using signal generators, power supplies or circuit analysers

Industry

CPC
G01R31/2839

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2839using signal generators, power supplies or circuit analysers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Troubleshooting system and method for current sensors
- Patent number 12,105,176
- Issue date Oct 1, 2024
- Delta Electronics, Inc.
- Kuo-Heng Chao
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Program burning device and current-protection detection method thereof
- Patent number 12,044,766
- Issue date Jul 23, 2024
- Delta Electronics, Inc.
- Kuo-Heng Chao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic device and corresponding self-test method
- Patent number 12,038,471
- Issue date Jul 16, 2024
- STMicroelectronics S.r.l.
- Mirko Dondini
- G01 - MEASURING TESTING
Information Patent Grant
Motor inverter
- Patent number 11,982,729
- Issue date May 14, 2024
- Delta Electronics, Inc.
- Kuo-Heng Chao
- G01 - MEASURING TESTING
Information Patent Grant
System and method for physically detecting counterfeit electronics
- Patent number 11,908,811
- Issue date Feb 20, 2024
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical power analyzer for large and small scale devices for env...
- Patent number 11,906,575
- Issue date Feb 20, 2024
- International Business Machines Corporation
- Jia Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Communicating using contactless coupling
- Patent number 11,899,056
- Issue date Feb 13, 2024
- Teradyne, Inc.
- Tushar K. Gohel
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for simulating a battery
- Patent number 11,874,322
- Issue date Jan 16, 2024
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for identifying and locating cyclic momentary ins...
- Patent number 11,867,718
- Issue date Jan 9, 2024
- Bender GmbH + Co. KG
- Dieter Hackl
- G01 - MEASURING TESTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,816,410
- Issue date Nov 14, 2023
- Siemens Electronic Design Automation Gmbh
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Current supply device and test system including the same
- Patent number 11,674,997
- Issue date Jun 13, 2023
- Keysight Technologies, Inc.
- Ken Yawata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measurement device and method for measuring a device under test
- Patent number 11,639,965
- Issue date May 2, 2023
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Maximization of side-channel sensitivity for trojan detection
- Patent number 11,579,185
- Issue date Feb 14, 2023
- University of Florida Research Foundation, Inc.
- Prabhat Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for formal fault propagation analysis
- Patent number 11,520,963
- Issue date Dec 6, 2022
- OneSpin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for physically detecting counterfeit electronics
- Patent number 11,450,625
- Issue date Sep 20, 2022
- NOKOMIS, INC.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
State output circuit and power supply apparatus
- Patent number 11,408,928
- Issue date Aug 9, 2022
- Fuji Electric Co., Ltd.
- Sho Nakagawa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Status check for a switch
- Patent number 11,346,881
- Issue date May 31, 2022
- Infineon Technologies AG
- Denis Bilstein
- G01 - MEASURING TESTING
Information Patent Grant
Current supply device and test system including the same
- Patent number 11,333,701
- Issue date May 17, 2022
- Keysight Technologies, Inc.
- Ken Yawata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method for detecting an open circuit state in a piezoelectric eleme...
- Patent number 11,300,607
- Issue date Apr 12, 2022
- TE CONNECTIVITY NORGE AS
- Hakon Boe
- G01 - MEASURING TESTING
Information Patent Grant
Controlling power dissipation in an output stage of a test channel
- Patent number 11,221,361
- Issue date Jan 11, 2022
- Teradyne, Inc.
- Jason A. Messier
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting faults in a transmission line by using a compl...
- Patent number 11,156,652
- Issue date Oct 26, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Esteban Cabanillas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip testing device
- Patent number 11,125,809
- Issue date Sep 21, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Modular power supply monitoring by accessory interface of a test an...
- Patent number 10,955,488
- Issue date Mar 23, 2021
- Tektronix, Inc.
- Haiping Lv
- G01 - MEASURING TESTING
Information Patent Grant
Testing and calibration of a circuit arrangement
- Patent number 10,921,368
- Issue date Feb 16, 2021
- Boehringer Ingelheim Vetmedica GmbH
- Axel Niemeyer
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Integrated circuit intended for insulation defect detection and hav...
- Patent number 10,845,405
- Issue date Nov 24, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Bertrand Chambion
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board inspection device and circuit board inspection method
- Patent number 10,761,654
- Issue date Sep 1, 2020
- Nidec-Read Corporation
- Tadashi Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Counterfeit microelectronics detection based on capacitive and indu...
- Patent number 10,685,144
- Issue date Jun 16, 2020
- The United States of America, as represented by the Secretary of the Navy
- Brett J. Hamilton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for measuring a propagation delay and transmittan...
- Patent number 10,488,463
- Issue date Nov 26, 2019
- INSPIRAIN TECHNOLOGIES PTE LTD
- Harshang Nileshkumar Pandya
- G01 - MEASURING TESTING
Information Patent Grant
System and method for physically detecting counterfeit electronics
- Patent number 10,475,754
- Issue date Nov 12, 2019
- Nokomis, Inc.
- Walter J. Keller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Counterfeit integrated circuit detection by comparing integrated ci...
