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G01R31/2848
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2848
using simulation
Industries
Overview
Organizations
People
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Thermal runaway trigger method
Patent number
12,095,049
Issue date
Sep 17, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Yujie Pu
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
System, apparatus, and method for testing of an electrical system
Patent number
12,055,590
Issue date
Aug 6, 2024
OneStep Power Solutions Inc.
Sarah Whiteford
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Direct current (DC)/DC converter fault diagnosis method and system...
Patent number
11,853,898
Issue date
Dec 26, 2023
Wuhan University
Yigang He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pathloss mitigation via simulated models of dynamic environments
Patent number
11,799,569
Issue date
Oct 24, 2023
The Boeing Company
Matthew Johnston
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data traffic injection for simulation of circuit designs
Patent number
11,630,935
Issue date
Apr 18, 2023
Xilinx, Inc.
Amit Kasat
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Predicting failure parameters of semiconductor devices subjected to...
Patent number
11,493,548
Issue date
Nov 8, 2022
UChicago Argonne, LLC
Moinuddin Ahmed
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for calibrating a battery simulator
Patent number
11,467,206
Issue date
Oct 11, 2022
Kristl, Seibt & Co. Gesellschaft M.B.H.
Arthur Goeldner
G01 - MEASURING TESTING
Information
Patent Grant
Self-heating effect apparatus and test method
Patent number
11,137,440
Issue date
Oct 5, 2021
Semiconductor Manufacturing International (Shanghai) Corporation
Xi Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reduced cost package device simulator, manufacturing method and met...
Patent number
10,788,531
Issue date
Sep 29, 2020
MODUS TEST, LLC
Lynwood Adams
G01 - MEASURING TESTING
Information
Patent Grant
System and method for simulating reliability of circuit design
Patent number
10,726,174
Issue date
Jul 28, 2020
Taiwan Semiconductor Manufacturing Company Ltd.
Chin-Shen Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Control and monitoring module
Patent number
10,725,096
Issue date
Jul 28, 2020
Wagner Group GmbH
Frank Eickhorn
G08 - SIGNALLING
Information
Patent Grant
Method and device for estimating level of damage or lifetime expect...
Patent number
10,705,133
Issue date
Jul 7, 2020
Mitsubishi Electric Corporation
Nicolas Degrenne
G01 - MEASURING TESTING
Information
Patent Grant
Single simulation-based structure function mapping
Patent number
10,571,514
Issue date
Feb 25, 2020
Mentor Graphics Corporation
Byron Blackmore
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of converting high-level test specification language to low-...
Patent number
10,539,609
Issue date
Jan 21, 2020
NXP USA, INC.
Arthur Freitas
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for generating validation tests
Patent number
10,503,854
Issue date
Dec 10, 2019
Cadence Design Systems, Inc.
Meir Ovadia
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for modeling an electronic device under test (DUT...
Patent number
10,474,775
Issue date
Nov 12, 2019
Keysight Technologies, Inc.
Sho Okuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for finite difference time domain simulation of...
Patent number
10,380,292
Issue date
Aug 13, 2019
Cadence Design Systems, Inc.
Kenneth Robert Willis
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Analog fault simulation control with multiple circuit representations
Patent number
10,353,789
Issue date
Jul 16, 2019
Mentor Graphics Corporation
Tina Najibi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cloud computing engineering application
Patent number
10,331,828
Issue date
Jun 25, 2019
Xendee Corporation
Adib Nasle
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Current-based cell modeling
Patent number
10,234,512
Issue date
Mar 19, 2019
Sendyne Corporation
Yannis Tsividis
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Power inductor evaluation apparatus and power inductor evaluation p...
Patent number
10,120,037
Issue date
Nov 6, 2018
Murata Manufacturing Co., Ltd.
Ko Yamanaga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Analog behavior modeling for 3-phase signaling
Patent number
9,961,174
Issue date
May 1, 2018
QUALCOMM Incorporated
Xiang Li
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measurement device, semiconductor device and impedance adjustment m...
