Vacuum environment

Industry

CPC
G01Q30/16

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/16Vacuum environment

Industries

Patents Grantslast 30 patents

Information Patent Grant
Conductive atomic force microscopy system with enhanced sensitivity...
- Patent number 11,175,307
- Issue date Nov 16, 2021
- GLOBALFOUNDRIES U.S. INC.
- Jay Mody
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for generating three-dimensional image of poly...
- Patent number 10,740,948
- Issue date Aug 11, 2020
- Hanbat National University Industry-Academic Cooperation Foundation
- Sang Mo Shin
- G01 - MEASURING TESTING
Information Patent Grant
High magnetic field scanning probe microscope employing liquid heli...
- Patent number 10,539,590
- Issue date Jan 21, 2020
- FUDAN UNIVERSITY
- Shiwei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Sample vessel retention structure for scanning probe microscope
- Patent number 10,175,263
- Issue date Jan 8, 2019
- Bruker Nano, Inc.
- Charles Meyer
- G02 - OPTICS
Information Patent Grant
Scanning probe microscope
- Patent number 9,689,893
- Issue date Jun 27, 2017
- Hitachi High-Tech Science Corporation
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling microscope assembly, reactor, and system
- Patent number 8,893,309
- Issue date Nov 18, 2014
- The Regents of the University of California
- Feng Tao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
In situ scanning tunneling microscope tip treatment device for spin...
- Patent number 7,361,893
- Issue date Apr 22, 2008
- UT-Battelle, LLC
- An-Ping Li
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring electrical capacitance
- Patent number 6,828,804
- Issue date Dec 7, 2004
- Sharp Kabushiki Kaisha
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic force microscope
- Patent number 6,504,365
- Issue date Jan 7, 2003
- Jeol Ltd.
- Shinichi Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing surfaces of samples
- Patent number 5,619,035
- Issue date Apr 8, 1997
- Biotechnology Research and Development Corporation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Small cavity analytical instruments
- Patent number 5,559,328
- Issue date Sep 24, 1996
- Biotechnology Research and Development Corporation
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for analyzing surfaces of samples
- Patent number 5,504,366
- Issue date Apr 2, 1996
- Biotechnology Research and Development Corp.
- Paul S. Weiss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Installation for the study or the transformation of the surface of...
- Patent number 5,306,918
- Issue date Apr 26, 1994
- Jean-Pierre Goudonnet
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface microscope and surface microscopy
- Patent number 5,144,128
- Issue date Sep 1, 1992
- Hitachi, Ltd.
- Tsuyoshi Hasegawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 5,038,034
- Issue date Aug 6, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Shigeto Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tunneling microscope
- Patent number 4,939,363
- Issue date Jul 3, 1990
- Director General of Agency of Industrial Science and Technology
- Hiroshi Bando
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 4,343,993
- Issue date Aug 10, 1982
- International Business Machines Corporation
- Gerd Binnig
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
- Publication number 20230176088
- Publication date Jun 8, 2023
- Rutgers, The State University of New Jersey
- Angela M. COE
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND P...
- Publication number 20190317125
- Publication date Oct 17, 2019
- CHINA UNIVERSITY OF GEOSCIENCES (WUHAN)
- Fulong Ning
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR GENERATING THREE-DIMENSIONAL IMAGE OF POLY...
- Publication number 20190035136
- Publication date Jan 31, 2019
- Hanbat National University Industry-Academic Cooperation Foundation
- Sang Mo Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH MAGNETIC FIELD SCANNING PROBE MICROSCOPE EMPLOYING LIQUID HELI...
- Publication number 20190025339
- Publication date Jan 24, 2019
- Fudan University
- Shiwei WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20180188286
- Publication date Jul 5, 2018
- Bruker Nano, Inc.
- Charles MEYER
- G02 - OPTICS
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20160356810
- Publication date Dec 8, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Kazunori ANDO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY
- Publication number 20150226766
- Publication date Aug 13, 2015
- Bruker Nano, Inc.
- Kristof Paredis
- G01 - MEASURING TESTING
Information Patent Application
Modular UHV Compatible Angle Physical Contact Fiber Connection for...
- Publication number 20140082775
- Publication date Mar 20, 2014
- Brookhaven Science Associates, LLC
- Percy Zahl
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Tunneling Microscope Assembly, Reactor, and System
- Publication number 20120244038
- Publication date Sep 27, 2012
- The Regents of the University of California
- Feng Tao
- G01 - MEASURING TESTING
Information Patent Application
NANOROBOT MODULE, AUTOMATION AND EXCHANGE
- Publication number 20100140473
- Publication date Jun 10, 2010
- Volker Klocke
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring electrical capacitance
- Publication number 20040108864
- Publication date Jun 10, 2004
- Yuji Yashiro
- G01 - MEASURING TESTING
Information Patent Application
Magnetic force microscope
- Publication number 20020097046
- Publication date Jul 25, 2002
- JEOL Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY

Vacuum environment

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Conductive atomic force microscopy system with enhanced sensitivity...

Apparatus and method for generating three-dimensional image of poly...

High magnetic field scanning probe microscope employing liquid heli...

Sample vessel retention structure for scanning probe microscope

Scanning probe microscope

Scanning tunneling microscope assembly, reactor, and system

In situ scanning tunneling microscope tip treatment device for spin...

Method of measuring electrical capacitance

Magnetic force microscope

System for analyzing surfaces of samples

Small cavity analytical instruments

System for analyzing surfaces of samples

Installation for the study or the transformation of the surface of...

Surface microscope and surface microscopy

Scanning tunneling microscope

Scanning tunneling microscope

Scanning tunneling microscope

Patents Applicationslast 30 patents

DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD

MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND P...

APPARATUS AND METHOD FOR GENERATING THREE-DIMENSIONAL IMAGE OF POLY...

HIGH MAGNETIC FIELD SCANNING PROBE MICROSCOPE EMPLOYING LIQUID HELI...

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY

Modular UHV Compatible Angle Physical Contact Fiber Connection for...

Scanning Tunneling Microscope Assembly, Reactor, and System

NANOROBOT MODULE, AUTOMATION AND EXCHANGE

Method of measuring electrical capacitance

Magnetic force microscope