using the Kerr effect

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CPC
G01R33/0325

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

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G01R33/0325using the Kerr effect

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus, systems, and methods for measurement using magneto-optic...
- Patent number 12,130,343
- Issue date Oct 29, 2024
- The United States of America, as represented by the Secretary of the Navy
- Nicholas J. Jones
- G08 - SIGNALLING
Information Patent Grant
Method for extracting a transverse magneto-optic effect signal
- Patent number 11,906,604
- Issue date Feb 20, 2024
- ASOCIACIÓN CENTRO DE INVESTIGACIÓN COOPERATIVA EN NANOCIENCIAS “CIC NANOGUNE”
- Eva Oblak
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems, and methods for measurement using magneto-optic...
- Patent number 11,906,605
- Issue date Feb 20, 2024
- The United States of America, as represented by the Secretary of the Navy
- Nicholas J. Jones
- G08 - SIGNALLING
Information Patent Grant
Method for measuring magnetic characteristics, apparatus for measur...
- Patent number 11,860,248
- Issue date Jan 2, 2024
- Sony Corporation
- Akifumi Ono
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic property measurement apparatus
- Patent number 11,796,608
- Issue date Oct 24, 2023
- Samsung Electronics Co., Ltd.
- Harutaka Sekiya
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic property measuring system, a method for measuring magnetic...
- Patent number 11,600,537
- Issue date Mar 7, 2023
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Super resolution for magneto-optical microscopy
- Patent number 11,474,283
- Issue date Oct 18, 2022
- UChicago Argonne, LLC
- Suzanne Gabriëlle Everdine te Velthuis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Magnetic property measuring systems, methods of measuring magnetic...
- Patent number 11,237,224
- Issue date Feb 1, 2022
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- G01 - MEASURING TESTING
Information Patent Grant
Magneto-optical circuit
- Patent number 11,139,824
- Issue date Oct 5, 2021
- Vulcan Inc.
- Keith John Perez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Magnetic property measuring system, a method for measuring magnetic...
- Patent number 10,892,196
- Issue date Jan 12, 2021
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing sample properties in a magnetic field
- Patent number 10,408,891
- Issue date Sep 10, 2019
- Scott Technology NZ Limited
- Michael Graeme Fee
- G01 - MEASURING TESTING
Information Patent Grant
Heat-assisted rotating disk magnetometer for ultra-high anisotropy...
- Patent number 10,134,446
- Issue date Nov 20, 2018
- Seagate Technology LLC
- Kangkang Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Magneto optic kerr effect magnetometer for ultra-high anisotropy ma...
- Patent number 9,348,000
- Issue date May 24, 2016
- Seagate Technology LLC
- Jason L. Pressesky
- G01 - MEASURING TESTING
Information Patent Grant
Sub-optical-resolution kerr signal detection for perpendicular writ...
- Patent number 8,427,929
- Issue date Apr 23, 2013
- Infinitum Solutions, Inc.
- Henry Patland
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing magnetic properties of magnetic media
- Patent number 8,283,622
- Issue date Oct 9, 2012
- Agency for Science, Technology and Research
- Chengwu An
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic multilayer device, method for producing such a device, mag...
- Patent number 8,247,093
- Issue date Aug 21, 2012
- Commissariat a l'Energie Atomique
- Bernard Rodmacq
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electric field sensor, magnetic field sensor, electromagnetic field...
- Patent number 8,233,753
- Issue date Jul 31, 2012
- NEC Corporation
- Mizuki Iwanami
- G01 - MEASURING TESTING
Information Patent Grant
Optical-magnetic Kerr effect waveform testing
- Patent number 8,106,653
- Issue date Jan 31, 2012
- Applied Micro Circuits Corporation
- Joseph Martin Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Complex transverse AC magneto-optic susceptometer for determination...
- Patent number 7,166,997
- Issue date Jan 23, 2007
- Seagate Technology LLC
- Ganping Ju
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 7,084,624
- Issue date Aug 1, 2006
- National Institute of Advanced Industrial Science and Technology
- Yoshinori Tokura
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for measuring magnetization of surfaces
- Patent number 6,593,739
- Issue date Jul 15, 2003
- International Business Machines Corp.
- Bernell Edwin Argyle
- G01 - MEASURING TESTING
Information Patent Grant
Vector kerr magnetometry
- Patent number 6,501,269
- Issue date Dec 31, 2002
- ADE Corporation
- Ferenc Vajda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring instantaneous power using a magn...
- Patent number 5,994,898
- Issue date Nov 30, 1999
- Northeastern University
- Charles A. DiMarzio
- G01 - MEASURING TESTING
Information Patent Grant
Magneto-optic characteristic measuring apparatus
- Patent number 5,838,444
- Issue date Nov 17, 1998
- SKC Limited
- Yung Kuk Jo
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetooptic system for article defects and flaws detection
- Patent number 5,754,044
- Issue date May 19, 1998
- Aram Tanielian
