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using signal generators, power supplies or circuit analysers
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G01R31/2839
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2839
using signal generators, power supplies or circuit analysers
Industries
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Troubleshooting system and method for current sensors
Patent number
12,105,176
Issue date
Oct 1, 2024
Delta Electronics, Inc.
Kuo-Heng Chao
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Program burning device and current-protection detection method thereof
Patent number
12,044,766
Issue date
Jul 23, 2024
Delta Electronics, Inc.
Kuo-Heng Chao
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electronic device and corresponding self-test method
Patent number
12,038,471
Issue date
Jul 16, 2024
STMicroelectronics S.r.l.
Mirko Dondini
G01 - MEASURING TESTING
Information
Patent Grant
Motor inverter
Patent number
11,982,729
Issue date
May 14, 2024
Delta Electronics, Inc.
Kuo-Heng Chao
G01 - MEASURING TESTING
Information
Patent Grant
System and method for physically detecting counterfeit electronics
Patent number
11,908,811
Issue date
Feb 20, 2024
NOKOMIS, INC.
Walter J. Keller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electrical power analyzer for large and small scale devices for env...
Patent number
11,906,575
Issue date
Feb 20, 2024
International Business Machines Corporation
Jia Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Communicating using contactless coupling
Patent number
11,899,056
Issue date
Feb 13, 2024
Teradyne, Inc.
Tushar K. Gohel
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for simulating a battery
Patent number
11,874,322
Issue date
Jan 16, 2024
Rohde & Schwarz GmbH & Co. KG
Bernhard Sterzbach
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for identifying and locating cyclic momentary ins...
Patent number
11,867,718
Issue date
Jan 9, 2024
Bender GmbH + Co. KG
Dieter Hackl
G01 - MEASURING TESTING
Information
Patent Grant
System and method for formal fault propagation analysis
Patent number
11,816,410
Issue date
Nov 14, 2023
Siemens Electronic Design Automation Gmbh
Dominik Strasser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Current supply device and test system including the same
Patent number
11,674,997
Issue date
Jun 13, 2023
Keysight Technologies, Inc.
Ken Yawata
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Measurement device and method for measuring a device under test
Patent number
11,639,965
Issue date
May 2, 2023
Rohde & Schwarz GmbH & Co. KG
Markus Freidhof
G01 - MEASURING TESTING
Information
Patent Grant
Maximization of side-channel sensitivity for trojan detection
Patent number
11,579,185
Issue date
Feb 14, 2023
University of Florida Research Foundation, Inc.
Prabhat Kumar Mishra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for formal fault propagation analysis
Patent number
11,520,963
Issue date
Dec 6, 2022
OneSpin Solutions GmbH
Dominik Strasser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for physically detecting counterfeit electronics
Patent number
11,450,625
Issue date
Sep 20, 2022
NOKOMIS, INC.
Walter J. Keller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
State output circuit and power supply apparatus
Patent number
11,408,928
Issue date
Aug 9, 2022
Fuji Electric Co., Ltd.
Sho Nakagawa
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Status check for a switch
Patent number
11,346,881
Issue date
May 31, 2022
Infineon Technologies AG
Denis Bilstein
G01 - MEASURING TESTING
Information
Patent Grant
Current supply device and test system including the same
Patent number
11,333,701
Issue date
May 17, 2022
Keysight Technologies, Inc.
Ken Yawata
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method for detecting an open circuit state in a piezoelectric eleme...
Patent number
11,300,607
Issue date
Apr 12, 2022
TE CONNECTIVITY NORGE AS
Hakon Boe
G01 - MEASURING TESTING
Information
Patent Grant
Controlling power dissipation in an output stage of a test channel
Patent number
11,221,361
Issue date
Jan 11, 2022
Teradyne, Inc.
Jason A. Messier
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting faults in a transmission line by using a compl...
