using simulation

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CPC
G01R31/2848

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/2848using simulation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Thermal runaway trigger method
- Patent number 12,095,049
- Issue date Sep 17, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Yujie Pu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System, apparatus, and method for testing of an electrical system
- Patent number 12,055,590
- Issue date Aug 6, 2024
- OneStep Power Solutions Inc.
- Sarah Whiteford
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Direct current (DC)/DC converter fault diagnosis method and system...
- Patent number 11,853,898
- Issue date Dec 26, 2023
- Wuhan University
- Yigang He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pathloss mitigation via simulated models of dynamic environments
- Patent number 11,799,569
- Issue date Oct 24, 2023
- The Boeing Company
- Matthew Johnston
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data traffic injection for simulation of circuit designs
- Patent number 11,630,935
- Issue date Apr 18, 2023
- Xilinx, Inc.
- Amit Kasat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting failure parameters of semiconductor devices subjected to...
- Patent number 11,493,548
- Issue date Nov 8, 2022
- UChicago Argonne, LLC
- Moinuddin Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibrating a battery simulator
- Patent number 11,467,206
- Issue date Oct 11, 2022
- Kristl, Seibt & Co. Gesellschaft M.B.H.
- Arthur Goeldner
- G01 - MEASURING TESTING
Information Patent Grant
Self-heating effect apparatus and test method
- Patent number 11,137,440
- Issue date Oct 5, 2021
- Semiconductor Manufacturing International (Shanghai) Corporation
- Xi Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reduced cost package device simulator, manufacturing method and met...
- Patent number 10,788,531
- Issue date Sep 29, 2020
- MODUS TEST, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Grant
System and method for simulating reliability of circuit design
- Patent number 10,726,174
- Issue date Jul 28, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chin-Shen Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control and monitoring module
- Patent number 10,725,096
- Issue date Jul 28, 2020
- Wagner Group GmbH
- Frank Eickhorn
- G08 - SIGNALLING
Information Patent Grant
Method and device for estimating level of damage or lifetime expect...
- Patent number 10,705,133
- Issue date Jul 7, 2020
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Single simulation-based structure function mapping
- Patent number 10,571,514
- Issue date Feb 25, 2020
- Mentor Graphics Corporation
- Byron Blackmore
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of converting high-level test specification language to low-...
- Patent number 10,539,609
- Issue date Jan 21, 2020
- NXP USA, INC.
- Arthur Freitas
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for generating validation tests
- Patent number 10,503,854
- Issue date Dec 10, 2019
- Cadence Design Systems, Inc.
- Meir Ovadia
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for modeling an electronic device under test (DUT...
- Patent number 10,474,775
- Issue date Nov 12, 2019
- Keysight Technologies, Inc.
- Sho Okuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for finite difference time domain simulation of...
- Patent number 10,380,292
- Issue date Aug 13, 2019
- Cadence Design Systems, Inc.
- Kenneth Robert Willis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog fault simulation control with multiple circuit representations
- Patent number 10,353,789
- Issue date Jul 16, 2019
- Mentor Graphics Corporation
- Tina Najibi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cloud computing engineering application
- Patent number 10,331,828
- Issue date Jun 25, 2019
- Xendee Corporation
- Adib Nasle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Current-based cell modeling
- Patent number 10,234,512
- Issue date Mar 19, 2019
- Sendyne Corporation
- Yannis Tsividis
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Power inductor evaluation apparatus and power inductor evaluation p...
- Patent number 10,120,037
- Issue date Nov 6, 2018
- Murata Manufacturing Co., Ltd.
- Ko Yamanaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog behavior modeling for 3-phase signaling
- Patent number 9,961,174
- Issue date May 1, 2018
- QUALCOMM Incorporated
- Xiang Li
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement device, semiconductor device and impedance adjustment m...
- Patent number 9,702,942
- Issue date Jul 11, 2017
- NEC Corporation
- Toshihiro Katoh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Voltage-current characteristic generator
- Patent number 9,692,299
- Issue date Jun 27, 2017
- Keysight Technologies, Inc.
- Takashi Kitagaki
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Real time dynamic physics simulation device of flexible DC transmis...
- Patent number 9,659,114
- Issue date May 23, 2017
- State Grid Corporation of China
- Zhiyuan He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for testing motor drives
- Patent number 9,645,194
- Issue date May 9, 2017
- Rockwell Automation Technologies, Inc.
- Yogesh Patel
- G01 - MEASURING TESTING
Information Patent Grant
Compact model for device/circuit/chip leakage current (IDDQ) calcul...
- Patent number 9,639,652
- Issue date May 2, 2017
- GLOBALFOUNDRIES Inc.
- Paul Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calculating circuit-level leakage using three dimensional technolog...
- Patent number 9,536,026
- Issue date Jan 3, 2017
- International Business Machines Corporation
- Rajiv V. Joshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterizing the sensitivity of electronic components...
- Patent number 9,506,970
- Issue date Nov 29, 2016
- AIRBUS GROUP SAS
- Florent Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for simulating battery
- Patent number 9,459,328
- Issue date Oct 4, 2016
- Compal Electronics, Inc.