- Patent number 10,460,326
- Issue date Oct 29, 2019
- Global Circuit Innovations, Inc.
- Erick Merle Spory
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE RELATED TO DETECTION OF INTERNAL VOLTAGE
- Publication number 20240418769
- Publication date Dec 19, 2024
- SK HYNIX INC.
- Seung Han OAK
- G01 - MEASURING TESTING
Information Patent Application
USE OF ELECTROMAGNETIC SIGNATURE TO DETERMINE THE TYPE OF INTEGRATE...
- Publication number 20240369618
- Publication date Nov 7, 2024
- Ohio State Innovation Foundation
- Robert Lee
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CURRENT MONITOR
- Publication number 20240353475
- Publication date Oct 24, 2024
- NVIDIA Corporation
- Miguel Rodriguez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST METHOD OF TEST SYSTEM AND TEST SYSTEM
- Publication number 20240345155
- Publication date Oct 17, 2024
- TOKYO ELECTRON LIMITED
- Kenichi NARIKAWA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND RECORDING MEDIUM
- Publication number 20240319243
- Publication date Sep 26, 2024
- Rohm Co., Ltd.
- Kenji HAMACHI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM FOR MEASURING AN INTERCEPT POINT VALUE OF A DEVI...
- Publication number 20240306018
- Publication date Sep 12, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Matthias RUENGELER
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER
- Publication number 20240255566
- Publication date Aug 1, 2024
- dSPACE GmbH
- Daniel EPPING
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER ARCHITECTURE FOR CHIPLETS
- Publication number 20240248132
- Publication date Jul 25, 2024
- QUALCOMM Incorporated
- Praveen RAGHURAMAN
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD AND APPARATUS FOR LINK, ELECTRONIC DEVICE AND COMP...
- Publication number 20240219454
- Publication date Jul 4, 2024
- ZTE CORPORATION
- Ruina Xu
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...
- Publication number 20240201248
- Publication date Jun 20, 2024
- dSPACE GmbH
- Daniel EPPING
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD FOR CHECKING A SIGNAL PATH OF AN ELECTRONIC SENSOR CIRCUIT F...
- Publication number 20240201246
- Publication date Jun 20, 2024
- Endress+Hauser SE+Co. KG
- Stefan Müller
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR SIMULATING A BATTERY
- Publication number 20240003965
- Publication date Jan 4, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Bernhard STERZBACH
- G01 - MEASURING TESTING
Information Patent Application
Virtualizing Hardware Processing Resources in a Processor
- Publication number 20230288471
- Publication date Sep 14, 2023
- NVIDIA Corporation
- Jerome F. DULUK
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATING USING CONTACTLESS COUPLING
- Publication number 20230280393
- Publication date Sep 7, 2023
- Teradyne, Inc.
- Tushar K. Gohel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING A SHORT CIRCUIT IN AN H-BRIDGE ELEC...
- Publication number 20230258738
- Publication date Aug 17, 2023
- Vitesco Technologies GMBH
- Baptiste ROL
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS AND METHOD FOR CONTROLLING THEREOF
- Publication number 20230204654
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Baekseok KO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PREPARING TRACE DATA
- Publication number 20230133912
- Publication date May 4, 2023
- STMicroelectronics Application GmbH
- Avneep Kumar Goyal
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR IDENTIFYING AND LOCATING CYCLIC MOMENTARY INS...
- Publication number 20230125797
- Publication date Apr 27, 2023
- BENDER GMBH & CO. KG
- Dieter Hackl
- G01 - MEASURING TESTING
Information Patent Application
PROGRAM BURNING DEVICE AND CURRENT-PROTECTION DETECTION METHOD THEREOF
- Publication number 20230123922
- Publication date Apr 20, 2023
- Delta Electronics, Inc.
- Kuo-Heng Chao
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS
- Publication number 20220414306
- Publication date Dec 29, 2022
- Onespin Solutions GmbH
- Dominik Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PHYSICALLY DETECTING COUNTERFEIT ELECTRONICS
- Publication number 20220352100
- Publication date Nov 3, 2022
- NOKOMIS, INC.
- WALTER J. KELLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...
- Publication number 20220291278
- Publication date Sep 15, 2022
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20220236319
- Publication date Jul 28, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Ken Yawata
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INPUT-OUTPUT DEVICE WITH DEBUG CONTROLLER
- Publication number 20220113353
- Publication date Apr 14, 2022
- Aruni P. Nelson
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND CORRESPONDING SELF-TEST METHOD
- Publication number 20220065923
- Publication date Mar 3, 2022
- STMicroelectronics S.r.l
- Mirko DONDINI
- G01 - MEASURING TESTING
Information Patent Application
Electrical Power Analyzer for Large and Small Scale Devices for Env...
- Publication number 20210325447
- Publication date Oct 21, 2021
- International Business Machines Corporation
- Jia Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20210231728
- Publication date Jul 29, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Ken Yawata
- G01 - MEASURING TESTING
Information Patent Application
Method for Detecting an Open Circuit State in a Piezoelectric Eleme...
- Publication number 20210208192
- Publication date Jul 8, 2021
- TE Connectivity Norge AS
- Hakon Boe
- G01 - MEASURING TESTING
Information Patent Application
STATE OUTPUT CIRCUIT AND POWER SUPPLY APPARATUS
- Publication number 20210080499
- Publication date Mar 18, 2021
- Fuji Electric Co., Ltd.
- Sho NAKAGAWA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CONTROLLING POWER DISSIPATION IN AN OUTPUT STAGE OF A TEST CHANNEL
- Publication number 20210063474
- Publication date Mar 4, 2021
- Teradyne, Inc.
- Jason A. Messier
- G01 - MEASURING TESTING

