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G01J3/26
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/26
using multiple reflection
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Spectroscopic unit and spectroscopic module
Patent number
11,971,301
Issue date
Apr 30, 2024
Hamamatsu Photonics K.K.
Kei Tabata
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring Raman spectrum and method thereof
Patent number
11,965,779
Issue date
Apr 23, 2024
TimeGate Instruments Oy
Lauri Kurki
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer device and method for producing a spectrometer device
Patent number
11,959,802
Issue date
Apr 16, 2024
Robert Bosch GmbH
Ralf Noltemeyer
G01 - MEASURING TESTING
Information
Patent Grant
Integrated evanescent wave spectral sensing device
Patent number
11,953,377
Issue date
Apr 9, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer apparatus and a corresponding method for operating a s...
Patent number
11,946,805
Issue date
Apr 2, 2024
Robert Bosch GmbH
Thomas Buck
G01 - MEASURING TESTING
Information
Patent Grant
Refractory anchor device and system
Patent number
11,927,395
Issue date
Mar 12, 2024
Brand Shared Services, LLC
Eduardo Fernando D'Oracio De Almeida
B82 - NANO-TECHNOLOGY
Information
Patent Grant
On-chip signal processing method and pixel-array signal
Patent number
11,921,285
Issue date
Mar 5, 2024
Arizona Board of Regents on behalf of the University of Arizona
John Koshel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multispectral sensor response balancing
Patent number
11,892,666
Issue date
Feb 6, 2024
Viavi Solutions Inc.
William D. Houck
G01 - MEASURING TESTING
Information
Patent Grant
Spectral device
Patent number
11,885,680
Issue date
Jan 30, 2024
Konica Minolta, Inc.
Toru Nakatani
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring transmittance curve of Fabry-Perot using frequ...
Patent number
11,874,169
Issue date
Jan 16, 2024
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Yingjian Wang
G01 - MEASURING TESTING
Information
Patent Grant
Air quality monitoring system and method
Patent number
11,874,170
Issue date
Jan 16, 2024
PROJECT CANARY, PBC
Anna Ailene Scott
G02 - OPTICS
Information
Patent Grant
Divided-aperture infra-red spectral imaging system
Patent number
11,867,564
Issue date
Jan 9, 2024
Rebellion Photonics, Inc.
Robert Timothy Kester
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Laser source apparatus with multiple plate continuum and measuremen...
Patent number
11,860,335
Issue date
Jan 2, 2024
National Tsing Hua University
Shang-Da Yang
G01 - MEASURING TESTING
Information
Patent Grant
Determination of measurement error in an etalon
Patent number
11,860,036
Issue date
Jan 2, 2024
Cymer, LLC
Russell Allen Burdt
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for in-situ optical inspection of laser-induce...
Patent number
11,860,091
Issue date
Jan 2, 2024
Iraj Kavosh
G01 - MEASURING TESTING
Information
Patent Grant
Optical filter array, photodetection device, and photodetection system
Patent number
11,843,876
Issue date
Dec 12, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Atsushi Ishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light detection device
Patent number
11,835,388
Issue date
Dec 5, 2023
Hamamatsu Photonics K.K.
Masaki Hirose
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light filter and spectrometer including the same
Patent number
11,828,650
Issue date
Nov 28, 2023
Samsung Electronics Co., Ltd.
Jineun Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor degradation evaluation method
Patent number
11,808,629
Issue date
Nov 7, 2023
Gigaphoton Inc.
Masato Moriya
G01 - MEASURING TESTING
Information
Patent Grant
Low-cost spectrometry system for end-user food analysis
Patent number
11,802,794
Issue date
Oct 31, 2023
VERIFOOD LTD.
Damian Goldring
G01 - MEASURING TESTING
Information
Patent Grant
Capacitively controlled fabry-perot interferometer
Patent number
11,796,887
Issue date
Oct 24, 2023
Teknologian tutkimuskeskus VTT Oy
Heikki Saari
G01 - MEASURING TESTING
Information
Patent Grant
Light detection device
Patent number
11,796,391
Issue date
Oct 24, 2023
Hamamatsu Photonics K.K.