- Chih-Yang Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER
- Publication number 20240255566
- Publication date Aug 1, 2024
- dSPACE GmbH
- Daniel EPPING
- G01 - MEASURING TESTING
Information Patent Application
TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...
- Publication number 20240201248
- Publication date Jun 20, 2024
- dSPACE GmbH
- Daniel EPPING
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Smart Connector Matrix - an electrical tool to design and test circ...
- Publication number 20240192266
- Publication date Jun 13, 2024
- Swaresh Borse
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE DEFECT SENSITIZATION IN TRANSISTOR-LEVEL CIRCUITS
- Publication number 20240061035
- Publication date Feb 22, 2024
- Synopsys, Inc.
- Mayukh BHATTACHARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, APPARATUS, AND METHOD FOR TESTING OF AN ELECTRICAL SYSTEM
- Publication number 20230133042
- Publication date May 4, 2023
- OneStep Power Solutions Inc.
- Sarah Whiteford
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING DEFECT IN SEMICONDUCTOR DEVICE
- Publication number 20220268830
- Publication date Aug 25, 2022
- Samsung Electronics Co., Ltd.
- Taeyoon An
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Predicting Failure Parameters of Semiconductor Devices Subjected to...
- Publication number 20220065919
- Publication date Mar 3, 2022
- UChicago Argonne, LLC
- Moinuddin Ahmed
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING DESIGN FAULTS OR SEMICONDUCTOR MO...
- Publication number 20210181250
- Publication date Jun 17, 2021
- Bayes Electronics Technology Co., Ltd
- Gang Peter Fang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS
- Publication number 20200333392
- Publication date Oct 22, 2020
- KRISTL, SEIBT & CO. GESELLSCHAFT M.B.H.
- Arthur GOELDNER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...
- Publication number 20190285689
- Publication date Sep 19, 2019
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
ANALOG FAULT SIMULATION CONTROL WITH MULTIPLE CIRCUIT REPRESENTATIONS
- Publication number 20190236232
- Publication date Aug 1, 2019
- Mentor Graphics Corporation
- Tina Najibi
- G01 - MEASURING TESTING
Information Patent Application
Control and Monitoring Module
- Publication number 20190049515
- Publication date Feb 14, 2019
- WAGNER Group GmbH
- Frank EICKHORN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR TESTING DESIGN OF SATELLITE WIRING HARNESS...
- Publication number 20180276321
- Publication date Sep 27, 2018
- The Boeing Company
- Villy Angelico
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE AND TEST SYSTEM PERFORMING T...
- Publication number 20180224498
- Publication date Aug 9, 2018
- Samsung Electronics Co., Ltd.
- Jae Su Jung
- G01 - MEASURING TESTING
Information Patent Application
SELF-HEATING EFFECT APPARATUS AND TEST METHOD
- Publication number 20180180664
- Publication date Jun 28, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- Xi LIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALOG BEHAVIOR MODELING FOR 3-PHASE SIGNALING
- Publication number 20180115637
- Publication date Apr 26, 2018
- QUALCOMM Incorporated
- Xiang Li
- G01 - MEASURING TESTING
Information Patent Application
CALCULATING CIRCUIT-LEVEL LEAKAGE USING THREE DIMENSIONAL TECHNOLOG...
- Publication number 20160210387
- Publication date Jul 21, 2016
- International Business Machines Corporation
- Rajiv V. Joshi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING MOTOR DRIVES
- Publication number 20150253381
- Publication date Sep 10, 2015
- Rockwell Automation Technologies, Inc.
- Yogesh Patel
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT VERIFICATION METHOD AND CIRCUIT VERIFICATION APPARATUS
- Publication number 20140337812
- Publication date Nov 13, 2014
- SATOSHI MATSUBARA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ELECTROSTATIC DISCHARGE TESTING
- Publication number 20140303920
- Publication date Oct 9, 2014
- HON HAI PRECISION INDUSTRY CO., LTD.
- WEI-CHIEH CHOU
- G01 - MEASURING TESTING
Information Patent Application
Emulation System and Method
- Publication number 20140172343
- Publication date Jun 19, 2014
- INFINEON TECHNOLOGIES AG
- Georg Pelz
- G01 - MEASURING TESTING
Information Patent Application
REAL TIME DYNAMIC PHYSICS SIMULATION DEVICE OF FLEXIBLE DC TRANSMIS...
- Publication number 20140129195
- Publication date May 8, 2014
- STATE GRID CORPORATION OF CHINA
- Zhiyuan He
- G01 - MEASURING TESTING
Information Patent Application
COMPACT MODEL FOR DEVICE/CIRCUIT/CHIP LEAKAGE CURRENT (IDDQ) CALCUL...
- Publication number 20140123097
- Publication date May 1, 2014
- International Business Machines Corporation
- Paul Chang
- G01 - MEASURING TESTING
Information Patent Application
Voltage-Current Characteristic Generator
- Publication number 20140117970
- Publication date May 1, 2014
- AGILENT TECHNOLOGIES, INC.
- Takashi Kitagaki
- G01 - MEASURING TESTING
Information Patent Application
Method of Determining Electromigration (EM) Lifetimes and Lifetime...
- Publication number 20140109030
- Publication date Apr 17, 2014
- Intermolecular, Inc.
- Mankoo Lee
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND TESTING METHOD FOR TOUCH DEVICE
- Publication number 20140043038
- Publication date Feb 13, 2014
- Mstar Semiconductor, Inc.
- Chien-Chuan Chen
- G01 - MEASURING TESTING
Information Patent Application
Automotive Diagnostic System
- Publication number 20140005881
- Publication date Jan 2, 2014
- Carmen Hardesty
- G01 - MEASURING TESTING
Information Patent Application
BATTERY SIMULATION CIRCUIT
- Publication number 20130307572
- Publication date Nov 21, 2013
- HON HAI PRECISION INDUSTRY CO., LTD.
- QI-LONG YU
- G01 - MEASURING TESTING
Information Patent Application
OPERATION CHECK SUPPORT DEVICE AND OPERATION CHECK SUPPORT METHOD
- Publication number 20130289923
- Publication date Oct 31, 2013
- Kenji MIZUTANI
- G01 - MEASURING TESTING
Information Patent Application
CELL MODELING
- Publication number 20130282353
- Publication date Oct 24, 2013
- SENDYNE CORP.
- Yannis Tsividis
- G01 - MEASURING TESTING