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing magnetic field measurements usi...
- Patent number 5,736,856
- Issue date Apr 7, 1998
- Northeastern University
- Steven A. Oliver
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring Kerr rotation of magneto-optical me...
- Patent number 5,694,384
- Issue date Dec 2, 1997
- Medar, Inc.
- Spencer D. Luster
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for performing magnetic field measurements usi...
- Patent number 5,631,559
- Issue date May 20, 1997
- Northeastern University
- Steven A. Oliver
- G01 - MEASURING TESTING
Information Patent Grant
Magneto-optic Kerr effect stress sensing system
- Patent number 5,493,220
- Issue date Feb 20, 1996
- Northeastern University
- Steven A. Oliver
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for non-destructive testing of dielectric/magnetic materials
- Patent number 5,389,875
- Issue date Feb 14, 1995
- Grumman Aerospace Corporation
- Mark D. A. Rosen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MANUFACTURING DEVICE AND SEMICONDUCTOR MANUFACTURING...
- Publication number 20240272245
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- KEN OZAWA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC...
- Publication number 20230187287
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MEASURING SPIN-ORBIT TORQUE
- Publication number 20230076199
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Sug-Bong CHOE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIZATION MEASUREMENT DEVICE AND MAGNETIZATION MEASUREMENT METHOD
- Publication number 20220317209
- Publication date Oct 6, 2022
- SHOWA DENKO K.K.
- Tatsunori SHINO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING MAGNETIC CHARACTERISTICS, APPARATUS FOR MEASUR...
- Publication number 20220221531
- Publication date Jul 14, 2022
- SONY CORPORATION
- Akifumi ONO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PROPERTY MEASUREMENT APPARATUS
- Publication number 20220137160
- Publication date May 5, 2022
- Samsung Electronics Co., Ltd.
- Harutaka SEKIYA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXTRACTING A TRANSVERSE MAGNETO-OPTIC EFFECT SIGNAL
- Publication number 20220050147
- Publication date Feb 17, 2022
- ASOCIACIÓN CENTRO DE INVESTIGACIÓN COOPERATIVE EN NANOCIENCIAS "CIC NANOGUNE"
- Eva OBLAK
- G01 - MEASURING TESTING
Information Patent Application
SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY
- Publication number 20210405086
- Publication date Dec 30, 2021
- UChicago Argonne, LLC
- Suzanne Gabriëlle Everdine te Velthuis
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC...
- Publication number 20210118753
- Publication date Apr 22, 2021
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETO-OPTICAL MEASUREMENT APPARATUS
- Publication number 20210109168
- Publication date Apr 15, 2021
- TIANMA JAPAN, LTD.
- Nobuya SEKO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PROPERTY MEASURING SYSTEMS, METHODS OF MEASURING MAGNETIC...
- Publication number 20210103011
- Publication date Apr 8, 2021
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for MOKE Metrology with Consistent MRAM Die Ori...
- Publication number 20210025951
- Publication date Jan 28, 2021
- KLA Corporation
- Ferenc Z. Vajda
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC...
- Publication number 20200126873
- Publication date Apr 23, 2020
- Samsung Electronics Co., Ltd.
- Eunsun Noh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR TESTING SAMPLE PROPERTIES IN A MAGNETIC FIELD
- Publication number 20160195591
- Publication date Jul 7, 2016
- HTS-110 LIMITED
- Michael Graeme FEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THERMAL MAGNETIC PROPERTIES OF...
- Publication number 20130093419
- Publication date Apr 18, 2013
- Agency for Science, Technology and Research
- Chengwu An
- G01 - MEASURING TESTING
Information Patent Application
SUB-OPTICAL-RESOLUTION KERR SIGNAL DETECTION FOR PERPENDICULAR WRIT...
- Publication number 20120057446
- Publication date Mar 8, 2012
- Infinitum Solutions, Inc.
- Henry Patland
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING MAGNETIC PROPERTIES OF MAGNETIC MEDIA
- Publication number 20110310387
- Publication date Dec 22, 2011
- Agency for Science, Technology and Research
- Chengwu An
- G01 - MEASURING TESTING
Information Patent Application
Optical-Magnetic Kerr Effect Waveform Testing
- Publication number 20100289488
- Publication date Nov 18, 2010
- Joseph Martin Patterson
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC FIELD SENSOR, MAGNETIC FIELD SENSOR, ELECTROMAGNETIC FIELD...
- Publication number 20090234619
- Publication date Sep 17, 2009
- NEC Corporation
- Mizuki Iwanami
- G02 - OPTICS
Information Patent Application
MAGNETIC MULTILAYER DEVICE, METHOD FOR PRODUCING SUCH A DEVICE, MAG...
- Publication number 20080151615
- Publication date Jun 26, 2008
- COMMISSARIAT A L'ENERGIE ATOMIQUE
- Bernard Rodmacq
- G01 - MEASURING TESTING
Information Patent Application
Magnetic sensor
- Publication number 20050012937
- Publication date Jan 20, 2005
- Yoshinori Tokura
- G01 - MEASURING TESTING
Information Patent Application
Complex transverse AC magneto-optic susceptometer for determination...
- Publication number 20040066190
- Publication date Apr 8, 2004
- Ganping Ju
- G01 - MEASURING TESTING