Patent number
11,156,652
Issue date
Oct 26, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Esteban Cabanillas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Chip testing device
Patent number
11,125,809
Issue date
Sep 21, 2021
ONE TEST SYSTEMS
Chen-Lung Tsai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Modular power supply monitoring by accessory interface of a test an...
Patent number
10,955,488
Issue date
Mar 23, 2021
Tektronix, Inc.
Haiping Lv
G01 - MEASURING TESTING
Information
Patent Grant
Testing and calibration of a circuit arrangement
Patent number
10,921,368
Issue date
Feb 16, 2021
Boehringer Ingelheim Vetmedica GmbH
Axel Niemeyer
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Integrated circuit intended for insulation defect detection and hav...
Patent number
10,845,405
Issue date
Nov 24, 2020
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Bertrand Chambion
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board inspection device and circuit board inspection method
Patent number
10,761,654
Issue date
Sep 1, 2020
Nidec-Read Corporation
Tadashi Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Counterfeit microelectronics detection based on capacitive and indu...
Patent number
10,685,144
Issue date
Jun 16, 2020
The United States of America, as represented by the Secretary of the Navy
Brett J. Hamilton
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for measuring a propagation delay and transmittan...
Patent number
10,488,463
Issue date
Nov 26, 2019
INSPIRAIN TECHNOLOGIES PTE LTD
Harshang Nileshkumar Pandya
G01 - MEASURING TESTING
Information
Patent Grant
System and method for physically detecting counterfeit electronics
Patent number
10,475,754
Issue date
Nov 12, 2019
Nokomis, Inc.
Walter J. Keller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Counterfeit integrated circuit detection by comparing integrated ci...
Patent number
10,460,326
Issue date
Oct 29, 2019
Global Circuit Innovations, Inc.
Erick Merle Spory
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
USE OF ELECTROMAGNETIC SIGNATURE TO DETERMINE THE TYPE OF INTEGRATE...
Publication number
20240369618
Publication date
Nov 7, 2024
Ohio State Innovation Foundation
Robert Lee
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CURRENT MONITOR
Publication number
20240353475
Publication date
Oct 24, 2024
NVIDIA Corporation
Miguel Rodriguez
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEST METHOD OF TEST SYSTEM AND TEST SYSTEM
Publication number
20240345155
Publication date
Oct 17, 2024
TOKYO ELECTRON LIMITED
Kenichi NARIKAWA
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS DEVICE AND RECORDING MEDIUM
Publication number
20240319243
Publication date
Sep 26, 2024
Rohm Co., Ltd.
Kenji HAMACHI
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM FOR MEASURING AN INTERCEPT POINT VALUE OF A DEVI...
Publication number
20240306018
Publication date
Sep 12, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Matthias RUENGELER
G01 - MEASURING TESTING
Information
Patent Application
TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER
Publication number
20240255566
Publication date
Aug 1, 2024
dSPACE GmbH
Daniel EPPING
G01 - MEASURING TESTING
Information
Patent Application
LOW POWER ARCHITECTURE FOR CHIPLETS
Publication number
20240248132
Publication date
Jul 25, 2024
QUALCOMM Incorporated
Praveen RAGHURAMAN
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD AND APPARATUS FOR LINK, ELECTRONIC DEVICE AND COMP...
Publication number
20240219454
Publication date
Jul 4, 2024
ZTE CORPORATION
Ruina Xu
G01 - MEASURING TESTING
Information
Patent Application
TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...
Publication number
20240201248
Publication date
Jun 20, 2024
dSPACE GmbH
Daniel EPPING
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
METHOD FOR CHECKING A SIGNAL PATH OF AN ELECTRONIC SENSOR CIRCUIT F...