using simulation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Thermal runaway trigger method

System, apparatus, and method for testing of an electrical system

Direct current (DC)/DC converter fault diagnosis method and system...

Pathloss mitigation via simulated models of dynamic environments

Data traffic injection for simulation of circuit designs

Predicting failure parameters of semiconductor devices subjected to...

Apparatus and method for calibrating a battery simulator

Self-heating effect apparatus and test method

Reduced cost package device simulator, manufacturing method and met...

System and method for simulating reliability of circuit design

Control and monitoring module

Method and device for estimating level of damage or lifetime expect...

Single simulation-based structure function mapping

Method of converting high-level test specification language to low-...

Method and system for generating validation tests

Method and system for modeling an electronic device under test (DUT...

Systems and methods for finite difference time domain simulation of...

Analog fault simulation control with multiple circuit representations

Cloud computing engineering application

Current-based cell modeling

Power inductor evaluation apparatus and power inductor evaluation p...

Analog behavior modeling for 3-phase signaling

Measurement device, semiconductor device and impedance adjustment m...

Voltage-current characteristic generator

Real time dynamic physics simulation device of flexible DC transmis...

Systems and methods for testing motor drives

Compact model for device/circuit/chip leakage current (IDDQ) calcul...

Calculating circuit-level leakage using three dimensional technolog...

Method for characterizing the sensitivity of electronic components...

Apparatus for simulating battery

Patents Applicationslast 30 patents

TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER

TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...

Smart Connector Matrix - an electrical tool to design and test circ...

MEASURING DEVICE DEFECT SENSITIZATION IN TRANSISTOR-LEVEL CIRCUITS

SYSTEM, APPARATUS, AND METHOD FOR TESTING OF AN ELECTRICAL SYSTEM

METHOD FOR PREDICTING DEFECT IN SEMICONDUCTOR DEVICE

Predicting Failure Parameters of Semiconductor Devices Subjected to...

SYSTEM AND METHOD FOR IDENTIFYING DESIGN FAULTS OR SEMICONDUCTOR MO...

APPARATUS

METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...

ANALOG FAULT SIMULATION CONTROL WITH MULTIPLE CIRCUIT REPRESENTATIONS

Control and Monitoring Module

METHOD AND APPARATUS FOR TESTING DESIGN OF SATELLITE WIRING HARNESS...

METHOD OF TESTING SEMICONDUCTOR DEVICE AND TEST SYSTEM PERFORMING T...

SELF-HEATING EFFECT APPARATUS AND TEST METHOD

ANALOG BEHAVIOR MODELING FOR 3-PHASE SIGNALING

CALCULATING CIRCUIT-LEVEL LEAKAGE USING THREE DIMENSIONAL TECHNOLOG...

SYSTEMS AND METHODS FOR TESTING MOTOR DRIVES

CIRCUIT VERIFICATION METHOD AND CIRCUIT VERIFICATION APPARATUS

SYSTEM AND METHOD FOR ELECTROSTATIC DISCHARGE TESTING

Emulation System and Method

REAL TIME DYNAMIC PHYSICS SIMULATION DEVICE OF FLEXIBLE DC TRANSMIS...

COMPACT MODEL FOR DEVICE/CIRCUIT/CHIP LEAKAGE CURRENT (IDDQ) CALCUL...

Voltage-Current Characteristic Generator

Method of Determining Electromigration (EM) Lifetimes and Lifetime...

TESTING SYSTEM AND TESTING METHOD FOR TOUCH DEVICE

Automotive Diagnostic System

BATTERY SIMULATION CIRCUIT

OPERATION CHECK SUPPORT DEVICE AND OPERATION CHECK SUPPORT METHOD

CELL MODELING