using the Kerr effect

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus, systems, and methods for measurement using magneto-optic...

Method for extracting a transverse magneto-optic effect signal

Apparatus, systems, and methods for measurement using magneto-optic...

Method for measuring magnetic characteristics, apparatus for measur...

Magnetic property measurement apparatus

Magnetic property measuring system, a method for measuring magnetic...

Super resolution for magneto-optical microscopy

Magnetic property measuring systems, methods of measuring magnetic...

Magneto-optical circuit

Magnetic property measuring system, a method for measuring magnetic...

Apparatus for testing sample properties in a magnetic field

Heat-assisted rotating disk magnetometer for ultra-high anisotropy...

Magneto optic kerr effect magnetometer for ultra-high anisotropy ma...

Sub-optical-resolution kerr signal detection for perpendicular writ...

Method and apparatus for testing magnetic properties of magnetic media

Magnetic multilayer device, method for producing such a device, mag...

Electric field sensor, magnetic field sensor, electromagnetic field...

Optical-magnetic Kerr effect waveform testing

Complex transverse AC magneto-optic susceptometer for determination...

Magnetic sensor

Apparatus and method for measuring magnetization of surfaces

Vector kerr magnetometry

Apparatus and method for measuring instantaneous power using a magn...

Magneto-optic characteristic measuring apparatus

Magnetooptic system for article defects and flaws detection

Method and apparatus for performing magnetic field measurements usi...

Method and system for measuring Kerr rotation of magneto-optical me...

Method and apparatus for performing magnetic field measurements usi...

Magneto-optic Kerr effect stress sensing system

Apparatus for non-destructive testing of dielectric/magnetic materials

Patents Applicationslast 30 patents

SEMICONDUCTOR MANUFACTURING DEVICE AND SEMICONDUCTOR MANUFACTURING...

MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC...

METHOD AND APPARATUS FOR MEASURING SPIN-ORBIT TORQUE

MAGNETIZATION MEASUREMENT DEVICE AND MAGNETIZATION MEASUREMENT METHOD

METHOD FOR MEASURING MAGNETIC CHARACTERISTICS, APPARATUS FOR MEASUR...

MAGNETIC PROPERTY MEASUREMENT APPARATUS

METHOD FOR EXTRACTING A TRANSVERSE MAGNETO-OPTIC EFFECT SIGNAL

SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY

MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC...

MAGNETO-OPTICAL MEASUREMENT APPARATUS

MAGNETIC PROPERTY MEASURING SYSTEMS, METHODS OF MEASURING MAGNETIC...

Systems and Methods for MOKE Metrology with Consistent MRAM Die Ori...

MAGNETIC PROPERTY MEASURING SYSTEM, A METHOD FOR MEASURING MAGNETIC...

APPARATUS FOR TESTING SAMPLE PROPERTIES IN A MAGNETIC FIELD

METHOD AND APPARATUS FOR DETERMINING THERMAL MAGNETIC PROPERTIES OF...

SUB-OPTICAL-RESOLUTION KERR SIGNAL DETECTION FOR PERPENDICULAR WRIT...

METHOD AND APPARATUS FOR TESTING MAGNETIC PROPERTIES OF MAGNETIC MEDIA

Optical-Magnetic Kerr Effect Waveform Testing

ELECTRIC FIELD SENSOR, MAGNETIC FIELD SENSOR, ELECTROMAGNETIC FIELD...

MAGNETIC MULTILAYER DEVICE, METHOD FOR PRODUCING SUCH A DEVICE, MAG...

Magnetic sensor

Complex transverse AC magneto-optic susceptometer for determination...