Publication number
20240201246
Publication date
Jun 20, 2024
Endress+Hauser SE+Co. KG
Stefan Müller
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR SIMULATING A BATTERY
Publication number
20240003965
Publication date
Jan 4, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Bernhard STERZBACH
G01 - MEASURING TESTING
Information
Patent Application
Virtualizing Hardware Processing Resources in a Processor
Publication number
20230288471
Publication date
Sep 14, 2023
NVIDIA Corporation
Jerome F. DULUK
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATING USING CONTACTLESS COUPLING
Publication number
20230280393
Publication date
Sep 7, 2023
Teradyne, Inc.
Tushar K. Gohel
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DETECTING A SHORT CIRCUIT IN AN H-BRIDGE ELEC...
Publication number
20230258738
Publication date
Aug 17, 2023
Vitesco Technologies GMBH
Baptiste ROL
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC APPARATUS AND METHOD FOR CONTROLLING THEREOF
Publication number
20230204654
Publication date
Jun 29, 2023
Samsung Electronics Co., Ltd.
Baekseok KO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PREPARING TRACE DATA
Publication number
20230133912
Publication date
May 4, 2023
STMicroelectronics Application GmbH
Avneep Kumar Goyal
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR IDENTIFYING AND LOCATING CYCLIC MOMENTARY INS...
Publication number
20230125797
Publication date
Apr 27, 2023
BENDER GMBH & CO. KG
Dieter Hackl
G01 - MEASURING TESTING
Information
Patent Application
PROGRAM BURNING DEVICE AND CURRENT-PROTECTION DETECTION METHOD THEREOF
Publication number
20230123922
Publication date
Apr 20, 2023
Delta Electronics, Inc.
Kuo-Heng Chao
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS
Publication number
20220414306
Publication date
Dec 29, 2022
Onespin Solutions GmbH
Dominik Strasser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR PHYSICALLY DETECTING COUNTERFEIT ELECTRONICS
Publication number
20220352100
Publication date
Nov 3, 2022
NOKOMIS, INC.
WALTER J. KELLER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...
Publication number
20220291278
Publication date
Sep 15, 2022
KEITHLEY INSTRUMENTS, LLC
Gregory Sobolewski
G01 - MEASURING TESTING
Information
Patent Application
CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME
Publication number
20220236319
Publication date
Jul 28, 2022
KEYSIGHT TECHNOLOGIES, INC.
Ken Yawata
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
INPUT-OUTPUT DEVICE WITH DEBUG CONTROLLER
Publication number
20220113353
Publication date
Apr 14, 2022
Aruni P. Nelson
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND CORRESPONDING SELF-TEST METHOD
Publication number
20220065923
Publication date
Mar 3, 2022
STMicroelectronics S.r.l
Mirko DONDINI
G01 - MEASURING TESTING
Information
Patent Application
Electrical Power Analyzer for Large and Small Scale Devices for Env...
Publication number
20210325447
Publication date
Oct 21, 2021
International Business Machines Corporation
Jia Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME
Publication number
20210231728
Publication date
Jul 29, 2021
KEYSIGHT TECHNOLOGIES, INC.
Ken Yawata
G01 - MEASURING TESTING
Information
Patent Application
Method for Detecting an Open Circuit State in a Piezoelectric Eleme...
Publication number
20210208192
Publication date
Jul 8, 2021
TE Connectivity Norge AS
Hakon Boe
G01 - MEASURING TESTING
Information
Patent Application
STATE OUTPUT CIRCUIT AND POWER SUPPLY APPARATUS
Publication number
20210080499
Publication date
Mar 18, 2021
Fuji Electric Co., Ltd.
Sho NAKAGAWA
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
CONTROLLING POWER DISSIPATION IN AN OUTPUT STAGE OF A TEST CHANNEL
Publication number
20210063474
Publication date
Mar 4, 2021
Teradyne, Inc.
Jason A. Messier
G01 - MEASURING TESTING
Information
Patent Application
CHIP TESTING DEVICE
Publication number
20210018557
Publication date
Jan 21, 2021
ONE TEST SYSTEMS
CHEN-LUNG TSAI
G01 - MEASURING TESTING