Patent number
9,702,942
Issue date
Jul 11, 2017
NEC Corporation
Toshihiro Katoh
G05 - CONTROLLING REGULATING
Information
Patent Grant
Voltage-current characteristic generator
Patent number
9,692,299
Issue date
Jun 27, 2017
Keysight Technologies, Inc.
Takashi Kitagaki
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Real time dynamic physics simulation device of flexible DC transmis...
Patent number
9,659,114
Issue date
May 23, 2017
State Grid Corporation of China
Zhiyuan He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for testing motor drives
Patent number
9,645,194
Issue date
May 9, 2017
Rockwell Automation Technologies, Inc.
Yogesh Patel
G01 - MEASURING TESTING
Information
Patent Grant
Compact model for device/circuit/chip leakage current (IDDQ) calcul...
Patent number
9,639,652
Issue date
May 2, 2017
GLOBALFOUNDRIES Inc.
Paul Chang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Calculating circuit-level leakage using three dimensional technolog...
Patent number
9,536,026
Issue date
Jan 3, 2017
International Business Machines Corporation
Rajiv V. Joshi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for characterizing the sensitivity of electronic components...
Patent number
9,506,970
Issue date
Nov 29, 2016
AIRBUS GROUP SAS
Florent Miller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for simulating battery
Patent number
9,459,328
Issue date
Oct 4, 2016
Compal Electronics, Inc.
Chih-Yang Lin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST ARRANGEMENT FOR TESTING A POWER ELECTRONICS CONTROLLER
Publication number
20240255566
Publication date
Aug 1, 2024
dSPACE GmbH
Daniel EPPING
G01 - MEASURING TESTING
Information
Patent Application
TEST ARRANGEMENT AND METHOD FOR EMULATING THE PHASE CURRENTS OF AN...
Publication number
20240201248
Publication date
Jun 20, 2024
dSPACE GmbH
Daniel EPPING
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Smart Connector Matrix - an electrical tool to design and test circ...
Publication number
20240192266
Publication date
Jun 13, 2024
Swaresh Borse
G01 - MEASURING TESTING
Information
Patent Application
MEASURING DEVICE DEFECT SENSITIZATION IN TRANSISTOR-LEVEL CIRCUITS
Publication number
20240061035
Publication date
Feb 22, 2024
Synopsys, Inc.
Mayukh BHATTACHARYA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM, APPARATUS, AND METHOD FOR TESTING OF AN ELECTRICAL SYSTEM
Publication number
20230133042
Publication date
May 4, 2023
OneStep Power Solutions Inc.
Sarah Whiteford
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PREDICTING DEFECT IN SEMICONDUCTOR DEVICE
Publication number
20220268830
Publication date
Aug 25, 2022
Samsung Electronics Co., Ltd.
Taeyoon An
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Predicting Failure Parameters of Semiconductor Devices Subjected to...
Publication number
20220065919
Publication date
Mar 3, 2022
UChicago Argonne, LLC
Moinuddin Ahmed
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR IDENTIFYING DESIGN FAULTS OR SEMICONDUCTOR MO...
Publication number
20210181250
Publication date
Jun 17, 2021
Bayes Electronics Technology Co., Ltd
Gang Peter Fang
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS
Publication number
20200333392
Publication date
Oct 22, 2020
KRISTL, SEIBT & CO. GESELLSCHAFT M.B.H.
Arthur GOELDNER
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR ESTIMATING LEVEL OF DAMAGE OR LIFETIME EXPECT...
Publication number
20190285689
Publication date
Sep 19, 2019
Mitsubishi Electric Corporation
Nicolas DEGRENNE
G01 - MEASURING TESTING
Information
Patent Application
ANALOG FAULT SIMULATION CONTROL WITH MULTIPLE CIRCUIT REPRESENTATIONS
Publication number
20190236232
Publication date
Aug 1, 2019
Mentor Graphics Corporation
Tina Najibi
G01 - MEASURING TESTING
Information
Patent Application
Control and Monitoring Module
Publication number
20190049515
Publication date
Feb 14, 2019
WAGNER Group GmbH
Frank EICKHORN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR TESTING DESIGN OF SATELLITE WIRING HARNESS...
