24, 2013
- Toshiyuki INOUE
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20130063728
- Publication date Mar 14, 2013
- Canon Kabushiki Kaisha
- Yoshiyuki Kuramoto
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC PATH AND/OR ROTATION MEASURING DEVICE
- Publication number 20120162658
- Publication date Jun 28, 2012
- Pawel Drabarek
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROM...
- Publication number 20120140239
- Publication date Jun 7, 2012
- Cheng-Chung LEE
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method of monitoring and measurement using spectral l...
- Publication number 20120013909
- Publication date Jan 19, 2012
- UNIVERSITY OF KENT AT CANTERBURY
- Adrian Podoleanu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
REAL-TIME INTERFEROMETER
- Publication number 20110299090
- Publication date Dec 8, 2011
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FINISHING SURFACE OF PRELIMINARY POLISHED GLASS SUBSTRATE
- Publication number 20110281069
- Publication date Nov 17, 2011
- Asahi Glass Company, Limited
- Koji OTSUKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING ROTATIONALLY SYMMETRIC ASPHERIC SURFACE
- Publication number 20110279823
- Publication date Nov 17, 2011
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING DEVICE WITH IMAGE DEFECT DETERMINATION
- Publication number 20110164232
- Publication date Jul 7, 2011
- Carl Zeiss SMT GMBH
- Rolf FREIMANN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL IMAGING APPARATUS AND METHOD
- Publication number 20110001982
- Publication date Jan 6, 2011
- Yu-Ta Wang
- G01 - MEASURING TESTING
Information Patent Application
LINEAR-CARRIER PHASE-MASK INTERFEROMETER
- Publication number 20100309476
- Publication date Dec 9, 2010
- 4D TECHNOLOGY CORPORATION
- JAMES E. MILLERD
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FINISHING SURFACE OF PRELIMINARY POLISHED GLASS SUBSTRATE
- Publication number 20100304282
- Publication date Dec 2, 2010
- Asahi Glass Company, Limited
- Koji OTSUKA
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS FREQUENCY-SHIFT MECHANISM IN FIZEAU INTERFEROMETER
- Publication number 20100134801
- Publication date Jun 3, 2010
- 4D TECHNOLOGY CORPORATION
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TOMOGRAPHIC IMAGE ACQUISITION APPARATUS AND METHOD OF ACQUI...
- Publication number 20100073682
- Publication date Mar 25, 2010
- FUJIFILM CORPORATION
- Toshiyuki INOUE
- G01 - MEASURING TESTING
Information Patent Application
System for Optical Coherence Tomography
- Publication number 20100027021
- Publication date Feb 4, 2010
- AGFA HEALTHCARE NV
- Rainer Nebosis
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR FINISHING SURFACE OF PRELIMINARY POLISHED GLASS SUBSTRATE
- Publication number 20090233192
- Publication date Sep 17, 2009
- ASAHI GLASS COMPANY LIMITED
- Koji Otsuka
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Reducing Nonlinearity in an Interferometer
- Publication number 20090135430
- Publication date May 28, 2009
- Miao Zhu
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Measuring Device
- Publication number 20090033943
- Publication date Feb 5, 2009
- ROBERT BOSCH GmbH
- Stefan Franz
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing an optical element
- Publication number 20080117436
- Publication date May 22, 2008
- Carl Zeiss SMT AG
- Michael Altenberger
- G01 - MEASURING TESTING
Information Patent Application
Synchronous frequency-shift mechanism in Fizeau interferometer
- Publication number 20080062428
- Publication date Mar 13, 2008
- 4D TECHNOLOGY CORPORATION
- James E. Millerd
- G01 - MEASURING TESTING
Information Patent Application
Interferometric Measuring System
- Publication number 20070291274
- Publication date Dec 20, 2007
- Pawel Drabarek
- G01 - MEASURING TESTING

using a second interferometer before or after measuring interferometer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Phase noise compensation system, and method

System for performing dual path, two-dimensional optical coherence...

Optical sectioning apparatus using advanced optical interference mi...

Optical imaging device with image defect determination

Interferometric distance sensing device and method with less depend...

System for performing dual path, two-dimensional optical coherence...

Interferometric distance measuring method for measuring surfaces, a...

Optical imaging device with image defect determination

Optical tomographic image acquisition apparatus and method of acqui...

Measuring apparatus

Swing-style and high signal-to-noise ratio demodulation devices and...

Interferometric path and/or rotation measuring device

Optical imaging device with image defect determination

Apparatus for measuring rotationally symmetric aspheric surface

Optical tomographic image acquisition apparatus and method of acqui...

Optical imaging apparatus and method

Method for finishing surface of preliminary polished glass substrate

Linear-carrier phase-mask interferometer

Synchronous frequency-shift mechanism in fizeau interferometer

System for optical coherence tomography

Method for finishing surface of preliminary polished glass substrate

Interferometric measuring device

Method for finishing surface of preliminary polished glass substrate

Linear-carrier phase-mask interferometer

Method of manufacturing an optical element

Synchronous frequency-shift mechanism in Fizeau interferometer

Method and apparatus for using a two-wave mixing ultrasonic detecti...

Interferometric measuring device

Interferometric measuring device

Interferometric measuring device

Patents Applicationslast 30 patents

System for Performing Dual Path, Two- Dimensional Optical Coherence...

Device For Optically Measuring An Object

DEVICE AND METHOD FOR MEASURING HEIGHT IN THE PRESENCE OF THIN LAYERS

OPTICAL SECTIONING APPARATUS USING ADVANCED OPTICAL INTERFERENCE MI...

System for Performing Dual Path, Two-Dimensional Optical Coherence...

SWING-STYLE AND HIGH SIGNAL-TO-NOISE RATIO DEMODULATION DEVICES AND...

INTERFEROMETRIC DISTANCE MEASURING METHOD FOR MEASURING SURFACES, A...

POSITION MONITORING SYSTEM WITH REDUCED NOISE

OPTICAL IMAGING DEVICE WITH IMAGE DEFECT DETERMINATION

OPTICAL TOMOGRAPHIC IMAGE ACQUISITION APPARATUS AND METHOD OF ACQUI...

MEASURING APPARATUS

INTERFEROMETRIC PATH AND/OR ROTATION MEASURING DEVICE

METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROM...

Apparatus and method of monitoring and measurement using spectral l...

REAL-TIME INTERFEROMETER

METHOD FOR FINISHING SURFACE OF PRELIMINARY POLISHED GLASS SUBSTRATE

APPARATUS FOR MEASURING ROTATIONALLY SYMMETRIC ASPHERIC SURFACE

OPTICAL IMAGING DEVICE WITH IMAGE DEFECT DETERMINATION

OPTICAL IMAGING APPARATUS AND METHOD

LINEAR-CARRIER PHASE-MASK INTERFEROMETER

METHOD FOR FINISHING SURFACE OF PRELIMINARY POLISHED GLASS SUBSTRATE

SYNCHRONOUS FREQUENCY-SHIFT MECHANISM IN FIZEAU INTERFEROMETER

OPTICAL TOMOGRAPHIC IMAGE ACQUISITION APPARATUS AND METHOD OF ACQUI...

System for Optical Coherence Tomography

METHOD FOR FINISHING SURFACE OF PRELIMINARY POLISHED GLASS SUBSTRATE

Systems and Methods for Reducing Nonlinearity in an Interferometer

Interferometric Measuring Device

Method of manufacturing an optical element

Synchronous frequency-shift mechanism in Fizeau interferometer

Interferometric Measuring System