using signal generators, power supplies or circuit analysers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Troubleshooting system and method for current sensors

Program burning device and current-protection detection method thereof

Electronic device and corresponding self-test method

Motor inverter

System and method for physically detecting counterfeit electronics

Electrical power analyzer for large and small scale devices for env...

Communicating using contactless coupling

Device and method for simulating a battery

Method and device for identifying and locating cyclic momentary ins...

System and method for formal fault propagation analysis

Current supply device and test system including the same

Measurement device and method for measuring a device under test

Maximization of side-channel sensitivity for trojan detection

System and method for formal fault propagation analysis

System and method for physically detecting counterfeit electronics

State output circuit and power supply apparatus

Status check for a switch

Current supply device and test system including the same

Method for detecting an open circuit state in a piezoelectric eleme...

Controlling power dissipation in an output stage of a test channel

System for detecting faults in a transmission line by using a compl...

Chip testing device

Modular power supply monitoring by accessory interface of a test an...

Testing and calibration of a circuit arrangement

Integrated circuit intended for insulation defect detection and hav...

Circuit board inspection device and circuit board inspection method

Counterfeit microelectronics detection based on capacitive and indu...

Method and system for measuring a propagation delay and transmittan...

System and method for physically detecting counterfeit electronics

Counterfeit integrated circuit detection by comparing integrated ci...

Patents Applicationslast 30 patents

ELECTRONIC DEVICE RELATED TO DETECTION OF INTERNAL VOLTAGE

USE OF ELECTROMAGNETIC SIGNATURE TO DETERMINE THE TYPE OF INTEGRATE...

INTEGRATED CURRENT MONITOR

TEST METHOD OF TEST SYSTEM AND TEST SYSTEM

ANALYSIS DEVICE AND RECORDING MEDIUM

MEASUREMENT SYSTEM FOR MEASURING AN INTERCEPT POINT VALUE OF A DEVI...

TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER

LOW POWER ARCHITECTURE FOR CHIPLETS

DETECTION METHOD AND APPARATUS FOR LINK, ELECTRONIC DEVICE AND COMP...

TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...

METHOD FOR CHECKING A SIGNAL PATH OF AN ELECTRONIC SENSOR CIRCUIT F...

DEVICE AND METHOD FOR SIMULATING A BATTERY

Virtualizing Hardware Processing Resources in a Processor

COMMUNICATING USING CONTACTLESS COUPLING

METHOD AND DEVICE FOR DETECTING A SHORT CIRCUIT IN AN H-BRIDGE ELEC...

ELECTRONIC APPARATUS AND METHOD FOR CONTROLLING THEREOF

SYSTEMS AND METHODS FOR PREPARING TRACE DATA

METHOD AND DEVICE FOR IDENTIFYING AND LOCATING CYCLIC MOMENTARY INS...

PROGRAM BURNING DEVICE AND CURRENT-PROTECTION DETECTION METHOD THEREOF

SYSTEM AND METHOD FOR FORMAL FAULT PROPAGATION ANALYSIS

SYSTEM AND METHOD FOR PHYSICALLY DETECTING COUNTERFEIT ELECTRONICS

UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION...

CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME

INPUT-OUTPUT DEVICE WITH DEBUG CONTROLLER

ELECTRONIC DEVICE AND CORRESPONDING SELF-TEST METHOD

Electrical Power Analyzer for Large and Small Scale Devices for Env...

CURRENT SUPPLY DEVICE AND TEST SYSTEM INCLUDING THE SAME

Method for Detecting an Open Circuit State in a Piezoelectric Eleme...

STATE OUTPUT CIRCUIT AND POWER SUPPLY APPARATUS

CONTROLLING POWER DISSIPATION IN AN OUTPUT STAGE OF A TEST CHANNEL