Takashi Kasahara
G01 - MEASURING TESTING
Information
Patent Grant
Air quality monitoring system and method
Patent number
11,788,889
Issue date
Oct 17, 2023
PROJECT CANARY, PBC
Anna Ailene Scott
G02 - OPTICS
Information
Patent Grant
Spectral apparatus and method of driving spectral apparatus
Patent number
11,774,744
Issue date
Oct 3, 2023
Seiko Epson Corporation
Nozomu Hirokubo
G01 - MEASURING TESTING
Information
Patent Grant
Air quality monitoring system and method
Patent number
11,768,110
Issue date
Sep 26, 2023
PROJECT CANARY, PBC
Anna Ailene Scott
G01 - MEASURING TESTING
Information
Patent Grant
Gas detector
Patent number
11,761,889
Issue date
Sep 19, 2023
Optronics Technology AS
Preben Storås
G08 - SIGNALLING
Information
Patent Grant
Interferometer element, spectrometer and method for operating an in...
Patent number
11,754,445
Issue date
Sep 12, 2023
Robert Bosch GmbH
Ralf Noltemeyer
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral image sensor with calibration
Patent number
11,733,095
Issue date
Aug 22, 2023
IMEC
Nicolaas Tack
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for analysing a chemical composition of a target...
Patent number
11,698,303
Issue date
Jul 11, 2023
Spectral Engines Oy
Jarkko Antila
G01 - MEASURING TESTING
Information
Patent Grant
White balance compensation using a spectral sensor system
Patent number
11,696,043
Issue date
Jul 4, 2023
Spectricity
Jonathan Borremans
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
LOW-COST SPECTROMETRY SYSTEM FOR END-USER FOOD ANALYSIS
Publication number
20240142302
Publication date
May 2, 2024
Verifood Ltd
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
MULTISPECTRAL IMAGER WITH ENLARGED SPECTRAL DOMAIN
Publication number
20240102861
Publication date
Mar 28, 2024
SILIOS TECHNOLOGIES
Stéphane TISSERAND
G01 - MEASURING TESTING
Information
Patent Application
REFRACTORY ANCHOR DEVICE AND SYSTEM
Publication number
20240102736
Publication date
Mar 28, 2024
BRAND SHARED SERVICES, LLC
Eduardo Fernando D'ORACIO DE ALMEIDA
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
Publication number
20240060820
Publication date
Feb 22, 2024
VERIFOOD, LTD.
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE
Publication number
20240035888
Publication date
Feb 1, 2024
Hamamatsu Photonics K.K.
Kei TABATA
G01 - MEASURING TESTING
Information
Patent Application
VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...
Publication number
20240019302
Publication date
Jan 18, 2024
Verity Instruments, Inc.
Andrew Weeks Kueny
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20240019304
Publication date
Jan 18, 2024
HAMAMATSU PHOTONICS K. K.
Masaki HIROSE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FABRY-PEROT CAVITY ARRAY AND SPECTRUM DETECTOR
Publication number
20240011831
Publication date
Jan 11, 2024
Nanjing Kanshijie Intelligent Technology Co., LTD
Qian MA
G01 - MEASURING TESTING
Information
Patent Application
AIR QUALITY MONITORING SYSTEM AND METHOD
Publication number
20230408334
Publication date
Dec 21, 2023
Project Canary, PBC
Anna Ailene Scott
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20230358610
Publication date
Nov 9, 2023
HAMAMATSU PHOTONICS K. K.
Takashi KASAHARA
G01 - MEASURING TESTING
Information
Patent Application
AIR QUALITY MONITORING SYSTEM AND METHOD
Publication number
20230324226
Publication date
Oct 12, 2023
Project Canary, PBC
Anna Ailene Scott
G02 - OPTICS
Information
Patent Application
MULTI-CHANNEL INFEROMETER-BASED OPTICAL SENSOR
Publication number
20230304861
Publication date
Sep 28, 2023
ams Sensors Singapore Pte. Ltd.