Publication number
20180276321
Publication date
Sep 27, 2018
The Boeing Company
Villy Angelico
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE AND TEST SYSTEM PERFORMING T...
Publication number
20180224498
Publication date
Aug 9, 2018
Samsung Electronics Co., Ltd.
Jae Su Jung
G01 - MEASURING TESTING
Information
Patent Application
SELF-HEATING EFFECT APPARATUS AND TEST METHOD
Publication number
20180180664
Publication date
Jun 28, 2018
Semiconductor Manufacturing International (Shanghai) Corporation
Xi LIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ANALOG BEHAVIOR MODELING FOR 3-PHASE SIGNALING
Publication number
20180115637
Publication date
Apr 26, 2018
QUALCOMM Incorporated
Xiang Li
G01 - MEASURING TESTING
Information
Patent Application
CALCULATING CIRCUIT-LEVEL LEAKAGE USING THREE DIMENSIONAL TECHNOLOG...
Publication number
20160210387
Publication date
Jul 21, 2016
International Business Machines Corporation
Rajiv V. Joshi
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR TESTING MOTOR DRIVES
Publication number
20150253381
Publication date
Sep 10, 2015
Rockwell Automation Technologies, Inc.
Yogesh Patel
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT VERIFICATION METHOD AND CIRCUIT VERIFICATION APPARATUS
Publication number
20140337812
Publication date
Nov 13, 2014
SATOSHI MATSUBARA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ELECTROSTATIC DISCHARGE TESTING
Publication number
20140303920
Publication date
Oct 9, 2014
HON HAI PRECISION INDUSTRY CO., LTD.
WEI-CHIEH CHOU
G01 - MEASURING TESTING
Information
Patent Application
Emulation System and Method
Publication number
20140172343
Publication date
Jun 19, 2014
INFINEON TECHNOLOGIES AG
Georg Pelz
G01 - MEASURING TESTING
Information
Patent Application
REAL TIME DYNAMIC PHYSICS SIMULATION DEVICE OF FLEXIBLE DC TRANSMIS...
Publication number
20140129195
Publication date
May 8, 2014
STATE GRID CORPORATION OF CHINA
Zhiyuan He
G01 - MEASURING TESTING
Information
Patent Application
COMPACT MODEL FOR DEVICE/CIRCUIT/CHIP LEAKAGE CURRENT (IDDQ) CALCUL...
Publication number
20140123097
Publication date
May 1, 2014
International Business Machines Corporation
Paul Chang
G01 - MEASURING TESTING
Information
Patent Application
Voltage-Current Characteristic Generator
Publication number
20140117970
Publication date
May 1, 2014
AGILENT TECHNOLOGIES, INC.
Takashi Kitagaki
G01 - MEASURING TESTING
Information
Patent Application
Method of Determining Electromigration (EM) Lifetimes and Lifetime...
Publication number
20140109030
Publication date
Apr 17, 2014
Intermolecular, Inc.
Mankoo Lee
G01 - MEASURING TESTING
Information
Patent Application
TESTING SYSTEM AND TESTING METHOD FOR TOUCH DEVICE
Publication number
20140043038
Publication date
Feb 13, 2014
Mstar Semiconductor, Inc.
Chien-Chuan Chen
G01 - MEASURING TESTING
Information
Patent Application
Automotive Diagnostic System
Publication number
20140005881
Publication date
Jan 2, 2014
Carmen Hardesty
G01 - MEASURING TESTING
Information
Patent Application
BATTERY SIMULATION CIRCUIT
Publication number
20130307572
Publication date
Nov 21, 2013
HON HAI PRECISION INDUSTRY CO., LTD.
QI-LONG YU
G01 - MEASURING TESTING
Information
Patent Application
OPERATION CHECK SUPPORT DEVICE AND OPERATION CHECK SUPPORT METHOD
Publication number
20130289923
Publication date
Oct 31, 2013
Kenji MIZUTANI
G01 - MEASURING TESTING
Information
Patent Application
CELL MODELING
Publication number
20130282353
Publication date
Oct 24, 2013
SENDYNE CORP.
Yannis Tsividis
G01 - MEASURING TESTING