Peter Roentgen
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL SENSOR SYSTEM WITH SPATIALLY MODIFIED CENTER WAVELENGTHS
Publication number
20230280210
Publication date
Sep 7, 2023
SPECTRICITY
Jonathan Borremans
G01 - MEASURING TESTING
Information
Patent Application
Temperature Measurement Device
Publication number
20230280214
Publication date
Sep 7, 2023
Nippon Telegraph and Telephone Corporation
Yurina Tanaka
G01 - MEASURING TESTING
Information
Patent Application
METAL MIRROR BASED MULTISPECTRAL FILTER ARRAY
Publication number
20230268362
Publication date
Aug 24, 2023
VIAVI SOLUTIONS INC.
Georg J. OCKENFUSS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FABRY-PEROT FOURIER TRANSFORM SPECTROMETER
Publication number
20230221180
Publication date
Jul 13, 2023
University of Hawaii
Paul Lucey
G01 - MEASURING TESTING
Information
Patent Application
LOW-COST SPECTROMETRY SYSTEM FOR END-USER FOOD ANALYSIS
Publication number
20230221179
Publication date
Jul 13, 2023
VERIFOOD, LTD.
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTABLE INFRARED OPTICAL FILTER DEVICE
Publication number
20230194853
Publication date
Jun 22, 2023
SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD.
Bin GUO
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MEASURING TRANSMITTANCE CURVE OF FABRY-PEROT USING FREQU...
Publication number
20230152153
Publication date
May 18, 2023
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Yingjian WANG
G01 - MEASURING TESTING
Information
Patent Application
FABRY-PEROT INTERFEROMETER HAVING SUPPORTING ELEMENTS
Publication number
20230152154
Publication date
May 18, 2023
Teknologian Tutkimuskeskus VTT Oy
Christer HOLMLUND
G02 - OPTICS
Information
Patent Application
DETERMINATION OF MEASUREMENT ERROR IN AN ETALON
Publication number
20230142333
Publication date
May 11, 2023
CYMER, LLC
Russell Allen Burdt
G01 - MEASURING TESTING
Information
Patent Application
Hyperspectral Imaging Device
Publication number
20230145952
Publication date
May 11, 2023
Teknologian Tutkimuskeskus VTT Oy
Kai OJALA
G02 - OPTICS
Information
Patent Application
DETECTING DEVICE AND MEASURING DEVICE
Publication number
20230133711
Publication date
May 4, 2023
SEIKO EPSON CORPORATION
Takefumi FUKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
TRANSPORTATION METHOD
Publication number
20230122733
Publication date
Apr 20, 2023
HAMAMATSU PHOTONICS K. K.
Hiroki OYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSPORTATION METHOD
Publication number
20230118479
Publication date
Apr 20, 2023
HAMAMATSU PHOTONICS K. K.
Hiroki OYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DRUG SCANNING AND IDENTIFICATION SYSTEM AND USE METHOD THEREOF
Publication number
20230124377
Publication date
Apr 20, 2023
InnoSpectra Corporation
Hsi-Pin Li
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
INTEGRATED DETECTOR ON FABRY-PEROT INTERFEROMETER SYSTEM
Publication number
20230111949
Publication date
Apr 13, 2023
ams Sensors Singapore Pte. Ltd.
Javier MIGUEL SÁNCHEZ
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING T...
Publication number
20230093853
Publication date
Mar 30, 2023
Samsung Electronics Co., Ltd.
Hyochul KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Color measuring device for a fluid distribution system
Publication number
20230086515
Publication date
Mar 23, 2023
EXEL INDUSTRIES
Ahmed BAIDAOUI
G01 - MEASURING TESTING
Information
Patent Application
ILLUMINANT CORRECTION IN AN IMAGING SYSTEM
Publication number
20230082539
Publication date
Mar 16, 2023
SPECTRICITY
Jonathan Borremans
G01 - MEASURING TESTING